JP2001307675A5 - - Google Patents

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JP2001307675A5
JP2001307675A5 JP2000123686A JP2000123686A JP2001307675A5 JP 2001307675 A5 JP2001307675 A5 JP 2001307675A5 JP 2000123686 A JP2000123686 A JP 2000123686A JP 2000123686 A JP2000123686 A JP 2000123686A JP 2001307675 A5 JP2001307675 A5 JP 2001307675A5
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Japan
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electrode
ions
mass
unit
power source
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JP2000123686A
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Japanese (ja)
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JP2001307675A (ja
JP3767317B2 (ja
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Publication of JP2001307675A5 publication Critical patent/JP2001307675A5/ja
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JP2000123686A 2000-04-19 2000-04-19 質量分析装置 Expired - Fee Related JP3767317B2 (ja)

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Application Number Priority Date Filing Date Title
JP2000123686A JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000123686A JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

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JP2001307675A JP2001307675A (ja) 2001-11-02
JP2001307675A5 true JP2001307675A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2005-07-14
JP3767317B2 JP3767317B2 (ja) 2006-04-19

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JP2000123686A Expired - Fee Related JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

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JP (1) JP3767317B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4167593B2 (ja) 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
US7947950B2 (en) 2003-03-20 2011-05-24 Stc.Unm Energy focus for distance of flight mass spectometry with constant momentum acceleration and an ion mirror
US7041968B2 (en) * 2003-03-20 2006-05-09 Science & Technology Corporation @ Unm Distance of flight spectrometer for MS and simultaneous scanless MS/MS
JP4690641B2 (ja) * 2003-07-28 2011-06-01 株式会社日立ハイテクノロジーズ 質量分析計
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Ｍａｌｄｉイオントラップ型質量分析装置及び分析方法
JP4848657B2 (ja) * 2005-03-28 2011-12-28 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
JP4894916B2 (ja) 2007-04-09 2012-03-14 株式会社島津製作所 イオントラップ質量分析装置
JPWO2009031179A1 (ja) * 2007-09-04 2010-12-09 株式会社島津製作所 質量分析装置
CN104112642B (zh) 2013-04-18 2017-05-24 岛津分析技术研发（上海）有限公司 离子导引装置以及离子导引方法
JP7143737B2 (ja) * 2018-11-21 2022-09-29 株式会社島津製作所 質量分析装置、イオン発生タイミング制御方法およびイオン発生タイミング制御プログラム

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