JP2001291748A - Probe card - Google Patents

Probe card

Info

Publication number
JP2001291748A
JP2001291748A JP2000103215A JP2000103215A JP2001291748A JP 2001291748 A JP2001291748 A JP 2001291748A JP 2000103215 A JP2000103215 A JP 2000103215A JP 2000103215 A JP2000103215 A JP 2000103215A JP 2001291748 A JP2001291748 A JP 2001291748A
Authority
JP
Japan
Prior art keywords
needle
probe
holding
ground
wiring board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000103215A
Other languages
Japanese (ja)
Inventor
Toshito Nobukiyo
俊人 信清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NS KK
ENU ESU KK
Original Assignee
NS KK
ENU ESU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NS KK, ENU ESU KK filed Critical NS KK
Priority to JP2000103215A priority Critical patent/JP2001291748A/en
Publication of JP2001291748A publication Critical patent/JP2001291748A/en
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PROBLEM TO BE SOLVED: To simplify the ground structure of probes to be grounded and also to hardly peel the probes and to shorten the length between the probes and the ground plane on the surface of a printed wiring board in a probe card. SOLUTION: A conducting layer (35) is formed extending over the inner peripheral surface (23), holding surface (24) and outer peripheral surface (25) of a holding stand (22) provided on the rear of a printed wiring board (20). A ground pin (27) and the outer surface conductors of coaxial pins (29) are secured on the holding surface (24) with a conductive bonding agent (36). The inner peripheral surface (23) and a ground plane (38) on the surface of the wiring board (20) are connected with each other through conductor (39).

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体ウエ−ハ上に
形成された電子回路ダイの電気的特性を検査する際に使
用するプロ−バのプロ−ブカ−ドに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe card for use in testing the electrical characteristics of an electronic circuit die formed on a semiconductor wafer.

【0002】[0002]

【従来の技術】ウエ−ハ上に形成された電子回路ダイ
は、プロ−バ及びテスタ−によって良否が検査される
が、このプロ−バに用いるプロ−ブカ−ドには、上記電
子回路ダイの電極に電気的に接続するための複数のプロ
−ブ針が設けられている。プロ−ブ針には、回路に給電
するための電源針、検査デ−タを得るための信号針、共
通電位用のグランド針等が含まれており、上記信号針に
も一般信号用の信号針と高周波信号用に針の周囲にテフ
ロン(登録商標)やポリイミド製の絶縁層を形成し外面
に導電体を設けた同軸針が用いられている。
2. Description of the Related Art An electronic circuit die formed on a wafer is inspected for quality by a prober and a tester. The probe card used for the prober includes an electronic circuit die. A plurality of probe needles are provided for electrical connection to the electrodes. The probe needle includes a power needle for supplying power to the circuit, a signal needle for obtaining test data, a ground needle for a common potential, and the like. A coaxial needle is used in which an insulating layer made of Teflon (registered trademark) or polyimide is formed around the needle and a conductor is provided on the outer surface for the high frequency signal.

【0003】上記プロ−ブ針のうち、同軸針の外面導電
体やグランド針は、プロ−ブカ−ドのプリント配線板に
形成したグランド面に接地されているが、この接地は、
伝送特性を良くするため、針先端と接地部との長さをで
きるだけ短かくすることが望まれている。そのため、従
来は、例えば図5に示すような接地構造が採用されてい
る。図において、それぞれのプロ−ブ針に接続するため
の配線パタ−ンを多層に形成したプリント配線板(1)
の裏面には、環状の保持台(2)が設けられ、この保持
台(2)にグランド針(3)や図示を省いた信号針、電
源針等が絶縁性のエポキシ樹脂等の樹脂層(4)で固着
されている。この際、プロ−ブ針を並列して並べ単層の
樹脂層で固定したり、積層状態に複数層に分散してプロ
−ブ針を並べ、各層毎に樹脂層を設けて固定している。
そして、先端の尖った略三角板状の銅箔(5)を形成
し、該銅箔(5)の先端(6)を、プリント配線板
(1)の中心孔(7)内に突出するグランド針(3)の
軸部分に半田付け(8)すると共に該銅箔(5)の基端
(9)をプリント配線板(1)の表面のグランド面(10)
に半田付け(11)していた。
Of the probe needles, the outer conductor of the coaxial needle and the ground needle are grounded on the ground surface formed on the printed wiring board of the probe card.
In order to improve the transmission characteristics, it is desired that the length between the tip of the needle and the ground portion be as short as possible. Therefore, conventionally, for example, a grounding structure as shown in FIG. 5 has been adopted. In the figure, a printed wiring board (1) in which wiring patterns for connecting to respective probe needles are formed in multiple layers.
An annular holding base (2) is provided on the back surface of the base. The holding base (2) has a grounding needle (3), a signal needle (not shown), a power needle, etc. It is fixed in 4). At this time, the probe needles are arranged side by side and fixed with a single resin layer, or the probe needles are dispersed in a plurality of layers in a laminated state and the probe needles are arranged, and a resin layer is provided for each layer and fixed. .
Then, a substantially triangular plate-shaped copper foil (5) having a sharp tip is formed, and a tip (6) of the copper foil (5) is protruded into a center hole (7) of the printed wiring board (1). Solder (8) to the shaft part of (3) and attach the base end (9) of the copper foil (5) to the ground plane (10) on the surface of the printed wiring board (1).
Was soldered (11).

【0004】上記のように先端が尖った略三角板状の銅
箔を各グランド針等に半田付けする作業は、グランド針
数が、全プロ−ブ針数の約8%程度の多数であり、また
各プロ−ブ針が非常に狭い間隔で多数並列しているの
で、他のプロ−ブ針に接触しないように細大の注意を払
って行わなければならず、面倒であり、そのためグラン
ド針等への半田付けが不確実になりやすい。特に複数層
に分散してプロ−ブ針を並べた場合には、グランド針が
上方に存する信号針、電源針等によってさえぎられて銅
箔によるグランド補強が不可能なときもあった。その
上、プリント配線板の中央孔に突出するグランド針の軸
部分は、測定の際針先が電極に当って針圧がかけられた
とき上下に移動するから、軸部分に固着した上記半田付
け部分は一層剥れやすくなり、機械的信頼性を乏しくす
る原因となっていた。
[0004] As described above, the operation of soldering a copper foil having a substantially triangular plate shape with a sharp tip to each ground needle or the like involves a large number of ground needles, about 8% of the total number of probe needles. In addition, since a large number of probe needles are arranged in parallel at a very small interval, it must be performed with great care so as not to come into contact with other probe needles. Soldering to the like tends to be uncertain. In particular, when the probe needles are arranged in a plurality of layers, the ground needles are sometimes interrupted by the signal needles, the power supply needles, and the like located above, and it is sometimes impossible to reinforce the ground with copper foil. In addition, the shaft portion of the ground needle protruding into the center hole of the printed wiring board moves up and down when the needle tip hits the electrode during measurement and the needle pressure is applied. The portion became more easily peeled off, causing poor mechanical reliability.

【0005】[0005]

【発明が解決しようとする課題】本発明の解決課題は、
上記のように、複数のプロ−ブ針を有するプロ−ブカ−
ドにおいて、接地すべきプロ−ブ針の接地構造を簡単に
製作することができ、かつ半田付け部分が剥れにくく信
頼性を向上させることができ、針先端と接地部間の長さ
を短くすることが可能であり、接地インピ−ダンスを小
さくし、同軸針の高周波に対する伝送特性を良くするこ
とができ、従来ではグランド補強ができなかった多層に
設けられたグランド針等でもグランド補強をできるよう
にしたプロ−ブカ−ドを提供することである。
The problem to be solved by the present invention is as follows.
As described above, a probe car having a plurality of probe needles
In the probe, the grounding structure of the probe needle to be grounded can be easily manufactured, the soldered part is hardly peeled off, the reliability can be improved, and the length between the needle tip and the grounding part can be shortened. It is possible to reduce the ground impedance, improve the transmission characteristics of the coaxial needle with respect to high frequency, and reinforce the ground even with a multi-layered ground needle or the like that could not be conventionally reinforced. The purpose of the present invention is to provide a probe card as described above.

【0006】[0006]

【課題を解決するための手段】本発明によれば、プリン
ト配線板に設けられる環状の保持台の中心孔側の内周
面、プロ−ブ針を保持する保持面及び外周面にわたって
導電層を形成し、接地すべきプロ−ブ針を上記保持面の
導電層に導電性接着剤で固着し、上記内周面の導電層と
上記プリント配線板の表面のグランド面を導電体で接続
したことを特徴とするプロ−ブカ−ドが提供され、上記
課題が解決される。
According to the present invention, a conductive layer is formed on the inner peripheral surface on the center hole side of the annular holder provided on the printed wiring board, the holding surface for holding the probe needle, and the outer peripheral surface. The probe needle to be formed and grounded is fixed to the conductive layer on the holding surface with a conductive adhesive, and the conductive layer on the inner peripheral surface and the ground surface on the surface of the printed wiring board are connected by a conductor. The above-mentioned problem is solved by providing a probe card characterized by the following.

【0007】[0007]

【発明の実施の形態】図1は、本発明の一実施例を示
し、図においてプリント配線板(20)は、それぞれのプロ
−ブ針に接続するための配線パタ−ンや通孔を有する
が、図においてはそれらの構成は省略されている。該プ
リント配線板(20)には、公知のように各プロ−ブ針を突
出させるための中央孔(21)があり、該中央孔(21)に面し
てプロ−ブ針を保持するための環状の保持台(22)が設け
られている。
FIG. 1 shows an embodiment of the present invention. In the drawing, a printed wiring board (20) has a wiring pattern and a through hole for connection to respective probe needles. However, those components are omitted in the figure. The printed wiring board (20) has a central hole (21) for projecting each probe needle as is well known, and is used to hold the probe needle facing the central hole (21). An annular holding base (22) is provided.

【0008】上記保持台(22)は、セラミックス等の絶縁
材料で作られているが、金属材料等の導電性材料で作る
こともできる。該保持台(22)は、上記中央孔(21)側の内
周面(23)と、プロ−ブ針の先端を下方に向かって保持す
るための内方へ向かって傾斜した保持面(24)と、外周面
(25)と、上記プリント配線板(20)に取付けられる取付面
(26)を有している。
The holding table (22) is made of an insulating material such as ceramics, but may be made of a conductive material such as a metal material. The holding table (22) has an inner peripheral surface (23) on the side of the central hole (21) and a holding surface (24) inclined inward for holding the tip of the probe needle downward. ) And outer peripheral surface
(25) and the mounting surface to be mounted on the printed wiring board (20)
(26).

【0009】上記保持面(24)に保持されるグランド針(2
7)、電源針(28)、同軸針(29)、信号針(30)等のプロ−ブ
針は、該保持面(24)に放射状に並列させエポキシ系の樹
脂材料等の絶縁性の樹脂層(31)で固着する際、互いに接
触しないよう上下方向に位相を変えて多層に設けられる
が、図1、2に図示する断面部分では1本のグランド針
を示してある。導通してはいけない針は、絶縁膜で被覆
すれば単層に並列させることもできる。なお、同軸針(2
9)は、図3に示すように針の軸部(32)の外側にテフロ
ン、ポリイミド等の絶縁層(33)を形成し、外表面に銅パ
イプ等の導電体(34)を設けたもので、公知のように高周
波信号用のプロ−ブ針として好適に用いられる。
The ground needle (2) held on the holding surface (24)
7) Probe needles such as a power needle (28), a coaxial needle (29), a signal needle (30) are arranged radially in parallel with the holding surface (24) and an insulating resin such as an epoxy resin material. When the layers are fixed by the layer (31), they are provided in multiple layers with their phases changed in the vertical direction so that they do not contact each other, but one cross section shown in FIGS. 1 and 2 shows one ground needle. The needles that should not be conducted can be arranged in a single layer by covering them with an insulating film. The coaxial needle (2
9) As shown in FIG. 3, an insulating layer (33) such as Teflon or polyimide is formed outside the needle shaft (32), and a conductor (34) such as a copper pipe is provided on the outer surface. As is well known, it is suitably used as a probe for a high-frequency signal.

【0010】上記保持台(22)の内周面(23)、保持面(2
4)、外周面(25)及び取付面(26)にわたって保持台の全周
面には導電層(35)が形成されている。この導電層(35)
は、セラミックス材料等で形成した上記保持台(22)の表
面にニッケル、銅、銀その他の適宜の導電材料を金属メ
ッキしたり、スパッタリング等して薄膜状に形成してあ
るが、導電性塗料を塗布することもできる。また、保持
台を導電性の良好な金属材料で形成すれば、別に薄膜等
を形成しなくても表面自体を導電層とすることができ
る。
The inner peripheral surface (23) of the holding table (22) and the holding surface (2)
4), a conductive layer (35) is formed on the entire peripheral surface of the holder over the outer peripheral surface (25) and the mounting surface (26). This conductive layer (35)
The surface of the holding table (22) formed of a ceramic material or the like is formed in a thin film by nickel plating, copper, silver or other suitable conductive material by metal plating or sputtering. Can also be applied. Further, if the holding table is formed of a metal material having good conductivity, the surface itself can be used as a conductive layer without forming a thin film or the like separately.

【0011】上記プロ−ブ針のうち、接地すべきプロ−
ブ針、図においては、上記グランド針(27)及び同軸針(2
9)の外面導電体(34)は、上記保持面(24)の導電層(35)に
導電性接着剤(36)、例えば銀粉を含んだエポキシ系接着
剤で固着される。この際、該接着剤(36)が溜るよう環状
の受溝(37)を保持面(24)に形成してもよい。なお、上記
グランド針(27)等は、図1に示す実施例では、上記導電
性接着剤(36)の部分を介して導電層(35)に導通するよう
にしてあるが、図2に示すように上記受溝(37)の両側の
保持面部分若しくはいずれか一方の部分(図示略)でも
上記導電層(35)に接続するようにしてもよい。
[0011] Among the probe needles, the probe to be grounded
Needle, the ground needle (27) and the coaxial needle (2
The outer surface conductor (34) of (9) is fixed to the conductive layer (35) of the holding surface (24) with a conductive adhesive (36), for example, an epoxy-based adhesive containing silver powder. At this time, an annular receiving groove (37) may be formed on the holding surface (24) so that the adhesive (36) accumulates. In the embodiment shown in FIG. 1, the ground needle (27) and the like are electrically connected to the conductive layer (35) via the conductive adhesive (36), but are shown in FIG. As described above, the holding surface portions on either side of the receiving groove (37) or any one of the portions (not shown) may be connected to the conductive layer (35).

【0012】上記内周面(23)の導電層(35)と、上記プリ
ント配線板(20)の表面に形成したグランド面(38)は、導
電体、図においては細片状の銅箔(39)を両者間に半田付
け(40)することにより接続されている。該導電体は、各
グランド針、同軸針等に対応する位置にそれぞれ設けた
り、適所に適宜数設けたり、銅箔に代えて導電性塗料を
塗布することにより形成することもできる。
The conductive layer (35) on the inner peripheral surface (23) and the ground surface (38) formed on the surface of the printed wiring board (20) are made of a conductor, in the figure, a strip-shaped copper foil ( 39) are connected by soldering (40) between them. The conductor may be provided at a position corresponding to each ground needle, coaxial needle, or the like, may be provided in an appropriate number in an appropriate position, or may be formed by applying a conductive paint instead of a copper foil.

【0013】上記プリント配線板(20)に設けたグランド
面(41)には、上記グランド針(27)の基端が接続される。
また、上記外周面(25)の導電層(35)と上記グランド面(4
1)の間にも導電性接着剤(42)を充填して接続してある
が、導電性塗料や他の導電体で接続するようにしてもよ
い。
A base end of the ground needle (27) is connected to a ground surface (41) provided on the printed wiring board (20).
Also, the conductive layer (35) on the outer peripheral surface (25) and the ground surface (4
Although the conductive adhesive (42) is filled and connected between 1), the conductive adhesive (42) may be connected with a conductive paint or another conductor.

【0014】図4にはプロ−ブ針を複数層に分散して固
着する場合のグランド補強の実施例が示されている。同
図(B)に示すように、保持台(22)の導電層(35)の下面
には、図面の下方から1層目、2層目、3層目、4層目
の各樹脂層(31a),(31b),(31c),(31d) が設けられ、各樹
脂層にはプロ−グ針が並べて固定されている。そして、
例えば2層目の樹脂層(31b) に接地すべきグランド針(2
7)等がある場合、従来の図5に示すような構造では、図
の上方に存する信号針(30)、電源針(28)等がじゃまにな
ってグランド補強することがむずかしい。このような場
合には、図に示すように、3層目の樹脂層(31c) に切目
(43)を形成し、4層目の樹脂層(31d) 中の導電性接着剤
(36)と導通するように上記切目(43)を通して上記2層目
の樹脂層(31b) まで導電性接着剤(36)を設ければよい。
この際、上記切目(43)部分に金属片等の導電体(44)を埋
設すれば、導電性接着剤の導電性を高めることができ
る。
FIG. 4 shows an embodiment of ground reinforcement when probe needles are dispersed and fixed in a plurality of layers. As shown in FIG. 3B, on the lower surface of the conductive layer (35) of the holding table (22), the first, second, third, and fourth resin layers ( 31a), (31b), (31c), and (31d) are provided, and prong needles are arranged and fixed to each resin layer. And
For example, a ground needle (2) to be grounded to the second resin layer (31b)
5), in the conventional structure as shown in FIG. 5, it is difficult for the signal needle (30), the power needle (28) and the like existing in the upper part of FIG. In such a case, a cut is made in the third resin layer (31c) as shown in the figure.
(43), the conductive adhesive in the fourth resin layer (31d)
The conductive adhesive (36) may be provided to the second resin layer (31b) through the cut (43) so as to conduct with the (36).
At this time, if the conductor (44) such as a metal piece is embedded in the cut (43), the conductivity of the conductive adhesive can be increased.

【0015】[0015]

【発明の効果】本発明は上記のように構成され、プロ−
ブ針を保持する保持台の内周面、保持面及び外周面にわ
たって導電層を形成し、上記保持面の導電層に接地すべ
きプロ−ブ針を導電性接着剤で固着し、上記内周面の導
電層とプリント配線板の表面のグランド面を導電体で接
続するようにしたので、従来のようにグランド針等の軸
部分に銅箔の尖端を半田付けするというような面倒な作
業をする必要がなく、製造が簡単であり、従来ではグラ
ンド補強が不可能であった針に対しても可能となった。
また針の可動部分に半田付けする構成ではないから、半
田付け部分が剥離するというおそれもなく、その上、内
周面とグランド面を導電体で直接接続したので、接地構
造が補強されると共にプリント配線板の中央孔に突出す
る針とグランド面間の長さを短かくすることができ、グ
ランド針の接地インピ−ダンスを小さくでき、同軸針の
高周波に対する伝送特性が向上され、外周面とプリント
配線板のグランド面を導通させると、一層良好な特性が
得られ、効率的に測定することができる。
The present invention is constituted as described above,
A conductive layer is formed on the inner peripheral surface, the holding surface and the outer peripheral surface of the holding table for holding the probe needle, and a probe needle to be grounded is fixed to the conductive layer on the holding surface with a conductive adhesive, and The conductive layer on the surface and the ground plane on the surface of the printed wiring board are connected by a conductor, so that the troublesome work of soldering the tip of copper foil to the shaft part of the ground needle etc. as in the past has been done. It is not necessary to carry out the process, the production is simple, and it has become possible even for a needle which cannot conventionally be ground-reinforced.
Also, since the structure is not soldered to the movable part of the needle, there is no danger that the soldered part will peel off.In addition, since the inner peripheral surface and the ground surface are directly connected by a conductor, the grounding structure is reinforced and The length between the needle protruding from the center hole of the printed wiring board and the ground plane can be shortened, the ground impedance of the ground needle can be reduced, the transmission characteristics of the coaxial needle for high frequencies are improved, and When the ground surface of the printed wiring board is made conductive, more excellent characteristics can be obtained and the measurement can be performed efficiently.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例を示し、プロ−ブカ−ドの一
部の切欠斜視図。
FIG. 1 shows an embodiment of the present invention and is a partially cutaway perspective view of a probe card.

【図2】本発明の他の実施例を示し、プロ−ブカ−ドの
一部の切欠斜視図。
FIG. 2 is a partially cutaway perspective view showing a probe card according to another embodiment of the present invention.

【図3】同軸針の断面図。FIG. 3 is a sectional view of a coaxial needle.

【図4】プロ−ブ針を多層に並べた状態を示す説明図で
あり、(A)は樹脂層を省略した斜視図、(B)は断面
図。
4A and 4B are explanatory views showing a state in which probe needles are arranged in multiple layers, wherein FIG. 4A is a perspective view in which a resin layer is omitted, and FIG.

【図5】従来例を示し、プロ−ブカ−ドの一部の切欠斜
視図。
FIG. 5 is a partially cutaway perspective view of a probe card, showing a conventional example.

【符号の説明】 20 プリント配線板 22 保持台 23 内周面
24 保持面 25 外周面 26 取付面 27 グラ
ンド針 28 電源針 29 同軸針 30信号針
35 導電層 36,42 導電性接着剤 38,41 グラ
ンド面 43切目
[Description of Signs] 20 Printed Wiring Board 22 Holder 23 Inner Peripheral Surface
24 Holding surface 25 Outer peripheral surface 26 Mounting surface 27 Ground needle 28 Power needle 29 Coaxial needle 30 Signal needle
35 Conductive layer 36,42 Conductive adhesive 38,41 Ground plane 43 cut

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 プリント配線板に設けられプロ−ブ針を
保持するための環状の保持台を有し、上記プリント配線
板の中心孔側の保持台の内周面、プロ−ブ針を保持する
保持面及び外周面にわたって導電層を形成し、接地すべ
きプロ−ブ針を上記保持面の導電層に導電性接着剤で固
着し、上記内周面の導電層と上記プリント配線板の表面
のグランド面を導電体で接続したことを特徴とするプロ
−ブカ−ド。
An annular holding base is provided on a printed wiring board for holding probe needles, and holds the inner peripheral surface of the holding base on the center hole side of the printed wiring board and the probe needles. A conductive layer is formed over the holding surface and the outer peripheral surface to be grounded, a probe needle to be grounded is fixed to the conductive layer on the holding surface with a conductive adhesive, and the conductive layer on the inner peripheral surface and the surface of the printed wiring board are fixed. A ground plane connected by a conductor.
【請求項2】 上記保持台の外周面と上記プリント配線
板のグランド面間は、導電性接着剤で接続されている請
求項1に記載のプロ−ブカ−ド。
2. The probe card according to claim 1, wherein an outer peripheral surface of said holding table and a ground surface of said printed wiring board are connected by a conductive adhesive.
【請求項3】 上記プロ−ブ針は上記保持台の保持面に
多層に並べられており、各層に存する接地すべきプロ−
ブ針は上記層間にわたって設けた導電性接着剤で導通さ
れている請求項1に記載のプロ−ブカ−ド。
3. The probe needles are arranged in multiple layers on the holding surface of the holding table, and the probe to be grounded exists in each layer.
2. The probe card according to claim 1, wherein the probe needles are electrically connected by a conductive adhesive provided between the layers.
【請求項4】 上記層間にわたって設けた導電性接着剤
による導通部には導電体が挿入されている請求項3に記
載のプロ−ブカ−ド。
4. The probe card according to claim 3, wherein a conductor is inserted in a conductive portion provided by a conductive adhesive provided over the layers.
JP2000103215A 2000-04-05 2000-04-05 Probe card Pending JP2001291748A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000103215A JP2001291748A (en) 2000-04-05 2000-04-05 Probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000103215A JP2001291748A (en) 2000-04-05 2000-04-05 Probe card

Publications (1)

Publication Number Publication Date
JP2001291748A true JP2001291748A (en) 2001-10-19

Family

ID=18616968

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000103215A Pending JP2001291748A (en) 2000-04-05 2000-04-05 Probe card

Country Status (1)

Country Link
JP (1) JP2001291748A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101823142B1 (en) 2016-10-05 2018-01-30 (주)이큐이엔지 The needle assembly for the probe card
KR101823141B1 (en) 2016-10-05 2018-01-30 (주)이큐이엔지 The needle assembly for the probe card

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01209380A (en) * 1988-02-16 1989-08-23 Fujitsu Ltd Probe card
JPH09218222A (en) * 1996-02-08 1997-08-19 Advantest Corp Probe card
JPH10185955A (en) * 1996-12-20 1998-07-14 Micronics Japan Co Ltd Inspection head
JPH11248748A (en) * 1998-03-05 1999-09-17 Advantest Corp Probe card

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01209380A (en) * 1988-02-16 1989-08-23 Fujitsu Ltd Probe card
JPH09218222A (en) * 1996-02-08 1997-08-19 Advantest Corp Probe card
JPH10185955A (en) * 1996-12-20 1998-07-14 Micronics Japan Co Ltd Inspection head
JPH11248748A (en) * 1998-03-05 1999-09-17 Advantest Corp Probe card

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101823142B1 (en) 2016-10-05 2018-01-30 (주)이큐이엔지 The needle assembly for the probe card
KR101823141B1 (en) 2016-10-05 2018-01-30 (주)이큐이엔지 The needle assembly for the probe card

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