JP2001194286A5 - - Google Patents

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Publication number
JP2001194286A5
JP2001194286A5 JP2000001026A JP2000001026A JP2001194286A5 JP 2001194286 A5 JP2001194286 A5 JP 2001194286A5 JP 2000001026 A JP2000001026 A JP 2000001026A JP 2000001026 A JP2000001026 A JP 2000001026A JP 2001194286 A5 JP2001194286 A5 JP 2001194286A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000001026A
Other languages
Japanese (ja)
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JP2001194286A (ja
JP4370032B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000001026A priority Critical patent/JP4370032B2/ja
Priority claimed from JP2000001026A external-priority patent/JP4370032B2/ja
Priority to US09/550,255 priority patent/US6545276B1/en
Publication of JP2001194286A publication Critical patent/JP2001194286A/ja
Publication of JP2001194286A5 publication Critical patent/JP2001194286A5/ja
Application granted granted Critical
Publication of JP4370032B2 publication Critical patent/JP4370032B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2000001026A 1999-04-14 2000-01-06 近接場光学顕微鏡装置 Expired - Fee Related JP4370032B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000001026A JP4370032B2 (ja) 2000-01-06 2000-01-06 近接場光学顕微鏡装置
US09/550,255 US6545276B1 (en) 1999-04-14 2000-04-14 Near field optical microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000001026A JP4370032B2 (ja) 2000-01-06 2000-01-06 近接場光学顕微鏡装置

Publications (3)

Publication Number Publication Date
JP2001194286A JP2001194286A (ja) 2001-07-19
JP2001194286A5 true JP2001194286A5 (enrdf_load_stackoverflow) 2007-06-14
JP4370032B2 JP4370032B2 (ja) 2009-11-25

Family

ID=18530285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000001026A Expired - Fee Related JP4370032B2 (ja) 1999-04-14 2000-01-06 近接場光学顕微鏡装置

Country Status (1)

Country Link
JP (1) JP4370032B2 (enrdf_load_stackoverflow)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3520335B2 (ja) 2001-01-10 2004-04-19 独立行政法人産業技術総合研究所 近接場光検出方法およびその装置
JP4332644B2 (ja) 2003-09-05 2009-09-16 独立行政法人産業技術総合研究所 光学測定方法および装置
JP4522884B2 (ja) * 2005-02-17 2010-08-11 株式会社資生堂 試料の光抽出性能の評価方法及び試料の光抽出性能の評価装置
JP4756270B2 (ja) * 2006-07-13 2011-08-24 独立行政法人産業技術総合研究所 光学分光測定方法及び装置
JP5033609B2 (ja) 2007-03-12 2012-09-26 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた試料の観察方法
FR2920538B1 (fr) * 2007-09-04 2009-11-20 Centre Nat Rech Scient Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjection
JP5504418B2 (ja) * 2008-07-07 2014-05-28 株式会社東芝 プラズモン評価方法およびプラズモン評価装置
JP5802417B2 (ja) * 2011-04-04 2015-10-28 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた測定方法
KR101531102B1 (ko) * 2013-06-26 2015-06-24 한국과학기술원 빛의 산란을 이용한 근접장 제어 장치 및 방법

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