JP2001177023A - Mounting structure of chip device - Google Patents

Mounting structure of chip device

Info

Publication number
JP2001177023A
JP2001177023A JP36201699A JP36201699A JP2001177023A JP 2001177023 A JP2001177023 A JP 2001177023A JP 36201699 A JP36201699 A JP 36201699A JP 36201699 A JP36201699 A JP 36201699A JP 2001177023 A JP2001177023 A JP 2001177023A
Authority
JP
Japan
Prior art keywords
heat
chip element
solid
imaging device
state imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP36201699A
Other languages
Japanese (ja)
Inventor
Kazuhiko Kanda
一彦 神田
Taku Koreki
卓 是木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP36201699A priority Critical patent/JP2001177023A/en
Publication of JP2001177023A publication Critical patent/JP2001177023A/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Landscapes

  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable heat released from a chip device to be dissipated outside so as to prevent it from rising in temperature. SOLUTION: A heat conduction member 21 is provided inside a resin housing 7, a solid-state image pick-up device 6 is mounted on the inner surface of the member 21 exposed in the housing 7, and the part of the member 21 exposed to the outside on the backside of the resin housing 7 is brought into contact with a metal plate 2. Therefore, heat released from the solid-state image pickup device is conducted to the backside of the resin housing 7 through the heat conduction member 21, so that heat released from the image pick-up device can be dissipated outside of the resin housing 7, and the rear of the heat conduction member 21 is brought into contact with a metal plate 2, so that the heat of the heat conduction member 21 can be dissipated through the metal plate 2. Therefore, heat released from the image pick-up device 6 can be efficiently dissipated outside, and the device 6 can be restrained from rising in temperature.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、固体撮像素子な
どのチップ素子の取付構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mounting structure for a chip device such as a solid-state image pickup device.

【0002】[0002]

【従来の技術】例えば、電子カメラにおいては、CCD
などの固体撮像素子をレンズ筐体内に設け、このレンズ
筐体内のレンズにより被写体の画像を固体撮像素子に結
像させ、この結像された被写体の画像を固体撮像素子で
電気信号として取り込むように構成されている。図12
はその電子カメラにおける固体撮像素子の取付構造の一
例を示した図である。この電子カメラでは、レンズ筐体
1の像面側(同図では右端側)に固定用の金属プレート
2がビス3により取り付けられ、レンズ筐体1の内側に
位置する金属プレート2の内面(同図では左側面)にお
ける光軸O上に撮像装置4が設けられ、この撮像装置4
が金属プレート2の裏面側の外面(同図では右側面)に
配置された配線基板5に電気的に接続されている。
2. Description of the Related Art For example, in an electronic camera, a CCD is used.
A solid-state imaging device such as is provided in a lens housing, an image of a subject is formed on the solid-state imaging device by a lens in the lens housing, and the formed image of the subject is captured as an electric signal by the solid-state imaging device. It is configured. FIG.
FIG. 2 is a diagram showing an example of a mounting structure of a solid-state imaging device in the electronic camera. In this electronic camera, a metal plate 2 for fixing is attached to the image surface side (the right end side in the figure) of the lens housing 1 with screws 3, and the inner surface of the metal plate 2 located inside the lens housing 1 (the same). The imaging device 4 is provided on the optical axis O on the left side in the figure).
Are electrically connected to a wiring board 5 disposed on the outer surface on the back surface side of the metal plate 2 (the right side surface in the figure).

【0003】撮像装置4は、チップ素子であるCCDな
どの固体撮像素子6と、この固体撮像素子6を収容する
樹脂ハウジング7と、この樹脂ハウジング7内に収容さ
れた固体撮像素子6を保護する保護ガラス8と、固体撮
像素子6の複数のバンプ電極(図示せず)がそれぞれボ
ンディングワイヤ9により接続される複数の電極端子1
0とを備えている。この撮像装置4は、樹脂ハウジング
7が金属プレート2の内面に接着剤(図示せず)により
取り付けられ、この状態で電極端子10の外部に延びた
先端部が金属プレート2に設けられた貫通孔2aおよび
配線基板5に設けられた貫通孔5aを通して配線基板5
の裏面側に突出し、この突出した部分が半田11により
配線基板5に取り付けられている。
The image pickup device 4 protects the solid state image pickup device 6 such as a CCD which is a chip element, a resin housing 7 for accommodating the solid state image pickup device 6, and the solid state image pickup device 6 accommodated in the resin housing 7. A plurality of electrode terminals 1 to which a protective glass 8 and a plurality of bump electrodes (not shown) of the solid-state imaging device 6 are connected by bonding wires 9 respectively.
0. In this imaging device 4, a resin housing 7 is attached to the inner surface of the metal plate 2 with an adhesive (not shown), and in this state, a tip extending to the outside of the electrode terminal 10 has a through hole formed in the metal plate 2. 2a and the wiring board 5 through the through hole 5a provided in the wiring board 5.
And the protruding portion is attached to the wiring board 5 by the solder 11.

【0004】この場合、固体撮像素子6は、受光した光
を電気信号に変換して出力するCCDなどの半導体素子
であり、その裏面が接着剤12により樹脂ハウジング7
の内面に接着されている。樹脂ハウジング7は、被写体
側(同図では左側)が開放された凹部形状に形成されて
おり、その開放側の周端部には保護ガラス8が取り付け
られている。複数の電極端子10はそれぞれ、一端部が
樹脂ハウジング7の内面に配置され、他端部が樹脂ハウ
ジング7の外部に延出され、この延出された先端が配線
基板5側に向けて折り曲げられ、この状態で樹脂ハウジ
ング7にインサート成形により設けられている。なお、
各電極端子10は、金属プレート2およびその貫通孔2
aに接触せずに、配線基板5に半田11により接合され
る。
In this case, the solid-state image pickup device 6 is a semiconductor device such as a CCD for converting received light into an electric signal and outputting the electric signal.
Is adhered to the inner surface. The resin housing 7 is formed in a concave shape in which the subject side (the left side in the figure) is open, and a protective glass 8 is attached to a peripheral end on the open side. One end of each of the plurality of electrode terminals 10 is arranged on the inner surface of the resin housing 7, the other end is extended outside the resin housing 7, and the extended tip is bent toward the wiring board 5 side. In this state, it is provided in the resin housing 7 by insert molding. In addition,
Each electrode terminal 10 includes a metal plate 2 and its through hole 2.
a, and is joined to the wiring board 5 by the solder 11 without contacting a.

【0005】[0005]

【発明が解決しようとする課題】ところで、このような
電子カメラにおいては、固体撮像素子6で鮮明な撮影画
像を得るために、固体撮像素子6の画素数の増大および
画素の高密度化が要望されており、これに伴って固体撮
像素子6の発熱温度も高くなる。このため、上記のよう
な固体撮像素子6の取付構造では、固体撮像素子6が熱
伝導率の低い樹脂ハウジング7内に収容されているの
で、固体撮像素子6が発熱しても、その熱を外部に放熱
しにくく、発熱により固体撮像素子6の温度が上昇し、
これにより撮像特性が劣化したり、あるいは発熱による
ノイズの影響を受けたりするという問題が生じる。
Incidentally, in such an electronic camera, in order to obtain a clear captured image with the solid-state imaging device 6, it is required to increase the number of pixels of the solid-state imaging device 6 and increase the density of the pixels. Accordingly, the heat generation temperature of the solid-state imaging device 6 also increases. For this reason, in the mounting structure of the solid-state imaging device 6 described above, the solid-state imaging device 6 is housed in the resin housing 7 having low thermal conductivity. It is difficult to radiate heat to the outside, and the temperature of the solid-state imaging device 6 rises due to heat generation,
As a result, there arises a problem that the imaging characteristics are degraded or noise is affected by heat generation.

【0006】なお、このような問題を解消するために、
図13に示すように、撮像装置4の固体撮像素子6の裏
面における中心部分に対応する箇所の金属プレート2に
長円形状の放熱孔13を設けた構造のものが考えられて
いる。しかし、このような構造では、固体撮像素子6の
中心部分が高熱になりやすく、この高熱部分に対応する
箇所の金属プレート2の面積が放熱孔13によって小さ
くなり、このため十分な放熱効果が得られず、固体撮像
素子6の温度上昇を十分に抑えることができないという
問題がある。
[0006] In order to solve such a problem,
As shown in FIG. 13, a structure in which an oval heat radiation hole 13 is provided in the metal plate 2 at a location corresponding to the center portion on the back surface of the solid-state imaging device 6 of the imaging device 4 has been considered. However, in such a structure, the central portion of the solid-state imaging device 6 tends to be heated to a high temperature, and the area of the metal plate 2 corresponding to the heated portion is reduced by the heat radiating holes 13, so that a sufficient heat radiating effect is obtained. Therefore, there is a problem that the temperature rise of the solid-state imaging device 6 cannot be sufficiently suppressed.

【0007】この発明の課題は、固体撮像素子などのチ
ップ素子に発生した熱を外部に逃がしてチップ素子の温
度上昇を抑えるようにすることである。
An object of the present invention is to release heat generated in a chip device such as a solid-state image pickup device to the outside to suppress a rise in the temperature of the chip device.

【0008】[0008]

【課題を解決するための手段】請求項1に記載の発明の
チップ素子の取付構造は、チップ素子と、このチップ素
子を収容する樹脂部材と、この樹脂部材内に露出し、こ
の露出した部分に前記チップ素子が取り付けられ、かつ
前記樹脂部材の外部に露出する熱伝導部材とを備えたこ
とを特徴とする。この発明によれば、チップ素子が発熱
すると、その熱が熱伝導部材により樹脂部材の外部に伝
導されるので、チップ素子に発生した熱を樹脂部材の外
部に確実に逃がすことができ、これによりチップ素子の
温度上昇を抑えることができる。
According to a first aspect of the present invention, there is provided a chip element mounting structure, comprising: a chip element; a resin member for accommodating the chip element; And a heat conducting member exposed to the outside of the resin member. According to the present invention, when the chip element generates heat, the heat is conducted to the outside of the resin member by the heat conducting member, so that the heat generated in the chip element can be reliably released to the outside of the resin member, The temperature rise of the chip element can be suppressed.

【0009】この場合、請求項2に記載のごとく、熱伝
導部材における樹脂部材の外部に露出した部分が接触し
た状態で樹脂部材が搭載される金属部を備えていれば、
チップ素子から熱伝導部材に伝導された熱が金属部に伝
導され、この伝導された熱を金属部で放熱させることが
でき、これによりチップ素子の熱を効率良く外部に逃が
すことができる。また、請求項3に記載のごとく、熱伝
導部材は、チップ素子の裏面に対向する樹脂部材の内面
において、チップ素子が接続される電極端子を除く領域
のほぼ全域に設けられ、その一部に樹脂部材の外部に延
出された足部が設けられていれば、熱伝導部材の熱容量
を大きくすることができ、これによりチップ素子の熱を
熱伝導部材で十分に取り込んで足部から効率良く外部に
逃がすことができる。さらに、請求項4に記載のごと
く、樹脂部材が一面に搭載される金属部と、この金属部
の他面に配置される配線基板とを備え、この配線基板に
熱伝導部材の足部が接触して取り付けられる放熱用の銅
箔が設けられていれば、チップ素子の熱を熱伝導部材の
足部を介して配線基板の銅箔に伝導することができ、こ
の伝導された熱を銅箔で放熱させることができ、このた
めチップ素子の熱を効率良く外部に逃がすことができ
る。
In this case, as described in claim 2, if the heat conductive member is provided with a metal portion on which the resin member is mounted in a state where the portion exposed to the outside of the resin member is in contact with the heat conductive member,
The heat conducted from the chip element to the heat conducting member is conducted to the metal part, and the conducted heat can be radiated by the metal part, whereby the heat of the chip element can be efficiently released to the outside. In addition, as described in claim 3, the heat conductive member is provided on substantially the entire area excluding the electrode terminal to which the chip element is connected on the inner surface of the resin member facing the back surface of the chip element, and is provided on a part thereof. If the foot extended to the outside of the resin member is provided, the heat capacity of the heat conductive member can be increased, and thereby the heat of the chip element can be sufficiently taken in by the heat conductive member and the heat can be efficiently transmitted from the foot. Can escape to the outside. Further, as set forth in claim 4, a metal part on which the resin member is mounted on one surface and a wiring board disposed on the other surface of the metal part are provided, and the foot of the heat conductive member contacts the wiring board. If the heat-dissipating copper foil is provided, the heat of the chip element can be conducted to the copper foil of the wiring board through the foot of the heat-conducting member. And the heat of the chip element can be efficiently released to the outside.

【0010】また、請求項5に記載の発明のチップ素子
の取付構造は、チップ素子と、このチップ素子を収容す
る樹脂部材と、前記チップ素子が収容された前記樹脂部
材が搭載される金属部とを備え、前記金属部には、前記
チップ素子の裏面における中心部分に対応する箇所から
その外周側に向けて放射状に延びる放熱孔が設けられて
いることを特徴とする。この発明によれば、放熱孔がチ
ップ素子の中心部分からその外周側に向けて延びる放射
状に形成されているので、チップ素子の裏面において、
高熱になりやすい中心部分に対応する箇所の放熱孔の面
積を小さくすることができ、これによりチップ素子の高
熱部分に対応する箇所の金属部の面積を広くすることが
でき、かつ放熱孔が外周側に向けて放射状に形成されて
いることにより、チップ素子に発生した熱を効率良く金
属部で放熱させることができ、これによりチップ素子の
温度上昇を抑えることができる。
According to a fifth aspect of the present invention, there is provided a chip element mounting structure, comprising: a chip element; a resin member accommodating the chip element; and a metal part on which the resin member accommodating the chip element is mounted. Wherein the metal portion is provided with a heat radiating hole radially extending from a portion corresponding to a central portion on the back surface of the chip element toward an outer peripheral side thereof. According to the present invention, since the heat radiation holes are formed radially extending from the central portion of the chip element toward the outer periphery thereof,
The area of the heat radiating hole corresponding to the central portion where the heat tends to be high can be reduced, whereby the area of the metal portion of the portion corresponding to the high heat portion of the chip element can be increased, and the heat radiating hole has an outer periphery. By being formed radially toward the side, the heat generated in the chip element can be efficiently radiated by the metal portion, and thereby the temperature rise of the chip element can be suppressed.

【0011】[0011]

【発明の実施の形態】[第1実施形態]以下、図1を参
照して、この発明のチップ素子の取付構造を電子カメラ
の固体撮像素子に適用した第1実施形態について説明す
る。なお、図12に示された従来例と同一部分には同一
符号を付して説明する。この取付構造は、撮像装置20
の樹脂ハウジング7に熱伝導部材21を設けた構造で、
これ以外は従来例と同じ構造になっている。すなわち、
熱伝導部材21は、銅、真鍮、アルミニウムなどの熱伝
導率の高い金属からなり、固体撮像素子6の裏面側に位
置する箇所の樹脂ハウジング7中にインサート成形によ
り埋め込まれている。この熱伝導部材21は、その内面
(図1では左側面)が樹脂ハウジング7内に露出し、こ
の露出した内面に固体撮像素子6が接着剤12により取
り付けられ、外面(同図では右側面)が樹脂ハウジング
7の裏面側の外部に露出し、この露出した外面が金属部
である金属プレート2に接触している。なお、金属プレ
ート2は、アルミニウムなどの熱伝導率の高い金属から
なっている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS First Embodiment A first embodiment in which a chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera will be described below with reference to FIG. The same parts as those in the conventional example shown in FIG. This attachment structure is
With a heat conductive member 21 provided in the resin housing 7 of
Otherwise, the structure is the same as that of the conventional example. That is,
The heat conductive member 21 is made of a metal having high heat conductivity such as copper, brass, and aluminum, and is embedded by insert molding in the resin housing 7 located on the back surface side of the solid-state imaging device 6. The inner surface (left side in FIG. 1) of the heat conductive member 21 is exposed in the resin housing 7, the solid-state imaging device 6 is attached to the exposed inner surface by the adhesive 12, and the outer surface (right side in FIG. 1). Is exposed to the outside on the back surface side of the resin housing 7, and the exposed outer surface is in contact with the metal plate 2 which is a metal portion. The metal plate 2 is made of a metal having a high thermal conductivity such as aluminum.

【0012】このような固体撮像素子6の取付構造で
は、固体撮像素子6が発熱すると、その熱が固体撮像素
子6の裏面側に位置する熱伝導部材21により樹脂ハウ
ジング7の裏面に伝導されるので、固体撮像素子6の熱
を樹脂ハウジング7の外部に確実に逃がすことができ
る。しかも、熱伝導部材21の裏面がレンズ筐体1に取
り付けられた熱伝導率の高い金属プレート2に接触して
いるので、熱伝導部材21の熱が金属プレート2に伝導
され、この伝導された熱を金属プレート2で放熱させる
ことができる。このため、固体撮像素子6に発生した熱
を効率良く外部に逃がすことができ、固体撮像素子6の
温度上昇を確実に抑えることができる。
In such a mounting structure of the solid-state imaging device 6, when the solid-state imaging device 6 generates heat, the heat is transmitted to the back surface of the resin housing 7 by the heat conducting member 21 located on the back surface side of the solid-state imaging device 6. Therefore, the heat of the solid-state imaging device 6 can be reliably released to the outside of the resin housing 7. In addition, since the back surface of the heat conductive member 21 is in contact with the metal plate 2 having a high thermal conductivity attached to the lens housing 1, the heat of the heat conductive member 21 is transmitted to the metal plate 2, and the heat is transmitted. The heat can be radiated by the metal plate 2. Therefore, the heat generated in the solid-state imaging device 6 can be efficiently released to the outside, and the temperature rise of the solid-state imaging device 6 can be reliably suppressed.

【0013】[第2実施形態]次に、図2〜図5を参照
して、この発明のチップ素子の取付構造を電子カメラの
固体撮像素子に適用した第2実施形態について説明す
る。この場合にも、図12に示された従来例と同一部分
には同一符号を付して説明する。この取付構造は、撮像
装置25の樹脂ハウジング7に熱伝導部材26を設け、
かつ配線基板5に放熱用の銅箔27を設けた構造で、こ
れ以外は従来例と同じ構造になっている。すなわち、熱
伝導部材26は、銅、真鍮、アルミニウムなどの熱伝導
率の高い金属板からなり、図2〜図4に示すように、固
体撮像素子6の裏面側に位置する樹脂ハウジング7の内
面において、固体撮像素子6がボンディングワイヤ9で
接続される複数の電極端子10を除く領域のほぼ全域に
設けられ、その内面に固体撮像素子6が接着剤12によ
り取り付けられている。また、この熱伝導部材26は、
樹脂ハウジング7の四隅に位置する部分が樹脂ハウジン
グ7の外部に延出され、この延出された足部28が配線
基板5側に向けて折り曲げられ、この状態でインサート
成形により樹脂ハウジング7に一体に設けられている。
[Second Embodiment] Next, a second embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera will be described with reference to FIGS. Also in this case, the same parts as those of the conventional example shown in FIG. In this mounting structure, a heat conductive member 26 is provided in the resin housing 7 of the imaging device 25,
The structure is the same as that of the conventional example except that the heat dissipation copper foil 27 is provided on the wiring board 5. That is, the heat conductive member 26 is made of a metal plate having a high heat conductivity such as copper, brass, or aluminum, and as shown in FIGS. 2 to 4, the inner surface of the resin housing 7 located on the back surface side of the solid-state imaging device 6. 1, the solid-state imaging device 6 is provided in almost the entire region except for the plurality of electrode terminals 10 connected by the bonding wires 9, and the solid-state imaging device 6 is attached to the inner surface thereof with an adhesive 12. Also, this heat conductive member 26
The portions located at the four corners of the resin housing 7 are extended to the outside of the resin housing 7, and the extended feet 28 are bent toward the wiring board 5, and in this state, integrated with the resin housing 7 by insert molding. It is provided in.

【0014】配線基板5は、図2に示すように、レンズ
筐体1にビス3により取り付けられた金属プレート2の
裏面側の外面(同図では右側面)に配置されている。こ
の配線基板5には、金属プレート2の内面に配置された
撮像装置25の各電極端子10および熱伝導部材26の
各足部28が金属プレート2の貫通孔2a、2bおよび
配線基板5の貫通孔5a、5bを通して配線基板5の裏
面側(同図では右面側)に突出し、この突出した部分が
半田11により取り付けられている。この場合、配線基
板5の裏面には、図5に示すように、複数の電極端子1
0がそれぞれ接続される複数の配線29が形成されてい
るとともに、これら配線29を除く領域のほぼ全域に熱
伝導部材26の各足部28が接続される放熱用の銅箔2
7が形成されている。
As shown in FIG. 2, the wiring board 5 is disposed on the outer surface on the back side (the right side in FIG. 2) of the metal plate 2 attached to the lens housing 1 with screws 3. In the wiring board 5, each electrode terminal 10 of the imaging device 25 and each foot 28 of the heat conductive member 26 disposed on the inner surface of the metal plate 2 are provided with through holes 2 a and 2 b of the metal plate 2 and through the wiring board 5. The wiring board 5 protrudes through the holes 5a and 5b toward the back side (the right side in the figure) of the wiring board 5, and the protruding portion is attached by the solder 11. In this case, as shown in FIG.
The heat-dissipating copper foil 2 to which each of the feet 28 of the heat conducting member 26 is connected over substantially the entire area excluding these wirings 29 is formed.
7 are formed.

【0015】このような固体撮像素子6の取付構造で
は、固体撮像素子6が発熱すると、その熱が固体撮像素
子6の裏面に位置する熱伝導部材26に伝導され、この
熱伝導部材26の足部28から樹脂ハウジング7の外部
に伝導されるので、固体撮像素子6の熱を樹脂ハウジン
グ7の外部に逃がすことができる。この場合、特に、熱
伝導部材26は、固体撮像素子6の裏面に位置する樹脂
ハウジング7の内面において、固体撮像素子6が接続さ
れる複数の電極端子10を除く領域のほぼ全域に設けら
れているので、熱伝導部材26の熱容量を大きくするこ
とができ、これにより固体撮像素子6の熱を十分に取り
込むことができ、この取り込んだ熱を足部28から樹脂
ハウジング7の外部に確実に逃がすことができる。しか
も、熱伝導部材26の足部28が金属プレート2の外面
に配置された配線基板5の放熱用の銅箔27に半田11
により接合されていることにより、熱伝導部材26の熱
が足部28を介して配線基板5の銅箔27に伝導され、
この伝導された熱を銅箔27で外部に放熱させることが
できる。これにより、固体撮像素子6に発生した熱を効
率良く外部に逃がすことができ、固体撮像素子6の温度
上昇を確実に抑えることができる。
In such a mounting structure of the solid-state imaging device 6, when the solid-state imaging device 6 generates heat, the heat is transmitted to the heat conduction member 26 located on the back surface of the solid-state imaging device 6, and the foot of the heat conduction member 26 Since the heat is transmitted from the portion 28 to the outside of the resin housing 7, the heat of the solid-state imaging device 6 can be released to the outside of the resin housing 7. In this case, in particular, the heat conductive member 26 is provided on substantially the entire region except for the plurality of electrode terminals 10 to which the solid-state imaging device 6 is connected, on the inner surface of the resin housing 7 located on the back surface of the solid-state imaging device 6. As a result, the heat capacity of the heat conducting member 26 can be increased, whereby the heat of the solid-state imaging device 6 can be sufficiently taken in, and the taken-in heat can be reliably released from the foot 28 to the outside of the resin housing 7. be able to. Moreover, the foot 28 of the heat conductive member 26 is soldered to the copper foil 27 for heat dissipation of the wiring board 5 disposed on the outer surface of the metal plate 2.
The heat of the heat conductive member 26 is conducted to the copper foil 27 of the wiring board 5 through the foot 28 by
This conducted heat can be radiated to the outside by the copper foil 27. Thereby, the heat generated in the solid-state imaging device 6 can be efficiently released to the outside, and the temperature rise of the solid-state imaging device 6 can be reliably suppressed.

【0016】[第3実施形態]次に、図6および図7を
参照して、この発明のチップ素子の取付構造を電子カメ
ラの固体撮像素子に適用した第3実施形態について説明
する。この場合にも、図12に示された従来例と同一部
分には同一符号を付して説明する。この取付構造は、撮
像装置30の樹脂ハウジング7に熱伝導部材31を設
け、かつ配線基板5に放熱用の銅箔32を設けた構造
で、これ以外は従来例とほぼ同じ構造になっている。こ
の場合、撮像装置30は、図7に示すように、固体撮像
素子6の裏面側に位置する樹脂ハウジング7の内面にお
ける上辺側と下辺側とにそれぞれ、固体撮像素子6が接
続される各電極端子10が複数個ずつ配列されている。
[Third Embodiment] Next, a third embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera will be described with reference to FIGS. Also in this case, the same parts as those of the conventional example shown in FIG. This mounting structure has a structure in which a heat conductive member 31 is provided on the resin housing 7 of the imaging device 30 and a copper foil 32 for heat dissipation is provided on the wiring board 5, and is otherwise substantially the same as the conventional example. . In this case, as shown in FIG. 7, the imaging device 30 includes, on the inner surface of the resin housing 7 located on the back surface side of the solid-state imaging device 6, the respective electrodes to which the solid-state imaging device 6 is connected on the upper side and lower side, respectively. A plurality of terminals 10 are arranged.

【0017】熱伝導部材31は、銅、真鍮、アルミニウ
ムなどの熱伝導率の高い金属板からなり、図6および図
7に示すように、固体撮像素子6の裏面側に位置する樹
脂ハウジング7の内面において、その上辺側と下辺側と
にそれぞれ配列された電極端子10の間に位置する領域
に設けられ、その内面に固体撮像素子6が接着剤12に
より取り付けられている。また、この熱伝導部材31
は、樹脂ハウジング7の図7における左右両側に位置す
る部分がそのまま樹脂ハウジング7の外部に延出され、
この延出された足部33が配線基板5側に向けて折り曲
げられた上、更にその各先端が配線基板5と平行に折り
曲げられ、この状態でインサート成形により樹脂ハウジ
ング7に一体に設けられている。この場合、各足部33
は、図7において樹脂ハウジング7の内面における上辺
側と下辺側とに配列された電極端子10の間に位置する
領域の幅Wとほぼ同じ幅で形成されている。
The heat conductive member 31 is made of a metal plate having a high heat conductivity such as copper, brass, aluminum or the like. As shown in FIGS. On the inner surface, it is provided in a region located between the electrode terminals 10 arranged on the upper side and the lower side, respectively, and the solid-state imaging element 6 is attached to the inner surface with an adhesive 12. Also, the heat conduction member 31
The portions of the resin housing 7 located on the left and right sides in FIG. 7 are directly extended to the outside of the resin housing 7,
The extended foot portion 33 is bent toward the wiring board 5 side, and each end thereof is further bent in parallel with the wiring board 5, and in this state, provided integrally with the resin housing 7 by insert molding. I have. In this case, each foot 33
7 is formed to have a width substantially equal to the width W of a region located between the electrode terminals 10 arranged on the upper side and the lower side on the inner surface of the resin housing 7 in FIG.

【0018】また、配線基板5は、金属プレート2の裏
面側の外面に配置されており、その内側面つまり金属プ
レート2に対向する内側面(図6では左側面)には、電
極端子10が挿入する貫通孔5aを除くほぼ全域に放熱
用の銅箔32が形成されている。この放熱用の銅箔32
は金属プレート2の裏面側の外面に密接している。ま
た、この銅箔32には、熱伝導部材31の足部33が金
属プレート2に形成された挿入孔34に挿入されて半田
11により接合されている。この場合、足部33は、金
属プレート2およびその挿入孔34に接触していなくて
も良く、また接触していても良い。また、アルミニウム
などの熱伝導率の高い金属で形成されている。
The wiring board 5 is disposed on the outer surface on the back side of the metal plate 2, and an electrode terminal 10 is provided on the inner surface thereof, that is, the inner surface facing the metal plate 2 (the left side surface in FIG. 6). A copper foil 32 for heat radiation is formed in almost the entire area except for the through hole 5a to be inserted. This heat dissipation copper foil 32
Is in close contact with the outer surface on the back side of the metal plate 2. The foot 33 of the heat conducting member 31 is inserted into the insertion hole 34 formed in the metal plate 2 and joined to the copper foil 32 by the solder 11. In this case, the foot 33 may not be in contact with the metal plate 2 and the insertion hole 34 thereof, and may be in contact with the metal plate 2 and the insertion hole 34 thereof. Further, it is formed of a metal having high thermal conductivity such as aluminum.

【0019】このような固体撮像素子6の取付構造で
は、固体撮像素子6が発熱すると、その熱が固体撮像素
子6の裏面に位置する熱伝導部材31に伝導され、この
熱伝導部材31の足部33から樹脂ハウジング7の外部
に伝導されるので、固体撮像素子6の熱を樹脂ハウジン
グ7の外部に逃がすことができる。この場合、熱伝導部
材31は、樹脂ハウジング7の内面における上辺側と下
辺側とにそれぞれ配列された電極端子10の間に位置す
る領域に設けられ、かつ樹脂ハウジング7の図7におけ
る左右両側に位置する部分がそのまま樹脂ハウジング7
の外部に延出されているので、熱伝導部材31の熱容量
を大きくすることができるとともに、足部33を広い面
積で形成することができ、これにより固体撮像素子6の
熱を熱伝導部材31で十分に取り込むことができるとと
もに、取り込んだ熱を足部33から樹脂ハウジング7の
外部に十分に逃がすことができる。
In such a mounting structure of the solid-state imaging device 6, when the solid-state imaging device 6 generates heat, the heat is transmitted to the heat conduction member 31 located on the back surface of the solid-state imaging device 6, and the foot of the heat conduction member 31 Since the heat is transmitted from the portion 33 to the outside of the resin housing 7, the heat of the solid-state imaging device 6 can be released to the outside of the resin housing 7. In this case, the heat conductive members 31 are provided in regions located between the electrode terminals 10 arranged on the upper side and the lower side, respectively, on the inner surface of the resin housing 7, and on both left and right sides of the resin housing 7 in FIG. 7. Resin housing 7 is located as it is
, The heat capacity of the heat conducting member 31 can be increased, and the foot 33 can be formed with a large area, so that the heat of the solid-state imaging device 6 can be transferred to the heat conducting member 31. And the heat taken in can be sufficiently released from the foot portion 33 to the outside of the resin housing 7.

【0020】また、この取付構造では、熱伝導部材31
の足部33が金属プレート2の外面に配置された配線基
板5の放熱用の銅箔32に半田11により接合されてい
ることにより、熱伝導部材31の熱を配線基板5の銅箔
32に伝導することができる。この場合、熱伝導部材3
1は、樹脂ハウジング7の外部に延出された足部33
が、電極端子10の間に位置する領域の幅Wと同じ幅
で、かつ配線基板5側に向けて折り曲げられた上、その
各先端が更に配線基板5と平行に折り曲げられているの
で、半田11の取付面積を大きくすることができ、これ
により熱伝導部材31の熱を足部33から配線基板5の
銅箔32に十分に伝導することができ、これによっても
放熱効果を高めることができる。しかも、配線基板5の
銅箔32が金属プレート2の外面に密接しているので、
銅箔32に伝導された熱を金属プレート2にも伝導する
ことができ、この伝導された熱を金属プレート2で放熱
させることができる。
In this mounting structure, the heat conducting member 31
Are bonded to the copper foil 32 for heat dissipation of the wiring board 5 disposed on the outer surface of the metal plate 2 by the solder 11, so that the heat of the heat conductive member 31 is transferred to the copper foil 32 of the wiring board 5. Can conduct. In this case, the heat conducting member 3
1 is a foot portion 33 extended to the outside of the resin housing 7.
Has the same width W as the width of the region located between the electrode terminals 10 and is bent toward the wiring board 5, and each end thereof is further bent in parallel with the wiring board 5. 11 can be enlarged, whereby the heat of the heat conducting member 31 can be sufficiently conducted from the foot portion 33 to the copper foil 32 of the wiring board 5, whereby the heat radiation effect can be enhanced. . Moreover, since the copper foil 32 of the wiring board 5 is in close contact with the outer surface of the metal plate 2,
The heat conducted to the copper foil 32 can also be conducted to the metal plate 2, and the conducted heat can be radiated by the metal plate 2.

【0021】このように、この取付構造では、熱伝導部
材31、その足部33、配線基板5の銅箔32、および
金属プレート2により、固体撮像素子6に発生した熱を
効率良く外部に逃がすことができ、これにより固体撮像
素子6の温度上昇を確実に抑えることができる。また、
このような取付構造では、放熱用の銅箔32を配線基板
5の内側面、つまり図5に示された配線29が形成され
ていない内側面に形成しているので、第2実施形態のも
のよりも銅箔32を広い面積で形成でき、これによって
も放熱効果を高めることができ、また配線29が放熱用
の銅箔32と異なる外側面に形成されるから、配線29
が放熱用の銅箔32の制約を受けないため、配線29の
引き回しが容易にできる。
As described above, in this mounting structure, the heat generated in the solid-state imaging device 6 is efficiently radiated to the outside by the heat conductive member 31, its feet 33, the copper foil 32 of the wiring board 5, and the metal plate 2. Accordingly, the temperature rise of the solid-state imaging device 6 can be reliably suppressed. Also,
In such an attachment structure, the heat-dissipating copper foil 32 is formed on the inner surface of the wiring board 5, that is, the inner surface on which the wiring 29 shown in FIG. 5 is not formed. Since the copper foil 32 can be formed in a wider area than that, the heat radiation effect can also be enhanced, and the wiring 29 is formed on an outer surface different from the heat radiation copper foil 32.
Is not restricted by the copper foil 32 for heat dissipation, so that the wiring 29 can be easily routed.

【0022】[第4実施形態]次に、図8を参照して、
この発明のチップ素子の取付構造を電子カメラの固体撮
像素子に適用した第4実施形態について説明する。この
場合にも、図12に示された従来例と同一部分には同一
符号を付して説明する。この取付構造は、撮像装置35
の樹脂ハウジング7に熱伝導部材36を設けた構造で、
これ以外は従来例とほぼ同じ構造になっている。すなわ
ち、この熱伝導部材36は、銅、真鍮、アルミニウムな
どの熱伝導率の高い金属板からなり、図8に示すよう
に、固体撮像素子6の裏面側に位置する樹脂ハウジング
7の内面において、固体撮像素子6が接続される複数の
電極端子10を除く領域の全域に設けられ、その内面に
固体撮像素子6が取り付けられている。また、この熱伝
導部材36は、電極端子10が設けられた箇所を除く樹
脂ハウジング7の外周から外部に延出され、この延出さ
れた足部37が金属プレート2の外形とほぼ同じ寸法に
形成され、この状態でインサート成形により樹脂ハウジ
ング7に一体に設けられている。なお、樹脂ハウジング
7から外部に延出された足部37の所定箇所には、ビス
3の取付孔38が設けられている。
[Fourth Embodiment] Next, referring to FIG.
A fourth embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera will be described. Also in this case, the same parts as those of the conventional example shown in FIG. This mounting structure is used for the imaging device 35.
With a heat conductive member 36 provided in the resin housing 7 of
Other than this, the structure is almost the same as the conventional example. That is, the heat conductive member 36 is made of a metal plate having a high thermal conductivity such as copper, brass, and aluminum, and as shown in FIG. The solid-state imaging device 6 is provided in the entire region except for the plurality of electrode terminals 10 to which the solid-state imaging device 6 is connected, and the solid-state imaging device 6 is attached to the inner surface thereof. The heat conducting member 36 extends outside from the outer periphery of the resin housing 7 except for the portion where the electrode terminals 10 are provided, and the extended foot portion 37 has approximately the same size as the outer shape of the metal plate 2. In this state, it is provided integrally with the resin housing 7 by insert molding. In addition, a mounting hole 38 for the screw 3 is provided at a predetermined position of the foot portion 37 extending outside from the resin housing 7.

【0023】このような固体撮像素子6の取付構造で
は、熱伝導部材36が樹脂ハウジング7の内面における
複数の電極端子10を除く領域のほぼ全域に設けられ、
かつ樹脂ハウジング7から外部に延出された足部37が
金属プレート2の外形とほぼ同じ大きさに形成されてい
るので、第2、第3実施形態のものよりも、熱伝導部材
36の熱容量を大きくすることができ、これにより固体
撮像素子6に発生した熱を十分に取り込むことができる
とともに、この取り込んだ熱を足部37により樹脂ハウ
ジング7の外部に確実に放熱させることができる。この
ため、固体撮像素子6に発生した熱を樹脂ハウジング7
の外部に効率良く逃がすことができ、これにより固体撮
像素子6の温度上昇を確実に抑えることができる。この
場合、熱伝導部材36の足部37が金属プレート2の外
形とほぼ同じ寸法に形成されているので、金属プレート
2を用いずに、熱伝導部材36の足部37をレンズ筐体
1に取り付けることができ、このため金属プレート2が
不要となり、部品点数およびコストの削減を図ることが
できるほか、取付構造全体の厚みをも薄くすることがで
き、取付構造全体のコンパクト化が図れる。
In such a mounting structure of the solid-state imaging device 6, the heat conductive member 36 is provided on almost the entire area except for the plurality of electrode terminals 10 on the inner surface of the resin housing 7,
In addition, since the foot portion 37 extending from the resin housing 7 to the outside is formed to have substantially the same size as the outer shape of the metal plate 2, the heat capacity of the heat conducting member 36 is larger than that of the second and third embodiments. Therefore, the heat generated in the solid-state imaging device 6 can be sufficiently taken in, and the taken-in heat can be reliably radiated to the outside of the resin housing 7 by the feet 37. Therefore, the heat generated in the solid-state imaging device 6 is transferred to the resin housing 7.
Of the solid-state imaging device 6 can be reliably suppressed. In this case, since the feet 37 of the heat conducting member 36 are formed to have substantially the same dimensions as the outer shape of the metal plate 2, the feet 37 of the heat conducting member 36 are attached to the lens housing 1 without using the metal plate 2. Since the metal plate 2 can be attached, the metal plate 2 becomes unnecessary, the number of parts and cost can be reduced, and the thickness of the entire mounting structure can be reduced, so that the entire mounting structure can be made compact.

【0024】[第5実施形態]次に、図9および図10
を参照して、この発明のチップ素子の取付構造を電子カ
メラの固体撮像素子に適用した第5実施形態について説
明する。この場合にも、図12および図13に示された
従来例と同一部分には同一符号を付して説明する。この
取付構造は、金属プレート2に放射状の放熱孔40を設
けた構造で、これ以外は従来例とほぼ同じ構造になって
いる。すなわち、金属プレート2には、固体撮像素子6
の裏面における中心部分に対応する箇所から外周側に向
けて放射状に延びる放熱孔40が十字状に設けられてい
る。
[Fifth Embodiment] Next, FIGS.
A fifth embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera will be described with reference to FIG. Also in this case, the same parts as those of the conventional example shown in FIGS. This mounting structure has a structure in which a radial heat radiating hole 40 is provided in the metal plate 2, and is otherwise substantially the same as the conventional example. That is, the metal plate 2 includes the solid-state image sensor 6
A radiating hole 40 extending radially from a position corresponding to the center portion on the back surface toward the outer peripheral side is provided in a cross shape.

【0025】このような固体撮像素子6の取付構造で
は、放熱孔40が固体撮像素子6の中心部分から外周側
に向けて延びる放射状に形成されているので、固体撮像
素子6の裏面において、高熱になりやすい中心部分に対
応する箇所の放熱孔40の面積を小さくすることがで
き、これにより固定撮像素子6の裏面における中心部分
に対応する箇所の金属プレート2の面積を広くすること
ができ、しかも放熱孔40が外周側に向けて放射状に延
びる十字状に形成されていることにより、固体撮像素子
6に発生した熱を効率良く金属プレート2により放熱さ
せることができ、これにより固体撮像素子6の温度上昇
を抑えることができる。また、撮像装置4の樹脂ハウジ
ング7を金属プレート2に接着剤(図示せず)により接
着する際、金属プレート2に形成された放射状の放熱孔
40に沿って接着剤が放射状に広がるので、接着強度を
も高めることができる。
In such a mounting structure of the solid-state imaging device 6, since the heat radiation holes 40 are formed in a radial shape extending from the central portion of the solid-state imaging device 6 to the outer peripheral side, the back surface of the solid-state imaging device 6 has high heat radiation. It is possible to reduce the area of the heat radiation hole 40 at a position corresponding to the central portion that is likely to cause the problem, whereby it is possible to increase the area of the metal plate 2 at a position corresponding to the central portion on the back surface of the fixed imaging element 6, In addition, since the heat radiating holes 40 are formed in a cross shape extending radially toward the outer peripheral side, the heat generated in the solid-state imaging device 6 can be efficiently radiated by the metal plate 2. Temperature rise can be suppressed. When the resin housing 7 of the imaging device 4 is bonded to the metal plate 2 with an adhesive (not shown), the adhesive radially spreads along the radial heat radiation holes 40 formed in the metal plate 2. Strength can also be increased.

【0026】なお、上記第5実施形態では、金属プレー
ト2に放熱孔40を十字状に形成したが、これに限ら
ず、例えば図11に示すようなX字状に形成しても良
く、また*字形状に形成しても良く、要は放射形状であ
れば、何のような形状であっても良い。また、上記第5
実施形態では、従来の構造の撮像装置4を用いた場合に
ついて述べたが、これに限らず、第1〜第4実施形態の
各撮像装置20、25、30、35を用いても良い。こ
のようにすれば、より一層、効率良く熱を逃がすことが
できる。なお、上記第1〜第5実施形態では、電子カメ
ラの固体撮像素子6の取付構造について述べたが、これ
に限らず、他の電子機器に用いられる半導体素子などの
チップ素子の取付構造にも適用することができる。
In the fifth embodiment, the heat radiating holes 40 are formed in the metal plate 2 in a cross shape. However, the present invention is not limited to this. For example, the heat radiating holes 40 may be formed in an X shape as shown in FIG. It may be formed in a * shape, that is, any shape as long as it is a radial shape. In addition, the fifth
In the embodiment, the case where the imaging device 4 having the conventional structure is used has been described. However, the invention is not limited thereto, and the imaging devices 20, 25, 30, and 35 according to the first to fourth embodiments may be used. With this configuration, heat can be more efficiently released. In the first to fifth embodiments, the mounting structure of the solid-state imaging element 6 of the electronic camera has been described. However, the present invention is not limited to this, and may be applied to the mounting structure of a chip element such as a semiconductor element used in other electronic devices. Can be applied.

【0027】[0027]

【発明の効果】以上説明したように、請求項1に記載の
発明のチップ素子の取付構造によれば、チップ素子と、
このチップ素子を収容する樹脂部材と、この樹脂部材内
に露出し、この露出した部分にチップ素子が取り付けら
れ、かつ樹脂部材の外部に露出する熱伝導部材とを備え
ているので、チップ素子が発熱すると、その熱を熱伝導
部材により樹脂部材の外部に伝導することができ、この
ためチップ素子に発生した発熱を外部に確実に逃がすこ
とができ、これによりチップ素子の温度上昇を抑えるこ
とができる。
As described above, according to the mounting structure of the chip element according to the first aspect of the present invention, the chip element has:
Since the chip element is provided with a resin member accommodating the chip element and a heat conductive member exposed in the resin member, the chip element is attached to the exposed portion, and exposed to the outside of the resin member, When heat is generated, the heat can be conducted to the outside of the resin member by the heat conducting member, so that the heat generated in the chip element can be reliably released to the outside, thereby suppressing a rise in the temperature of the chip element. it can.

【0028】この場合、熱伝導部材における樹脂部材の
外部に露出した部分が接触した状態で樹脂部材が搭載さ
れる金属部を備えていれば、チップ素子から熱伝導部材
に伝導された熱が金属部に伝導され、この伝導された熱
を金属部で放熱させることができ、これによりチップ素
子の熱を効率良く外部に逃がすことができる。また、熱
伝導部材が、チップ素子の裏面に対向する樹脂部材の内
面において、チップ素子が接続される電極端子を除く領
域のほぼ全域に設けられ、その一部に樹脂部材の外部に
延出された足部が設けられていれば、熱伝導部材の熱容
量を大きくすることができ、これによりチップ素子の熱
を熱伝導部材で十分に取り込んで足部から効率良く外部
に逃がすことができる。さらに、樹脂部材が一面に搭載
される金属部と、この金属部の他面に配置される配線基
板とを備え、この配線基板に熱伝導部材の足部が接触し
て取り付けられる放熱用の銅箔が設けられていれば、チ
ップ素子の熱を熱伝導部材の足部を介して配線基板の銅
箔に伝導することができ、この伝導された熱を銅箔で放
熱させることができ、このためチップ素子の熱を効率良
く外部に逃がすことができる。
In this case, if a metal portion on which the resin member is mounted in a state where the portion of the heat conductive member exposed to the outside of the resin member is in contact is provided, the heat conducted from the chip element to the heat conductive member is transferred to the metal. The heat can be radiated by the metal part, and the heat of the chip element can be efficiently released to the outside. In addition, the heat conductive member is provided on substantially the entire area except for the electrode terminals to which the chip element is connected on the inner surface of the resin member facing the back surface of the chip element, and partially extends outside the resin member. If the foot portion is provided, the heat capacity of the heat conducting member can be increased, whereby the heat of the chip element can be sufficiently taken in by the heat conducting member and can be efficiently released from the foot portion to the outside. Further, there is provided a metal part on which the resin member is mounted on one surface, and a wiring board disposed on the other surface of the metal part, and a heat-dissipating copper to which the foot part of the heat conductive member is attached by contact with the wiring board. If the foil is provided, the heat of the chip element can be conducted to the copper foil of the wiring board through the foot of the heat conducting member, and the conducted heat can be radiated by the copper foil. Therefore, the heat of the chip element can be efficiently released to the outside.

【0029】また、請求項5に記載の発明のチップ素子
の取付構造によれば、チップ素子と、このチップ素子を
収容する樹脂部材と、この樹脂部材が搭載される金属部
とを備え、金属部に、チップ素子の裏面における中心部
分に対応する箇所からその外周側に向けて放射状に延び
る放熱孔を設けたので、チップ素子の裏面において高熱
になりやすい中心部分に対応する箇所の放熱孔の面積を
小さくすることができ、これによりチップ素子の裏面に
おける中心部分に対応する箇所の金属部の面積を広くす
ることができ、かつ放熱孔が外周側に向けて放射状に形
成されていることにより、チップ素子の熱を効率良く金
属部で放熱させることができ、これによりチップ素子の
温度上昇を抑えることができる。
According to a fifth aspect of the present invention, there is provided a chip element mounting structure comprising: a chip element; a resin member accommodating the chip element; and a metal portion on which the resin member is mounted. Since the heat radiation holes extending radially from the portion corresponding to the central portion on the back surface of the chip element toward the outer peripheral side thereof are provided in the portion, the heat radiation holes at the portion corresponding to the central portion where high heat is likely to be generated on the back surface of the chip element are provided. The area can be reduced, the area of the metal part corresponding to the central part on the back surface of the chip element can be increased, and the radiation holes are formed radially toward the outer periphery. In addition, the heat of the chip element can be efficiently dissipated by the metal portion, thereby suppressing the temperature rise of the chip element.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明のチップ素子の取付構造を電子カメラ
の固体撮像素子に適用した第1実施形態を示した要部拡
大断面図。
FIG. 1 is an enlarged sectional view of a main part showing a first embodiment in which a chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera.

【図2】この発明のチップ素子の取付構造を電子カメラ
の固体撮像素子に適用した第2実施形態を示した要部拡
大断面図。
FIG. 2 is an enlarged sectional view of a main part showing a second embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera.

【図3】図2の撮像装置を示した断面図。FIG. 3 is a cross-sectional view illustrating the imaging device of FIG. 2;

【図4】図3のA−A矢視における横断面図。FIG. 4 is a transverse sectional view taken along the line AA of FIG. 3;

【図5】図2の配線基板の裏面側を示した拡大図。FIG. 5 is an enlarged view showing the back surface side of the wiring board of FIG. 2;

【図6】この発明のチップ素子の取付構造を電子カメラ
の固体撮像素子に適用した第3実施形態を示した要部拡
大断面図。
FIG. 6 is an enlarged sectional view of a main part showing a third embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera.

【図7】図6のB−B矢視における撮像装置の横断面
図。
FIG. 7 is a cross-sectional view of the imaging device as viewed in the direction of arrows BB in FIG. 6;

【図8】この発明のチップ素子の取付構造を電子カメラ
の固体撮像素子に適用した第4実施形態における撮像装
置を示した横断面図。
FIG. 8 is a cross-sectional view showing an imaging device according to a fourth embodiment in which the chip element mounting structure of the present invention is applied to a solid-state imaging device of an electronic camera.

【図9】この発明のチップ素子の取付構造を電子カメラ
の固体撮像素子に適用した第5実施形態を示した要部拡
大断面図。
FIG. 9 is an enlarged sectional view of a main part showing a fifth embodiment in which the mounting structure of the chip element of the present invention is applied to a solid-state imaging device of an electronic camera.

【図10】図9の金属プレートを裏面側から見た図。FIG. 10 is a view of the metal plate of FIG. 9 as viewed from the back side.

【図11】この発明の第5実施形態の変形例を示した金
属プレートを裏面側から見た図。
FIG. 11 is a view of a metal plate showing a modification of the fifth embodiment of the present invention as viewed from the back surface side.

【図12】電子カメラに用いられた従来の固体撮像素子
の取付構造を示した要部の拡大断面図。
FIG. 12 is an enlarged sectional view of a main part showing a mounting structure of a conventional solid-state imaging device used for an electronic camera.

【図13】他の従来例における撮像装置が取り付けられ
た金属プレートを裏面側から見た図。
FIG. 13 is a view of a metal plate to which an imaging device according to another conventional example is attached, viewed from the back surface side.

【符号の説明】[Explanation of symbols]

2 金属プレート 4、20、25、30、35、40 撮像装置 5 配線基板 6 固体撮像素子 7 樹脂ハウジング 10 電極端子 21、26、31、36 熱伝導部材 27、32 銅箔 28、33、37 足部 40 放熱孔 2 Metal plate 4, 20, 25, 30, 35, 40 Imaging device 5 Wiring board 6 Solid-state imaging device 7 Resin housing 10 Electrode terminal 21, 26, 31, 36 Thermal conductive member 27, 32 Copper foil 28, 33, 37 Feet Part 40 Heat radiation hole

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】チップ素子と、 このチップ素子を収容する樹脂部材と、 この樹脂部材内に露出し、この露出した部分に前記チッ
プ素子が取り付けられ、かつ前記樹脂部材の外部に露出
する熱伝導部材とを備えたことを特徴とするチップ素子
の取付構造。
A chip element; a resin member accommodating the chip element; and a heat conduction exposed in the resin member, the chip element attached to the exposed portion, and exposed to the outside of the resin member. And a member for mounting the chip element.
【請求項2】前記熱伝導部材における前記樹脂部材の外
部に露出した部分が接触した状態で前記樹脂部材が搭載
される金属部を備えていることを特徴とする請求項1に
記載のチップ素子の取付構造。
2. The chip element according to claim 1, further comprising a metal portion on which the resin member is mounted in a state where a portion of the heat conductive member exposed to the outside of the resin member is in contact with the metal member. Mounting structure.
【請求項3】前記熱伝導部材は、前記チップ素子の裏面
に対向する前記樹脂部材の内面において、前記チップ素
子が接続される電極端子を除く領域のほぼ全域に設けら
れ、その一部に前記樹脂部材の外部に延出された足部が
設けられていることを特徴とする請求項1に記載のチッ
プ素子の取付構造。
3. The heat conductive member is provided on substantially the entire area except for an electrode terminal to which the chip element is connected, on the inner surface of the resin member facing the back surface of the chip element, and the heat conductive member is partially provided. The mounting structure for a chip element according to claim 1, wherein a foot portion extending outside the resin member is provided.
【請求項4】前記樹脂部材が一面に搭載される金属部
と、この金属部の他面に配置される配線基板とを備え、 前記配線基板には、前記熱伝導部材の前記足部が接触し
て取り付けられる放熱用の銅箔が設けられていることを
特徴とする請求項3に記載のチップ素子の取付構造。
4. A metal part on which the resin member is mounted on one surface, and a wiring board disposed on the other surface of the metal part, wherein the foot of the heat conductive member contacts the wiring board. 4. The mounting structure for a chip element according to claim 3, wherein a heat-dissipating copper foil is provided.
【請求項5】チップ素子と、このチップ素子を収容する
樹脂部材と、前記チップ素子を収容した前記樹脂部材が
搭載される金属部とを備え、 前記金属部には、前記チップ素子の裏面における中心部
分に対応する箇所からその外周側に向けて放射状に延び
る放熱孔が設けられていることを特徴とするチップ素子
の取付構造。
5. A semiconductor device comprising: a chip element; a resin member accommodating the chip element; and a metal part on which the resin member accommodating the chip element is mounted. A mounting structure for a chip element, wherein a radiating hole extending radially from a portion corresponding to a central portion toward an outer peripheral side thereof is provided.
JP36201699A 1999-12-21 1999-12-21 Mounting structure of chip device Abandoned JP2001177023A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP36201699A JP2001177023A (en) 1999-12-21 1999-12-21 Mounting structure of chip device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP36201699A JP2001177023A (en) 1999-12-21 1999-12-21 Mounting structure of chip device

Publications (1)

Publication Number Publication Date
JP2001177023A true JP2001177023A (en) 2001-06-29

Family

ID=18475629

Family Applications (1)

Application Number Title Priority Date Filing Date
JP36201699A Abandoned JP2001177023A (en) 1999-12-21 1999-12-21 Mounting structure of chip device

Country Status (1)

Country Link
JP (1) JP2001177023A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100455881B1 (en) * 2001-12-06 2004-11-06 (주)나노팩 Package structure of optical device and method of manufacturing thereof
US7829833B2 (en) * 2005-05-24 2010-11-09 Olympus Imaging Corp. Arranging and/or supporting an image pickup device in an image pickup apparatus
JP2016162779A (en) * 2015-02-26 2016-09-05 京セラ株式会社 Imaging element, imaging device, and method of manufacturing imaging element
US10741597B2 (en) 2015-02-26 2020-08-11 Kyocera Corporation Image sensor, imaging apparatus, and method of manufacturing image sensor
CN112736107A (en) * 2021-03-29 2021-04-30 广东际洲科技股份有限公司 Image sensor module and intelligent environment monitoring system
WO2021241053A1 (en) 2020-05-28 2021-12-02 ソニーセミコンダクタソリューションズ株式会社 Solid-state imaging device and electronic apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100455881B1 (en) * 2001-12-06 2004-11-06 (주)나노팩 Package structure of optical device and method of manufacturing thereof
US7829833B2 (en) * 2005-05-24 2010-11-09 Olympus Imaging Corp. Arranging and/or supporting an image pickup device in an image pickup apparatus
JP2016162779A (en) * 2015-02-26 2016-09-05 京セラ株式会社 Imaging element, imaging device, and method of manufacturing imaging element
US10741597B2 (en) 2015-02-26 2020-08-11 Kyocera Corporation Image sensor, imaging apparatus, and method of manufacturing image sensor
WO2021241053A1 (en) 2020-05-28 2021-12-02 ソニーセミコンダクタソリューションズ株式会社 Solid-state imaging device and electronic apparatus
CN112736107A (en) * 2021-03-29 2021-04-30 广东际洲科技股份有限公司 Image sensor module and intelligent environment monitoring system

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