JP2001150255A - Parts feeder - Google Patents

Parts feeder

Info

Publication number
JP2001150255A
JP2001150255A JP33769799A JP33769799A JP2001150255A JP 2001150255 A JP2001150255 A JP 2001150255A JP 33769799 A JP33769799 A JP 33769799A JP 33769799 A JP33769799 A JP 33769799A JP 2001150255 A JP2001150255 A JP 2001150255A
Authority
JP
Japan
Prior art keywords
mounting
component
inspection
mounting table
component supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33769799A
Other languages
Japanese (ja)
Other versions
JP3898401B2 (en
Inventor
Kenichi Muto
健一 武藤
Toru Goto
徹 後藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP33769799A priority Critical patent/JP3898401B2/en
Publication of JP2001150255A publication Critical patent/JP2001150255A/en
Application granted granted Critical
Publication of JP3898401B2 publication Critical patent/JP3898401B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Automatic Assembly (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Die Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To optimize the layout of parts feeding units. SOLUTION: The plurality of parts feeding units are provided each comprising a placement table 10 capable of movement in X direction and Y direction and θrotation while having placed thereon a plurality of wafers 11 each containing a number of bare chips, a takeout mechanism 15 for taking out the desired bare chips from within the wafers 11 on the placement table 10 and transferring the bare chips onto a corresponding inspection table 16, an inspection mechanism 20 for inspecting the bare chips on the inspection stand 16 for their states, and a mounting mechanism 21 for taking out and mounting the bare chips on mounting substrates 2 after an inspection carried out with the inspection mechanism 20. The parts feeding units are arranged so that the interval between the parts taking positions of adjacent takeout mechanisms 15 is smaller than the interval between the centers of θ rotation of adjacent placement stands 10, so that the interval between adjacent mounting stations and therefore the distance over which the mounting substrate 2 is conveyed are reduced.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、部品供給装置に関
し、更に言えば、実装基板に実装する各種部品を供給す
る部品供給装置の配置効率向上を図る技術に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a component supply device, and more particularly, to a technique for improving the arrangement efficiency of a component supply device for supplying various components mounted on a mounting board.

【0002】[0002]

【従来の技術】以下、従来の部品供給装置について説明
する。尚、説明の便宜上、以下の説明では実装基板に各
種部品を実装する部品実装装置に搭載された基板供給装
置を例にして説明する。
2. Description of the Related Art A conventional component supply apparatus will be described below. For convenience of explanation, the following description will be given by taking a board supply device mounted on a component mounting apparatus for mounting various components on a mounting board as an example.

【0003】従来の部品供給装置として、例えば、図3
に示すように多数の部品を収納した部品群(例えば、半
導体ウエハ等)31を複数個(本実施形態では4個)載
置し、X方向移動及びY方向移動並びにθ回転可能な載
置台32と、前記載置台32上の複数個の部品群31内
から所望部品を取出し、検査台33上に移載する取出し
機構34と、前記検査台33上の部品状態を検査する検
査機構35と、前記検査機構35による検査終了後の部
品を取出し、実装基板36上に実装する実装機構37と
から成る部品供給ユニットを複数体備えることで、部品
実装効率を高めていた。
[0003] As a conventional component supply device, for example, FIG.
A plurality of (four in this embodiment) parts groups (for example, semiconductor wafers) 31 accommodating a large number of parts are placed as shown in FIG. A take-out mechanism 34 for taking out a desired component from the plurality of component groups 31 on the mounting table 32 and transferring it to the test table 33; an inspection mechanism 35 for inspecting the component state on the test table 33; The component mounting efficiency is enhanced by providing a plurality of component supply units each including a component after completion of inspection by the inspection mechanism 35 and a mounting mechanism 37 mounted on the mounting board 36.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上述し
た構成の部品供給装置において、前記載置台32が取出
し機構34による部品の取出し位置に合わせてX方向移
動及びY方向移動並びにθ回転するため、その中心Tを
基準にした移動範囲(図3に載置台32外周部を取り囲
むように二点鎖線で示した範囲)及び所定間隔を存して
隣り合う載置台32同士を配置する必要があり、この部
品供給ユニットが装置スペースの比較的広い範囲を占め
ていた。
However, in the component supply device having the above-described configuration, the mounting table 32 moves in the X and Y directions and rotates by θ in accordance with the position where the component is taken out by the take-out mechanism 34. It is necessary to arrange the moving range based on the center T (the range indicated by a two-dot chain line so as to surround the outer peripheral portion of the mounting table 32 in FIG. 3) and the mounting tables 32 adjacent to each other at a predetermined interval. Component supply units occupy a relatively large area of equipment space.

【0005】特に、近年、多品種の部品実装装置の要求
仕様が高度化し、装置が大型化している。そのため、部
品供給ユニット配置方式の改善を図ることで、配置効率
を高めたいという要望があった。
[0005] In particular, in recent years, the required specifications of various types of component mounting apparatuses have become more sophisticated, and the apparatuses have become larger. Therefore, there has been a demand to improve the arrangement efficiency by improving the component supply unit arrangement method.

【0006】更に言えば、上記部品供給ユニット配置方
式の改善により、実装基板の搬送距離の短縮化が図れれ
ば、搬送時間短縮に有利なものとなる。
Furthermore, if the transport distance of the mounting board can be shortened by the improvement of the component supply unit arrangement method, it will be advantageous to shorten the transport time.

【0007】[0007]

【課題を解決するための手段】そこで、本発明の部品供
給装置は上記課題に鑑みなされたもので、図1に示すよ
うに多数のベアチップを収納したウエハ11を複数個載
置し、X方向移動及びY方向移動並びにθ回転可能な載
置台10と、前記載置台10上のウエハ11内から所望
のベアチップを取出し、各ベアチップを対応する検査台
16上に移載する取出し機構15と、前記検査台16上
のベアチップ状態を検査する検査機構20と、前記検査
機構20による検査終了後のベアチップを取出し、実装
基板2上に実装する実装機構21とから成る部品供給ユ
ニットを複数体備え、隣り合う取出し機構15同士の部
品取出し位置間隔が、隣り合う載置台10同士のθ回転
中心の間隔よりも狭くなるように配置したことで、隣り
合う実装ステーション同士の間隔が短くなるので、実装
基板2の搬送距離の短縮化が可能になる。
SUMMARY OF THE INVENTION In view of the above-mentioned problems, a component supply apparatus according to the present invention mounts a plurality of wafers 11 containing a large number of bare chips as shown in FIG. A mounting table 10 capable of moving and moving in the Y direction and rotating by θ, a take-out mechanism 15 for taking out a desired bare chip from within the wafer 11 on the mounting table 10 and transferring each bare chip onto a corresponding inspection table 16, A plurality of component supply units including an inspection mechanism 20 for inspecting a bare chip state on the inspection table 16 and a mounting mechanism 21 for taking out the bare chip after the inspection by the inspection mechanism 20 and mounting it on the mounting board 2 are provided. By disposing the component take-out positions between the corresponding take-out mechanisms 15 so as to be narrower than the space between the θ rotation centers of the adjacent mounting tables 10, the adjacent mounting stations are arranged. Since the distance between the components is shortened, the transport distance of the mounting board 2 can be reduced.

【0008】また、前記載置台10,取出し機構15及
び実装基板2が、それぞれ前後関係を有する形で直線上
に配置され、当該載置台10のθ回転中心を所定量ずら
し、かつ隣り合う載置台10同士を近づけることで、図
3に示すように前記載置台32,取出し機構及び実装基
板が、それぞれ前後関係を有する形で直線上に配置さ
れ、当該載置台のθ回転中心がその直線上にある構成の
ものに比して実装ステーション同士の間隔が短くなるの
で、実装基板2の搬送距離の短縮化が可能になる。
Further, the mounting table 10, the take-out mechanism 15, and the mounting board 2 are arranged on a straight line so as to have a front-rear relationship, the θ rotation center of the mounting table 10 is shifted by a predetermined amount, and the adjacent mounting tables are shifted. 3, the mounting table 32, the takeout mechanism, and the mounting board are arranged on a straight line in a front-rear relationship, as shown in FIG. 3, and the θ rotation center of the mounting table is on the straight line. Since the interval between the mounting stations is shorter than that of a certain configuration, the transport distance of the mounting board 2 can be reduced.

【0009】更に、前記載置台10,取出し機構15及
び実装基板2が、それぞれ前後関係を有する形で直線上
に配置され、当該載置台10のθ回転中心を、その直線
上よりも隣り合う載置台10同士が離間する方向に所定
量ずらし、その所定量ずらした分だけ、直線上に配置さ
れる隣り合う前記載置台10,取出し機構15及び実装
基板2同士の間隔を狭まる方向にずらすことで、隣り合
う作業ステーション同士の間隔が短くなるので、実装基
板2の搬送距離の短縮化が可能になる。
Further, the mounting table 10, the take-out mechanism 15, and the mounting board 2 are arranged on a straight line so as to have a front-rear relationship with each other. The mounting tables 10 are shifted by a predetermined amount in the direction in which the mounting tables 10 are separated from each other, and the distance between the adjacent mounting tables 10, the take-out mechanism 15, and the mounting substrate 2 that are linearly arranged is shifted in the direction of narrowing by the predetermined amount. Since the interval between the adjacent work stations is reduced, the transport distance of the mounting board 2 can be reduced.

【0010】更に、図1に示すように前記載置台10上
に4個(あるいは6個)のウエハ11が載置され、例え
ば、載置台10のθ回転中心が当該載置台10,取出し
機構15及び実装基板2が、それぞれ前後関係を有する
形で直線上から45°(あるいは60°)ずらした場合
において、取出し機構15による取出しから実装基板2
への実装作業中に取出したベアチップを90°(あるい
は120°)回転させることで、載置台10上に載置す
る際のウエハ11内のベアチップの向きと、当該ベアチ
ップを実装基板2に実装する際の実装機構21の移動方
向とを合わせることができる。
Further, as shown in FIG. 1, four (or six) wafers 11 are mounted on the mounting table 10, and, for example, the θ rotation center of the mounting table 10 is When the mounting substrate 2 is shifted from the straight line by 45 ° (or 60 °) in a form having a front-rear relationship, the mounting substrate 2
By rotating the bare chip taken out during the mounting operation onto the mounting table 10 by 90 ° (or 120 °), the orientation of the bare chip in the wafer 11 when the bare chip is mounted on the mounting table 10 and the bare chip are mounted on the mounting board 2. In this case, the moving direction of the mounting mechanism 21 can be matched.

【0011】[0011]

【発明の実施の形態】以下、本発明の部品供給装置に係
る一実施形態について図面を参照しながら説明する。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a component supply apparatus according to an embodiment of the present invention.

【0012】図1及び図2は本発明が適用される部品供
給装置の平面図及びその側面図である。
FIGS. 1 and 2 are a plan view and a side view of a component supply apparatus to which the present invention is applied.

【0013】図において、1は部品供給装置本体で、こ
の本体1には不図示の供給ストッカから供給され、各種
部品が実装される実装基板2を載置した作業用パレット
3を実装ステーションに搬送し、実装作業が終了した実
装基板2を下流に搬送する搬送機構4が構成されてい
る。尚、前記作業用パレット3に載置される実装基板2
は1枚でも、また複数枚でも構わない。
In FIG. 1, reference numeral 1 denotes a component supply device main body, which is supplied from a supply stocker (not shown) to the main body 1 and transports a work pallet 3 on which a mounting board 2 on which various components are mounted is mounted to a mounting station. Further, a transport mechanism 4 for transporting the mounting board 2 on which the mounting operation has been completed to the downstream is configured. The mounting board 2 mounted on the work pallet 3
May be one sheet or a plurality of sheets.

【0014】また、前記搬送機構4の構成としては、種
々の構成が考えられるが、本実施形態では前記作業用パ
レット3を載置した状態で、搬送ガイド5にガイドされ
ながら水平移動可能なスライド機構6を有する構成を採
用しているが、その他に例えば、コンベアによる搬送方
式、あるいは竿送り方式等でも良い。
Although various configurations are conceivable as the configuration of the transport mechanism 4, in the present embodiment, a slide that can be moved horizontally while being guided by the transport guide 5 with the work pallet 3 mounted thereon. Although a configuration having the mechanism 6 is adopted, for example, a transport system using a conveyor or a rod feed system may be used.

【0015】更に、本実施形態では部品実装効率の向上
を図るため、後述する部品供給ユニットを複数(例え
ば、2体)用意し、これに対応する作業用パレット3
(実装基板2)を複数個(2個)ずつ実装ステーション
に搬送している。
Further, in this embodiment, in order to improve the component mounting efficiency, a plurality of (for example, two) component supply units described later are prepared, and the corresponding work pallet 3 is provided.
The (mounting board 2) is transported to the mounting station by a plurality (two) at a time.

【0016】10は多数の部品を収納した部品群(本実
施形態ではダイシングされた半導体ウエハで、以下ウエ
ハと称し、このウエハ11から取出される部品をベアチ
ップと称す。)11を複数個(例えば、4個)載置し、
X方向移動及びY方向移動並びにθ回転可能な載置台
で、隣り合う形で2体配置されている。尚、図1に載置
台10外周部を取り囲むように二点鎖線で示した範囲
が、中心Tを基準にした当該載置台10の移動範囲であ
る。
Reference numeral 10 denotes a component group containing a large number of components (in this embodiment, a diced semiconductor wafer, hereinafter referred to as a wafer, and a component taken out of the wafer 11 is referred to as a bare chip). , 4)
The mounting table is capable of moving in the X direction, the Y direction, and rotating by θ, and is arranged in two adjacent shapes. The range indicated by the two-dot chain line so as to surround the outer peripheral portion of the mounting table 10 in FIG. 1 is the moving range of the mounting table 10 with respect to the center T.

【0017】15は前記載置台10上のウエハ11内か
ら所望のベアチップを取出し、検査台16上に移載する
取出し機構で、90°水平回転及び上下移動可能なピッ
クアップアーム17を有し、当該ピックアップアーム1
7で前記ウエハ11上のベアチップを吸着取出した後
に、支点を介してピックアップアーム17を90°回転
させて、前記検査台16上にベアチップを移載する。
A pick-up mechanism 15 picks up a desired bare chip from within the wafer 11 on the mounting table 10 and transfers it to the inspection table 16. The pick-up mechanism 15 has a pickup arm 17 that can be rotated 90 ° horizontally and moved up and down. Pickup arm 1
After the bare chips on the wafer 11 are sucked out at 7, the pickup arm 17 is rotated by 90 ° via the fulcrum to transfer the bare chips onto the inspection table 16.

【0018】20は前記検査台16上に移載されたベア
チップの状態(姿勢及び欠け等)を検査する検査機構
で、当該検査台16上方に位置させた不図示の認識カメ
ラにより当該ベアチップの姿勢及び欠け状態等を認識す
る。
Reference numeral 20 denotes an inspection mechanism for inspecting the state (posture, chipping, etc.) of the bare chip transferred on the inspection table 16, and the posture of the bare chip by a recognition camera (not shown) positioned above the inspection table 16. And recognizes a chipped state or the like.

【0019】21は検査終了後のベアチップを取出し、
実装基板2上に実装する実装機構で、前記検査機構20
による検査ステーションから実装ステーションまで水平
移動及び上下移動可能並びにθ回転可能なボンディング
ヘッド22を有し、当該ボンディングヘッド22で前記
検査台16上のベアチップを吸着取出した後に、実装基
板2上の実装ポイントまで水平移動して行き、そのポイ
ントで下動して当該ベアチップをボンディングする。
21 is to take out the bare chip after the inspection is completed,
A mounting mechanism for mounting on the mounting board 2;
Has a bonding head 22 that can move horizontally and vertically and can rotate θ from the inspection station to the mounting station, and picks up the bare chip on the inspection table 16 by the bonding head 22 and then mounts the mounting point on the mounting board 2. And then move down at that point to bond the bare chip.

【0020】これらの載置台10,取出し機構15,検
査機構20及び実装機構21とで部品供給ユニットが構
成され、当該部品供給ユニットが隣り合うようにして、
前記搬送機構4に並設されている。
A component supply unit is constituted by the mounting table 10, the take-out mechanism 15, the inspection mechanism 20, and the mounting mechanism 21, and the component supply units are arranged adjacent to each other.
The transfer mechanism 4 is provided side by side.

【0021】また、載置台10上の部品取出しポイン
ト,検査機構20による検査ポイント及び実装基板2上
の実装ポイントは、それぞれ前後関係を有する形で直線
上に配置され、当該載置台10のθ回転中心Tが、その
直線上よりも隣り合う載置台10同士が離間する方向に
所定量(例えば、直線上から45°)ずれた(隣り合う
取出し機構15同士の部品取出し位置間隔が、隣り合う
載置台10同士のθ回転中心Tの間隔よりも狭くなる)
位置に設定されている。
The component take-out points on the mounting table 10, the inspection points by the inspection mechanism 20, and the mounting points on the mounting board 2 are arranged on a straight line in a back-and-forth relationship. The center T is shifted by a predetermined amount (for example, 45 ° from the straight line) in a direction in which the mounting tables 10 adjacent to each other are separated from the straight line. (It becomes narrower than the interval between the θ rotation centers T between the mounting tables 10)
Set to position.

【0022】このような配置構成を採用することで本発
明では、従来(図3に示す配置構成)のような前記載置
台31上の部品取出しポイント,検査機構35による検
査ポイント及び実装基板36上の実装ポイントが、それ
ぞれ前後関係を有する形で直線上に配置され、当該載置
台31のθ回転中心Tがその直線上にある構成のものに
比して、載置台10同士の間隔(隣り合う実装基板2上
の実装ポイント同士の間隔A<A’)及び載置台10の
移動範囲(B<B’)を狭くすることができる。従っ
て、実装基板2の搬送距離の短縮化が図れる。
By adopting such an arrangement, in the present invention, the parts take-out point on the mounting table 31, the inspection point by the inspection mechanism 35, and the mounting point on the mounting board 36 as in the prior art (arrangement shown in FIG. 3). Are arranged on a straight line in a manner having a front-rear relationship, and the interval between the mounting tables 10 (adjacent to each other) is smaller than that in the configuration in which the θ rotation center T of the mounting table 31 is on the straight line. The distance A <A ′) between the mounting points on the mounting board 2 and the moving range (B <B ′) of the mounting table 10 can be reduced. Therefore, the transport distance of the mounting board 2 can be reduced.

【0023】また、前述したように載置台10上に4個
のウエハ11が載置され、例えば、載置台10のθ回転
中心が当該載置台10上の取出し機構15による取出し
ポイント,検査機構16による検査ポイント及び実装基
板2上の実装機構21による実装ポイントを結ぶ直線上
から45°ずれた位置に配置した場合において、前記取
出し機構15のピックアップアーム17によりベアチッ
プを取出した後に、当該ピックアップアーム17を90
°回転させることで、ベアチップを90°回転させて実
装基板2に実装させるため、載置台10上にウエハ11
を載置する際のウエハ11内のベアチップの向きと、実
装基板2にベアチップを実装する際の実装機構21の移
動方向(実装方向)とを合わせることができるため、作
業者による載置台10へのウエハ11の装着ミス発生を
抑止できる。
Further, as described above, four wafers 11 are placed on the mounting table 10, and, for example, the θ rotation center of the mounting table 10 is set to the unloading point by the unloading mechanism 15 on the mounting table 10, the inspection mechanism 16 In a case where the bare chip is taken out by the pickup arm 17 of the take-out mechanism 15 when it is arranged at a position shifted by 45 ° from a straight line connecting the inspection point by the mounting mechanism 21 and the mounting point by the mounting mechanism 21 on the mounting board 2, 90
In order to rotate the bare chip 90 ° and mount it on the mounting substrate 2 by rotating the wafer
Can be matched with the direction of the bare chips in the wafer 11 when the wafer is placed and the moving direction (mounting direction) of the mounting mechanism 21 when the bare chips are mounted on the mounting substrate 2. Of the wafer 11 can be suppressed.

【0024】尚、本実施形態では載置台10上に4個の
ウエハ11を載置し、載置台10のθ回転中心が当該載
置台10上の取出し機構15による取出しポイント,検
査機構20による検査ポイント及び実装基板2上の実装
機構21による実装ポイントを結ぶ直線上から45°ず
らした位置に配置する構成について説明したが、本発明
はこれに限定されるものではなく、図示した説明は省略
するが、例えば、載置台10上に6個のウエハ11を載
置し、載置台10のθ回転中心が当該載置台10上の取
出し機構15による取出しポイント,検査機構20によ
る検査ポイント及び実装基板2上の実装機構21による
実装ポイントを結ぶ直線上から60°ずらした位置に配
置する構成とすることで、本発明の特徴である部品供給
ユニットの配置効率向上を可能にすると共に、前記取出
し機構15のピックアップアーム17によりベアチップ
を取出した後に、当該ピックアップアーム17を120
°回転させることで、ベアチップを120°回転させて
実装基板2に実装するようにすれば、同じく載置台10
上にウエハ11を載置する際のウエハ11内のベアチッ
プの向きと、実装基板2にベアチップを実装する際の実
装機構21の移動方向(実装方向)とを合わせることが
できるため、作業者による載置台10へのウエハ11の
装着ミス発生を抑止できる。
In this embodiment, four wafers 11 are placed on the mounting table 10, and the θ rotation center of the mounting table 10 is determined by the unloading point of the unloading mechanism 15 on the mounting table 10 and the inspection by the inspection mechanism 20. Although the configuration in which the points and the mounting point of the mounting mechanism 21 on the mounting substrate 2 are arranged at a position shifted by 45 ° from the straight line connecting the mounting points has been described, the present invention is not limited to this, and the illustrated description is omitted. However, for example, six wafers 11 are placed on the mounting table 10, and the θ rotation center of the mounting table 10 is determined by the unloading point of the unloading mechanism 15 on the mounting table 10, the inspection point by the inspection mechanism 20, and the mounting substrate 2. By arranging the components at a position shifted by 60 ° from a straight line connecting the mounting points by the mounting mechanism 21 above, the component supply unit arrangement efficiency which is a feature of the present invention is provided. Together to enable the top, after the removal of the bare chip by the pickup arm 17 of the take-out mechanism 15, the pick-up arm 17 120
If the bare chip is rotated by 120 ° to be mounted on the mounting substrate 2 by rotating the mounting table 2
Since the direction of the bare chips in the wafer 11 when placing the wafer 11 thereon and the moving direction (mounting direction) of the mounting mechanism 21 when mounting the bare chips on the mounting board 2 can be matched, An error in mounting the wafer 11 on the mounting table 10 can be suppressed.

【0025】以下、部品供給動作について図面を参照し
ながら説明する。
Hereinafter, the component supply operation will be described with reference to the drawings.

【0026】先ず、作業者は載置台10上にウエハ11
を4枚載置する。このとき、前述したようにウエハ11
内のベアチップの向きは、実装基板2に当該ベアチップ
を実装する際の実装機構21の移動方向に合せて装着す
れば良いため、装着ミスが起こり難くくなる(図1に部
品の向きを⇒で示してある。)。
First, the worker places the wafer 11 on the mounting table 10.
Is placed on four sheets. At this time, as described above, the wafer 11
The mounting direction of the bare chip inside the mounting board 21 may be adjusted in accordance with the moving direction of the mounting mechanism 21 when mounting the bare chip on the mounting board 2, so that mounting errors are less likely to occur (in FIG. Shown).

【0027】そして、前述したようにして載置台10上
にウエハ11を4枚装着した後、作業者は部品実装作業
を開始させる。
After mounting four wafers 11 on the mounting table 10 as described above, the operator starts the component mounting operation.

【0028】部品実装作業が開始されると、載置台10
がX方向移動及びY方向移動並びにθ回転(載置台10
外周部を取り囲むように二点鎖線で示した範囲が、中心
Tを基準にした当該載置台10の移動範囲である。)し
て、所望のベアチップ上方に取出し機構15のピックア
ップアーム17が位置される(図1及び図2参照)。
When the component mounting operation is started, the mounting table 10
Move in the X and Y directions and rotate θ (
A range indicated by a two-dot chain line so as to surround the outer peripheral portion is a moving range of the mounting table 10 with respect to the center T. Then, the pickup arm 17 of the take-out mechanism 15 is positioned above the desired bare chip (see FIGS. 1 and 2).

【0029】次に、当該ピックアップアーム17が所定
量下動して所望のベアチップを吸着取出しする。尚、こ
の吸着取出し時には、図示しないがウエハ裏面からベア
チップを突き上げて吸着取出しし易くする突き上げ機構
が準備されている。
Next, the pick-up arm 17 moves down by a predetermined amount to suck and take out a desired bare chip. At the time of suction and removal, a push-up mechanism (not shown) is provided to push up the bare chip from the back surface of the wafer to facilitate suction and removal.

【0030】続いて、ピックアップアーム17で前記ウ
エハ11上のベアチップを吸着取出した後に、支点を介
して当該ピックアップアーム17を90°回転させて、
前記検査台16上にベアチップを移載する。このとき、
ウエハ11上のベアチップ向きと検査台16上のベアチ
ップ向きとが同じ向きになる。ここで、前記検査台16
上に移載されたベアチップ状態(姿勢及び欠け等)が、
検査機構20により認識される。
Subsequently, after picking up the bare chip on the wafer 11 by the pick-up arm 17, the pick-up arm 17 is rotated 90 ° through a fulcrum,
A bare chip is transferred onto the inspection table 16. At this time,
The direction of the bare chip on the wafer 11 and the direction of the bare chip on the inspection table 16 are the same. Here, the inspection table 16
The bare chip state (posture, chipping, etc.) transferred above is
It is recognized by the inspection mechanism 20.

【0031】最後に、検査終了後のベアチップを実装機
構21のボンディングヘッド22で取出し、当該ボンデ
ィングヘッド22を介してベアチップを実装基板2上の
実装ポイントにボンディングする。尚、このとき前記検
査機構20による認識の結果、姿勢(位置)ずれがある
ベアチップに対しては、ボンディングヘッド22で吸着
後、当該ヘッド22を所望角度θ回転させることでその
姿勢(位置)ずれを修正し、実装基板2上に実装する。
また、欠け等の不良品に対しては、実装作業を一旦中断
し、異常報知等して作業者に連絡する。
Finally, the bare chip after the inspection is taken out by the bonding head 22 of the mounting mechanism 21, and the bare chip is bonded to the mounting point on the mounting board 2 via the bonding head 22. At this time, as a result of recognition by the inspection mechanism 20, for a bare chip having a posture (position) deviation, the head 22 is rotated by a desired angle θ after being sucked by the bonding head 22, and the posture (position) deviation is thereby obtained. Is corrected and mounted on the mounting board 2.
In addition, for a defective product such as a chipped product, the mounting operation is temporarily interrupted, an abnormality is notified, and the worker is notified.

【0032】以下、同様の作業が繰り返される。このと
き、所望のベアチップが順次選択され、実装されていく
ことになるが、本発明では載置台10上の部品取出しポ
イント,検査機構20による検査ポイント及び実装基板
2上の実装ポイントを、それぞれ前後関係を有する形で
直線上に配置し、当該載置台10のθ回転中心Tを、そ
の直線上よりも隣り合う載置台10同士が離間する方向
に所定量(例えば、直線上から45°)ずらし(隣り合
う取出し機構15同士の部品取出し位置間隔が、隣り合
う載置台10同士のθ回転中心Tの間隔よりも狭くなる
ように配置した)ことで、従来(図3に示す配置構成)
のような前記載置台31上の部品取出しポイント,検査
機構35による検査ポイント及び実装基板36上の実装
ポイントが、それぞれ前後関係を有する形で直線上に配
置され、当該載置台31のθ回転中心Tがその直線上に
ある構成のものに比して、載置台10同士の間隔(隣り
合う実装基板2上の実装ポイント同士の間隔A<A’)
及び載置台10の移動範囲(B<B’)を狭くすること
ができる。従って、実装基板2の搬送距離の短縮化が図
れ、実装基板2の搬送にかかる時間を短縮でき、作業性
が向上する。
Hereinafter, the same operation is repeated. At this time, a desired bare chip is sequentially selected and mounted. In the present invention, a component take-out point on the mounting table 10, an inspection point by the inspection mechanism 20, and a mounting point on the mounting board 2 are respectively set before and after. Are arranged on a straight line in a relational manner, and the θ rotation center T of the mounting table 10 is shifted by a predetermined amount (for example, 45 ° from the straight line) in a direction in which the mounting tables 10 adjacent to each other are separated from the straight line. Conventionally (arrangement configuration shown in FIG. 3) by arranging the component take-out position intervals between adjacent take-out mechanisms 15 smaller than the interval between θ rotation centers T between adjacent mounting tables 10.
The component take-out points on the mounting table 31, the inspection points by the inspection mechanism 35, and the mounting points on the mounting board 36 are arranged on a straight line in a back-and-forth relationship, and the rotation center θ of the mounting table 31 Compared to the configuration in which T is on the straight line, the interval between the mounting tables 10 (the interval A <A ′ between the mounting points on the adjacent mounting substrates 2).
Further, the moving range (B <B ′) of the mounting table 10 can be narrowed. Therefore, the transfer distance of the mounting board 2 can be shortened, the time required for transferring the mounting board 2 can be shortened, and workability is improved.

【0033】[0033]

【発明の効果】本発明によれば、載置台,取出し機構及
び実装基板を、それぞれ前後関係を有する形で直線上に
配置し、当該載置台のθ回転中心を、その直線上よりも
隣り合う載置台同士が離間する方向に所定量ずらしたこ
とで、従来のような載置台,取出し機構及び実装基板
が、それぞれ前後関係を有する形で直線上に配置され、
当該載置台のθ回転中心がその直線上にある構成のもの
に比して、載置台同士の間隔(隣り合う実装基板上の実
装ポイント同士の間隔)及び載置台が移動する際の移動
範囲を狭くすることができる。従って、上記した配置構
成を採用することで、実装基板の搬送距離の短縮化が図
れ、基板搬送にかかる時間の短縮化による搬送効率の向
上が図れる。
According to the present invention, the mounting table, the take-out mechanism, and the mounting board are arranged on a straight line in a front-rear relationship, and the θ rotation center of the mounting table is adjacent to the mounting table. By displacing the mounting tables by a predetermined amount in a direction in which the mounting tables are separated from each other, the mounting table, the takeout mechanism, and the mounting board as in the related art are arranged on a straight line in a front-rear relationship,
Compared to the configuration in which the θ rotation center of the mounting table is on the straight line, the space between the mounting tables (the space between the mounting points on adjacent mounting boards) and the moving range when the mounting table moves. Can be narrow. Therefore, by employing the above arrangement, the transfer distance of the mounting board can be reduced, and the transfer efficiency can be improved by shortening the time required for transferring the board.

【0034】また、載置台上に複数個の部品群を載置
し、当該載置台のθ回転中心が当該載置台,取出し機構
及び実装基板とを結ぶ直線上から所定角度ずれた位置に
配置した場合には、前記取出し機構により部品を取出し
た後に、当該ベアチップを所定角度回転させて実装基板
上に実装することで、載置台上にウエハを載置する際の
ベアチップの向きと、実装基板に部品を実装するための
実装機構の移動方向(実装方向)とを合わせることがで
きるため、作業者による載置台へのウエハの装着ミス発
生を抑止できる。
A plurality of component groups are placed on the mounting table, and the θ rotation center of the mounting table is arranged at a position shifted by a predetermined angle from a straight line connecting the mounting table, the take-out mechanism, and the mounting board. In this case, after the parts are taken out by the take-out mechanism, the bare chips are mounted on a mounting board by rotating the bare chips by a predetermined angle, so that the orientation of the bare chips when the wafer is mounted on the mounting table and the mounting board. Since the direction of movement (mounting direction) of the mounting mechanism for mounting the components can be matched, it is possible to prevent a worker from mounting the wafer on the mounting table.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態の部品供給装置を示す平面
図である。
FIG. 1 is a plan view showing a component supply device according to an embodiment of the present invention.

【図2】本発明の一実施形態の部品供給装置を示す側面
図である。
FIG. 2 is a side view showing a component supply device according to an embodiment of the present invention.

【図3】従来の部品供給装置を示す平面図である。FIG. 3 is a plan view showing a conventional component supply device.

【符号の説明】[Explanation of symbols]

1 部品供給装置本体 2 実装基板 4 搬送機構 10 載置台 11 半導体ウエハ 15 取出し機構 16 検査台 20 検査機構 21 実装機構 DESCRIPTION OF SYMBOLS 1 Component supply apparatus main body 2 Mounting board 4 Transfer mechanism 10 Mounting table 11 Semiconductor wafer 15 Take-out mechanism 16 Inspection table 20 Inspection mechanism 21 Mounting mechanism

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2F065 AA37 CC19 FF04 JJ03 PP12 QQ31 3C030 BC16 DA01 DA11 DA15 4M106 AA02 CA38 DB01 DG08 DG10 DG20 DG26 5F047 FA02 FA03 FA05 FA08 FA72 FA74 FA83  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2F065 AA37 CC19 FF04 JJ03 PP12 QQ31 3C030 BC16 DA01 DA11 DA15 4M106 AA02 CA38 DB01 DG08 DG10 DG20 DG26 5F047 FA02 FA03 FA05 FA08 FA72 FA74 FA83

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 実装基板上に実装される各種部品を供給
する部品供給装置において、 多数の部品を収納した部品群を複数個載置し、X方向移
動及びY方向移動並びにθ回転可能な載置台と、 前記載置台上の複数個の部品群内から所望の部品を取出
し、実装基板上に実装する実装機構とから成る部品供給
ユニットを複数体備え、 隣り合う取出し機構同士の部品取出し位置間隔が、隣り
合う載置台同士のθ回転中心の間隔よりも狭くなるよう
に配置されていることを特徴とする部品供給装置。
1. A component supply device for supplying various components mounted on a mounting board, wherein a plurality of component groups accommodating a large number of components are placed, and the component group is capable of moving in an X direction, a Y direction, and rotating θ. A plurality of component supply units each including a mounting table and a mounting mechanism for picking up desired components from the plurality of component groups on the mounting table and mounting the components on a mounting board, and a component pick-up position interval between adjacent picking-up mechanisms. Are arranged so as to be narrower than the interval between the θ rotation centers of the adjacent mounting tables.
【請求項2】 実装基板上に実装される各種部品を供給
する部品供給装置において、 多数の部品を収納した部品群を複数個載置し、X方向移
動及びY方向移動並びにθ回転可能な載置台と、 前記載置台上の複数個の部品群内から所望の部品を取出
し、検査台上に移載する取出し機構と、 前記検査台上の部品状態を検査する検査機構と、 前記検査機構による検査終了後の部品を取出し、実装基
板上に実装する実装機構とから成る部品供給ユニットを
複数体備え、 隣り合う取出し機構同士の部品取出し位置間隔が、隣り
合う載置台同士のθ回転中心の間隔よりも狭くなるよう
に配置されていることを特徴とする部品供給装置。
2. A component supply apparatus for supplying various components mounted on a mounting board, wherein a plurality of component groups containing a large number of components are placed, and a component group capable of moving in the X and Y directions and rotating θ. A mounting table, a take-out mechanism for taking out a desired part from a plurality of component groups on the mounting table, and transferring the component to an inspection table; an inspection mechanism for inspecting a component state on the inspection table; Equipped with a plurality of component supply units consisting of a mounting mechanism that picks up components after inspection and mounts them on the mounting board, and the interval between component pick-up positions between adjacent pick-up mechanisms is the interval between the θ rotation centers of adjacent mounting tables. A component supply device, wherein the component supply device is arranged to be narrower than the component supply device.
【請求項3】 実装基板上に実装される各種部品を供給
する部品供給装置において、 多数の部品を収納した部品群を複数個載置し、X方向移
動及びY方向移動並びにθ回転可能な載置台と、 前記載置台上の複数個の部品群内から所望の部品を取出
し、実装基板上に実装する実装機構とから成る部品供給
ユニットを複数体備え、 前記載置台,取出し機構及び実装基板が、それぞれ前後
関係を有する形で直線上に配置され、当該載置台のθ回
転中心が、その直線上にないことを特徴とする部品供給
装置。
3. A component supply device for supplying various components mounted on a mounting board, wherein a plurality of component groups accommodating a large number of components are placed, and the component group can be moved in X and Y directions and rotated by θ. A plurality of component supply units each including a mounting table and a mounting mechanism for extracting a desired component from the plurality of component groups on the mounting table and mounting the mounting component on the mounting board are provided. A component supply device, which is arranged on a straight line in a front-rear relationship, and the center of rotation of the mounting table is not on the straight line.
【請求項4】 実装基板上に実装される各種部品を供給
する部品供給装置において、 多数の部品を収納した部品群を複数個載置し、X方向移
動及びY方向移動並びにθ回転可能な載置台と、 前記載置台上の複数個の部品群内から所望の部品を取出
し、検査台上に移載する取出し機構と、 前記検査台上の部品状態を検査する検査機構と、 前記検査機構による検査終了後の部品を取出し、実装基
板上に実装する実装機構とから成る部品供給ユニットを
複数体備え、 前記載置台,取出し機構及び実装基板が、それぞれ前後
関係を有する形で直線上に配置され、当該載置台のθ回
転中心が、その直線上にないことを特徴とする部品供給
装置。
4. A component supply device for supplying various components mounted on a mounting board, wherein a plurality of component groups accommodating a large number of components are placed, and a component group capable of moving in the X and Y directions and rotating θ. A mounting table, a take-out mechanism for taking out a desired part from a plurality of component groups on the mounting table, and transferring the component to an inspection table; an inspection mechanism for inspecting a component state on the inspection table; A plurality of component supply units including a mounting mechanism for taking out the component after the inspection and mounting the component on the mounting board are provided. The mounting table, the removing mechanism, and the mounting board are linearly arranged in a front-rear relationship. A component supply device, wherein the center of rotation of the mounting table is not on the straight line.
【請求項5】 前記載置台のθ回転中心が、当該載置
台,取出し機構及び実装基板がそれぞれ配置された直線
上から所定角度ずれていることを特徴とする請求項3あ
るいは請求項4に記載の部品供給装置。
5. The apparatus according to claim 3, wherein the θ rotation center of the mounting table is shifted by a predetermined angle from a straight line on which the mounting table, the take-out mechanism, and the mounting board are arranged. Parts supply equipment.
【請求項6】 前記載置台のθ回転中心が、当該載置
台,取出し機構及び実装基板がそれぞれ配置された直線
上から角度45°,60°ずれていることを特徴とする
請求項3あるいは請求項4あるいは請求項5に記載の部
品供給装置。
6. The method according to claim 3, wherein the θ rotation center of the mounting table is offset by 45 ° and 60 ° from a straight line on which the mounting table, the take-out mechanism, and the mounting board are respectively arranged. The component supply device according to claim 4 or 5.
【請求項7】 前記取出し機構が、載置台上の部品取出
し位置から前記検査台上の部品移載位置まで水平回転可
能に構成されていることを特徴とする請求項2あるいは
請求項4に記載の部品供給装置。
7. The device according to claim 2, wherein the take-out mechanism is configured to be horizontally rotatable from a component take-out position on the mounting table to a component transfer position on the inspection table. Parts supply equipment.
JP33769799A 1999-11-29 1999-11-29 Parts supply device Expired - Fee Related JP3898401B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33769799A JP3898401B2 (en) 1999-11-29 1999-11-29 Parts supply device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33769799A JP3898401B2 (en) 1999-11-29 1999-11-29 Parts supply device

Publications (2)

Publication Number Publication Date
JP2001150255A true JP2001150255A (en) 2001-06-05
JP3898401B2 JP3898401B2 (en) 2007-03-28

Family

ID=18311117

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33769799A Expired - Fee Related JP3898401B2 (en) 1999-11-29 1999-11-29 Parts supply device

Country Status (1)

Country Link
JP (1) JP3898401B2 (en)

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CN109564172A (en) * 2016-07-05 2019-04-02 佳能机械株式会社 Defect detecting device, defect inspection method, chip, semiconductor chip, semiconductor device, bare die jointing machine, joint method, semiconductor making method and manufacturing method for semiconductor device
CN109564172B (en) * 2016-07-05 2021-08-31 佳能机械株式会社 Defect detecting device, defect detecting method, die bonder, semiconductor manufacturing method, and semiconductor device manufacturing method
WO2018225664A1 (en) * 2017-06-07 2018-12-13 キヤノンマシナリー株式会社 Defect detection device, defect detection method, wafer, semiconductor chip, die bonder, semiconductor manufacturing method, and semiconductor device manufacturing method
JPWO2018225664A1 (en) * 2017-06-07 2019-06-27 キヤノンマシナリー株式会社 Defect detection apparatus, defect detection method, wafer, semiconductor chip, die bonder, semiconductor manufacturing method, and semiconductor device manufacturing method
CN110741464A (en) * 2017-06-07 2020-01-31 佳能机械株式会社 Defect detecting device, defect detecting method, wafer, semiconductor chip, die bonder, semiconductor manufacturing method, and semiconductor device manufacturing method
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