JP2001148437A - Solid image pickup element package - Google Patents

Solid image pickup element package

Info

Publication number
JP2001148437A
JP2001148437A JP33222699A JP33222699A JP2001148437A JP 2001148437 A JP2001148437 A JP 2001148437A JP 33222699 A JP33222699 A JP 33222699A JP 33222699 A JP33222699 A JP 33222699A JP 2001148437 A JP2001148437 A JP 2001148437A
Authority
JP
Japan
Prior art keywords
package
solid
imaging device
state imaging
image pickup
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP33222699A
Other languages
Japanese (ja)
Inventor
Kazuyuki Omori
和之 大森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP33222699A priority Critical patent/JP2001148437A/en
Publication of JP2001148437A publication Critical patent/JP2001148437A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Landscapes

  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent temperature increase due to the heat generation of a solid image pickup element within an inexpensive and light configuration without newly adding any parts in a package for accommodating the solid image pickup element. SOLUTION: An uneven part 1c is provided at one portion or entire portion of the surface of a package for accommodating a solid image pickup element 2. Then, heat from the solid image pickup element 2 is transferred to the uneven part 1c with a large surface area through an adhesive 3 for efficient cooling. Also, inexpensive and light plastic is used as a plastic material.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、固体撮像素子を収
納するパッケージ、特に放熱機能を有する固体撮像素子
パッケージに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a package for accommodating a solid-state imaging device, and more particularly to a solid-state imaging device package having a heat radiation function.

【0002】[0002]

【従来の技術】被写体を撮影する際に使用する媒体とし
て、従来からの銀塩フィルムの他にCCD等の固体撮像
素子があり、この固体撮像素子を搭載した機器、いわゆ
る電子カメラも既に製品化されている。この固体撮像素
子は通常凹形状に樹脂成形されたパッケージに収納され
ているが、固体撮像素子の動作時に発生する熱がパッケ
ージ内にこもるため、固体撮像素子の温度が上昇してし
まう要因となっている。そして、この温度上昇により白
傷や黒傷と呼ばれる画素欠陥の出力信号レベルの絶対値
が増大し、このときにその固体撮像素子を搭載した電子
カメラを用いて撮影すると、画像の画質劣化が発生す
る。
2. Description of the Related Art In addition to a conventional silver halide film, a solid-state imaging device such as a CCD has been used as a medium for photographing a subject. Devices equipped with the solid-state imaging device, so-called electronic cameras, have already been commercialized. Have been. This solid-state imaging device is usually housed in a package that is resin-molded in a concave shape. However, heat generated during operation of the solid-state imaging device is trapped in the package, which causes a rise in the temperature of the solid-state imaging device. ing. The increase in the temperature causes an increase in the absolute value of the output signal level of a pixel defect called a white defect or a black defect. At this time, if an image is taken using an electronic camera equipped with the solid-state imaging device, the image quality deteriorates. I do.

【0003】このための対策として三つの方法が考えら
れるが、一つ目として特開平08−298303号公報
や特開平09−064251号公報に示されているよう
な放熱効果を持った部材を新たに加える方法が考えられ
ている。図5にその方法を用いた固体撮像素子パッケー
ジの構成を断面図として示す。
As a countermeasure for this, three methods are conceivable. First, a member having a heat radiation effect as disclosed in JP-A-08-298303 and JP-A-09-064251 is newly added. There is a way to add it. FIG. 5 is a cross-sectional view showing a configuration of a solid-state imaging device package using the method.

【0004】図5において、100は凹型状に樹脂成形
されたエポキシ樹脂、イミド樹脂、ポリイミド樹脂、シ
リコーン樹脂、アクリル樹脂、フェノール樹脂、不飽和
ポリエステル樹脂等の熱硬化性樹脂からなるパッケージ
であり、その凹部100aの底面上に固体撮像素子10
1があり、この固体撮像素子101の下面側には放熱が
効果的に行われるようにするために該固体撮像素子10
1よりも大きな外形を有する金属製の放熱板(1)10
2がある。さらに、この放熱板102とつながっている
放熱板(2)103は、パッケージ100の開口部10
0bから外部に露出している。
In FIG. 5, reference numeral 100 denotes a package made of a thermosetting resin such as an epoxy resin, an imide resin, a polyimide resin, a silicone resin, an acrylic resin, a phenol resin, and an unsaturated polyester resin which are molded into a concave shape. The solid-state imaging device 10 is placed on the bottom of the concave portion 100a.
1 is provided on the lower surface side of the solid-state imaging device 101 in order to effectively dissipate heat.
Metal heat sink (1) 10 having an outer shape larger than 1
There are two. Further, the heat radiating plate (2) 103 connected to the heat radiating plate 102 is
0b is exposed to the outside.

【0005】したがって、固体撮像素子101で発生し
た熱はまず放熱板102に吸収され、さらに外側の放熱
板103を伝わってパッケージ100外に放出される。
Therefore, the heat generated by the solid-state image pickup device 101 is first absorbed by the heat radiating plate 102, and further transmitted through the outer heat radiating plate 103 to be radiated out of the package 100.

【0006】104及び105はパッケージ100と一
体成形されたアウターリード及びインナーリードであ
り、固体撮像素子101のボンディングパッドとインナ
ーリード105がアルミ細線あるいは金細線からなるワ
イヤー106により電気的に接続されている。また、パ
ッケージ100の上面には光学ガラスからなる透明キャ
ップ107が熱硬化型エポキシ樹脂等で接着されてお
り、これによってパッケージ100の内部が気密封止さ
れている。
Reference numerals 104 and 105 denote outer leads and inner leads which are integrally formed with the package 100. The bonding pads of the solid-state image pickup device 101 and the inner leads 105 are electrically connected by wires 106 made of an aluminum thin wire or a gold thin wire. I have. A transparent cap 107 made of optical glass is adhered to the upper surface of the package 100 with a thermosetting epoxy resin or the like, thereby hermetically sealing the inside of the package 100.

【0007】また、二つ目としてして固体撮像素子の温
度上昇を防ぐ方法の代りに温度上昇により発生する画素
欠陥を補正する方法があり、0次補正及び1次補間等の
欠陥補正法やPRN補正法が実用化されている。
As a second method, there is a method of correcting a pixel defect caused by a rise in temperature instead of a method of preventing a rise in temperature of a solid-state image pickup device, such as a defect correction method such as 0-order correction and primary interpolation. The PRN correction method has been put to practical use.

【0008】さらに、三つ目としてはパッケージの材質
をプラスチック(熱伝導率:2×10−4cal/(m
m・sec・℃))により熱伝導率の高いセラミック
(40×10−4cal/(mm・sec・℃))にす
る方法があり、このセラミックをパッケージ材料として
用いれば、固体撮像素子の動作時の発熱の殆どはパッケ
ージ裏面のベースフレームを通して大気中に放熱できる
ので、画素欠陥の信号レベルは問題にならない程度まで
小さくなる。
Third, the material of the package is made of plastic (thermal conductivity: 2 × 10 −4 cal / (m
m.sec..degree. C.)) to make a ceramic having a high thermal conductivity (40.times.10.sup.-4 cal / (mm.sec..degree. C.)). Most of the heat generated can be radiated to the atmosphere through the base frame on the back surface of the package, so that the signal level of the pixel defect is reduced to a level that does not cause any problem.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、上記の
ような従来の固体撮像素子パッケージにおいて、一つ目
の対策である放熱板により固体撮像素子の熱を外部に発
散する方法では、放熱板の分だけ部品が増えるため、装
置のコストが上がるとともに、放熱板の一部が外部に露
出するのでパッケージの気密性が損なわれ、その結果、
外部から水分が進入して耐湿性に劣るという問題点が発
生する。
However, in the above-described conventional solid-state imaging device package, the first measure of dissipating the heat of the solid-state imaging device to the outside by using a heat-radiating plate is the same as that of the heat-radiating plate. However, since the number of components increases, the cost of the device increases, and the airtightness of the package is impaired because a part of the heat sink is exposed to the outside.
There is a problem that moisture enters from outside and the moisture resistance is poor.

【0010】二つ目の対策である温度上昇により発生す
る画素欠陥を補正する方法では、温度変化に応じて補正
方法を変えなければならず、そのための温度センサーが
新たに必要になり、さらに欠陥画素のデータを記憶する
レジスターも必要になるので、部品点数が増えてコスト
がかさむという問題点が発生する。
In the second method of correcting a pixel defect caused by a rise in temperature, the correction method must be changed in accordance with a change in temperature. Therefore, a new temperature sensor is required. Since a register for storing pixel data is also required, there arises a problem that the number of components increases and the cost increases.

【0011】また、三つ目の対策であるパッケージ材質
をプラスチックから熱伝導率の高いセラミックにする方
法では、プラスチックと比較するとセラミックの方が価
格が高いことと比重が高い(セラミックの比重は2.0
〜2.6、プラスチックは1.0前後)ことを考える
と、近年の装置の低価格化、小型軽量化の要求に反する
ものであり、あまり良い方法とは言えない。
In the third measure, a method of changing the package material from plastic to ceramic having a high thermal conductivity, ceramic is more expensive and has higher specific gravity than plastic (ceramic has a specific gravity of 2%). .0
-2.6, plastic is around 1.0), which is contrary to the recent demand for lower price, smaller size and lighter weight of the apparatus, and is not a very good method.

【0012】本発明は、上記のような問題点を解決する
ためになされたものであり、部品を新たに追加すること
なく、画素欠陥の原因となる固体撮像素子の温度上昇を
防ぐことができ、且つ安価で小型軽量な固体撮像素子パ
ッケージを供給することを目的としている。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problems, and can prevent a temperature rise of a solid-state imaging device which causes a pixel defect without newly adding a component. It is another object of the present invention to provide an inexpensive, compact and lightweight solid-state imaging device package.

【0013】[0013]

【課題を解決するための手段】本発明に係る固体撮像素
子パッケージは、次のように構成したものである。
The solid-state image pickup device package according to the present invention is constructed as follows.

【0014】(1)固体撮像素子を収納するパッケージ
であって、表面に複数の凹凸形状部を設けた。
(1) A package for accommodating a solid-state image sensor, wherein a plurality of uneven portions are provided on the surface.

【0015】(2)上記(1)の構成において、凹凸形
状部を表面の一部に設けた。
(2) In the structure of the above (1), the uneven portion is provided on a part of the surface.

【0016】(3)上記(1)の構成において、凹凸形
状部を表面の全体に設けた。
(3) In the structure of the above (1), the uneven portion is provided on the entire surface.

【0017】(4)上記(1)ないし(3)何れかの構
成において、プラスチックで成形した。
(4) In any one of the above-mentioned constitutions (1) to (3), it is molded with plastic.

【0018】[0018]

【発明の実施の形態】以下、本発明の実施例を図1〜図
4について説明する。図1,図2は実施例の固体撮像素
子パッケージの外観を示す斜視図であり、図1は上から
見た場合、図2は下から見た場合を示している。また、
図3は基板に実装した状態を示す断面図、図4は熱の経
路を示す図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS. 1 and 2 are perspective views showing the appearance of the solid-state imaging device package of the embodiment. FIG. 1 shows a case when viewed from above, and FIG. 2 shows a case when viewed from below. Also,
FIG. 3 is a cross-sectional view showing a state of being mounted on a substrate, and FIG. 4 is a view showing a heat path.

【0019】図1〜図4において、1は固体撮像素子2
を収納するパッケージで、プラスチックで成形されてい
る。3は接着剤、4はインナーリード、5はアウターリ
ード、6はワイヤー、7はカバーガラス、8は基板であ
る。
1 to 4, reference numeral 1 denotes a solid-state imaging device 2.
This is a package for storing plastic. 3 is an adhesive, 4 is an inner lead, 5 is an outer lead, 6 is a wire, 7 is a cover glass, and 8 is a substrate.

【0020】本実施例の固体撮像素子パッケージ構造
は、図に示すように、凹型の形状に樹脂(プラスチッ
ク)成形されたパッケージ1の凹部1aに固体撮像素子
2がパッケージ1よりも熱伝導率が大きい接着剤3によ
り接着されている。固体撮像素子2の表面2aには撮影
光束が結像する結像エリアとその周りにボンディングパ
ッドがレイアウトされている。そして、このボンディン
グパッドとインナーリード4及びアウターリード5がワ
イヤー6により電気的に接続されている。また、アウタ
ーリード5は固体撮像素子2を制御するためのドライバ
ー等が実装されている基板8上に半田により実装されて
つながっている。
In the solid-state image pickup device package structure of the present embodiment, as shown in the figure, the solid-state image pickup device 2 has a thermal conductivity higher than that of the package 1 in the concave portion 1a of the package 1 formed of resin (plastic) in a concave shape. They are bonded by a large adhesive 3. On the surface 2a of the solid-state imaging device 2, an image forming area where a photographic light beam forms an image and bonding pads are laid out therearound. The bonding pad is electrically connected to the inner lead 4 and the outer lead 5 by a wire 6. The outer leads 5 are mounted by soldering on a substrate 8 on which a driver or the like for controlling the solid-state imaging device 2 is mounted.

【0021】さらに、パッケージ1の底部1bの表面側
には放熱効果を持たせるためのフィン状の複数の凹凸形
状部1cが存在し、固体撮像素子2から発生した熱は接
着剤3を通ってパッケージ1の底部1bから凹凸形状部
1cに伝達し、フラットな面にした場合よりも表面積が
大きな凹凸形状部1cから大気中に発散する(図4の経
路R1)。
Further, a plurality of fin-shaped uneven portions 1c for providing a heat radiation effect are present on the surface side of the bottom 1b of the package 1, and the heat generated from the solid-state imaging device 2 passes through the adhesive 3 The light is transmitted from the bottom 1b of the package 1 to the uneven portion 1c, and diverges into the atmosphere from the uneven portion 1c having a larger surface area than a flat surface (path R1 in FIG. 4).

【0022】また、このとき、パッケージ1の側壁部1
dの厚さTをパッケージ1の強度を保持できる程度まで
薄くしてあり、このため、パッケージ1の側壁部1dか
らのパッケージ1の上面1eへ伝達する経路(図4のR
2)が狭く、ここを通る熱量が少なくなり、固体撮像素
子2から発生する熱の殆どが経路R1を通るようにな
る。
At this time, the side wall 1 of the package 1
The thickness T of the package 1 is made thin enough to maintain the strength of the package 1. Therefore, a path (R in FIG. 4) for transmitting from the side wall 1d of the package 1 to the upper surface 1e of the package 1 is formed.
2) is narrow, the amount of heat passing therethrough decreases, and most of the heat generated from the solid-state imaging device 2 passes through the route R1.

【0023】さらに、パッケージ1の上面1eとカバー
ガラス7は熱硬化性の接着剤で結合されていて、パッケ
ージ1の内部が密閉状態になっており、ゴミ,チリ等が
入らないようになっている。
Further, the upper surface 1e of the package 1 and the cover glass 7 are bonded by a thermosetting adhesive, so that the inside of the package 1 is sealed, so that dust, dust and the like do not enter. I have.

【0024】このように、本実施例では固体撮像素子2
の温度上昇を放熱板といった部品を新たに増やすことな
く防止することができる。また、パッケージ1の材質を
プラスチックにしても、セラミック材質に見られる放熱
効果を持ち、安価で軽量な固体撮像素子パッケージが実
現できる。
As described above, in this embodiment, the solid-state imaging device 2
Temperature rise can be prevented without newly increasing components such as heat sinks. Further, even if the material of the package 1 is made of plastic, an inexpensive and lightweight solid-state image pickup device package having the heat radiation effect seen in the ceramic material can be realized.

【0025】なお、パッケージ1の表面の凹凸形状部1
cは、表面の一部あるいは全体に設けることができる。
The uneven portion 1 on the surface of the package 1
c can be provided on part or all of the surface.

【0026】[0026]

【発明の効果】以上説明したように、本発明によれば、
固体撮像素子を収納するパッケージ表面に複数の凹凸形
状部を設けたので、固体撮像素子の温度上昇を放熱板と
いった部品を新たに増やすことなく防止することがで
き、コストアップすることなく安価に温度上昇を防ぐこ
とができる。
As described above, according to the present invention,
Since a plurality of concave-convex portions are provided on the surface of the package that houses the solid-state imaging device, it is possible to prevent the temperature of the solid-state imaging device from rising without adding additional components such as heat sinks, and to reduce the temperature without increasing the cost. The rise can be prevented.

【0027】また、パッケージの材質をプラスチックと
することにより、高価で比重の高いセラミックをパッケ
ージ材料に使用しなくともセラミック材質に見られる放
熱効果を持たせることができ、安価で軽量な固体撮像素
子パッケージが実現できる。
Further, by using plastic as the material of the package, the heat radiation effect seen in the ceramic material can be provided without using expensive and high specific gravity ceramic for the package material. Package can be realized.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の実施例による固体撮像素子パッケー
ジの外観を示す斜視図
FIG. 1 is a perspective view showing the appearance of a solid-state imaging device package according to an embodiment of the present invention.

【図2】 本発明の実施例による固体撮像素子パッケー
ジの外観を示す斜視図
FIG. 2 is a perspective view illustrating an appearance of a solid-state imaging device package according to an embodiment of the present invention.

【図3】 実施例の固体撮像素子パッケージを基板に実
装した状態を示す断面図
FIG. 3 is a cross-sectional view illustrating a state where the solid-state imaging device package according to the embodiment is mounted on a substrate.

【図4】 実施例の固体撮像素子パッケージの熱の経路
を示す説明図
FIG. 4 is an explanatory diagram illustrating heat paths of the solid-state imaging device package according to the embodiment;

【図5】 従来例の構成を示す断面図FIG. 5 is a sectional view showing a configuration of a conventional example.

【符号の説明】[Explanation of symbols]

1 パッケージ 1c 凹凸形状部 2 固体撮像素子 3 接着剤 8 基板 DESCRIPTION OF SYMBOLS 1 Package 1c Irregular shape part 2 Solid-state image sensor 3 Adhesive 8 Substrate

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 固体撮像素子を収納するパッケージであ
って、表面に複数の凹凸形状部を設けたことを特徴とす
る固体撮像素子パッケージ。
1. A package for accommodating a solid-state imaging device, wherein a plurality of uneven portions are provided on the surface.
【請求項2】 凹凸形状部を表面の一部に設けたことを
特徴とする請求項1記載の固体撮像素子パッケージ。
2. The solid-state imaging device package according to claim 1, wherein the uneven portion is provided on a part of the surface.
【請求項3】 凹凸形状部を表面の全体に設けたことを
特徴とする請求項1記載の固体撮像素子パッケージ。
3. The solid-state imaging device package according to claim 1, wherein the uneven portion is provided on the entire surface.
【請求項4】 プラスチックで成形したことを特徴とす
る請求項1ないし3何れか記載の固体撮像素子パッケー
ジ。
4. The solid-state imaging device package according to claim 1, wherein the package is formed of plastic.
JP33222699A 1999-11-24 1999-11-24 Solid image pickup element package Withdrawn JP2001148437A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33222699A JP2001148437A (en) 1999-11-24 1999-11-24 Solid image pickup element package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33222699A JP2001148437A (en) 1999-11-24 1999-11-24 Solid image pickup element package

Publications (1)

Publication Number Publication Date
JP2001148437A true JP2001148437A (en) 2001-05-29

Family

ID=18252591

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33222699A Withdrawn JP2001148437A (en) 1999-11-24 1999-11-24 Solid image pickup element package

Country Status (1)

Country Link
JP (1) JP2001148437A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008064863A (en) * 2006-09-05 2008-03-21 Sony Corp Camera shake correction mechanism and imaging apparatus
US7514672B2 (en) 2005-02-15 2009-04-07 Sumitomo Chemical Company, Limited Case for accommodating solid-state imaging device and solid-state imaging apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7514672B2 (en) 2005-02-15 2009-04-07 Sumitomo Chemical Company, Limited Case for accommodating solid-state imaging device and solid-state imaging apparatus
JP2008064863A (en) * 2006-09-05 2008-03-21 Sony Corp Camera shake correction mechanism and imaging apparatus
US7961220B2 (en) 2006-09-05 2011-06-14 Sony Corporation Camera shake correction mechanism and image capture apparatus, including heat dissipating mechanism

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