JP2001118880A - First bonding point inspection method in wire bonding - Google Patents

First bonding point inspection method in wire bonding

Info

Publication number
JP2001118880A
JP2001118880A JP29505799A JP29505799A JP2001118880A JP 2001118880 A JP2001118880 A JP 2001118880A JP 29505799 A JP29505799 A JP 29505799A JP 29505799 A JP29505799 A JP 29505799A JP 2001118880 A JP2001118880 A JP 2001118880A
Authority
JP
Japan
Prior art keywords
ball
bonding
size
detected
bonding point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP29505799A
Other languages
Japanese (ja)
Other versions
JP3557965B2 (en
Inventor
Hirofumi Matsuzaki
浩文 松▲崎▼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP29505799A priority Critical patent/JP3557965B2/en
Publication of JP2001118880A publication Critical patent/JP2001118880A/en
Application granted granted Critical
Publication of JP3557965B2 publication Critical patent/JP3557965B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • HELECTRICITY
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    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
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    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/859Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop
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    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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    • H01L2924/1016Shape being a cuboid
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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a first bonding point inspection method in a wire bonding, in which the position of a ball and the size of the ball can be detected stably. SOLUTION: In a first bonding point inspecting method, which detects the size of a ball bonded to a bonding point on a pad on a chip and the position of the ball, an image of a double circle, which consists of an outer circle to show the outline of the external shape of the ball, and an inner circle to show the inside of an impression due to a capillary tool, is acquired, first the inner circle to show the inside of the impression due to the capillary tool is detected, the outer circle to show the outline of the external shape of the ball is detected by searching the outside of this impression, then the position coordinates of the ball and the size of the ball are detected from the detected outer circle, to show the outside of the external shape of the ball. Hereby, even in the case where the ball is crushed and even in the case, where the position of the ball is shifted and the ball is protruded from the pad, the position coordinates of the ball and the size of the ball can be stably detected.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【発明の属する技術分野】本発明は、チップと基板を接
続するワイヤボンディングにおけるボンディング点の検
査方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a bonding point inspection method in wire bonding for connecting a chip and a substrate.

【従来の技術】チップと、チップが搭載されたリードフ
レームやプリント基板などの基板をワイヤで接続するワ
イヤボンディングは、次のようにして行われる。まず、
キャピラリツールの下端部から下方へ導出されたワイヤ
の下端部とトーチとの間で電気的にスパークを発生さ
せ、ワイヤの下端部にボールを形成した後、キャピラリ
ツールを下降させてボールを基板に搭載されたチップの
上面にボンディングする(以下、「ファーストボンディ
ング」という)。次いで、キャピラリツールを一旦上方
に移動させた後に、キャピラリツールの下端部を所定の
軌跡を描かせながら基板のパッドに向かって下降させワ
イヤを基板にボンディングする(以下、「セカンドボン
ディング」という)。そしてワイヤボンディング後に
は、チップやワイヤを保護するため、樹脂封止が行われ
る。この樹脂封止に先立って、ワイヤボンディングの状
態を確認するための検査が行われ、正常なワイヤボンデ
ィングが行われているか否かが検査される。この検査で
は、ファーストボンディング点については、ボンディン
グされたボールの大きさおよび位置が検出対象となる。
これらを検出することにより、ボンディングが正常に行
われたか否かを検査できるとともに、ボンディング圧力
やボンディング位置など、ボンディング装置のボンディ
ング条件の設定に何らかの異常があるか否かを推定する
ことができる。ところで、ボールやキャピラリツールの
圧痕の位置や大きさを検出する方法として、画像認識に
よる方法が知られている。この方法は、ボンディング点
をカメラで撮像し、得られた画像上でのボールとパッド
とのコントラスト差に基づいてボールの形状を求め、こ
れによりボールのサイズや位置を検出するものである。
2. Description of the Related Art Wire bonding for connecting a chip to a substrate, such as a lead frame or a printed circuit board, on which the chip is mounted by wires is performed as follows. First,
An electrical spark is generated between the lower end of the wire drawn down from the lower end of the capillary tool and the torch, and a ball is formed at the lower end of the wire. Bonding is performed on the upper surface of the mounted chip (hereinafter, referred to as “first bonding”). Next, after once moving the capillary tool upward, the lower end of the capillary tool is lowered toward the pad of the substrate while drawing a predetermined trajectory to bond the wire to the substrate (hereinafter, referred to as “second bonding”). After the wire bonding, resin sealing is performed to protect the chips and wires. Prior to this resin sealing, an inspection for confirming the state of the wire bonding is performed, and whether or not the normal wire bonding is performed is inspected. In this inspection, the size and position of the bonded ball are to be detected at the first bonding point.
By detecting these, it can be checked whether or not the bonding has been performed normally, and it can be estimated whether or not there is any abnormality in the setting of the bonding conditions of the bonding apparatus such as the bonding pressure and the bonding position. By the way, as a method of detecting the position and size of an indentation of a ball or a capillary tool, a method based on image recognition is known. In this method, a bonding point is imaged by a camera, and the shape of the ball is determined based on the contrast difference between the ball and the pad on the obtained image, thereby detecting the size and position of the ball.

【発明が解決しようとする課題】しかしながら、ファー
ストボンディング点における上記従来の検査方法には、
以下に述べるような問題点があった。ファーストボンデ
ィングでは、ワイヤの下端部に形成されたボールをキャ
ピラリツールによってパッドに押し付けるが、このとき
押しつけ力によってはボールが押しつぶされて正常な円
形状とならない場合がある。そしてこのような場合に
は、キャピラリツールによってつぶされた部分は画像上
では光沢部分になり、パッドとのコントラスト差が生じ
ないため精度のよいボールの近似円を求めることができ
ない。また、つぶれたボールの縁部がパッドからはみ出
したような場合には、不完全な部分円弧から近似円を求
める処理を行うが、この近似の結果が実際の円弧形状と
大きく異なる場合がある。このように従来のボンディン
グ点の検査方法には、ボールのつぶれやはみ出しが大き
い場合には、ボール形状を正確に検出できず、したがっ
てボール位置やサイズを正しく検出できず正常な検査が
困難であるという問題点があった。そこで本発明は、ボ
ールの位置やサイズを安定して検出できるワイヤボンデ
ィングにおけるファーストボンディング点の検査方法を
提供することを目的とする。
However, the above-described conventional inspection method at the first bonding point includes:
There were the following problems. In the first bonding, a ball formed at the lower end of a wire is pressed against a pad by a capillary tool. At this time, depending on the pressing force, the ball may be crushed and may not have a normal circular shape. In such a case, the portion crushed by the capillary tool becomes a glossy portion on the image, and there is no contrast difference with the pad, so that it is not possible to obtain an accurate approximate circle of the ball. When the edge of the crushed ball protrudes from the pad, a process of obtaining an approximate circle from an incomplete partial arc is performed, but the result of this approximation may be significantly different from the actual arc shape. As described above, according to the conventional bonding point inspection method, when the ball is greatly crushed or protruded, the ball shape cannot be accurately detected, and therefore, the ball position and size cannot be correctly detected, and it is difficult to perform a normal inspection. There was a problem. Therefore, an object of the present invention is to provide a method of inspecting a first bonding point in wire bonding, which can stably detect the position and size of a ball.

【課題を解決するための手段】請求項1記載のワイヤボ
ンデイングにおけるボンディング点の検査方法は、チッ
プのパッドのボンディング点をカメラにより撮像し、撮
像結果を画像処理することにより前記ボンディング点に
ボンディングされたボールのサイズとボール位置を検出
するワイヤボンディングにおけるファーストボンディン
グ点の検査方法であって、前記ボールに生じたキャピラ
リツールによる圧痕を検出する圧痕検出工程と、この圧
痕よりも外側をサーチすることにより前記ボールの輪郭
を検出する輪郭検出工程と、検出されたボールの輪郭よ
りボールの位置座標およびサイズを検出する位置・サイ
ズ検出工程とを含む。請求項2記載のワイヤボンデイン
グにおけるボンディング点の検査方法は、請求項1記載
のワイヤボンデイングにおけるボンディング点の検査方
法であって、前記圧痕検出工程において圧痕検出結果に
基づいてボールの仮の中心座標と仮のサイズを求め、前
記輪郭検出工程において輪郭が検出されないならば、前
記仮の中心座標と仮のサイズをボールの中心座標および
サイズとして出力するようにした。本発明によれば、ボ
ールに生じたキャピラリツールによる圧痕を検出する圧
痕検出工程の後にこの圧痕の外側をサーチしてボールの
輪郭を検出することにより、ボールがつぶされて画像上
で2重円弧状になる場合においても、またボール位置が
ずれて画像からはみ出している場合においても、ボール
の位置座標およびサイズを安定して検出することができ
る。
According to a first aspect of the present invention, there is provided a method for inspecting a bonding point in wire bonding, wherein a bonding point of a chip pad is imaged by a camera, and the imaged result is image-processed to bond to the bonding point. A method for inspecting a first bonding point in wire bonding for detecting a size and a ball position of a ball, wherein an indentation detecting step of detecting an indentation by a capillary tool generated in the ball, and searching outside the indentation by searching for an indentation The method includes a contour detecting step of detecting a contour of the ball, and a position / size detecting step of detecting a position coordinate and a size of the ball from the detected contour of the ball. A method for inspecting a bonding point in wire bonding according to claim 2 is the method for inspecting a bonding point in wire bonding according to claim 1, wherein a temporary center coordinate of the ball is determined based on an indentation detection result in the indentation detecting step. A provisional size is obtained, and if no contour is detected in the contour detection step, the provisional center coordinates and the provisional size are output as the center coordinates and size of the ball. According to the present invention, after the indentation detecting step of detecting the indentation of the ball by the capillary tool, the outside of the indentation is searched to detect the contour of the ball, so that the ball is crushed and the double circle is formed on the image. The position coordinates and size of the ball can be stably detected even when the ball is in an arc shape or when the ball position is shifted and protrudes from the image.

【発明の実施の形態】次に、本発明の実施の形態を図面
を参照して説明する。図1は本発明の一実施の形態のワ
イヤボンディングにおけるボンディング点の検査装置の
構成を示すブロック図、図2は同ワイヤボンディングが
行われる基板の平面図、図3は同ファーストボンディン
グ点の拡大側面図、図4は同ファーストボンディング点
の画像図、図5は同ファーストボンディング点のボール
検出処理のフロー図、図6、図7、図8、図9、図1
0、図11は同ファーストボンディング点のボール検出
処理の説明図である。まず、図1を参照してワイヤボン
ディングにおけるボンディング点の検査装置の構成を説
明する。図1において、ステージ1上には基板2が載置
されている。基板2上にはチップ4が搭載されている。
基板2のパッド3とチップ4のパッド5はワイヤ6によ
って接続されている。ステージ1の上方にはXテーブル
9及びYテーブル10より成る可動テーブル11が配設
されている。可動テーブル11にはカメラ8が装着され
ている。カメラ8は可動テーブル11によりX方向やY
方向に水平移動し、チップ4と基板2を接続するワイヤ
6を撮像する。カメラ8の下方には照明部7が装着され
ている。照明部7は撮像時に基板2やチップ4を上方よ
り照明する。カメラ8にはAD変換部12が接続されて
いる。AD変換部12はカメラ8に取り込まれた撮像デ
ータを画像データにAD変換する。画像記憶部13はA
D変換された画像データを記憶する。検査処理部14は
ボンディング点の画像データに基づき、ボールやキャピ
ラリツールの圧痕のエッジのサーチや、求められたエッ
ジ点の近似円演算などの処理を行う。記憶部15は、ボ
ンディング座標データ、ワイヤサイズなどワイヤボンデ
ィング時に使用したデータ及び検出されたデータや判定
値などを記憶する。表示部16は検査画面を表示するモ
ニタである。次に、図2を参照してワイヤボンディング
点について説明する。図2において、基板2上には、チ
ップ4が搭載されている。チップ4の上面には縁部に沿
って多数のパッド5形成されている。また、基板2上に
はチップ4のそれぞれのパッド5に対応した位置にパッ
ド3が形成されている。チップ4のパッド5と基板2の
パッド3を接続するようにワイヤ6が放射状にボンディ
ングされている。チップ4のパッド5のボンディング点
はファーストボンディング点20であり、基板2のパッ
ド3のボンディング点は2ndボンディング点30であ
る。ここでファーストボンディング点におけるボールの
状態について説明する。ファーストボンディング点にお
いては、スパークにより形成されたボールをキャピラリ
ツールによってチップ4のパッド5に圧着することによ
りボンディングが行われる。ボンディングが正常に行わ
れている場合には、図3(a)に示すようにボールBは
パッド5のほぼ中央部に略球形状の外形を保ったままボ
ンディングされる。ところが圧着荷重やボンディング位
置などの条件が変動した場合には、必ずしも図3(a)
に示すような正常なボール形状とはならず、ボールBが
キャピラリツールにより押しつぶされ非正常なボール形
状となる場合がある。この場合には、図3(b)に示す
ようにボールBが半ば押しつぶされキャピラリツールに
よる圧痕部分が平らな平坦部Baとなり、ボールB全体
の形状は段差を有する変則的な形状となる。また、ボン
ディング位置がずれた場合には、図3(c)に示すよう
にボールBはパッド5の一方側の端部に偏って圧着され
る。次に、このボンディング点の検査装置によるファー
ストボンディング点の検査について各図を参照して説明
する。まず、図1に示すようにチップ4が搭載された基
板2がステージ1上に載置される。次に可動テーブル1
1を駆動してカメラ8を検査対象である各ボンディング
点20,30の上方に移動させ、照明部を点灯してカメ
ラ8により各ボンディング点20,30を撮像する。撮
像されたデータはAD変換部12を経て画像記憶部13
に送られ、画像データとして記憶される。この画像デー
タは、検査処理部14に送られ、以下に説明する各ボン
ディング点の画像データの検査処理が行われる。ここ
で、撮像によって得られるファーストボンディング点の
画像について図3、図4を参照して説明する。図3
(a)、(b)に示す下向きの矢印aは照明光の入射方
向を、上向きの矢印bは反射光の反射方向を示してい
る。パッド5の表面や圧痕部分Baに入射する光は上方
に反射し、ワイヤ6やボールBの側面に入射する光は斜
め方向に反射するため、カメラ8によって上方から撮像
された画像データ上では、パッド5や圧痕部分Baと、
ワイヤ6およびボール6aの側面とでは輝度が異なる。
したがって、画像データを2値化処理することにより、
図4(a)に示すように、パッド3面を明像としボール
Bやワイヤ6を暗像とする画像を得る。また、ボンディ
ング点が図3(b)に示す状態の場合には、図4(b)
に示すように、パッド3面や圧痕部分Baを明像としワ
イヤ6とボールBの側面部分Bbを暗像とする略2重円
状の画像を得る。そして、図3(c)に示すようにボン
ディング位置がずれている場合には、図4(c)に示す
ようにボールBとパッド5の相対位置が偏った画像を得
る。このようにして得られた画像データよりボールBの
位置と大きさを求める方法について各図を参照して説明
する。ここで、図4(a)に示すような正常状態でボン
ディングが行われた場合については、従来より行われて
いる輪郭検出による検出方法で特に難点はないが、図4
(b)、(c)のようなボールBが半ば押し潰されてい
る場合や位置が大きくずれている場合には、従来の輪郭
検出による方法では適切なボール位置やサイズの検出が
困難である。以下、このような場合を対象としたボール
の位置およびサイズ検出方法について図5のフローに沿
って各図を参照して説明する。最初にキャピラリツール
によって生じた圧痕(ツール圧痕)を検出する圧痕検出
工程について説明する。図5において、まず四角パター
ンを用いてツール圧痕の一次検出を行う(ST1)。こ
の一次検出においては、図6に示すように視野内にツー
ル圧痕の内側の暗像部B1の大きさに相当するリファレ
ンスパターンが設定される。すなわちツール圧痕の内側
境界を示す円(内円)に内接する大きさの四角形状のリ
ファレンスパターンRが設定される。そしてこのリファ
レンスパターンRを用いたパターンマッチングによって
圧痕を検出する際には、視野内の対照エリアを移動させ
てサーチすることにより、リファレンスパターンRが内
円に内接する位置を検出し、このときの対照エリアの位
置を以て圧痕の位置とする。この対照エリア設定に際し
ては、ワイヤ6が延出していることによるノイズを除去
するため、ワイヤ延出方向と反対側の所定位置に参照ウ
インドウWが設定される。すなわち、パターンマッチン
グにおいてこの参照ウインドウW内が明像部分であるこ
とを条件として圧痕検出が行われる。なおツール圧痕の
一次検出の方法としては、パターンマッチングの外に対
照エリア内の白黒画素比率を用いて検出する方法でも良
い。次いで、輪郭検出によるツール圧痕の二次検出を行
う(ST2)。図7に示すように、(ST1)にて検出
された圧痕内部から外側方向にサーチして輪郭点Paを
検出することにより、内円の輪郭を検出する。次に、検
出された輪郭に基づきボールBの仮の中心座標とボール
Bの仮のサイズを算出する(ST3)。ここでボールB
の仮の中心座標と仮のサイズとは、ボールBが押しつぶ
されたことによって画像に現れる2重円の内円の中心点
Bcの座標と直径dを意味している。次に、ボールの輪
郭を検出する輪郭検出工程について説明する。ここでは
ボールBの真の形状を検出するための処理、すなわち、
ツール圧痕よりも外側の円(外円)を検出するための処
理を行う。まず、ボールBの輪郭検出のためのスタート
点Psを検出する(ST4)。ここでは、既に検出され
た内円の中心点Bcから外側にサーチを行い、外円の輪
郭点を輪郭追跡のスタート点Psとして求める。この場
合、図8に示すように、サーチ方向を斜め45度の4方
向に方向に設定し、パッド5の外周によるノイズを拾う
確率をできるだけ減少させるようにしている。ここで、
スタート点Psが検出されたか否かの判断を行う(ST
5)。前述のように、正常にボンディングが行われた場
合には画像には2重円は現れず、したがって一次検出に
よって検出される内円の外側に位置することを条件とす
るボールの輪郭は検出されない。この場合には後述する
ステップに進む。そしてここでスタート点Psが検出さ
れた場合には、検出されたスタート点Psより、輪郭追
跡によりボールBの輪郭を検出する(ST6)。この輪
郭追跡においては、最初のスタート点から所定ピッチで
連続して輪郭点Pbが検出される場合、すなわち図9に
示すように一筆書きで輪郭が検出可能な場合と、図4
(c)に示すようにボンディング位置がずれていること
により輪郭点を連続して検出することができない場合と
が存在する。前者の場合には、求められた輪郭点Pbに
基づいて近似円を求める演算を行い、また後者の場合に
は、図10に示すように(ST4)にて検出された複数
のスタート点Psを起点としてそれぞれ検出された輪郭
点Pbによって構成される輪郭線の断片をつなぎ合わせ
ることにより近似円を求める処理を行う。いずれの場合
においても、この輪郭検出によりボールBの輪郭をしめ
す近似円が求められる。次に、位置・サイズ検出工程に
ついて説明する。ここでは検出されたボールの輪郭より
ボールの中心座標と直径とを算出する(ST7)。図1
1に示すように輪郭点Pbより求められた近似円CRの
中心点Cの座標と、近似円CRの直径Dを求める。ま
た、(ST5)においてスタート点Psが検出されなか
ったならば、すなわちボールBが押しつぶされた圧痕が
検出されないならば、図3(b)に示すような正常なボ
ンディングが行われていると判断し、(ST3)におい
て求められた仮のボールの中心座標と仮のサイズをボー
ルBの中心座標とボールの直径に置き換える(ST
8)。そして、ボールの中心座標とボールの直径を出力
して(ST9)、ボール位置・サイズの検出処理を終了
する。この後、出力されたボール位置およびボールサイ
ズを基準データと比較することにより、ファーストボン
ディング点の検査が行われる。このようにして得られた
検査結果は、個々の検査対象についての合否判定に用い
られるとともに、連続して得られる多数の検査結果のデ
ータ傾向を解析することにより、ボンディング装置にお
ける異常の有無判断のためのデータとして用いられる。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a block diagram showing a configuration of a bonding point inspection apparatus in wire bonding according to an embodiment of the present invention, FIG. 2 is a plan view of a substrate on which the wire bonding is performed, and FIG. 3 is an enlarged side view of the first bonding point. FIG. 4, FIG. 4 is an image diagram of the first bonding point, FIG. 5 is a flowchart of the ball detection processing of the first bonding point, FIG. 6, FIG. 7, FIG.
0 and FIG. 11 are explanatory diagrams of the ball detection processing at the first bonding point. First, a configuration of a bonding point inspection apparatus in wire bonding will be described with reference to FIG. In FIG. 1, a substrate 2 is placed on a stage 1. A chip 4 is mounted on the substrate 2.
The pads 3 on the substrate 2 and the pads 5 on the chip 4 are connected by wires 6. A movable table 11 including an X table 9 and a Y table 10 is disposed above the stage 1. The camera 8 is mounted on the movable table 11. The camera 8 is moved by the movable table 11 in the X direction and the Y direction.
It moves horizontally in the direction to image the wire 6 connecting the chip 4 and the substrate 2. A lighting unit 7 is mounted below the camera 8. The illumination unit 7 illuminates the substrate 2 and the chip 4 from above during imaging. An AD converter 12 is connected to the camera 8. The AD converter 12 converts the image data captured by the camera 8 into image data. The image storage unit 13 is A
The D-converted image data is stored. The inspection processing unit 14 performs processes such as searching for an edge of an indentation of a ball or a capillary tool, and calculating an approximate circle of the obtained edge point based on the image data of the bonding point. The storage unit 15 stores bonding coordinate data, data used during wire bonding such as wire size, detected data, determination values, and the like. The display unit 16 is a monitor that displays an inspection screen. Next, the wire bonding point will be described with reference to FIG. In FIG. 2, a chip 4 is mounted on a substrate 2. A large number of pads 5 are formed on the upper surface of the chip 4 along the edge. The pads 3 are formed on the substrate 2 at positions corresponding to the respective pads 5 of the chip 4. Wires 6 are radially bonded so as to connect the pads 5 of the chip 4 and the pads 3 of the substrate 2. The bonding point of the pad 5 of the chip 4 is a first bonding point 20, and the bonding point of the pad 3 of the substrate 2 is a second bonding point 30. Here, the state of the ball at the first bonding point will be described. At the first bonding point, bonding is performed by pressing the ball formed by the spark onto the pad 5 of the chip 4 using a capillary tool. When the bonding is performed normally, the ball B is bonded to a substantially central portion of the pad 5 while maintaining a substantially spherical outer shape, as shown in FIG. However, when the conditions such as the pressure load and the bonding position change, the condition shown in FIG.
In some cases, the ball B does not have a normal ball shape, and the ball B is crushed by the capillary tool to have an abnormal ball shape. In this case, as shown in FIG. 3B, the ball B is crushed halfway, and the indented portion formed by the capillary tool becomes a flat flat portion Ba, and the entire shape of the ball B has an irregular shape having a step. Further, when the bonding position is shifted, the ball B is pressure-bonded to one end of the pad 5 as shown in FIG. Next, the inspection of the first bonding point by the bonding point inspection apparatus will be described with reference to the drawings. First, as shown in FIG. 1, the substrate 2 on which the chip 4 is mounted is placed on the stage 1. Next, the movable table 1
The camera 1 is driven to move the camera 8 above the bonding points 20 and 30 to be inspected, the illumination unit is turned on, and the camera 8 images the bonding points 20 and 30. The captured data passes through an AD conversion unit 12 and is stored in an image storage unit 13.
And stored as image data. The image data is sent to the inspection processing unit 14, and the inspection processing of the image data of each bonding point described below is performed. Here, an image of a first bonding point obtained by imaging will be described with reference to FIGS. FIG.
(A) and (b) indicate the direction of incidence of illumination light, and the upward arrow b indicates the direction of reflection of reflected light. The light incident on the surface of the pad 5 and the indented portion Ba is reflected upward, and the light incident on the side surfaces of the wire 6 and the ball B is reflected in an oblique direction. Therefore, on the image data captured from above by the camera 8, With the pad 5 and the indentation part Ba,
The brightness differs between the side surfaces of the wire 6 and the ball 6a.
Therefore, by binarizing the image data,
As shown in FIG. 4A, an image in which the surface of the pad 3 is a bright image and the ball B and the wire 6 are dark images is obtained. When the bonding point is in the state shown in FIG.
As shown in FIG. 7, a substantially double circular image is obtained in which the surface of the pad 3 and the indented portion Ba are bright images and the side portions Bb of the wire 6 and the ball B are dark images. When the bonding position is shifted as shown in FIG. 3C, an image in which the relative position between the ball B and the pad 5 is deviated as shown in FIG. A method for obtaining the position and size of the ball B from the image data thus obtained will be described with reference to the drawings. Here, in the case where bonding is performed in a normal state as shown in FIG. 4A, there is no particular difficulty in the conventional detection method using contour detection.
In the case where the ball B is partially crushed or the position is largely displaced as in (b) and (c), it is difficult to detect an appropriate ball position and size by the conventional method using contour detection. . Hereinafter, a method of detecting the position and size of the ball for such a case will be described with reference to the drawings along the flow of FIG. First, an indentation detection step of detecting an indentation (tool indentation) generated by a capillary tool will be described. In FIG. 5, first, primary detection of a tool impression is performed using a square pattern (ST1). In this primary detection, a reference pattern corresponding to the size of the dark image portion B1 inside the tool impression is set in the field of view as shown in FIG. That is, a square reference pattern R having a size inscribed in a circle (inner circle) indicating the inner boundary of the tool indentation is set. When an indentation is detected by pattern matching using the reference pattern R, the position where the reference pattern R is inscribed in the inner circle is detected by moving the control area in the field of view and searching. The position of the impression area is defined as the position of the control area. In setting the reference area, a reference window W is set at a predetermined position on the opposite side to the wire extending direction in order to remove noise due to the extension of the wire 6. That is, in pattern matching, indentation detection is performed on the condition that the inside of the reference window W is a bright image portion. As a primary detection method of the tool indentation, a method of detecting using the black-and-white pixel ratio in the reference area in addition to the pattern matching may be used. Next, secondary detection of tool impressions is performed by contour detection (ST2). As shown in FIG. 7, the contour of the inner circle is detected by searching the inward direction from the inside of the indentation detected in (ST1) and detecting the contour point Pa. Next, the temporary center coordinates of the ball B and the temporary size of the ball B are calculated based on the detected outline (ST3). Here ball B
The temporary center coordinates and the temporary size mean the coordinates and the diameter d of the center point Bc of the inner circle of the double circle appearing in the image when the ball B is crushed. Next, a contour detecting step of detecting the contour of the ball will be described. Here, a process for detecting the true shape of the ball B, that is,
Processing for detecting a circle (outer circle) outside the tool impression is performed. First, a start point Ps for detecting the contour of the ball B is detected (ST4). Here, a search is performed outward from the already detected center point Bc of the inner circle, and the contour point of the outer circle is obtained as the contour tracking start point Ps. In this case, as shown in FIG. 8, the search direction is set to four directions at an angle of 45 degrees so that the probability of picking up noise due to the outer periphery of the pad 5 is reduced as much as possible. here,
It is determined whether or not the start point Ps has been detected (ST
5). As described above, when bonding is performed normally, no double circle appears in the image, and therefore, the outline of the ball provided that it is located outside the inner circle detected by the primary detection is not detected. . In this case, the process proceeds to the step described later. When the start point Ps is detected, the contour of the ball B is detected from the detected start point Ps by contour tracing (ST6). In this contour tracking, a case where the contour points Pb are continuously detected at a predetermined pitch from the first start point, that is, a case where the contour can be detected with one stroke as shown in FIG.
As shown in (c), there is a case where the contour point cannot be detected continuously due to a shift in the bonding position. In the former case, an operation for obtaining an approximate circle is performed based on the obtained contour point Pb. In the latter case, a plurality of start points Ps detected in (ST4) are determined as shown in FIG. A process of obtaining an approximate circle by connecting pieces of a contour line formed by the contour points Pb detected as the starting points is performed. In any case, an approximate circle indicating the outline of the ball B is obtained by this outline detection. Next, the position / size detection step will be described. Here, the center coordinates and the diameter of the ball are calculated from the detected outline of the ball (ST7). FIG.
As shown in FIG. 1, the coordinates of the center point C of the approximate circle CR determined from the contour point Pb and the diameter D of the approximate circle CR are determined. If the start point Ps is not detected in (ST5), that is, if the indentation of the crushed ball B is not detected, it is determined that the normal bonding as shown in FIG. 3B is performed. Then, the center coordinates and the temporary size of the temporary ball obtained in (ST3) are replaced with the center coordinates of the ball B and the diameter of the ball (ST3).
8). Then, the center coordinates of the ball and the diameter of the ball are output (ST9), and the detection processing of the ball position / size is completed. Then, the first bonding point is inspected by comparing the output ball position and ball size with the reference data. The inspection results obtained in this way are used for pass / fail judgment of each inspection object, and by analyzing the data tendency of a large number of continuously obtained inspection results, it is possible to determine whether there is an abnormality in the bonding apparatus. Is used as data for

【発明の効果】本発明によれば、ボールに生じたキャピ
ラリツールによる圧痕を検出する圧痕検出工程の後にこ
の圧痕の外側をサーチしてボールの輪郭を検出するよう
にしたので、ボールがつぶされて画像上で2重円状にな
る場合においても、またボール位置がずれて画像からは
み出している場合においても、ボールの位置座標および
サイズを安定して検出することができる。
According to the present invention, the contour of the ball is detected by searching outside the indentation after the indentation detecting step of detecting the indentation of the ball by the capillary tool, so that the ball is crushed. Thus, even when the image is formed into a double circle on the image, or when the ball position is shifted and protrudes from the image, the position coordinates and the size of the ball can be detected stably.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態のワイヤボンディングに
おけるボンディング点の検査装置の構成を示すブロック
FIG. 1 is a block diagram showing a configuration of a bonding point inspection apparatus in wire bonding according to an embodiment of the present invention.

【図2】本発明の一実施の形態のワイヤボンディングが
行われる基板の平面図
FIG. 2 is a plan view of a substrate on which wire bonding is performed according to an embodiment of the present invention.

【図3】本発明の一実施の形態のファーストボンディン
グ点の拡大側面図
FIG. 3 is an enlarged side view of a first bonding point according to the embodiment of the present invention;

【図4】本発明の一実施の形態のファーストボンディン
グ点の画像図
FIG. 4 is an image diagram of a first bonding point according to the embodiment of the present invention;

【図5】本発明の一実施の形態のファーストボンディン
グ点のボール検出処理のフロー図
FIG. 5 is a flowchart of a first bonding point ball detection process according to one embodiment of the present invention;

【図6】本発明の一実施の形態のファーストボンディン
グ点のボール検出処理の説明図
FIG. 6 is an explanatory diagram of a first bonding point ball detection process according to one embodiment of the present invention;

【図7】本発明の一実施の形態のファーストボンディン
グ点のボール検出処理の説明図
FIG. 7 is an explanatory diagram of ball detection processing at a first bonding point according to the embodiment of the present invention;

【図8】本発明の一実施の形態のファーストボンディン
グ点のボール検出処理の説明図
FIG. 8 is an explanatory diagram of a first bonding point ball detection process according to one embodiment of the present invention;

【図9】本発明の一実施の形態のファーストボンディン
グ点のボール検出処理の説明図
FIG. 9 is an explanatory diagram of a first bonding point ball detection process according to one embodiment of the present invention;

【図10】本発明の一実施の形態のファーストボンディ
ング点のボール検出処理の説明図
FIG. 10 is an explanatory diagram of ball detection processing of a first bonding point according to one embodiment of the present invention;

【図11】本発明の一実施の形態のファーストボンディ
ング点のボール検出処理の説明図
FIG. 11 is an explanatory diagram of a first bonding point ball detection process according to one embodiment of the present invention;

【符号の説明】[Explanation of symbols]

2 基板 4 チップ 5 パッド 6 ワイヤ 8 カメラ 20 ファーストボンディング点 B ボール Ba 平坦部 Bc 中心点 Pa,Pb 輪郭点 2 substrate 4 chip 5 pad 6 wire 8 camera 20 first bonding point B ball Ba flat part Bc center point Pa, Pb contour point

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】チップのパッドのボンディング点をカメラ
により撮像し、撮像結果を画像処理することにより前記
ボンディング点にボンディングされたボールのサイズと
ボール位置を検出するワイヤボンディングにおけるファ
ーストボンディング点の検査方法であって、前記ボール
に生じたキャピラリツールによる圧痕を検出する圧痕検
出工程と、この圧痕よりも外側をサーチすることにより
前記ボールの輪郭を検出する輪郭検出工程と、検出され
たボールの輪郭よりボールの中心座標およびサイズを検
出する位置・サイズ検出工程とを含むことを特徴とする
ワイヤボンディングにおけるボンディング点の検査方
法。
1. A method of inspecting a first bonding point in wire bonding in which a bonding point of a pad of a chip is imaged by a camera, and the imaged result is processed to detect a size and a position of a ball bonded to the bonding point. An indentation detecting step of detecting an indentation by a capillary tool generated in the ball, an outline detecting step of detecting an outline of the ball by searching outside the indentation, and a step of detecting an outline of the ball. A method for detecting a bonding point in wire bonding, comprising: a position / size detection step of detecting a center coordinate and a size of a ball.
【請求項2】前記圧痕検出工程において圧痕検出結果に
基づいてボールの仮の中心座標と仮のサイズを求め、前
記輪郭検出工程において輪郭が検出されないならば、前
記仮の中心座標と仮のサイズをボールの中心座標および
サイズとして出力することを特徴とする請求項1記載の
ワイヤボンディングにおけるボンディング点の検査方
法。
2. The provisional center coordinates and provisional size of the ball are obtained in the indentation detection step based on the indentation detection result. If no contour is detected in the contour detection step, the provisional center coordinates and the provisional size are determined. 2. The method for inspecting a bonding point in wire bonding according to claim 1, wherein is output as the center coordinates and the size of the ball.
JP29505799A 1999-10-18 1999-10-18 Inspection method of first bonding point in wire bonding Expired - Fee Related JP3557965B2 (en)

Priority Applications (1)

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Application Number Priority Date Filing Date Title
JP29505799A JP3557965B2 (en) 1999-10-18 1999-10-18 Inspection method of first bonding point in wire bonding

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JP3557965B2 JP3557965B2 (en) 2004-08-25

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009122605A1 (en) * 2008-03-31 2009-10-08 株式会社新川 Bonding apparatus and bonding method
WO2022249262A1 (en) * 2021-05-25 2022-12-01 株式会社新川 Wire bonding system, inspection device, wire bonding method, and program

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009122605A1 (en) * 2008-03-31 2009-10-08 株式会社新川 Bonding apparatus and bonding method
US8091761B2 (en) 2008-03-31 2012-01-10 Shinkawa Ltd. Bonding apparatus and bonding method
CN101981679B (en) * 2008-03-31 2012-07-25 株式会社新川 Bonding apparatus and bonding method
WO2022249262A1 (en) * 2021-05-25 2022-12-01 株式会社新川 Wire bonding system, inspection device, wire bonding method, and program

Also Published As

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