JP2001064766A - Sputtering target for forming optical recording protective film, minimal in generation of particle - Google Patents
Sputtering target for forming optical recording protective film, minimal in generation of particleInfo
- Publication number
- JP2001064766A JP2001064766A JP23964499A JP23964499A JP2001064766A JP 2001064766 A JP2001064766 A JP 2001064766A JP 23964499 A JP23964499 A JP 23964499A JP 23964499 A JP23964499 A JP 23964499A JP 2001064766 A JP2001064766 A JP 2001064766A
- Authority
- JP
- Japan
- Prior art keywords
- silicon dioxide
- powder
- zinc sulfide
- sputtering target
- crystalline silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Physical Vapour Deposition (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】この発明は、レーザーを用い
て情報の記録および消去を行う相変化型光ディスクなど
の保護膜を形成するための硫化亜鉛−二酸化ケイ素焼結
体からなる光記録保護膜形成用スパッタリングターゲッ
トに関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to formation of an optical recording protection film made of a zinc sulfide-silicon dioxide sintered body for forming a protection film of a phase change optical disk or the like in which information is recorded and erased by using a laser. The present invention relates to a sputtering target for use.
【0002】[0002]
【従来の技術】一般に、光記録保護膜は、二酸化ケイ素
粉末と硫化亜鉛末の混合粉末を焼結して得られた相対密
度が90%以上の焼結体からなる円盤状ターゲットを用
いスパッタすることにより形成されることは知られてお
り、この二酸化ケイ素と硫化亜鉛からなる円盤状ターゲ
ットは、純度:99.999重量%以上の硫化亜鉛粉末
に対し、純度:99.999重量%以上の二酸化ケイ素
粉末を10〜30mol%添加し均一に混合し、得られ
た混合粉末を円盤状に加圧成形したのち焼結することに
より製造することも知られている。また、この方法で作
製した円盤状ターゲットは硫化亜鉛素地中に二酸化ケイ
素粉末が均一分散した組織を有することも知られている
(特開平6−65725号公報参照)。前記純度:9
9.999重量%以上の二酸化ケイ素粉末は、安価で高
純度の二酸化ケイ素粉末を使用しなければならないとこ
ろから、比較的製造しやすい高純度な非晶質の溶融シリ
カ粉末が使用されている。前記非晶質の溶融シリカ粉末
は特に粉砕して得られた非晶質の溶融シリカ粉末を使用
するとホットプレスして得られたターゲットに亀裂が発
生することが無いことも知られている(特開平10−3
24968号公報参照)。2. Description of the Related Art Generally, an optical recording protective film is sputtered using a disk-shaped target made of a sintered body having a relative density of 90% or more obtained by sintering a mixed powder of silicon dioxide powder and zinc sulfide powder. It is known that the disc-shaped target composed of silicon dioxide and zinc sulfide has a purity of 99.999% by weight or more and a zinc sulfide powder of 99.999% by weight or more. It is also known that silicon powder is added to 10 to 30 mol%, mixed uniformly, and the resulting mixed powder is press-formed into a disk shape and then sintered to be manufactured. It is also known that the disk-shaped target produced by this method has a structure in which silicon dioxide powder is uniformly dispersed in a zinc sulfide base (see JP-A-6-65725). The purity: 9
Since 9.999% by weight or more of silicon dioxide powder must be inexpensive and high purity silicon dioxide powder, high purity amorphous fused silica powder which is relatively easy to produce is used. It is also known that the use of the amorphous fused silica powder, particularly when the amorphous fused silica powder obtained by pulverization is used, does not cause cracks in the target obtained by hot pressing (particularly, Kaihei 10-3
24968).
【0003】[0003]
【発明が解決しようとする課題】一般に、これら硫化亜
鉛−二酸化ケイ素焼結体からなるスパッタリングターゲ
ットを用いて光記録保護膜を形成するとパーティクルが
発生することは避けられないが、パーティクルが大量に
発生すると光記録保護膜は不良品となるので好ましくな
い。したがって、パーティクル発生の可及的に少ないタ
ーゲットを得るべく日々研究が進められている。Generally, when an optical recording protective film is formed using a sputtering target composed of these zinc sulfide-silicon dioxide sintered bodies, particles cannot be avoided, but a large amount of particles are generated. Then, the optical recording protection film becomes a defective product, which is not preferable. Therefore, research is being conducted every day to obtain a target with as few particles as possible.
【0004】[0004]
【課題を解決するための手段】そこで、本発明者らも、
パーティクルが発生することが少ない硫化亜鉛−二酸化
ケイ素焼結体からなる光記録保護膜形成用スパッタリン
グターゲットを得るべく研究を行なっていたところ、
(a)従来は、硫化亜鉛−二酸化ケイ素焼結体からなる
光記録保護膜形成用スパッタリングターゲットを作製す
るための二酸化ケイ素粉末として溶融シリカ粉末などの
非晶質の二酸化ケイ素粉末を使用していたが、非晶質の
二酸化ケイ素粉末よりも結晶質の二酸化ケイ素粉末を使
用して作製したパッタリングターゲットの方がパーティ
クルの発生数は少なくなる、(b)前記結晶質の二酸化
ケイ素粉末は、具体的には、石英粉末、クリストバライ
ト粉末またはトリジマイト粉末であることが好ましく、
これら結晶質の二酸化ケイ素粉末は粉砕粉末であること
がターゲット高強度向上のために一層好ましい、などの
研究結果が得られたのである。Means for Solving the Problems Accordingly, the present inventors have
While conducting research to obtain a sputtering target for forming an optical recording protective film composed of a zinc sulfide-silicon dioxide sintered body with less generation of particles,
(A) Conventionally, an amorphous silicon dioxide powder such as a fused silica powder has been used as a silicon dioxide powder for producing a sputtering target for forming an optical recording protective film composed of a zinc sulfide-silicon dioxide sintered body. However, the number of generated particles is smaller in a sputtering target manufactured using a crystalline silicon dioxide powder than in an amorphous silicon dioxide powder. (B) The crystalline silicon dioxide powder is Specifically, it is preferably quartz powder, cristobalite powder or tridymite powder,
Research results have shown that these crystalline silicon dioxide powders are more preferably pulverized powders in order to improve the strength of the target.
【0005】この発明は、かかる研究結果に基づいて成
されたものであって、(1)二酸化ケイ素:10〜30
モル%を含有し、残りが硫化亜鉛からなる組成を有し、
硫化亜鉛素地中に二酸化ケイ素粉末が均一分散してなる
組織を有する硫化亜鉛−二酸化ケイ素燒結体からなるス
パッタリングターゲットにおいて、前記二酸化ケイ素粉
末は結晶質の二酸化ケイ素粉末であるパーティクル発生
の少ない光記録保護膜形成用スパッタリングターゲッ
ト、(2)前記結晶質の二酸化ケイ素粉末は、石英、ク
リストバライトまたはトリジマイトの内のいずれかの粉
末である前記(1)記載のパーティクル発生の少ない光
記録保護膜形成用スパッタリングターゲット、(3)前
記結晶質の二酸化ケイ素粉末は、石英、クリストバライ
トまたはトリジマイトの内のいずれかの粉砕粉末である
前記(1)記載のパーティクル発生の少ない光記録保護
膜形成用スパッタリングターゲット、に特徴を有するも
のである。[0005] The present invention has been made based on the results of such research, and (1) silicon dioxide: 10 to 30.
Mole%, the balance consisting of zinc sulfide,
In a sputtering target comprising a zinc sulfide-silicon dioxide sintered body having a structure in which silicon dioxide powder is uniformly dispersed in a zinc sulfide base, the silicon dioxide powder is a crystalline silicon dioxide powder, and optical recording protection with less generation of particles. The sputtering target for forming a film, (2) the crystalline silicon dioxide powder is any one of quartz, cristobalite and tridymite, and the sputtering target for forming an optical recording protective film with less generation of particles according to (1) above. (3) The sputtering target for forming an optical recording protective film with less generation of particles according to the above (1), wherein the crystalline silicon dioxide powder is a pulverized powder of any of quartz, cristobalite and tridymite. Have
【0006】前記石英、クリストバライトまたはトリジ
マイトを粉砕して得られた結晶質の二酸化ケイ素粉の平
均粒径は、3〜7μmの範囲内にあることが好ましく、
これらの内でもクリストバライトを粉砕して得られた結
晶質の二酸化ケイ素粉が最も好ましい。The average particle size of the crystalline silicon dioxide powder obtained by grinding the quartz, cristobalite or tridymite is preferably in the range of 3 to 7 μm,
Among these, crystalline silicon dioxide powder obtained by pulverizing cristobalite is most preferred.
【0007】この発明の光記録保護膜形成用スパッタリ
ングターゲットは下記のごとくして製造する。まず、市
販の硫化亜鉛粉末を用意し、この市販の硫化亜鉛粉末に
含まれるガスを除去する目的で市販の硫化亜鉛粉末をA
r雰囲気中、温度:650℃(昇温速度:2.2℃/m
in)1時間保持の条件の脱ガス熱処理を施し、この脱
ガス熱処理を施した硫化亜鉛粉末に対し、結晶質の二酸
化ケイ素の原料粉末を10〜30mol%添加し、これ
らを均一に混合し、得られた混合粉末を円盤状にホット
プレスすることにより製造する。この時のホットプレス
条件は、Arガス雰囲気中、圧力:300〜400kg
f/cm2 、温度:850〜1100℃、5〜7時間保
持の条件で行われ、その後、この保持温度から冷却速
度:1〜3℃/minで常温まで冷却する。The sputtering target for forming an optical recording protection film according to the present invention is manufactured as follows. First, a commercially available zinc sulfide powder is prepared, and a commercially available zinc sulfide powder is used for removing gas contained in the commercially available zinc sulfide powder.
r Atmosphere, temperature: 650 ° C (heating rate: 2.2 ° C / m
in) Degassing heat treatment under the condition of holding for 1 hour, 10 to 30 mol% of crystalline silicon dioxide raw material powder is added to the zinc sulfide powder subjected to the degassing heat treatment, and these are uniformly mixed. The obtained mixed powder is manufactured by hot pressing in a disk shape. The hot pressing conditions at this time are as follows: Ar gas atmosphere, pressure: 300 to 400 kg.
f / cm 2, temperature: 850 to 1100 ° C., carried out under the conditions of 5 to 7 hours retention, then, the cooling rate from the holding temperature to cool to room temperature at 1 to 3 ° C. / min.
【0008】[0008]
【発明の実施の形態】実施例 脱ガスする目的で市販のZnS粉末をAr雰囲気中で昇
温速度:2.2℃/minで加熱し、650℃で1時間
保持の熱処理を施すことにより、ZnS原料粉末を作製
した。さらに、石英、クリストバライトおよびトリジマ
イトを粉砕して表1に示される異なった平均粒径を有す
る石英、クリストバライトおよびトリジマイトの粉砕粉
を用意した。前記ZnS原料粉末に対して前記石英粉
末、クリストバライト粉末およびトリジマイト粉末を表
1に示される割合で配合し、この配合粉末をエタノール
と共にポリポットの中に入れ、1時間湿式混合してスラ
リーとし、得られた混合粉末のスラリーを乾燥すること
によりエタノールを蒸発させ、その後、軽く解砕を行っ
た後、ホットプレスの黒鉛型に充填し、Arガス雰囲気
中において温度:1000℃、圧力:340kgf/c
m2 、6時間保持の条件のホットプレスを行うことによ
り表1の配合組成と同じ組成を有する円盤状ホットプレ
ス体を作製し、これら円盤状ホットプレス体の表面を機
械加工して直径:200mm、厚さ:5mmの寸法を有
する本発明光記録媒体保護膜形成用スパッタリングター
ゲット(以下、本発明ターゲットという)1〜9を作製
し、これら本発明ターゲット1〜9の密度および曲げ強
度を測定し、その結果を表1に示した。DESCRIPTION OF THE PREFERRED EMBODIMENTS For the purpose of degassing, a commercially available ZnS powder is heated in an Ar atmosphere at a heating rate of 2.2 ° C./min, and subjected to a heat treatment at 650 ° C. for 1 hour. A ZnS raw material powder was produced. Further, crushed quartz, cristobalite and tridymite having different average particle sizes shown in Table 1 were prepared by crushing quartz, cristobalite and tridymite. The quartz powder, cristobalite powder and tridymite powder were blended with the ZnS raw material powder in the proportions shown in Table 1, and the blended powder was put into a polypot together with ethanol, and wet-mixed for 1 hour to obtain a slurry. The ethanol was evaporated by drying the slurry of the mixed powder thus obtained, and after crushing lightly, the mixture was filled in a graphite mold of a hot press, and the temperature was 1000 ° C. and the pressure was 340 kgf / c in an Ar gas atmosphere.
By performing hot pressing under the conditions of m 2 and holding for 6 hours, disk-shaped hot pressed bodies having the same composition as the composition shown in Table 1 were produced, and the surfaces of these disk-shaped hot pressed bodies were machined to have a diameter of 200 mm. The sputtering targets (hereinafter, referred to as the present invention targets) 1 to 9 of the present invention having a thickness of 5 mm for forming an optical recording medium protective film were prepared, and the densities and bending strengths of the targets 1 to 9 of the present invention were measured. The results are shown in Table 1.
【0009】また、これら本発明ターゲット1〜9のZ
nS素地中に分散する二酸化ケイ素粉末について、マッ
クサイエンスのX線マイクロアナライザーによって、走
査速度:2.4でg/min,Step:0.04de
g,発散:0.5deg,受光:0.15mmの条件で
X線回折を行ったところ、強いピークが得られたのでい
ずれも結晶質の二酸化ケイ素粉末であることを確認し
た。Further, Z of the targets 1 to 9 of the present invention
With respect to the silicon dioxide powder dispersed in the nS substrate, the scanning speed was 2.4 g / min, and the step was 0.04 de by a Mac Science X-ray microanalyzer.
X-ray diffraction was performed under the conditions of g, divergence: 0.5 deg, and light reception: 0.15 mm. As a result, a strong peak was obtained, and it was confirmed that each of the powders was crystalline silicon dioxide powder.
【0010】従来例 さらに比較のために、溶融シリカを粉砕して得られた平
均粒径:7μmを有する溶融シリカ粉末を用意し、この
溶融シリカ粉末を実施例で用意したZnS原料粉末に対
して表1に示される割合となるように配合し、混合して
実施例と同様にして表1の配合組成と同じ組成を有する
従来光記録媒体保護膜形成用スパッタリングターゲット
(以下、従来ターゲットという)を作製し、密度および
曲げ強度を測定し、その結果を表1に示し、さらに実施
例と同様にしてマックサイエンスのX線マイクロアナラ
イザーによってZnS素地中に分散する二酸化ケイ素粉
末をX線回折したところ、幅広いピークが得られたとこ
ろから、ZnS素地中に分散する二酸化ケイ素粉末は非
晶質の二酸化ケイ素粉末であることを確認した。Conventional Example For further comparison, a fused silica powder having an average particle diameter of 7 μm obtained by pulverizing the fused silica was prepared, and this fused silica powder was compared with the ZnS raw material powder prepared in the examples. A conventional sputtering target for forming a protective film for an optical recording medium (hereinafter, referred to as a conventional target) having the same composition as the composition in Table 1 was blended and mixed in the proportions shown in Table 1 in the same manner as in the examples. It was manufactured, the density and bending strength were measured, and the results are shown in Table 1. Further, when the silicon dioxide powder dispersed in the ZnS base was X-ray diffracted by a Mac Science X-ray microanalyzer in the same manner as in the example, From the broad peak obtained, it was confirmed that the silicon dioxide powder dispersed in the ZnS substrate was an amorphous silicon dioxide powder.
【0011】このようにして得られた本発明ターゲット
1〜9および従来ターゲットをそれぞれモリブデン製の
冷却用バッキングプレートに純度:99.999重量%
のイリジウムろう材にてハンダ付けし、これを高周波マ
グネトロンスパッタリング装置にセットし、 ・スパッタガス:Ar、 ・スパッタガス圧力:5×10-3Torr、 ・スパッタ電力:13.56MHzの高周波電力150
0Kw(約8.5W/cm2 )、の条件で1分間および
5分間スパッタを行い、発生したパーティクルの数を測
定し、その結果を表1に示した。The targets 1 to 9 of the present invention and the conventional targets thus obtained were each put on a molybdenum cooling backing plate with a purity of 99.999% by weight.
And then set it in a high-frequency magnetron sputtering device. ・ Sputter gas: Ar ・ Sputter gas pressure: 5 × 10 −3 Torr ・ Sputter power: 13.56 MHz high-frequency power 150
Sputtering was performed for 1 minute and 5 minutes under the conditions of 0 Kw (about 8.5 W / cm 2 ), the number of generated particles was measured, and the results are shown in Table 1.
【0012】[0012]
【表1】 [Table 1]
【0013】[0013]
【発明の効果】表1に示される結果から、硫化亜鉛素地
中に結晶質の二酸化ケイ素粉末が分散した本発明ターゲ
ット1〜9は、硫化亜鉛素地中に非晶質の二酸化ケイ素
粉末が分散した従来ターゲットに比べて密度および強度
が優れており、さらにスパッタ中に発生するパーティク
ルの数が少ないことが分かる。According to the results shown in Table 1, the targets 1 to 9 of the present invention in which crystalline silicon dioxide powder was dispersed in zinc sulfide base had amorphous silicon dioxide powder dispersed in zinc sulfide base. It can be seen that the density and strength are superior to the conventional target, and the number of particles generated during sputtering is small.
Claims (3)
し、残りが硫化亜鉛からなる組成を有し、硫化亜鉛素地
中に二酸化ケイ素粉末が均一分散してなる組織を有する
硫化亜鉛−二酸化ケイ素燒結体からなるスパッタリング
ターゲットにおいて、 前記二酸化ケイ素粉末は結晶質の二酸化ケイ素粉末であ
ることを特徴とするパーティクル発生の少ない光記録保
護膜形成用スパッタリングターゲット。1. Zinc sulfide-silicon dioxide containing 10 to 30 mol% of silicon dioxide with the balance being zinc sulfide and having a structure in which silicon dioxide powder is uniformly dispersed in a zinc sulfide base In a sputtering target comprising a sintered body, the silicon dioxide powder is a crystalline silicon dioxide powder, and the sputtering target for forming an optical recording protective film with less generation of particles.
英、クリストバライトまたはトリジマイトの内のいずれ
かの粉末であることを特徴とする請求項1記載のパーテ
ィクル発生の少ない光記録保護膜形成用スパッタリング
ターゲット。2. The sputtering target according to claim 1, wherein the crystalline silicon dioxide powder is any one of quartz, cristobalite and tridymite. .
英、クリストバライトまたはトリジマイトの内のいずれ
かの粉砕粉末であることを特徴とする請求項1記載のパ
ーティクル発生の少ない光記録保護膜形成用スパッタリ
ングターゲット。3. The sputtering according to claim 1, wherein the crystalline silicon dioxide powder is a crushed powder selected from the group consisting of quartz, cristobalite, and tridymite. target.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23964499A JP2001064766A (en) | 1999-08-26 | 1999-08-26 | Sputtering target for forming optical recording protective film, minimal in generation of particle |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23964499A JP2001064766A (en) | 1999-08-26 | 1999-08-26 | Sputtering target for forming optical recording protective film, minimal in generation of particle |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2001064766A true JP2001064766A (en) | 2001-03-13 |
Family
ID=17047788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23964499A Pending JP2001064766A (en) | 1999-08-26 | 1999-08-26 | Sputtering target for forming optical recording protective film, minimal in generation of particle |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2001064766A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002072910A1 (en) * | 2001-03-12 | 2002-09-19 | Nikko Materials Company, Limited | Zns-sio2 sputtering target and optical recording medium having zns-sio2 phase-change type optical disc protective film formed through use of that target |
WO2012086300A1 (en) * | 2010-12-21 | 2012-06-28 | Jx日鉱日石金属株式会社 | Sputtering target for magnetic recording film, and process for production thereof |
-
1999
- 1999-08-26 JP JP23964499A patent/JP2001064766A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002072910A1 (en) * | 2001-03-12 | 2002-09-19 | Nikko Materials Company, Limited | Zns-sio2 sputtering target and optical recording medium having zns-sio2 phase-change type optical disc protective film formed through use of that target |
WO2012086300A1 (en) * | 2010-12-21 | 2012-06-28 | Jx日鉱日石金属株式会社 | Sputtering target for magnetic recording film, and process for production thereof |
JP5009447B1 (en) * | 2010-12-21 | 2012-08-22 | Jx日鉱日石金属株式会社 | Sputtering target for magnetic recording film and manufacturing method thereof |
US9605339B2 (en) | 2010-12-21 | 2017-03-28 | Jx Nippon Mining & Metals Corporation | Sputtering target for magnetic recording film and process for production thereof |
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