JP2001013892A - Display device - Google Patents

Display device

Info

Publication number
JP2001013892A
JP2001013892A JP11185000A JP18500099A JP2001013892A JP 2001013892 A JP2001013892 A JP 2001013892A JP 11185000 A JP11185000 A JP 11185000A JP 18500099 A JP18500099 A JP 18500099A JP 2001013892 A JP2001013892 A JP 2001013892A
Authority
JP
Japan
Prior art keywords
electrode
group
connection terminal
terminal
divided
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11185000A
Other languages
Japanese (ja)
Inventor
Takeshi Yoshino
吉野  武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Priority to JP11185000A priority Critical patent/JP2001013892A/en
Publication of JP2001013892A publication Critical patent/JP2001013892A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To obtain a display device which facilitates a short-circuit test of driving electrodes. SOLUTION: In this display device, in the electrodes for driving display elements sandwiched between two substrates opposed to each other, a substrate 1 is provided with a signal electrode group, and another substrate 2 is provided with a scanning electrode group, and these groups are arranged so that the groups cross each other, and the terminals 31a-31e connected with the signal electrode group on the substrate 1 form the central terminal group, and the scanning electrodes on the substrate 2 are divided into two groups 42a-42e, 52a-52e, and are connected with the divided terminal groups 41a-41e and 52a-52e located on both the sides of the central terminal group. In this case, one 52a of the two electrodes adjacent to the electrode groups divided above has connection terminals 51a, 51t, which are on both sides of the central terminal group and arranged as one of each terminal group divided above.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、平面表示装置にお
ける駆動電極の短絡試験をし易くした配線パターに関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring pattern which facilitates a short-circuit test of a drive electrode in a flat display device.

【0002】[0002]

【従来の技術】テレビやパソコンに代表されるように表
示装置のコンパクト化や省スペース化の要請は強い。こ
れらを実現する手段としてプラズマ表示装置や液晶表示
装置が用いられている。これら平面表示装置は表示素子
を2枚の基板で挟持し、1枚の基板には複数の信号電極
を、他の基板には複数の走査電極を配設した2種類の駆
動電極を備え、これらを相互に交差するように配置し
て、表示信号と走査信号を与え、その時間的信号差で表
示素子を駆動するダイナミック駆動方式が採用されてい
る。
2. Description of the Related Art As represented by televisions and personal computers, there is a strong demand for compact and space-saving display devices. A plasma display device or a liquid crystal display device is used as a means for achieving these. In these flat display devices, a display element is sandwiched between two substrates, one substrate is provided with a plurality of signal electrodes, and the other substrate is provided with two types of driving electrodes provided with a plurality of scanning electrodes. Are arranged so as to intersect with each other, a display signal and a scanning signal are applied, and a dynamic driving method of driving a display element by a temporal signal difference is adopted.

【0003】図7、図8はこうしたダイナミック駆動方
式を表示装置に採用したときの配線パターンを含む概略
構成図である。図7は透視的斜視図、図8は図7のA−
A断面図である。図中、1は下基板、2はそれに対向す
る透明な上基板である。両基板1、2の間には上基板2
の外周に沿ったリング状の封止部60により封止を行
い、その内側に液晶表示部を形成する。下基板1には3
2a〜32eの信号電極群が、上基板2には走査電極が
42a〜42eと52a〜52eの二つの電極群とに分
けられて配設されている。電極パターンは上下基板の対
向面、即ち、下基板1には上側、上基板2には下面側に
配設されている。上下基板のパターンの関係が解りやす
いように、電極線は透視的に、両者を重ね合わせた状態
で図示している。実際の電極は極く薄い透明電極が用い
られているので厚みは極薄いが、説明をしやすく断面電
極の厚みは極端に厚く示してある。また、駆動電極部の
パターンも必要な幅を有するが、こちら説明しやすく線
で示した。信号電極には信号電圧が、走査電極に走査電
圧が時間差的に印加され、その交点が画素となり、両者
の電圧差に応じて液晶が状態を変え、視覚的変化となっ
て表示機能を果たす。ここでは8x8=64画素の例を
示したが、走査電極線の数、走査電極の数は任意に選ぶ
ことが出来る。
FIGS. 7 and 8 are schematic structural diagrams including wiring patterns when such a dynamic drive system is employed in a display device. FIG. 7 is a perspective view, and FIG.
It is A sectional drawing. In the figure, 1 is a lower substrate, and 2 is a transparent upper substrate opposed thereto. Upper substrate 2 between both substrates 1 and 2
Is sealed by a ring-shaped sealing portion 60 along the outer periphery of the liquid crystal display portion, and a liquid crystal display portion is formed inside the sealing portion. 3 for lower substrate 1
The signal electrodes 2a to 32e are arranged on the upper substrate 2 and the scanning electrodes are divided into two electrode groups 42a to 42e and 52a to 52e. The electrode patterns are disposed on the opposing surfaces of the upper and lower substrates, that is, on the lower substrate 1 on the upper side and on the upper substrate 2 on the lower side. The electrode lines are shown in a transparent state so that the relationship between the patterns of the upper and lower substrates can be easily understood. The actual electrode is extremely thin because an extremely thin transparent electrode is used, but the thickness of the cross-sectional electrode is extremely thick for ease of explanation. Further, the pattern of the drive electrode portion also has a required width, which is indicated by a line for easy explanation. A signal voltage is applied to the signal electrode at a time difference, and a scanning voltage is applied to the scanning electrode at a time difference. Intersections of the signal electrodes serve as pixels. Here, an example of 8 × 8 = 64 pixels is shown, but the number of scanning electrode lines and the number of scanning electrodes can be arbitrarily selected.

【0004】下基板1には上記駆動電極が外から駆動信
号を得るための接続端子が設けられ、信号電極と走査電
極の全ての電極と1対1で電気的に接続している。下基
板1にある信号電極32a〜32eに対応する接続端子
31a〜31eは一群となって基板中央に位置する。こ
の端子群を中央端子群と称する。接続端子は多くの場合
同一ピッチで配置されている。
The lower substrate 1 is provided with a connection terminal for the drive electrode to obtain a drive signal from the outside, and is electrically connected one-to-one with the signal electrode and all of the scan electrodes. The connection terminals 31a to 31e corresponding to the signal electrodes 32a to 32e on the lower substrate 1 are grouped and located at the center of the substrate. This terminal group is called a center terminal group. The connection terminals are often arranged at the same pitch.

【0005】一方、上基板2にある二つの走査電極電極
群42a〜42eと52a〜52eは、中央端子群の左
右にある端子群41a〜41eと51a〜51eの二つ
の分割端子群に接続しいる。分割端子群の接続端子も中
央端子群と同様同一ピッチで配置されていることが多
い。ダイナミック駆動する平面表示装置において、片方
の基板の電極を左右に分けて外部との接続を取るのは、
実際の表示画素となる走査電極群と信号電極群の交差部
分が表示装置の中央に位置しやすいからで、これにより
コンパクトで見やすい表示装置を提供している。
On the other hand, two scanning electrode electrode groups 42a to 42e and 52a to 52e on the upper substrate 2 are connected to two divided terminal groups 41a to 41e and 51a to 51e on the left and right sides of the central terminal group. I have. The connection terminals of the divided terminal group are often arranged at the same pitch as the central terminal group. In a flat display device that is dynamically driven, it is necessary to divide the electrode of one substrate into left and right and connect with the outside,
Since the intersection of the scan electrode group and the signal electrode group, which are actual display pixels, is easily located at the center of the display device, a compact and easy-to-view display device is provided.

【0006】上基板2に配設されている電極と下基板1
にある接続端子との接続はシール部に混入された導電粒
により行われている。分割接続端子群の接続端子は封止
部内においては走査電極パターンと同じ形状のパターン
をなし、絶縁物質を主剤とする封止剤に混ぜられた細か
い導電粒により、隣接する電極とは絶縁を保ちながら上
下に導通して電気的接続を確保している。61a、61
bは接続端子を保護するダミー端子で電気的接続をして
いる場合と、電気的接続をしていない場合がある。
The electrodes provided on the upper substrate 2 and the lower substrate 1
The connection with the connection terminal is made by conductive particles mixed in the seal portion. The connection terminals of the divided connection terminal group form a pattern of the same shape as the scanning electrode pattern in the sealing portion, and maintain insulation from adjacent electrodes by fine conductive particles mixed in a sealing agent mainly composed of an insulating substance While conducting up and down, electrical connection is ensured. 61a, 61
b is a dummy terminal that protects the connection terminal and is electrically connected, or is not electrically connected.

【0007】[0007]

【発明が解決しようとする課題】より見やすい表示を行
うためには密度の高い表示画素が要求される。即ち、ダ
イナミック駆動を行う表示装置においては信号電極、走
査電極共に高い密度でパターニング(配設)しなければ
ならない。その結果、隣り合う電極の隙間は小さくなり
短絡の危険が生じやすい。製品にこうした不良品の混入
を防ぐために、製造工程において短絡テストを行い、不
良品を排除する必要がある。
In order to perform display more easily, a high-density display pixel is required. That is, in a display device that performs dynamic driving, both the signal electrode and the scanning electrode must be patterned (arranged) at a high density. As a result, the gap between the adjacent electrodes becomes small, and the risk of a short circuit is likely to occur. In order to prevent such a defective product from being mixed into a product, it is necessary to perform a short-circuit test in the manufacturing process to eliminate the defective product.

【0008】短絡テストにあたっては、接続端子に検査
用のプローバーをあて、隣り合う電極を次々に選択して
その間の短絡の有無を検査する。図1の下基板1につい
て説明すると、下基板1の信号電極32aと32b間の
検査は中央端子群の接続端子31aと31bを選択し、
そこに検査用のプローバーを当てて検査する。次に、信
号電極32bと32c間の検査は接続端子31bと31
cを選択して行う。以下電極32c〜32eの検査も同
様にして隣り合う接続端子31c〜31eを順次二つず
つ選択し、最後に接続端子31eとその手前の接続端子
の選択をして下基板1にある電極の短絡テストは終わ
る。下基板の場合は電極と接続端子の配列順番が同じな
ので、接続端子のピッチを等間隔に配列して有れば、プ
ローバーの間隔も固定して、31aから順次左に移動し
ながら検査をすれば容易に検査が可能である。
In the short-circuit test, a prober for inspection is applied to the connection terminal, adjacent electrodes are selected one after another, and the presence or absence of a short circuit therebetween is inspected. 1, the inspection between the signal electrodes 32a and 32b of the lower substrate 1 selects the connection terminals 31a and 31b of the central terminal group.
An inspection prober is applied to the inspection. Next, the inspection between the signal electrodes 32b and 32c is performed on the connection terminals 31b and 31c.
Perform by selecting c. In the same manner, in the inspection of the electrodes 32c to 32e, the adjacent connection terminals 31c to 31e are sequentially selected two by two in the same manner, and finally the connection terminal 31e and the connection terminal in front thereof are selected to short-circuit the electrodes on the lower substrate 1. The test ends. In the case of the lower substrate, the arrangement order of the electrodes and the connection terminals is the same. Therefore, if the connection terminals are arranged at equal intervals, the prober intervals are fixed, and the inspection is performed while moving sequentially to the left from 31a. Inspection is possible easily.

【0009】上基板2の走査電極42a〜42e、52
a〜52eの検査もお互いに隣り合う電極に接続する接
続端子を二つずつ選択して行わなくてはならないが、走
査電極は二つに分けられ、中央端子群を挟んで分かれて
いる接続端子群に接続されているので、下基板と同じに
は検査が出来ない。つまり、走査電極群42a〜42e
に接続する接続端子41a〜41eはこの範囲内におい
て電極の配列と接続端子の配列が同じであるから、検査
用のプローバーは接続端子41aと41bを選択して検
査を行い、以下は順次接続端子を41bと次の接続端子
と二つずつ選び、最後に接続端子41aとその前の接続
端子の検査をして終わる。検査の順番は41aから始め
て41eに向かって順次行っても、逆に、41eから始
めて41aに順次右に向かっても同じである。二つに分
けられたもう一つの電極群52a〜52eの短絡テスト
もそれに接続するもう一つの分割端子群51a〜51e
の接続端子を使って行う。分割端子群51a〜51eの
接続端子の配列方向は41a〜41eの接続端子群と左
右逆方向であるが、接続端子51eから51aに向かっ
て順次右に向かって二つずつ選択するか、51aから5
1eに向かって順次左側に二つずつ選択することによ
り、検査が出来る。このようにすれば、分割した各群の
中の電極は相互に検査が完了するが、このままだと分割
した電極群の群同士間の隣接する電極間のテストが出来
ない。つまり、電極42eと52e間の短絡テストは出
来ていない。これを行うためには別の分割端子群にある
接続端子41eと51aを選択し、ここに検査用のプロ
ーバーを当接させなければならない。図から明らかなよ
うに、この選択は中央端子群をまたいで行わなければな
らないので、他の電極の検査に比べて極端にピッチの大
きいプローバーを使用しなければならず、検査用のプロ
ーバーが同一電極群内の隣接電極間を測定するプローバ
ーと異なった大きさのプローバが必要になり、少なくと
も2種類のプローバが必要になる。このことより作業手
順や、プローバー管理が複雑になり、さらにプローバー
コストが高くなる問題もあった。これらの問題の解決が
課題となっていた。
The scanning electrodes 42a to 42e, 52 of the upper substrate 2
Inspections a to 52e must be performed by selecting two connection terminals to be connected to the electrodes adjacent to each other, but the scanning electrodes are divided into two, and the connection terminals are separated by the center terminal group. Since they are connected to a group, they cannot be inspected in the same way as the lower substrate. That is, the scanning electrode groups 42a to 42e
The connection of the connection terminals 41a to 41e is the same in this range because the arrangement of the electrodes and the arrangement of the connection terminals are the same. Therefore, the prober for inspection performs the inspection by selecting the connection terminals 41a and 41b. , 41b and the next connection terminal are selected two by two. Finally, the connection terminal 41a and the connection terminal before it are inspected, and the process is finished. The order of the inspection is the same whether the inspection is performed sequentially from 41a to 41e or vice versa. The short-circuit test of the other two electrode groups 52a to 52e is also performed by the other divided terminal groups 51a to 51e connected thereto.
Use the connection terminals of The arrangement direction of the connection terminals of the divided terminal groups 51a to 51e is opposite to the left and right direction of the connection terminal groups of the connection terminals 41a to 41e. 5
The inspection can be performed by sequentially selecting two pairs on the left side toward 1e. In this way, the electrodes in each of the divided groups are mutually inspected, but the test between adjacent electrodes between the divided electrode groups cannot be performed. That is, a short circuit test between the electrodes 42e and 52e has not been performed. In order to do this, the connection terminals 41e and 51a in another divided terminal group must be selected, and a prober for inspection must be brought into contact therewith. As is clear from the figure, since this selection must be made across the central terminal group, a prober with an extremely large pitch must be used as compared with the inspection of other electrodes, and the prober for inspection is the same. A prober different in size from a prober that measures between adjacent electrodes in an electrode group is required, and at least two types of probers are required. This complicates the work procedure and the prober management, and further increases the prober cost. The solution of these problems has been an issue.

【0010】また、別の検査方法で、プローバーを分割
端子単位の多ピンで行い(図1の場合は4本)、電気的
なスキャンニングをしながら検査する場合でも、これだ
けではやはり端子群内だけしか検査が出来ない。これを
可能にするには中央端子群をまたぐ大がかりな多ピンプ
ローバーが必要で、治具の標準化が難しい問題もあっ
た。
In another inspection method, a prober is performed with multiple pins in units of divided terminals (four in the case of FIG. 1), and inspection is performed while electrical scanning is performed. Only the inspection can be performed. In order to make this possible, a large multi-pin prober that straddles the central terminal group was required, and there was a problem that standardization of the jig was difficult.

【0011】本発明は、駆動電極の短絡試験をしやすく
した表示装置を提供することを目的とする。
An object of the present invention is to provide a display device which facilitates a short-circuit test of a drive electrode.

【0012】[0012]

【課題を解決するための手段】上記課題を解決するため
に、本発明では、対向する二つの基板に挟持された表示
素子を駆動する電極は一方の基板に信号電極群が配設さ
れ他方の基板に走査電極群が配設され前記信号電極と前
記走査電極とが互いに交差するようにマトリックス状に
配置されそれぞれの前記基板の各電極は駆動信号が印可
される接続端子と接続され前記走査電極の一部は略右方
向へ引出され接続端子に接続される配線と略左方向へ引
出され接続端子に接続される配線とを有することで複数
の電極群を有する表示装置に於いて、前記電極群同士が
隣接してなるところの隣接する電極群の2本の電極の内
の少なくとも1本の電極の一部は略左右の両方向に引き
出され更に前記電極群と接続される前記接続端子群の近
傍に接続端子又は検査端子或いは接続端子と検査端子を
有することを特徴とする。
In order to solve the above-mentioned problems, according to the present invention, an electrode for driving a display element sandwiched between two opposing substrates has a signal electrode group disposed on one substrate and the other electrode disposed on the other substrate. A scanning electrode group is provided on a substrate, and the signal electrodes and the scanning electrodes are arranged in a matrix so as to intersect each other, and each electrode of each substrate is connected to a connection terminal to which a drive signal is applied, and the scanning electrode In a display device having a plurality of electrode groups, a part of which has a wiring that is pulled out substantially to the right and is connected to the connection terminal and a wiring that is drawn out substantially to the left and connected to the connection terminal, A part of at least one electrode of two electrodes of an adjacent electrode group where the electrode groups are adjacent to each other is drawn out substantially in both right and left directions, and further connected to the connection terminal group connected to the electrode group Connection terminal or near Characterized in that it has a test terminal and 査端Ko or connection terminals.

【0013】また、前記走査電極の接続端子群のピッチ
と前記信号電極群の接続端子群のピッチとが略同じであ
ることを特徴とする。
Further, the pitch of the connection terminal group of the scanning electrode and the pitch of the connection terminal group of the signal electrode group are substantially the same.

【0014】また、前記走査電極の接続端子群のピッチ
と前記信号電極群の接続端子群のピッチと前記左右の両
方向に引き出され電極に接続される前記接続端子接続端
子又は検査端子或いは接続端子と検査端子のピッチとが
略同じであることを特徴とする。
The pitch of the scanning electrode connection terminal group, the pitch of the signal electrode group connection terminal group, and the connection terminal connection terminal, inspection terminal or connection terminal drawn out in both the left and right directions and connected to the electrodes. The pitch of the inspection terminals is substantially the same.

【0015】さらに、対向する二つの基板に挟持された
表示素子を駆動する電極は一方の基板に信号電極群が配
設され他方の基板に走査電極群が配設され前記信号電極
と前記走査電極とが互いに交差するようにマトリックス
状に配置されそれぞれの前記基板の各電極は駆動信号が
印可される接続端子と接続されどちらか一方の前記基板
の電極に接続した前記接続端子は互いに隣接して中央端
子群をなし他方の基板に配置された電極は二つ以上に分
割されるとともに二つ以上に分割された前記電極と接続
される接続端子は分割された前記電極に対応して分割端
子群を構成し該分割端子群は該中央端子群の両側に位置
する電極パターンを有しており、該前記分割された電極
群の隣接する2本の電極の内の少なくとも1本の電極は
両端に接続端子を有し該接続端子は該中央端子群の両側
にあって該それぞれの分割端子群の一つとして配置され
ていることを特徴とする。
Further, the electrodes for driving the display element sandwiched between the two opposing substrates include a signal electrode group disposed on one substrate and a scanning electrode group disposed on the other substrate. Are arranged in a matrix so as to cross each other, each electrode of each of the substrates is connected to a connection terminal to which a drive signal is applied, and the connection terminals connected to the electrodes of one of the substrates are adjacent to each other. The electrode that forms the central terminal group and is disposed on the other substrate is divided into two or more, and the connection terminals connected to the two or more divided electrodes are divided terminal groups corresponding to the divided electrodes. The divided terminal group has an electrode pattern located on both sides of the central terminal group, and at least one electrode of two adjacent electrodes of the divided electrode group is at both ends. Connection terminal The connection terminals and is characterized by being arranged on either side of the central terminal group as one of the split terminal group respectively said.

【0016】また、前記分割接続端子群のピッチが互い
に同じであることを特徴とする。
Further, the pitch of the divided connection terminal groups is the same as each other.

【0017】また、前記分割接続端子群のピッチおよび
前記中央端子群のピッチが互いに同じであることを特徴
とする。
Further, the pitch of the divided connection terminal group and the pitch of the center terminal group are the same.

【0018】また、前記両端に接続端子を有する電極の
接続端子の一方は検査領域のみを有し表示駆動用の外部
接続領域を持たないことを特徴とする。
Further, one of the connection terminals of the electrode having connection terminals at both ends has only an inspection region and does not have an external connection region for display driving.

【0019】[0019]

【発明の実施の形態】以下、本発明の実施形態を実施例
に基づき図面を参照して説明する。図1は本発明の第1
の実施形態で、外部接続端子が一枚の基板に設けられて
いる液晶表示装置の配線パターンを透視的に示した平面
図である。液晶表示装置の概略構成と断面は従来技術の
説明に用いた図7、図8と同じであり、同じ構成要素は
同じ符号で示してある。即ち、上基板には走査電極群4
2a〜42eと52a〜52eが、下基板には信号電極
群32a〜32eが互いに対向する面に敷設され、該信
号電極群32a〜32eと接続する中央端子群31a〜
31eと走査電極群42a〜42e、52a〜52eと
に接続する二つの分割接続端子群41a〜41e、51
a〜51e、及び、その接続端子群を保護するダミー端
子61a、61bは下基板に配置されている。 図3で
は更に、電極52eを点線で示すように延長し、下基板
にある外部接続端子51tに接続しており、本発明の要
所である。この外部接続端子51tは検査に供すること
が主目的であるが、電気的には51aと同等であるか
ら、この端子を用いて駆動用の信号を供与することも出
来る。電極の延長を点線で示したがこれは説明のため
で、電極パターンは一体である。また、接続端子群を対
称的に配置するため、ダミー端子61cを下基板に設け
てある。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The embodiments of the present invention will be described below based on examples with reference to the drawings. FIG. 1 shows a first embodiment of the invention.
FIG. 5 is a plan view transparently showing a wiring pattern of a liquid crystal display device in which external connection terminals are provided on one substrate in the embodiment. The schematic structure and cross section of the liquid crystal display device are the same as those shown in FIGS. 7 and 8 used for the description of the prior art, and the same components are denoted by the same reference numerals. That is, the scanning electrode group 4 is provided on the upper substrate.
2a-42e and 52a-52e, signal electrode groups 32a-32e are laid on the lower substrate on surfaces facing each other, and central terminal groups 31a-32e are connected to the signal electrode groups 32a-32e.
31e and two divided connection terminal groups 41a to 41e, 51 connected to the scan electrode groups 42a to 42e, 52a to 52e.
a to 51e and dummy terminals 61a and 61b for protecting the connection terminal group are arranged on the lower substrate. In FIG. 3, the electrode 52e is further extended as shown by a dotted line and connected to the external connection terminal 51t on the lower substrate, which is a key point of the present invention. The main purpose of the external connection terminal 51t is to provide an inspection, but since it is electrically equivalent to the terminal 51a, a driving signal can be provided using this terminal. The extension of the electrode is shown by a dotted line, but this is for explanation, and the electrode pattern is integral. In order to arrange the connection terminal group symmetrically, a dummy terminal 61c is provided on the lower substrate.

【0020】このように、外部接続端子51tは接続端
子41eの隣りに配置できるので、解決課題であった分
割電極群の隣同士の電極、つまり、電極42eと52a
の短絡テストが隣り合った端子で可能となった。接続端
子41a〜41eに51tも加えて一つの端子群とする
と、41a〜41eに続けて41eと51tの端子を選
択して検査を行えば、分割電極群間の検査が容易に出来
る。このことにより、中央端子群をまたぐ大きなピッチ
のプローバーの準備など特別な治具の準備は必要なくな
る。外部端子51tを含む分割端子群のピッチを等間隔
に配置すれば、プローバーのピッチは固定ピッチで良
く、更に検査治具は簡単となり、確実な検査が可能とな
る。
As described above, since the external connection terminal 51t can be arranged next to the connection terminal 41e, the electrodes adjacent to the divided electrode group, ie, the electrodes 42e and 52a
Short-circuit test was possible with adjacent terminals. If one terminal group is formed by adding 51t to the connection terminals 41a to 41e, the inspection between the divided electrode groups can be easily performed by selecting and inspecting the terminals 41e and 51t following the 41a to 41e. This eliminates the need for special jigs such as a large pitch prober that straddles the central terminal group. If the pitches of the divided terminal groups including the external terminals 51t are arranged at equal intervals, the prober pitch may be a fixed pitch, the inspection jig becomes simpler, and reliable inspection can be performed.

【0021】以上図1においては下基板と上基板とが一
体となった組立品で検査する場合を説明したが、実際の
液晶製造においては、上下の基板を別々の単体で検査す
る場合も多々ある。それぞれの各基板での検査が完了し
ていれば組立品での不良品は高い確率で排除されるから
である。次にその場合の実施形態について図2と図3を
用いて説明する。
In FIG. 1, the case where the inspection is performed using an assembly in which the lower substrate and the upper substrate are integrated has been described. However, in actual liquid crystal manufacturing, the upper and lower substrates are often inspected as separate units. is there. This is because if the inspection of each of the substrates is completed, defective products in the assembled product are eliminated with a high probability. Next, an embodiment in that case will be described with reference to FIGS.

【0022】図2は図1のB部分を拡大した他の実施形
態で、下基板のパターンを点線で、上基板のパターンは
実線で示してある。41a1〜41e1、51t1は電
極42a〜42e、52aの上基板の接続端子部で、下
基板と一体にしたとき下基板の接続端子41a〜41e
と接続するように配置すると共に上基板単体での検査に
供する。下基板の61dが51t1と重なる配置になっ
ていない理由は後述する。図示してないが、上基板の電
極52a〜52eの上基板の接続端子部は下基板の接続
端子(図1の51a〜51e)に接続する位置に配置さ
れている。上基板単体での検査をする場合は、図1で説
明した外部端子の代わりに上基板の接続端子を用いれ
ば、電極42eと52aとの間は41e1と51t1の
端子があるので、前述したように特別のプローバーを使
用しなくても検査が出来、検査治具の簡素化が行える。
下基板は図1そのものであるので、下基板の検査は接続
端子31a〜31eの間を従来通りに行えば良い。
FIG. 2 shows another embodiment in which the portion B of FIG. 1 is enlarged. The pattern of the lower substrate is indicated by a dotted line, and the pattern of the upper substrate is indicated by a solid line. 41a1 to 41e1 and 51t1 are connection terminals on the upper substrate of the electrodes 42a to 42e and 52a, and the connection terminals 41a to 41e of the lower substrate when integrated with the lower substrate.
And an inspection of the upper substrate alone. The reason why the lower substrate 61d is not arranged to overlap the 51t1 will be described later. Although not shown, the connection terminals of the electrodes 52a to 52e on the upper substrate are arranged at positions to connect to the connection terminals (51a to 51e in FIG. 1) of the lower substrate. When testing the upper substrate alone, if the connection terminals of the upper substrate are used instead of the external terminals described with reference to FIG. 1, there are terminals 41e1 and 51t1 between the electrodes 42e and 52a. The inspection can be performed without using a special prober, and the inspection jig can be simplified.
Since the lower substrate is the same as that shown in FIG. 1, the inspection of the lower substrate may be performed between the connection terminals 31a to 31e in the conventional manner.

【0023】図2においては、61dはダミー端子で、
上基板の接続端子51t1とは電気的な接続はしていな
い。これは、上基板の単体での試験が済んでいることと
表示駆動のための信号は図1で示す接続端子51aが司
るからである。このように、検査用に設けた接続端子を
切り離すことにより、静電気などの外からの外乱がパネ
ルに入ることを防ぐと同時に、下基板の端子をダミー端
子にすることにより、接続端子に外部信号入力用フレキ
シブル基板(FPC)を異方性導電接着剤で貼り付けた
時の接続端子の外側の接着の剥がれ防止などの保護が出
来る。また、限られた基板の中で図1のダミー端子61
cと対象形にパターンが形成できるので、見かけ上従来
と同じ形の表示装置の提供が出来るので、従来のものと
の互換性が保てる利点もある。
In FIG. 2, 61d is a dummy terminal,
The connection terminal 51t1 on the upper substrate is not electrically connected. This is because the test for the upper substrate alone has been completed and the signal for driving the display is controlled by the connection terminal 51a shown in FIG. In this way, by disconnecting the connection terminals provided for inspection, external disturbances such as static electricity can be prevented from entering the panel, and at the same time, external terminals can be connected to the connection terminals by using the terminals on the lower substrate as dummy terminals. When the input flexible substrate (FPC) is attached with an anisotropic conductive adhesive, protection such as prevention of peeling of the adhesive outside the connection terminal can be performed. Also, the dummy terminal 61 of FIG.
Since a pattern can be formed in c and the target shape, a display device having the same shape as the conventional one can be provided, and there is an advantage that compatibility with the conventional one can be maintained.

【0024】さらに、この形で検査を行うときには検査
を行う時にプローバーを当接する場所と実際の表示駆動
するための外部接続の場所とが異なり、検査時のプロー
バーの接触による検査痕の影響を受けずに外部接続でき
るので、表示装置としての品質もより安定する。このこ
とは下基板においても同様な対応が出来るので、別の実
施形態図3で説明する。
Further, when the inspection is performed in this manner, the location where the prober comes in contact with the inspection is different from the location of the external connection for actually driving the display, and the inspection is affected by the inspection mark due to the contact of the prober during the inspection. Since the display device can be connected to an external device without the need, the quality of the display device is more stable. The same can be applied to the lower substrate, so that another embodiment will be described with reference to FIG.

【0025】ダイナミック駆動による表示はマトリック
ス駆動とも呼ばれるように、上下電極の交差点における
状態の違いによって表示作動を行うものであるから、上
下の基板のどちらに信号電極、走査電極を配置しても良
く、また、いずれの電極の接続端子群との接続もまた中
央端子群、分割端子群のいずれでも選択できる。図3は
下基板に走査電極群を想定し、それを分割電極群とした
場合の実施形態である。41a〜41eは接続端子で、
図2の電極42a〜42e、52t、検査端子51t1
に相当する電極42a2〜42e2、52t2、検査端
子51a2が点線のごとく下基板1枚に配置されてい
る。ここでは、検査プローブを当接させる検査領域は2
点鎖線で示したCの部分、外部接続領域は2点鎖線で示
したDの部分である。この場合、接続端子41a〜41
eの検査領域と検査端子51t2を用いて基板単体での
試験がプローバーのピッチを固定して行える。2点鎖線
Eは上基板の端を示す。
Since the display by the dynamic drive performs the display operation depending on the difference in the state at the intersection of the upper and lower electrodes as called the matrix drive, the signal electrode and the scan electrode may be arranged on either the upper or lower substrate. Also, the connection of any electrode to the connection terminal group can be selected from either the center terminal group or the divided terminal group. FIG. 3 shows an embodiment in which a scanning electrode group is assumed on the lower substrate and is used as a divided electrode group. 41a to 41e are connection terminals,
The electrodes 42a to 42e and 52t and the inspection terminal 51t1 of FIG.
The electrodes 42a2 to 42e2, 52t2 and the inspection terminals 51a2 corresponding to are arranged on one lower substrate as indicated by the dotted lines. Here, the inspection area where the inspection probe is brought into contact is 2
The portion C indicated by the dashed line and the external connection region are the portion D indicated by the two-dot chain line. In this case, connection terminals 41a to 41
Using the inspection area e and the inspection terminal 51t2, the test of the substrate alone can be performed with the prober pitch fixed. The two-dot chain line E indicates the edge of the upper substrate.

【0026】以上の実施形態は走査電極を二つに分け
て、二つの接続端群に振り分けた例を示したが、本発明
は分割がいくつのものでも出来る。図4の実施形態でこ
れを説明する。図4は電極群を4つに分けて実施した場
合の透視的平面図である。図1と同じ符号は全く同じ内
容のものである。即ち32a〜32eは下基板の信号電
極群、42a〜42eは上基板の第1の走査電極群、5
2a〜52eは第2の走査電極群、31a〜31eは中
央端子群、41a〜41e、51a〜51eは分割端子
群、51tは第2の分割端子群に追加して設けた接続端
子、61a、61b、61cはダミー端子である。これ
に追加して、上基板には第3の走査電極群72a〜72
e、第4の走査電極群82a〜82eが配設される。ま
た、下基板には第3の電極群に対応した接続端子群71
a〜71eが配設されると共に、電極82aに接続する
二つの端子の内の一つの接続端子81tが、接続端子群
71a〜71eの側方にこの端子群と並んで配置され
る。一方、第4の電極群82a〜82eに対応する接続
端子81a〜81eが配設され、さらに電極72aに接
続する二つの端子の内の一つの接続端子71tが接続端
子81a〜81eの側方に配設されると共に、この端子
群に並んで配置されている。
Although the above embodiment has shown an example in which the scanning electrode is divided into two and divided into two connection end groups, the present invention can be applied to any number of divisions. This is described in the embodiment of FIG. FIG. 4 is a perspective plan view when the electrode group is divided into four groups. 1 have the same contents. That is, 32a to 32e are signal electrode groups on the lower substrate, 42a to 42e are first scan electrode groups on the upper substrate,
2a to 52e are a second scanning electrode group, 31a to 31e are central terminal groups, 41a to 41e, 51a to 51e are divided terminal groups, and 51t is a connection terminal additionally provided to the second divided terminal group, 61a, 61b and 61c are dummy terminals. In addition to this, the third scan electrode groups 72a to 72
e, fourth scanning electrode groups 82a to 82e are provided. The lower substrate has a connection terminal group 71 corresponding to the third electrode group.
a to 71e are arranged, and one connection terminal 81t of the two terminals connected to the electrode 82a is arranged beside the connection terminal groups 71a to 71e. On the other hand, connection terminals 81a to 81e corresponding to the fourth electrode groups 82a to 82e are provided, and one connection terminal 71t of the two terminals connected to the electrode 72a is located on the side of the connection terminals 81a to 81e. It is arranged and arranged alongside this terminal group.

【0027】このように、走査電極72aは端子71a
と71tを、走査電極82aは端子81aと81tをそ
れぞれ二つの端子を持つことにより、端子51eと71
aの短絡テストは端子51eと71tとを、電極72e
と82aの短絡テストは「接続」端子71eと81tの
との隣り合った端子を選択して行えるので、中央端子群
をまたいだ接続の端子にプローバーを当てることなく検
査が可能となる。本実施形態においても81tをダミー
端子化して、図2及び図3で説明した効果を得ることが
出来る。
As described above, the scanning electrode 72a is connected to the terminal 71a.
The scanning electrode 82a has two terminals 81a and 81t, and the scanning electrodes 82a have two terminals 51e and 71t.
In the short-circuit test of a, the terminals 51e and 71t are connected to the electrode 72e.
And 82a can be performed by selecting adjacent terminals of the "connection" terminals 71e and 81t, so that inspection can be performed without applying a prober to terminals connected across the central terminal group. Also in the present embodiment, the effect described with reference to FIGS. 2 and 3 can be obtained by using 81t as a dummy terminal.

【0028】以上の説明は上基板の電極は表示装置内で
下基板に接続し、駆動のための端子接続を下基板でまと
めて出来る実施形態で行ったが、上基板の電極の外部接
続は上基板から直接行う場合もある。図6と図7を用い
てその実施形態について説明する。
In the above description, the electrodes of the upper substrate are connected to the lower substrate in the display device, and the terminal connection for driving is performed by the lower substrate. It may be performed directly from the upper substrate. The embodiment will be described with reference to FIGS.

【0029】図5は透視的平面図、図6は図5のF−F
簡略的断面図である。下基板1には信号電極32a〜3
2eが中央端子群31a〜31eに接続して、接続端子
群はダミー端子61a、61bで保護されている。駆動
のための外部接続は、図5においては、端子31a〜3
1eの上面から行う。この接続は、エポキシなどの接着
樹脂の中に導電粒子と絶縁粒子を混入させた異方性導電
接着剤が用いられ、熱圧着されて接続が行われる。上基
板の走査電極は42a〜42eと51a〜52eの二つ
の群で構成され、それぞれ第1の分割端子群41a2〜
41e2、と第2の分割端子群52a2〜52e2に接
続している。更に、電極42eと52aは二つの接続端
子を持っていて、それぞれ反対側の分割端子群の中の4
1t2、51t2に接続している。駆動のための外部接
続は図6下面から行う。図7の150はこの下面でのパ
ターン位置を簡略的に示したものである。60は封止部
で、この場合は上下基板間の電気的な接続は不要であ
る。
FIG. 5 is a perspective plan view, and FIG. 6 is an FF of FIG.
It is a simplified sectional view. The lower substrate 1 has signal electrodes 32a-3
2e is connected to the center terminal groups 31a to 31e, and the connection terminal group is protected by the dummy terminals 61a and 61b. The external connection for driving includes terminals 31a to 3a in FIG.
1e. For this connection, an anisotropic conductive adhesive in which conductive particles and insulating particles are mixed in an adhesive resin such as epoxy is used, and the connection is performed by thermocompression bonding. The scanning electrodes on the upper substrate are composed of two groups of 42a to 42e and 51a to 52e, and the first divided terminal groups 41a2 to 41e2 respectively.
41e2 and the second divided terminal groups 52a2 to 52e2. Further, the electrodes 42e and 52a have two connection terminals, and each of the electrodes 42e and 52a has four terminals in the opposite terminal group.
It is connected to 1t2 and 51t2. External connection for driving is performed from the lower surface of FIG. Reference numeral 150 in FIG. 7 simply shows the pattern position on the lower surface. Reference numeral 60 denotes a sealing portion. In this case, electrical connection between the upper and lower substrates is unnecessary.

【0030】上基板2の電極の短絡テストを行う場合、
接続端子51t2または41t2が準備してないと電極
42eと52aの間のテストは接続端子41eと51a
で行わなければならないから、この時のみ検査プローバ
ーは下基板をまたいだものを用いなければならない。本
実施例「形態」の場合は41e2と51t2又は51a
2と41t2の隣り合う端子で行うことが出来るので、
簡単な検査治具で確実な検査を行うことが出来る。本実
施例では二つの接続端子をもつ電極が2本で説明した
が、41t2、51t2のいずれか一つでも良い。
When performing a short-circuit test of the electrodes of the upper substrate 2,
If the connection terminals 51t2 or 41t2 are not prepared, the test between the electrodes 42e and 52a is performed by the connection terminals 41e and 51a.
In this case, only at this time, the inspection prober must use the one that straddles the lower substrate. In the case of this embodiment “form”, 41e2 and 51t2 or 51a
2 and 41t2 can be performed at adjacent terminals.
Reliable inspection can be performed with a simple inspection jig. In the present embodiment, two electrodes having two connection terminals are described, but any one of 41t2 and 51t2 may be used.

【0031】[0031]

【発明の効果】本発明は、以上説明したようにマトリッ
クス駆動する電極群を振り分け分割して外からの駆動信
号を得る表示装置においても、分割群の隣り合う電極の
一本は両側に端子を有し、常に隣り合う電極を検査可能
な接続端子が準備されているので、全ての電極の検査が
隣り合う接続端子の選択を繰り返すことによって検査が
可能となる。このことによって、検査用のプローバーは
極端に大きなスパンのものを準備する必要がなく、簡便
な治具で検査を容易に、且つ確実に行える効果がある。
According to the present invention, as described above, even in a display device in which a matrix-driven electrode group is divided and divided to obtain an external drive signal, one of the electrodes adjacent to the divided group has terminals on both sides. Since the connection terminals that can always inspect the adjacent electrodes are prepared, the inspection of all the electrodes can be performed by repeating the selection of the adjacent connection terminals. As a result, there is no need to prepare an inspection prober having an extremely large span, and there is an effect that the inspection can be performed easily and reliably with a simple jig.

【0032】従来、検査用のプローバーが同一電極群内
の隣接電極間を測定するプローバーと異なった大きさの
プローバが必要になり、少なくとも2種類のプローバが
必要としていたため。このことより作業手順や、プロー
バーの管理が複雑になり、さらにプローバーコストが高
くなる問題もあったが、本願発明によれば、プローバが
1種類で済み、前記従来の問題が解決できる効果を有す
る。さらに、接続端子群のピッチを同一にすることによ
り、検査プローバーの当接スパンは固定でき、検査治具
がより簡便になると同時に、検査治具の標準化がはかり
やすくなる。
Conventionally, a prober for inspection needs a prober different in size from a prober that measures between adjacent electrodes in the same electrode group, and at least two types of probers are required. As a result, the work procedure and the management of the prober are complicated, and there is also a problem that the prober cost is increased. However, according to the present invention, only one type of prober is required, and the conventional problem can be solved. . Furthermore, by making the pitch of the connection terminal group the same, the contact span of the inspection prober can be fixed, so that the inspection jig becomes simpler and the standardization of the inspection jig becomes easier.

【0033】また、両端に接続端子を有する電極の片方
の接続端子は検査領域にのみ配置することにより、表示
装置の完成体において、外部からの静電気による悪影響
などの外乱の影響を受けずらい品質を確保できると同時
に、従来品と互換性有る製品の提供が可能となる。
Further, by arranging one connection terminal of the electrode having connection terminals at both ends only in the inspection area, the quality of the completed display device is less likely to be affected by disturbances such as adverse effects of external static electricity in the completed display device. At the same time, it is possible to provide products that are compatible with conventional products.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施形態で、外部接続端子が一
枚の基板に設けられている液晶パネルの配線パターンを
示す透視的平面図である。
FIG. 1 is a perspective plan view showing a wiring pattern of a liquid crystal panel in which an external connection terminal is provided on one substrate according to a first embodiment of the present invention.

【図2】図1のB部を拡大した他の実施形態を示す部分
図であり、上基板に分割電極群を配した場合のパターン
を示す部分平面図である。
FIG. 2 is a partial view showing another embodiment in which a portion B in FIG. 1 is enlarged, and is a partial plan view showing a pattern when a divided electrode group is arranged on an upper substrate.

【図3】図1のB部を拡大した他の実施形態を示す部分
図であり、下基板に分割電極群を配した場合のパターン
を示す部分平面図である。
FIG. 3 is a partial view showing another embodiment in which a portion B in FIG. 1 is enlarged, and is a partial plan view showing a pattern when a divided electrode group is arranged on a lower substrate.

【図4】本発明の他の実施形態で、電極の分割群を増や
したときの配線パターンを示す透視的平面図である。
FIG. 4 is a perspective plan view showing a wiring pattern when a group of divided electrodes is increased in another embodiment of the present invention.

【図5】本発明の更に他の実施形態で、駆動信号を得る
接続端子が2枚の基板のそれぞれに設けられている液晶
パネルの配線パターンを示す透視的的平面図である。
FIG. 5 is a perspective plan view showing a wiring pattern of a liquid crystal panel in which connection terminals for obtaining drive signals are provided on each of two substrates according to still another embodiment of the present invention.

【図6】図5のF−F断面図である。FIG. 6 is a sectional view taken along line FF of FIG. 5;

【図7】「本発明に関する」従来技術を示す表示「液
晶」装置の例である液晶パネルを斜め上から見た斜視図
である。
FIG. 7 is a perspective view of a liquid crystal panel, which is an example of a display “liquid crystal” device showing the prior art “related to the present invention”, as viewed obliquely from above.

【図8】図7に示す液晶パネルのA−A線の断面図であ
る。
FIG. 8 is a cross-sectional view taken along line AA of the liquid crystal panel shown in FIG.

【符号の説明】[Explanation of symbols]

1 下基板 2 上基板 31a〜31e 中央端子群(接続端子) 32a〜32e 信号電極群(信号電極) 41a〜41e 走査電極端子群(分割接続端子群) 41a1〜41e1 上基板の接続端子部(端子) 41a2〜41e2 第1の分割端子群(端子) 41t、41t2、51t、51t1、51t2、71
t、81t 検査端子 42a〜42e 走査電極群(走査電極) 42a2〜42e2 走査電極群に相当する電極群(電
極) 51a〜51e 走査電極端子群(分割接続端子群) 52a〜52e 走査電極群(走査電極) 52a2〜52e2 第2の分割端子群(端子) 61、61a〜61h ダミー端子 71a〜71e 接続端子群 72a〜72e 第3の走査電極群 81a〜81e 接続端子群 82a〜82e 第4の走査電極群(走査電極) C 検査領域 D 外部接続領域
DESCRIPTION OF SYMBOLS 1 Lower board | substrate 2 Upper board | substrate 31a-31e Central terminal group (connection terminal) 32a-32e Signal electrode group (signal electrode) 41a-41e Scanning electrode terminal group (divided connection terminal group) 41a1-41e1 Connection terminal part (terminal of upper board) 41a2 to 41e2 First divided terminal group (terminal) 41t, 41t2, 51t, 51t1, 51t2, 71
t, 81t Inspection terminals 42a-42e Scan electrode group (scan electrode) 42a2-42e2 Electrode group (electrode) corresponding to scan electrode group 51a-51e Scan electrode terminal group (split connection terminal group) 52a-52e Scan electrode group (scan) Electrodes) 52a2-52e2 Second divided terminal group (terminal) 61, 61a-61h Dummy terminal 71a-71e Connection terminal group 72a-72e Third scan electrode group 81a-81e Connection terminal group 82a-82e Fourth scan electrode Group (scanning electrode) C Inspection area D External connection area

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2G014 AA03 AB20 AB21 2H092 GA32 NA30 5C040 GK05 5C094 AA42 AA43 AA48 BA31 BA43 CA19 DB01 DB03 DB04 DB10 EA03 EA05 EB03 FA01 FB12 GB10 5G435 AA17 BB06 BB12 CC09 EE12 EE41 KK05 KK10  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2G014 AA03 AB20 AB21 2H092 GA32 NA30 5C040 GK05 5C094 AA42 AA43 AA48 BA31 BA43 CA19 DB01 DB03 DB04 DB10 EA03 EA05 EB03 FA01 FB12 GB10 5G435 AA17 BB06 BB12 CC09 EE12

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 対向する二つの基板に挟持された表示素
子を駆動する電極は一方の基板に信号電極群が配設され
他方の基板に走査電極群が配設され前記信号電極と前記
走査電極とが互いに交差するようにマトリックス状に配
置されそれぞれの前記基板の各電極は駆動信号が印可さ
れる接続端子と接続され前記走査電極の一部は略右方向
へ引出され接続端子に接続される配線と略左方向へ引出
され接続端子に接続される配線とを有することで複数の
電極群を有する表示装置に於いて、前記電極群同士が隣
接してなるところの隣接する電極群の2本の電極の内の
少なくとも1本の電極の一部は略左右の両方向に引き出
され更に前記電極群と接続される前記接続端子群の近傍
に接続端子又は検査端子或いは接続端子と検査端子を有
することを特徴とする表示装置。
An electrode for driving a display element sandwiched between two opposing substrates has a signal electrode group disposed on one substrate and a scanning electrode group disposed on the other substrate. Are arranged in a matrix so as to cross each other, each electrode of each of the substrates is connected to a connection terminal to which a drive signal is applied, and a part of the scanning electrode is pulled out substantially to the right and connected to the connection terminal. In a display device having a plurality of electrode groups by having a wiring and a wiring which is pulled out substantially to the left and connected to a connection terminal, in the display device having a plurality of electrode groups, two of the adjacent electrode groups where the electrode groups are adjacent to each other A portion of at least one of the electrodes is drawn out substantially in both left and right directions, and further has a connection terminal or an inspection terminal or a connection terminal and an inspection terminal near the connection terminal group connected to the electrode group. Characterized by Display device.
【請求項2】 前記走査電極の接続端子群のピッチと前
記信号電極群の接続端子群のピッチとが略同じであるこ
とを特徴とする請求項1に記載の表示装置。
2. The display device according to claim 1, wherein a pitch of the connection terminal group of the scanning electrode is substantially equal to a pitch of the connection terminal group of the signal electrode group.
【請求項3】 前記走査電極の接続端子群のピッチと前
記信号電極群の接続端子群のピッチと前記左右の両方向
に引き出され電極に接続される前記接続端子接続端子又
は検査端子或いは接続端子と検査端子のピッチとが略同
じであることを特徴とする請求項1または請求項2に記
載の表示装置。
3. The connection terminal connection terminal, the inspection terminal or the connection terminal which is drawn out in both the left and right directions and connected to the electrode, wherein the connection terminal group of the scanning electrode and the connection terminal group of the signal electrode group have a pitch. 3. The display device according to claim 1, wherein the pitch of the inspection terminals is substantially the same.
【請求項4】 対向する二つの基板に挟持された表示素
子を駆動する電極は一方の基板に信号電極群が配設され
他方の基板に走査電極群が配設され前記信号電極と前記
走査電極とが互いに交差するようにマトリックス状に配
置されそれぞれの前記基板の各電極は駆動信号が印可さ
れる接続端子と接続されどちらか一方の前記基板の電極
に接続した前記接続端子は互いに隣接して中央端子群を
なし他方の基板に配置された電極は二つ以上に分割され
るとともに二つ以上に分割された前記電極と接続される
接続端子は分割された前記電極に対応して分割端子群を
構成し該分割端子群は該中央端子群の両側に位置する電
極パターンを有しており、該前記分割された電極群の隣
接する2本の電極の内の少なくとも1本の電極は両端に
接続端子を有し該接続端子は該中央端子群の両側にあっ
て該それぞれの分割端子群の一つとして配置されている
ことを特徴とする表示装置。
4. An electrode for driving a display element sandwiched between two opposing substrates, wherein a signal electrode group is disposed on one substrate, and a scanning electrode group is disposed on the other substrate. Are arranged in a matrix so as to cross each other, each electrode of each of the substrates is connected to a connection terminal to which a drive signal is applied, and the connection terminals connected to the electrodes of one of the substrates are adjacent to each other. The electrode that forms the central terminal group and is disposed on the other substrate is divided into two or more, and the connection terminals connected to the two or more divided electrodes are divided terminal groups corresponding to the divided electrodes. The divided terminal group has an electrode pattern located on both sides of the central terminal group, and at least one electrode of two adjacent electrodes of the divided electrode group is at both ends. Having a connection terminal The display device, wherein the connection terminals are disposed on both sides of the central terminal group and are arranged as one of the divided terminal groups.
【請求項5】 前記分割接続端子群のピッチが互いに同
じであることを特徴とする請求項4に記載の表示装置。
5. The display device according to claim 4, wherein the pitches of the divided connection terminal groups are the same.
【請求項6】 前記分割接続端子群のピッチおよび前記
中央端子群のピッチが互いに同じであることを特徴とす
る請求項4に記載の表示装置。
6. The display device according to claim 4, wherein a pitch of the divided connection terminal group and a pitch of the center terminal group are the same.
【請求項7】 前記両端に接続端子を有する電極の接続
端子の一方は検査領域のみを有し表示駆動用の外部接続
領域を持たないことを特徴とする請求項4または請求項
5または請求項6に記載の表示装置。
7. The connection terminal according to claim 4, wherein one of the connection terminals of the electrode having connection terminals at both ends has only an inspection region and does not have an external connection region for display driving. 7. The display device according to 6.
JP11185000A 1999-06-30 1999-06-30 Display device Pending JP2001013892A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11185000A JP2001013892A (en) 1999-06-30 1999-06-30 Display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11185000A JP2001013892A (en) 1999-06-30 1999-06-30 Display device

Publications (1)

Publication Number Publication Date
JP2001013892A true JP2001013892A (en) 2001-01-19

Family

ID=16163033

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11185000A Pending JP2001013892A (en) 1999-06-30 1999-06-30 Display device

Country Status (1)

Country Link
JP (1) JP2001013892A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100496283B1 (en) * 2000-04-28 2005-06-17 삼성에스디아이 주식회사 Plasma display panel
JP2005201958A (en) * 2004-01-13 2005-07-28 Seiko Epson Corp Substrate for electrooptic device, electrooptic device, inspection device, electronic equipment, inspection method, and method for manufacturing electrooptic device
US7038484B2 (en) 2004-08-06 2006-05-02 Toshiba Matsushita Display Technology Co., Ltd. Display device
KR100736279B1 (en) * 2004-08-06 2007-07-06 도시바 마쯔시따 디스플레이 테크놀로지 컴퍼니, 리미티드 Display device, inspection method for display device, and inspection device for display device
KR100762699B1 (en) * 2005-12-08 2007-10-01 삼성에스디아이 주식회사 Liquid Crystal Display Device
JP2008039869A (en) * 2006-08-02 2008-02-21 Fuji Xerox Co Ltd Image display medium, image writing device, and image forming apparatus
US7948459B2 (en) 2006-07-07 2011-05-24 Toshiba Matsushita Displays Technology Co., Ltd. Display device and inspection method for display device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100496283B1 (en) * 2000-04-28 2005-06-17 삼성에스디아이 주식회사 Plasma display panel
JP2005201958A (en) * 2004-01-13 2005-07-28 Seiko Epson Corp Substrate for electrooptic device, electrooptic device, inspection device, electronic equipment, inspection method, and method for manufacturing electrooptic device
JP4682516B2 (en) * 2004-01-13 2011-05-11 セイコーエプソン株式会社 Electro-optical device substrate, electro-optical device, and electronic apparatus
US7038484B2 (en) 2004-08-06 2006-05-02 Toshiba Matsushita Display Technology Co., Ltd. Display device
KR100725194B1 (en) * 2004-08-06 2007-06-08 도시바 마쯔시따 디스플레이 테크놀로지 컴퍼니, 리미티드 Display device
KR100736279B1 (en) * 2004-08-06 2007-07-06 도시바 마쯔시따 디스플레이 테크놀로지 컴퍼니, 리미티드 Display device, inspection method for display device, and inspection device for display device
US7796222B2 (en) 2004-08-06 2010-09-14 Toshiba Matsushita Display Technology Co., Ltd. Display device, inspection method for display device, and inspection device for display device
KR100762699B1 (en) * 2005-12-08 2007-10-01 삼성에스디아이 주식회사 Liquid Crystal Display Device
US7714971B2 (en) 2005-12-08 2010-05-11 Samsung Mobile Display Co., Ltd. Liquid crystal display
US7948459B2 (en) 2006-07-07 2011-05-24 Toshiba Matsushita Displays Technology Co., Ltd. Display device and inspection method for display device
JP2008039869A (en) * 2006-08-02 2008-02-21 Fuji Xerox Co Ltd Image display medium, image writing device, and image forming apparatus

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