JPH06214247A - Liquid crystal display device - Google Patents

Liquid crystal display device

Info

Publication number
JPH06214247A
JPH06214247A JP2073293A JP2073293A JPH06214247A JP H06214247 A JPH06214247 A JP H06214247A JP 2073293 A JP2073293 A JP 2073293A JP 2073293 A JP2073293 A JP 2073293A JP H06214247 A JPH06214247 A JP H06214247A
Authority
JP
Japan
Prior art keywords
wiring
conductive film
electrode
substrate
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2073293A
Other languages
Japanese (ja)
Inventor
Heihachiro Ebihara
平八郎 海老原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Priority to JP2073293A priority Critical patent/JPH06214247A/en
Publication of JPH06214247A publication Critical patent/JPH06214247A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To decrease problems, such as crosstalks, degradation in contrast or nonuniform display, by providing the lower parts of the drawing around parts of wiring electrodes or pixel electrodes with wiring conductive films which are respectively in contact therewith. CONSTITUTION:The front surface of a substrate 21 is provided with a conductive film and is etched, by which the conductive films 25 acting as light shielding films, the wiring conductive films 30, 31 and lining part of an inspecting electrode 29 are formed. The front surface of the substrate is then provided with an insulating film and is formed by etching to required shapes in such a manner that the wiring conductive films 30, 31 and the lining part of the inspecting electrode 29 are exposed. A transparent conductive film is then provided over the entire surface of the substrate and is etched, by which the wiring electrodes 26, the inspecting electrode 29 and the pixel electrodes 23 are formed. The pixel electrodes 23 are partly lined with the wiring conductive films 31 and the resistance value is decreased by the wiring electrodes 26 and the wiring conductive films 30. Since the inspecting electrode 29 is connected to the conductive film 25, the shorting inspection of the pixel electrodes 23 and the conductive film 25 is thereafter executed at all times by testing the conduction between the respective pixel electrodes 23 and the inspecting electrode 29.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、液晶表示装置の構造に
関するものである。液晶表示装置は基本的には複数の画
素を形成するための透明電極(以下画素電極とする)を
形成した2枚の基板を、画素電極を形成した面を対向さ
せ、封止材により封止し、これに液晶材料を注入して構
成する。個々にはモノクローム、カラー、セグメント
型、マトリクス型、アクティブ型、パッシブ型あるいは
TN、STNその他のモード等の違いにより、構造が異
なる場合があるが、本発明は何れにも対応可能である。
以下の説明はSTN、パッシブマトリクス型モノクロー
ム液晶表示装置を代表として説明する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to the structure of a liquid crystal display device. In a liquid crystal display device, basically, two substrates on which transparent electrodes (hereinafter, referred to as pixel electrodes) for forming a plurality of pixels are formed, and the surfaces on which the pixel electrodes are formed face each other, and are sealed with a sealing material. Then, a liquid crystal material is injected into this. The structure may be different depending on the mode such as monochrome, color, segment type, matrix type, active type, passive type or TN, STN or other modes, but the present invention is applicable to any of them.
In the following description, STN and passive matrix type monochrome liquid crystal display devices will be described as representatives.

【0002】[0002]

【従来の技術】以下図面に基づいて従来技術を説明す
る。図3はチップオングラス(以下COGとする)技術
を用いた従来のパッシブマトリクス配列のモノクローム
液晶表示装置の構造を示す断面図である。第1の基板1
1と第2の基板21は封止材24によって封止され、こ
の封止領域内に液晶14が注入される。両基板間の間隔
(以下基板間隔と言う)はスペーサー15によって規制
される。第1の基板11には画素電極13が設けられ
る。第2の基板21上には導電膜25が設けられ、導電
膜25の上に絶縁膜28が設けられ、絶縁膜28上に画
素電極23が設けられる。画素電極13と23上には実
際には配向膜が設けられているが簡単のため図示を省略
して有る。基板11、21の外側にはそれぞれ偏光板1
2、22が設けられる。
2. Description of the Related Art A conventional technique will be described below with reference to the drawings. FIG. 3 is a cross-sectional view showing the structure of a conventional passive matrix array monochrome liquid crystal display device using a chip-on-glass (hereinafter referred to as COG) technique. First substrate 1
The 1st and 2nd board | substrate 21 is sealed by the sealing material 24, and the liquid crystal 14 is inject | poured in this sealing area | region. The spacer 15 regulates the distance between both substrates (hereinafter referred to as the substrate distance). The pixel electrode 13 is provided on the first substrate 11. A conductive film 25 is provided on the second substrate 21, an insulating film 28 is provided on the conductive film 25, and a pixel electrode 23 is provided on the insulating film 28. An alignment film is actually provided on the pixel electrodes 13 and 23, but the illustration is omitted for simplicity. A polarizing plate 1 is provided outside the substrates 11 and 21, respectively.
2, 22 are provided.

【0003】画素電極13と23は、それぞれ直交して
井桁状に配列され、両者の交差する部分が画素となる。
画素電極23は封止材24の外側で、駆動集積回路40
の出力端子41に接続される。駆動集積回路40の入力
端子42は画素電極23とは独立した、かつ画素電極2
3と同質の透明電極(以下配線電極とする)26に接続
され、配線電極26はフレキシブルシート等の配線部材
32に接続される。
The pixel electrodes 13 and 23 are arranged orthogonally to each other in a grid pattern, and the intersections of the two serve as pixels.
The pixel electrode 23 is outside the encapsulant 24, and the driving integrated circuit 40
Of the output terminal 41. The input terminal 42 of the driving integrated circuit 40 is independent of the pixel electrode 23 and
3 is connected to a transparent electrode (hereinafter referred to as a wiring electrode) 26 having the same quality as that of the wiring 3, and the wiring electrode 26 is connected to a wiring member 32 such as a flexible sheet.

【0004】画素部分の液晶には画素電極13と画素電
極23にそれぞれ印加される駆動電圧の差の電圧が印加
され、液晶はその実効電圧に関係して状態を変え、表示
に関与する。画素以外の部分の液晶には正規の電圧が印
加されないため、表示に不都合な状態を呈して表示コン
トラストを低下させる場合があり、これを防ぐため非画
素部に井桁状に遮光用の膜を設ける場合がある。この膜
は非導電性、導電性のいずれであっても良いが、遮光特
性や膜厚が他の特性に与える影響を考慮して導電性の膜
が使用される場合が多い。
The liquid crystal in the pixel portion is applied with a voltage which is the difference between the driving voltages applied to the pixel electrode 13 and the pixel electrode 23, and the liquid crystal changes its state in relation to its effective voltage and participates in display. Since a normal voltage is not applied to the liquid crystal in the parts other than the pixels, it may cause a display inconvenient state and lower the display contrast. There are cases. This film may be either non-conductive or conductive, but a conductive film is often used in consideration of the effect of the light-shielding property and the film thickness on other properties.

【0005】図3は導電膜25を遮光膜として用いた場
合を示しており、この導電膜25は上述の如く画素が配
列されている部分(以下表示部とする)の非画素部に井
桁状に設ける他、封止材24の近傍の見切りとして、あ
るいは封止部分の基板間隔を表示部のそれと一致させる
目的で表示部以外の部分にも伸張される場合がある。図
3は封止部分の基板間隔を表示部の基板間隔と一致させ
る目的で導電膜25が封止材24の下まで伸張し、さら
に基板11の封止部分にの基板間隔調整用の透明電極1
6を設けた例を示す。
FIG. 3 shows a case where the conductive film 25 is used as a light-shielding film. The conductive film 25 is arranged in a non-pixel portion in a portion where pixels are arranged as described above (hereinafter referred to as a display portion). In addition to the above-mentioned structure, it may be extended to a portion other than the display portion as a parting near the sealing material 24 or for the purpose of matching the substrate interval of the sealing portion with that of the display portion. In FIG. 3, the conductive film 25 extends below the sealing material 24 for the purpose of matching the substrate spacing of the sealing portion with the substrate spacing of the display portion, and further, the transparent electrode for adjusting the substrate spacing in the sealing portion of the substrate 11. 1
An example in which 6 is provided will be shown.

【0006】上記COG技術は特に細密な画素電極1
3、23を有する表示装置に有効である。またこの様に
細密な画素電極13、23を有する表示装置にあっては
有効画素面積が低下してコントラストが低下する傾向に
あり、遮光膜が必要となる事が多い。
[0006] The COG technique described above uses a particularly fine pixel electrode 1
This is effective for the display device having 3, 23. Further, in the display device having such fine pixel electrodes 13 and 23, the effective pixel area tends to decrease and the contrast tends to decrease, and a light shielding film is often required.

【0007】[0007]

【発明が解決しようとする課題】COG技術の問題点の
一つは、駆動集積回路40が基板21上に設けられるた
め、その電源線の抵抗が上昇する傾向にある点である。
すなわち、配線部材32と配線電極26との接続抵抗、
配線電極26自身の配線抵抗、配線電極26と駆動集積
回路40の入力端子42との接続抵抗等がその原因とな
る。駆動集積回路40の電源線のうち、特に液晶駆動電
圧に関係する電源線の抵抗増加は、液晶に印加する駆動
電圧の波形に歪みを生じさせ、理想波形からのズレを生
じ、クロストークやコントラスト低下の原因となる。
One of the problems of the COG technique is that the drive integrated circuit 40 is provided on the substrate 21, so that the resistance of the power supply line tends to increase.
That is, the connection resistance between the wiring member 32 and the wiring electrode 26,
The wiring resistance of the wiring electrode 26 itself, the connection resistance between the wiring electrode 26 and the input terminal 42 of the drive integrated circuit 40, etc. are the causes. Among the power supply lines of the drive integrated circuit 40, an increase in the resistance of the power supply lines particularly related to the liquid crystal drive voltage causes the waveform of the drive voltage applied to the liquid crystal to be distorted and deviates from the ideal waveform, resulting in crosstalk and contrast. It causes a decrease.

【0008】また画素電極23の集積回路40への引き
回し部分は極めて狭い範囲に集中的に寄せ集めるため、
この部分では画素電極23は極めて細い線幅となり抵抗
が増大し、これもクロストークやコントラスト低下の原
因となる。さらに各画素電極23は、引き回し部分の長
さがそれぞれ異なるため抵抗値が一定とならず、表示状
態が均一にならないと言う問題も生ずる。
Further, since the lead-out portions of the pixel electrodes 23 to the integrated circuit 40 are concentrated together in an extremely narrow range,
In this portion, the pixel electrode 23 has an extremely narrow line width and the resistance increases, which also causes crosstalk and contrast reduction. Furthermore, since the lengths of the drawn-out portions of the pixel electrodes 23 are different from each other, the resistance value is not constant, which causes a problem that the display state is not uniform.

【0009】そこで本発明が解決しようとする第1の課
題は、配線電極26の配線抵抗を低下させる事であり、
画素電極23の駆動集積回路40への引き回し配線の抵
抗を低下させる事である。
The first problem to be solved by the present invention is to reduce the wiring resistance of the wiring electrode 26.
The purpose is to reduce the resistance of the wiring that connects the pixel electrode 23 to the drive integrated circuit 40.

【0010】次に遮光膜として用いる導電膜25は、絶
縁膜28により画素電極23と絶縁されているのである
が、それにもかかわらずしばしば導電膜25と画素電極
23の間で電気的短絡が起こり、歩留まりを大幅に低下
させてしまう。その原因としては、例えば絶縁膜28に
発生した微細なピンホールが挙げられる。このピンホー
ルを完全に無くすことは現在のところ非常に難しい。ま
た他の原因としてはゴミによるものが挙げられる。
Next, the conductive film 25 used as the light-shielding film is insulated from the pixel electrode 23 by the insulating film 28, but nevertheless, an electrical short circuit often occurs between the conductive film 25 and the pixel electrode 23. , The yield will be significantly reduced. The cause thereof is, for example, a fine pinhole generated in the insulating film 28. Completely eliminating this pinhole is currently very difficult. Another cause is dust.

【0011】種々の原因により、短絡の発生する工程は
同一ではない。基板21に画素電極23を設けた段階で
既に短絡が発生する場合、基板11との組立工程に於い
て画素電極23が押圧されたとき発生する場合、封止領
域内に液晶14を注入し、液晶14の層の厚みを整える
ために両基板11、21を加圧したとき発生する場合等
が考えられる。
Due to various causes, the steps in which a short circuit occurs are not the same. If a short circuit already occurs when the pixel electrode 23 is provided on the substrate 21, or if the pixel electrode 23 is pressed during the assembly process with the substrate 11, the liquid crystal 14 is injected into the sealing region. It can be considered that this occurs when the substrates 11 and 21 are pressed to adjust the thickness of the liquid crystal layer.

【0012】このうち、基板11との組立工程以降に発
生する短絡は、主として封止材24の近傍で有る事が多
い。すなわち前述の如く封止部分の基板間隔を表示部の
それと一致させる目的で表示部以外の部分にも伸張した
場合、封止部分の導電膜25の面積はかなり大きなもの
となり、短絡発生の確率が上昇する事に加え、一般に封
止部分に加わる応力の方が表示部に加わる応力よりも大
きいからである。そこで本発明が解決しようとする第2
の課題は、封止部分での短絡発生を防ぐ事である。
Of these, a short circuit that occurs after the step of assembling the substrate 11 is often in the vicinity of the sealing material 24 in many cases. That is, as described above, when the substrate spacing of the sealing portion is extended to a portion other than the display portion for the purpose of matching it with that of the display portion, the area of the conductive film 25 in the sealing portion becomes considerably large and the probability of occurrence of short circuit is increased. This is because, in addition to rising, the stress applied to the sealing portion is generally larger than the stress applied to the display portion. Therefore, the second problem to be solved by the present invention is
The problem is to prevent the occurrence of a short circuit in the sealed portion.

【0013】短絡の発生工程を基板21の状態で表現す
ると、画素電極23が設けられた基板状態、基板11と
の組立が終了し、未だ液晶14が注入されていない空セ
ル状態、液晶14が注入封止され検査治具等を用いて表
示可能な状態、偏光板接着等の工程を経た完成状態の4
つ分ける事が出来る。何れにしても出来るだけ早い工程
に於いて短絡の発生を検出し、後の工程への流出を防が
ないと後の工程は全て無駄となり、大きな損失を招く事
になる。
When the process of generating a short circuit is expressed in the state of the substrate 21, the state of the substrate on which the pixel electrode 23 is provided, the assembly of the substrate 11 and the empty cell state in which the liquid crystal 14 is not yet injected, and the liquid crystal 14 are Injected and sealed, displayable using inspection jigs, etc., completed state after processes such as polarizing plate adhesion
Can be divided into two. In any case, if the occurrence of a short circuit is detected in the earliest possible process and the outflow to the subsequent process is not prevented, all the subsequent processes will be wasted, resulting in a large loss.

【0014】従来この短絡検査は液晶14が注入された
状態でしか行えず、偏光板や駆動回路を含む検査治具を
用い、複数の各画素電極13、23にそれぞれ検査電極
を接触し、画素電極23に走査駆動電圧を印加して検査
していた。この様にすれば、導電膜25と短絡している
画素電極23部分のみが他の画素電極部分とは異なる表
示状態を呈し、異常が発見できるのである。
Conventionally, this short-circuit inspection can be performed only in a state where the liquid crystal 14 is injected, and an inspection jig including a polarizing plate and a drive circuit is used to bring the inspection electrodes into contact with the plurality of pixel electrodes 13 and 23, respectively. The scanning drive voltage was applied to the electrode 23 for inspection. By doing so, only the portion of the pixel electrode 23 short-circuited with the conductive film 25 exhibits a display state different from that of the other pixel electrode portions, and the abnormality can be found.

【0015】しかし画素電極23が微細な場合は個々の
画素電極23の全てにそれぞれ個別に検査電極を接触さ
せる事は困難で、一部の電極にしか接触する事ができな
いか、あるいはゴムコネクター等で全ての画素電極23
に同時に接触することしか出来ない。
However, when the pixel electrodes 23 are fine, it is difficult to individually contact all the individual pixel electrodes 23 with the inspection electrodes, and it is possible to contact only a part of the electrodes, or a rubber connector or the like. With all pixel electrodes 23
You can only touch the same time.

【0016】この様な場合は、基板11上の画素電極1
3をゴムコネクターで共通に接触して一方の共通電極と
し、基板21の画素電極23をゴムコネクターで共通に
接触して他方の共通電極とし、両共通電極間に駆動電圧
を印加して液晶を表示して検査する事になる。
In such a case, the pixel electrode 1 on the substrate 11
3 is commonly contacted by a rubber connector to be one common electrode, and the pixel electrode 23 of the substrate 21 is commonly contacted by a rubber connector to be the other common electrode. A driving voltage is applied between both common electrodes to drive the liquid crystal. It will be displayed and inspected.

【0017】しかしこの検査では画素電極23は走査さ
れず、全ての画素電極23に同時に同一の電圧が印加さ
れてしまうため、全体が同じように表示され、短絡部分
の検出が難しく、後工程を経過して通常の駆動が可能に
なった段階で初めて異常が発見される場合がほとんどで
あった。
However, in this inspection, the pixel electrodes 23 are not scanned, and the same voltage is applied to all the pixel electrodes 23 at the same time, so that the entire display is the same and it is difficult to detect a short-circuited portion, and the subsequent process is performed. In most cases, the abnormality was discovered only when the normal driving became possible after a certain period of time.

【0018】すなわちCOG技術を用いた場合、駆動集
積回路40を基板21取り付けてから故障が発見される
事になり、高価な集積回路まで無駄となってしまうた
め、その損失は極めて大きかった。
That is, when the COG technique is used, a failure is discovered after the drive integrated circuit 40 is mounted on the substrate 21, and an expensive integrated circuit is wasted, so that the loss is extremely large.

【0019】この短絡検査の最も簡便な方法として特開
平4−271326号公報(以下引例とする)の請求項
1および図1には、画素電極13および23が交差する
点以外の表示面全域に広く形成された金属膜からなる遮
光マスク(以下導電膜とする)25と、該導電膜25か
ら外部に引き出されたテスト電極を有する液晶表示素子
が提案されている。この提案による方法は簡便であり、
かつ確実であるが次のような重大な欠点が有った。
As the simplest method of this short-circuit inspection, in claim 1 and FIG. 1 of Japanese Patent Laid-Open No. 4-271326 (hereinafter referred to as “reference”), the entire display surface except the point where the pixel electrodes 13 and 23 intersect. There has been proposed a liquid crystal display element having a light-shielding mask (hereinafter referred to as a conductive film) 25 formed of a wide metal film and a test electrode drawn out from the conductive film 25. The proposed method is simple,
And certainly, there were the following serious drawbacks.

【0020】引例の発明に於けるテスト電極29は、導
電膜25が絶縁膜28の外まで伸張され、配線部材40
の設置位置とは異なる位置に露出されている構成となっ
ているため、表示装置の完成状態でテスト電極29に配
線をする事が困難である。ところがテスト電極29を開
路状態で放置すると、ここから種々の原因で発生した静
電気が導電膜25に取り込まれ、導電膜25の電位が画
素電極23とは無関係に変動する結果、液晶の状態に影
響を与え表示状態に悪影響を及ぼす他、場合によっては
画素電極23と導電膜25との間に放電が起こり、画素
電極23に損傷を与えてしまう。
In the test electrode 29 in the cited invention, the conductive film 25 is extended to the outside of the insulating film 28, and the wiring member 40 is formed.
Since it is exposed at a position different from the installation position of, it is difficult to wire the test electrodes 29 in the completed state of the display device. However, if the test electrode 29 is left open, static electricity generated by various causes is taken into the conductive film 25, and the potential of the conductive film 25 changes independently of the pixel electrode 23. As a result, the state of the liquid crystal is affected. In addition to adversely affecting the display state, electric discharge may occur between the pixel electrode 23 and the conductive film 25 in some cases, damaging the pixel electrode 23.

【0021】また導電膜が酸化しやすい材料である場合
は、工程を重ねる内にテスト電極29の露出部分が酸化
して絶縁性を呈し、正しい検査が行えなくなり、不良品
を完成工程まで流してしまう事になる。
When the conductive film is a material which is easily oxidized, the exposed portion of the test electrode 29 is oxidized and exhibits an insulating property in the course of repeating the process, and the correct inspection cannot be performed, and the defective product is flown to the completion process. I will end up.

【0022】そこで本発明が解決しようとする第3の課
題は、上記問題に鑑み、導電膜25と画素電極23との
短絡を検査するための検査電極の変質防ぎ、また検査電
極の電位を、表示装置の完成状態において容易に制御出
来るようにする事である。
In view of the above problems, a third problem to be solved by the present invention is to prevent alteration of the inspection electrode for inspecting a short circuit between the conductive film 25 and the pixel electrode 23, and to reduce the potential of the inspection electrode. It is to be able to easily control in the completed state of the display device.

【0023】[0023]

【課題を解決するための手段】上記第1の課題を解決す
るために本発明が用いる第1の手段は、少なくとも配線
電極26あるいは画素電極23の引き回し部分の下部
に、それぞれ独立して接する配線導電膜を設ける事であ
る。
The first means used by the present invention to solve the above-mentioned first problem is a wiring which is independently in contact with at least a lower portion of the wiring electrode 26 or the leading portion of the pixel electrode 23. It is to provide a conductive film.

【0024】次に上記第2の課題を解決するために本発
明が用いる第2の手段は、画素電極23の下部に接する
配線導電膜を封止材24の中まで伸張し、代わりに画素
電極23の下部にかかる導電膜25を封止材24の内側
へ後退させる事である。
Next, the second means used by the present invention to solve the above-mentioned second problem is to extend the wiring conductive film in contact with the lower portion of the pixel electrode 23 into the inside of the sealing material 24, and instead use the pixel electrode. That is, the conductive film 25 on the lower part of 23 is retracted inside the sealing material 24.

【0025】また上記第3の課題を解決するために本発
明が用いる第3の手段は、導電膜25と接続された、配
線電極26と同質の透明電極(以下検査電極とする)を
設ける事である。
The third means used by the present invention to solve the third problem is to provide a transparent electrode (hereinafter referred to as an inspection electrode) which is connected to the conductive film 25 and has the same quality as the wiring electrode 26. Is.

【0026】さらに本発明の第4の手段は各透明電極の
接続部付近に裏打ち用の導電膜のない部分33を設ける
事であり、第5の手段は検査電極を駆動集積回路40に
接続される配線電極26のいずれかと共通にする事であ
る。
Further, the fourth means of the present invention is to provide a portion 33 having no conductive film for backing in the vicinity of the connecting portion of each transparent electrode, and the fifth means is to connect the inspection electrode to the driving integrated circuit 40. It is common to any of the wiring electrodes 26.

【0027】[0027]

【作用】第1の手段によれば、配線電極26あるいは画
素電極23の引き回し部分は配線導電膜で裏打ちされる
事になるから配線抵抗が減少する。
According to the first means, the wiring electrode 26 or the leading portion of the pixel electrode 23 is lined with the wiring conductive film, so that the wiring resistance is reduced.

【0028】次に第2の手段によれば、画素電極23の
下部に接する配線導電膜を封止材24の中まで伸張し、
代わりに画素電極23の下部にかかる導電膜25を封止
材24の内側へ後退させるから、封止部分の基板間隔は
変化せず、しかも封止材24が押圧されて封止材24の
下部にある画素電極23と配線導電膜が短絡しても、配
線導電膜はもともと画素電極23に接しているのである
から何等問題がおきない。
Next, according to the second means, the wiring conductive film in contact with the lower portion of the pixel electrode 23 is extended into the sealing material 24,
Instead, the conductive film 25 under the pixel electrode 23 is retracted to the inside of the encapsulant 24, so that the substrate interval of the encapsulation portion does not change, and the encapsulant 24 is pressed to cause the lower part of the encapsulant 24. Even if the pixel electrode 23 and the wiring conductive film are short-circuited, there is no problem because the wiring conductive film is originally in contact with the pixel electrode 23.

【0029】また第3の手段によれば、検査電極29は
配線電極26と同質の材料を用いるから変質の恐れがな
く、確実な検査が行えるうえ、配線部材32と容易に接
続する事が出来、表示装置の使用状態で検査電極29を
簡単に駆動回路の一部に接続する事が出来るから静電気
等による問題が解消される。
Further, according to the third means, since the inspection electrode 29 is made of the same material as the wiring electrode 26, there is no fear of alteration, the reliable inspection can be performed, and the inspection electrode 29 can be easily connected to the wiring member 32. Since the inspection electrode 29 can be easily connected to a part of the drive circuit when the display device is in use, the problem due to static electricity or the like is solved.

【0030】さらに第3の手段によれば、各工程内での
検査が可能となるのは無論であるが検査電極29と配線
電極26あるいは画素電極23とは同一の面、同一の材
質で互いに近傍に設ける事が出来るから、検査のための
治具の設計も極めて簡単となる。
Further, according to the third means, it is needless to say that the inspection can be performed in each process, but the inspection electrode 29 and the wiring electrode 26 or the pixel electrode 23 are formed on the same surface and made of the same material. Since it can be installed in the vicinity, the design of the jig for inspection becomes extremely simple.

【0031】第4の手段によれば基板21の裏面から導
電膜のない部分を通して各透明電極の接続部分の状態を
目視検査する事が出来、第5の手段によれば配線部材の
幅を広げる必要がなくなる。
According to the fourth means, the state of the connecting portion of each transparent electrode can be visually inspected from the back surface of the substrate 21 through the portion without the conductive film, and the fifth means widens the width of the wiring member. There is no need.

【0032】[0032]

【実施例】以下、本発明の実施例を図面によって説明す
るが、図面は基板21の構造のみを示すものであって寸
法などについて示すものではない。また符号は図3と同
一のものについては同一の符号を用いる。さらに本発明
に於いて導電膜とは透明電極膜とは異なるものを言う。
Embodiments of the present invention will now be described with reference to the drawings, but the drawings show only the structure of the substrate 21 and do not show the dimensions or the like. The same reference numerals are used for the same reference numerals as those in FIG. Further, in the present invention, the conductive film is different from the transparent electrode film.

【0033】図1(a)は本発明の一実施例を示す基板
21の平面図であり、図1(b)は図1(a)のAA’
断面図であり、図1(c)はBB’断面図である。図1
においては本発明の第1の手段と第3の手段を同時に実
施している。すなわち、図1(b)は第1の手段の実施
を示し、図1(c)は第3の手段の実施を示す。
FIG. 1 (a) is a plan view of a substrate 21 showing one embodiment of the present invention, and FIG. 1 (b) is AA 'of FIG. 1 (a).
It is a cross-sectional view and FIG. 1C is a BB ′ cross-sectional view. Figure 1
In the above, the first means and the third means of the present invention are carried out at the same time. That is, FIG. 1 (b) shows the implementation of the first means, and FIG. 1 (c) shows the implementation of the third means.

【0034】図1に於いて、基板21の全面に導電膜が
設けられた後、エッチング等により遮光膜として作用す
る導電膜25と配線導電膜30、31および検査電極2
9の裏打ち部分が形成される。次に基板全面に絶縁膜が
設けられ、該絶縁膜をエッチング等により配線導電膜3
0、31および検査電極29の裏打ち部分が露出するよ
うに、かつ必要な形状に形成される。次に透明電極膜が
基板全面に設けられた後、エッチング等により配線電極
26、検査電極29、画素電極23が形成される。
In FIG. 1, after the conductive film is provided on the entire surface of the substrate 21, the conductive film 25, the wiring conductive films 30, 31 and the inspection electrode 2 which act as a light shielding film by etching or the like.
9 backing portions are formed. Next, an insulating film is provided on the entire surface of the substrate, and the wiring conductive film 3 is formed by etching the insulating film.
It is formed so that the backing portions of 0 and 31 and the inspection electrode 29 are exposed and have a required shape. Next, after the transparent electrode film is provided on the entire surface of the substrate, the wiring electrode 26, the inspection electrode 29, and the pixel electrode 23 are formed by etching or the like.

【0035】各透明電極とその裏打ち用の導電膜の形状
は、各透明電極の抵抗値を下げるためには各透明電極よ
り太くする事が望ましいが、酸化等による悪影響が考え
られる場合は外部に露出しないように各透明電極によっ
て覆うようにしてもよい。図1は裏打ち用の導電膜の形
状を各透明電極と一致させた場合を示して有る。
The shape of each transparent electrode and the conductive film for lining it is preferably thicker than each transparent electrode in order to reduce the resistance value of each transparent electrode. You may make it cover with each transparent electrode so that it may not be exposed. FIG. 1 shows a case where the shape of the conductive film for backing is made to match each transparent electrode.

【0036】この状態で配線電極26は配線導電膜30
により、画素電極23の一部は配線導電膜31により裏
打ちされて抵抗値が低減する。また検査電極29は導電
膜25と接続するから、これ以降は画素電極23と導電
膜25の短絡検査は、各画素電極23と検査電極29の
導通を見る事により常時行う事が出来る。
In this state, the wiring electrode 26 becomes the wiring conductive film 30.
As a result, a part of the pixel electrode 23 is lined with the wiring conductive film 31, and the resistance value is reduced. Further, since the inspection electrode 29 is connected to the conductive film 25, the short circuit inspection of the pixel electrode 23 and the conductive film 25 can be always performed thereafter by observing the continuity between each pixel electrode 23 and the inspection electrode 29.

【0037】前述のように図1の構成によれば検査電極
29は画素電極23と同一の面、同一の材質とする事が
出来るから検査治具も簡単となる。図1(a)に於いて
検査電極29は幅およびピッチが配線電極26と等し
く、かつ配線電極26と同等の位置に設けた例を示した
が、勿論幅、ピッチ、形状は異なっていても良いし位置
が異なっても良い。しかし配線部材32との接続が容易
なように設ける事が望ましい。
As described above, according to the structure shown in FIG. 1, the inspection electrode 29 can be made to have the same surface and the same material as the pixel electrode 23, so that the inspection jig can be simplified. In FIG. 1A, the inspection electrode 29 has an example in which the width and the pitch are equal to the wiring electrode 26 and is provided at the same position as the wiring electrode 26, but of course the width, pitch and shape may be different. Good or different position. However, it is desirable to provide the wiring member 32 so that it can be easily connected.

【0038】その後配向膜27が必要部に設けられ、さ
らにラビング工程、組立工程、注入工程等を経て、CO
G工程に於いて駆動集積回路40が取り付けられ、さら
に配線部材32が接続される。
After that, an alignment film 27 is provided in a necessary portion, and a rubbing step, an assembling step, an injecting step, etc.
In the G process, the drive integrated circuit 40 is attached and the wiring member 32 is further connected.

【0039】配線部材32の配線は配線電極26と検査
電極29に接続され、検査電極29に接続された配線は
配線部材32上で、または表示装置が組み込まれる他の
装置のなかで、電位が不定ででない箇所(出来れば液晶
駆動電圧の基準レベルを表すようなものである事が望ま
しい)に接続される。
The wiring of the wiring member 32 is connected to the wiring electrode 26 and the inspection electrode 29, and the wiring connected to the inspection electrode 29 has a potential on the wiring member 32 or in another device in which the display device is incorporated. It is connected to a part that is not indefinite (preferably, it should represent the reference level of the liquid crystal drive voltage).

【0040】図1に於いては画素電極23の集積回路4
0への引き回し部分を簡略に示したが、実際には極めて
狭い範囲に画素電極23を集中的に寄せ集めなければな
らず、従ってこの部分では画素電極23は極めて細い線
幅となり抵抗が増大する。
In FIG. 1, the integrated circuit 4 of the pixel electrode 23 is shown.
Although the lead-out portion to 0 is shown briefly, actually, the pixel electrodes 23 must be concentrated and gathered in an extremely narrow range. Therefore, in this portion, the pixel electrode 23 has an extremely thin line width and the resistance increases. .

【0041】しかも各画素電極23の引き回し部分の長
さはそれぞれ異なるため抵抗値が一定とならず、表示状
態が均一にならないと言う問題も生ずる。本発明によれ
ばこれらの問題点も画素電極23の一部にも配線導電膜
31を設ける事により解決する。
Moreover, since the lengths of the lead-out portions of the respective pixel electrodes 23 are different from each other, the resistance value is not constant, and there is a problem that the display state is not uniform. According to the present invention, these problems can be solved by providing the wiring conductive film 31 also on a part of the pixel electrode 23.

【0042】図2は本発明の第2の実施例を示し、図2
(a)は基板21の平面図であり、図2(b)は基板2
1のAA’断面図である。この実施例は第1の実施例に
加えるに本発明の第2の手段、第4の手段および第5の
手段の実施を示す。
FIG. 2 shows a second embodiment of the present invention.
FIG. 2A is a plan view of the substrate 21, and FIG.
2 is a sectional view taken along line AA ′ of FIG. This embodiment shows the implementation of the second, fourth and fifth means of the present invention in addition to the first embodiment.

【0043】第2の手段について説明すると図2(b)
に示すように配線導電膜31を封止材24の中まで伸張
し、代わりに画素電極23の下部にかかる導電膜25を
封止材24の内側へ後退させれば、封止部分の基板間隔
は変化せず、封止材24の下部において、画素電極23
と配線導電膜31が短絡しても、配線導電膜31は導電
膜25とは分離して個々の画素電極23にもともと個別
に接触しているものであるから何等問題が生じない。
The second means will be described with reference to FIG.
As shown in FIG. 3, the wiring conductive film 31 is extended into the sealing material 24, and instead the conductive film 25 under the pixel electrode 23 is retracted to the inside of the sealing material 24. Does not change, and the pixel electrode 23
Even if the wiring conductive film 31 and the wiring conductive film 31 are short-circuited, no problem occurs because the wiring conductive film 31 is separated from the conductive film 25 and individually contacts the individual pixel electrodes 23.

【0044】次に図1の場合は裏打ち用の導電膜の形状
を各透明電極と一致させたが、その場合配線導電膜3
0、31が不透明であると、COG技術により駆動集積
回路40を基板21に取り付けた際、各透明電極26、
23と駆動集積回路40の各端子41、42との接続状
態、または配線部材32を接続した際、各透明電極2
6、29と配線部材32との接続状態を基板21の裏面
から目視検査する事が出来なくなる。そこで図2の実施
例に示す如く、各透明電極の接続部付近に裏打ち用の導
電膜のない部分33を設ければこれらの接続状態が目視
可能になる。この点につき図1に於いては配線電極2
6、検査電極29についての実施を示したが画素電極2
3についても実施できる事は当然である。
Next, in the case of FIG. 1, the shape of the conductive film for backing was made to match each transparent electrode. In that case, the wiring conductive film 3
When 0 and 31 are opaque, each transparent electrode 26, when the drive integrated circuit 40 is mounted on the substrate 21 by the COG technique,
23 and the respective terminals 41 and 42 of the drive integrated circuit 40, or the transparent member 2 when the wiring member 32 is connected.
It becomes impossible to visually inspect the connection state between 6, 29 and the wiring member 32 from the back surface of the substrate 21. Therefore, as shown in the embodiment of FIG. 2, if a portion 33 without a conductive film for backing is provided near the connection portion of each transparent electrode, the connection state of these can be visually observed. Regarding this point, in FIG.
6 shows the implementation of the inspection electrode 29, the pixel electrode 2
As a matter of course, it is possible to implement No. 3.

【0045】さらに図2に於いて検査電極29を駆動集
積回路40に接続される配線電極26のいずれかと共通
にすると配線部材32の幅を広げる必要がなくなるので
都合がよい。この場合、検査電極29と共通にすべき配
線電極26は必ずしも最外端のものである必要はない。
また共通にすべき配線電極26は電源線でも信号線でも
良いが、出来れば液晶駆動電圧の基準レベルを表すよう
なものである事が望ましい。
Further, in FIG. 2, if the inspection electrode 29 is shared with any of the wiring electrodes 26 connected to the driving integrated circuit 40, it is convenient because it is not necessary to increase the width of the wiring member 32. In this case, the wiring electrode 26 to be shared with the inspection electrode 29 does not necessarily have to be the outermost end.
Further, the wiring electrode 26 to be shared may be a power line or a signal line, but if possible, it is desirable that the wiring electrode 26 represents a reference level of a liquid crystal drive voltage.

【0046】以上の本発明の第1、第2実施例の説明
は、導電膜が遮光膜の場合を想定して行ったが、本発明
は導電膜(透明、非透明を問わない)が電熱線等の他の
目的に使用される場合であっても有効で有るし、またカ
ラーパネル等、構造的な差や液晶モードが異なっても有
効である事は自明である。
The above description of the first and second embodiments of the present invention has been made assuming that the conductive film is a light-shielding film. However, in the present invention, the conductive film (whether transparent or non-transparent) is electrically conductive. It is obvious that it is effective even when it is used for other purposes such as heat rays, and that it is effective even if structural differences such as color panels and liquid crystal modes are different.

【0047】また上記説明はCOG技術と共に実施する
場合について行ったが、COG技術を用いない場合でも
有効である。例えば画素電極23は直接配線部材32と
接続される場合であっても、画素を構成する部分から配
線部材32までの引き出し部分の抵抗値は出来るだけ小
さい事が望ましく、この引き出し部分に本発明の第1の
手段を実施する事により抵抗値を下げる事が出来、また
第2の手段を用いる事により短絡事故を減少する事が出
来る。
Although the above description has been made for the case where the COG technique is carried out, it is effective even when the COG technique is not used. For example, even when the pixel electrode 23 is directly connected to the wiring member 32, it is desirable that the resistance value of the lead-out portion from the portion forming the pixel to the wiring member 32 is as small as possible. By implementing the first means, the resistance value can be lowered, and by using the second means, the short-circuit accident can be reduced.

【0048】さらに上記実施例は複数の手段を同時に実
施した場合を示したが、個々の手段のみを用いる事も出
来る。例えば第1の手段、第2の手段は遮光等の目的を
持った導電膜25が存在しない場合でも配線導電膜3
0、31を設ける事により実施する事が出来る。
Further, although the above embodiment shows the case where a plurality of means are carried out at the same time, it is also possible to use only individual means. For example, the first means and the second means use the wiring conductive film 3 even if the conductive film 25 for the purpose of shielding light does not exist.
It can be implemented by providing 0 and 31.

【0049】なお導電膜25と配線導電膜30、31と
は必ずしも同一である必要はないし、また低抵抗化のた
めにはその材質として比較的導電性のよいものを使用す
べきであり、この場合密着性、安定性を考慮して多層構
造とする等の配慮は当然本願発明に含まれるものであ
る。
The conductive film 25 and the wiring conductive films 30 and 31 do not necessarily have to be the same, and in order to reduce the resistance, a material having relatively good conductivity should be used. In this case, consideration of adhesion, stability, and the like to form a multilayer structure is naturally included in the present invention.

【0050】[0050]

【発明の効果】以上の説明で明かなように、本発明の第
1の手段によれば、導電膜を用いて配線電極26あるい
は画素電極23の一部を裏打ちするの各電極の抵抗値を
下げる事が出来、クロストークやコントラスト低下ある
いは表示不均一等の問題を軽減する事が出来る。
As is apparent from the above description, according to the first means of the present invention, the resistance value of each electrode for lining a part of the wiring electrode 26 or the pixel electrode 23 with the conductive film is set. Therefore, it is possible to reduce problems such as crosstalk, lowering of contrast, and uneven display.

【0051】次に第2の手段によれば導電膜25を有す
る基板21に於いて、封止材部分の高さと表示部分の高
さを同一としたまま、画素電極23と導電膜25との短
絡事故の発生を減少できる。
Next, according to the second means, in the substrate 21 having the conductive film 25, the pixel electrode 23 and the conductive film 25 are formed with the height of the sealing material portion and the height of the display portion being the same. The occurrence of short circuit accidents can be reduced.

【0052】なお第1、第2の手段によれば封止材24
の外部に於いて配線電極26、画素電極23が損傷を受
け、断線に至る事があっても裏打ちした配線導伝膜3
0、31により電気的接続が維持されるから大事に至ら
ない。
According to the first and second means, the sealing material 24
Even if the wiring electrode 26 and the pixel electrode 23 are damaged outside the device and the wire is broken, the wiring conductive film 3 is lined.
It is not important because the electrical connection is maintained by 0 and 31.

【0053】さらに本発明の第3の手段によれば、導電
膜25と接続する検査電極29を配線電極26と同質と
するから、検査電極29の変質による検査不良の恐れが
解消できる上、各工程での検査を簡単な治具を用いて容
易に行え、また配線部材32と容易に接続可能であるか
ら、検査電極29に不定でない電位を簡単に与える事が
出来るので、静電気による事故を防ぐ事が出来る。
Further, according to the third means of the present invention, since the inspection electrode 29 connected to the conductive film 25 is of the same quality as the wiring electrode 26, it is possible to eliminate the risk of defective inspection due to the alteration of the inspection electrode 29. Since the inspection in the process can be easily performed using a simple jig and can be easily connected to the wiring member 32, it is possible to easily apply a non-constant electric potential to the inspection electrode 29, so that an accident due to static electricity can be prevented. I can do things.

【0054】第4の手段は本発明の第1、第2の手段の
実施に於いて各透明電極の接続状態の目視検査を可能と
し、また第5の手段は配線部材32の寸法に変化を与え
ないから従来の部材がそのまま使用できる。
The fourth means enables visual inspection of the connection state of each transparent electrode in the practice of the first and second means of the present invention, and the fifth means changes the size of the wiring member 32. Since it is not given, conventional members can be used as they are.

【0055】このように本発明は、従来の技術が有して
いた重大な問題点を解消し、表示品質および信頼性の高
い液晶表示装置を提供する事に貢献するところは大き
い。
As described above, the present invention greatly solves the serious problems of the prior art and contributes to provide a liquid crystal display device with high display quality and reliability.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す図で(a)は基板21
の平面図、(b)はAA’断面図で本発明の第1の手段
の実施を示し、(c)はBB’断面図で本発明の第3の
手段の実施を示す。
FIG. 1 is a diagram showing an embodiment of the present invention, in which FIG.
2A is a plan view of the first embodiment of the present invention, and FIG. 7B is a cross-sectional view of the first means of the present invention, and FIG.

【図2】本発明の他の一実施例を示す図で(a)は基板
21の平面図、(b)はAA’断面図であり、第2の手
段の実施を示す。
2A and 2B are views showing another embodiment of the present invention, in which FIG. 2A is a plan view of a substrate 21 and FIG. 2B is a sectional view taken along the line AA ′, showing an implementation of the second means.

【図3】従来の導電膜を有しかつCOG技術を用いた液
晶表示装置の断面図である。
FIG. 3 is a cross-sectional view of a liquid crystal display device having a conventional conductive film and using COG technology.

【符号の説明】[Explanation of symbols]

21 基板 23 画素電極 25 導電膜 28 絶縁膜 29 検査電極 30 配線導電膜 31 配線導電膜 32 配線部材 21 Substrate 23 Pixel Electrode 25 Conductive Film 28 Insulating Film 29 Inspection Electrode 30 Wiring Conductive Film 31 Wiring Conductive Film 32 Wiring Member

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 画素電極と同質でかつ画素電極と分離し
た配線電極が、基板上に設けた導電膜と接している事を
特徴とする液晶表示装置。
1. A liquid crystal display device characterized in that a wiring electrode having the same quality as the pixel electrode and separated from the pixel electrode is in contact with a conductive film provided on a substrate.
【請求項2】 画素電極が少なくとも封止材の外部に於
いて、基板上に設けた導電膜と接する事を特徴とする液
晶表示装置。
2. A liquid crystal display device, wherein the pixel electrode is in contact with a conductive film provided on a substrate, at least outside the sealing material.
【請求項3】 画素電極が封止部分に於いて、基板上に
設けた導電膜と接する事を特徴とする請求項2に記載の
液晶表示装置。
3. The liquid crystal display device according to claim 2, wherein the pixel electrode is in contact with the conductive film provided on the substrate in the sealing portion.
【請求項4】 封止材の内側の基板上に設けた導電膜と
接続し、かつ画素電極と同質でかつ画素電極と分離した
配線電極を1個以上有する事を特徴とする液晶表示装
置。
4. A liquid crystal display device comprising one or more wiring electrodes which are connected to a conductive film provided on the substrate inside the encapsulating material and which are of the same quality as the pixel electrodes and are separated from the pixel electrodes.
【請求項5】 封止材の内側の基板上に設けた導電膜と
接続し、かつ画素電極と同質でかつ画素電極と分離した
配線電極を基板外に於いて不定でない電位を有する箇所
に接続した事を特徴とする請求項4に記載の液晶表示装
置。
5. A wiring electrode, which is connected to a conductive film provided on the substrate inside the encapsulating material, and which is of the same quality as the pixel electrode and is separated from the pixel electrode is connected to a portion having a non-constant potential outside the substrate. The liquid crystal display device according to claim 4, wherein the liquid crystal display device is provided.
【請求項6】 配線電極または画素電極の他部材との接
続部分に導電膜が接しない部分を設けた事を特徴とする
請求項1、請求項2、請求項3または請求項4に記載の
液晶表示装置。
6. The method according to claim 1, wherein a portion where the conductive film is not in contact is provided in a portion where the wiring electrode or the pixel electrode is connected to another member. Liquid crystal display device.
JP2073293A 1993-01-14 1993-01-14 Liquid crystal display device Pending JPH06214247A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2073293A JPH06214247A (en) 1993-01-14 1993-01-14 Liquid crystal display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2073293A JPH06214247A (en) 1993-01-14 1993-01-14 Liquid crystal display device

Publications (1)

Publication Number Publication Date
JPH06214247A true JPH06214247A (en) 1994-08-05

Family

ID=12035363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2073293A Pending JPH06214247A (en) 1993-01-14 1993-01-14 Liquid crystal display device

Country Status (1)

Country Link
JP (1) JPH06214247A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148652A (en) * 2000-11-07 2002-05-22 Rohm Co Ltd Structure for liquid crystal display device
JP2005164679A (en) * 2003-11-28 2005-06-23 Optrex Corp Organic electroluminescence display device
US8730422B2 (en) 2012-05-23 2014-05-20 Samsung Display Co., Ltd. Liquid crystal display

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148652A (en) * 2000-11-07 2002-05-22 Rohm Co Ltd Structure for liquid crystal display device
JP2005164679A (en) * 2003-11-28 2005-06-23 Optrex Corp Organic electroluminescence display device
JP4480989B2 (en) * 2003-11-28 2010-06-16 オプトレックス株式会社 Organic EL display device
US8730422B2 (en) 2012-05-23 2014-05-20 Samsung Display Co., Ltd. Liquid crystal display

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