JP2000317837A - Polishing method for disc substrate - Google Patents

Polishing method for disc substrate

Info

Publication number
JP2000317837A
JP2000317837A JP12383899A JP12383899A JP2000317837A JP 2000317837 A JP2000317837 A JP 2000317837A JP 12383899 A JP12383899 A JP 12383899A JP 12383899 A JP12383899 A JP 12383899A JP 2000317837 A JP2000317837 A JP 2000317837A
Authority
JP
Japan
Prior art keywords
polishing
abrasive grains
substrate
disk substrate
liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12383899A
Other languages
Japanese (ja)
Inventor
Motoharu Sato
元治 佐藤
Toru Matsubara
亨 松原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Macoho Co Ltd
Original Assignee
Kobe Steel Ltd
Macoho Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd, Macoho Co Ltd filed Critical Kobe Steel Ltd
Priority to JP12383899A priority Critical patent/JP2000317837A/en
Publication of JP2000317837A publication Critical patent/JP2000317837A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To polish a high-hardness disc substrate with high productivity by spraying polishing abrasive grains with a specified grain diameter or a mixed liquid of polishing abrasive grains and a liquid to the disc substrate by pressurized air. SOLUTION: A glass substrate 6 (crystallized galss) with a diameter of 2.5 inch is used as a substrate to be polished. The polishing abrasive grains (media) are alumina abrasive grains, and the centric grain size is 40 μm (preferably 20 to 60 μm). The pressure of a liquid (water) is 1.2 kgf/mm2, the air pressure is 2.5 kgf/mm2 and the feed speed of a gun 1 is 5 mm/sec. The concentration of polishing abrasive grains to the liquid is 20 vol.%. Then, polishing is performed unitl the polishing amount of the substrate surface reaches about 240 μm. A nozzle 2 of the polishing gun is 90 mm long and 2 mm wide. As a result, the maximum surface roughness (Rmax) after polishing is smaller than 5 μm.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は磁気ディスク用基
板、特に硬質ガラス製の磁気ディスク基板を研磨するの
に有効なディスク基板の研磨方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for polishing a magnetic disk substrate, and more particularly to a disk substrate polishing method effective for polishing a hard glass magnetic disk substrate.

【0002】[0002]

【従来の技術】コンピュータのハードディスク等に使用
される磁気ディスクは、データ容量を増大させるため
に、更に一層高速回転することが要求されている。この
ような高速回転を可能とするためには、ディスク基板の
平坦度を向上させる必要があると共に、ディスク基板の
剛性を高めることが必要である。このような剛性が高い
基板としては、硬質ガラス基板、例えば、非晶質ガラ
ス、結晶化ガラス及びセラミックス等の硬い材料があ
る。
2. Description of the Related Art A magnetic disk used for a hard disk or the like of a computer is required to rotate at a higher speed in order to increase a data capacity. In order to enable such high-speed rotation, it is necessary to improve the flatness of the disk substrate and to increase the rigidity of the disk substrate. Such a substrate having high rigidity includes a hard glass substrate, for example, a hard material such as amorphous glass, crystallized glass, and ceramics.

【0003】通常、磁気ディスク用基板は、平坦面を得
るために、その表裏両面を1段又は2段のラッピング加
工した後、粗研磨し、仕上研磨している。
Usually, in order to obtain a flat surface, a magnetic disk substrate is subjected to one or two lapping processes on the front and rear surfaces thereof, and then rough-polished and finish-polished.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、硬度が
高い材料は、剛性は高いものの、加工が極めて困難であ
り、研磨に多くの時間がかかり、生産性が著しく低いと
いう欠点がある。また、ダイヤモンド砥石を使用して研
磨すると、研削性は良好であるものの、同様に生産性が
低いという欠点を有する。
However, a material having a high hardness has a drawback that, although it has a high rigidity, it is extremely difficult to process, requires much time for polishing, and has extremely low productivity. Polishing using a diamond grindstone has the disadvantage that although the grindability is good, the productivity is similarly low.

【0005】本発明はかかる問題点に鑑みてなされたも
のであって、高硬度のディスク基板を高生産性で研磨す
ることができるディスク基板の研磨方法を提供すること
を目的とする。
The present invention has been made in view of the above problems, and has as its object to provide a disk substrate polishing method capable of polishing a hard disk substrate with high productivity.

【0006】[0006]

【課題を解決するための手段】本発明に係るディスク基
板の研磨方法は、粒径20乃至60μmの研磨砥粒又は
研磨砥粒と液体との混合液を加圧空気によりディスク基
板に吹き付けることにより、前記ディスク基板の表面を
研磨することを特徴とする。
According to the present invention, there is provided a method for polishing a disk substrate, comprising: blowing abrasive grains having a particle size of 20 to 60 μm or a mixture of the abrasive grains and a liquid onto the disk substrate by pressurized air. And polishing the surface of the disk substrate.

【0007】前記ディスク基板は例えば硬質ガラス基板
である。
The disk substrate is, for example, a hard glass substrate.

【0008】[0008]

【発明の実施の形態】以下、本発明の実施例について添
付の図面を参照して具体的に説明する。図1は本発明の
実施例方法に使用する研磨用ガンを示す断面図である。
この研磨用ガン1には圧縮空気の通路3と、研磨砥粒の
み、空気と研磨砥粒との混合気又は水と研磨砥粒との混
合液の通路4とが形成されており、両通路3,4はガン
1内の混合室5で合流し、その下方のノズル2から下方
に向けて噴出されるようになっている。また、ノズル2
の形状は混合液の噴出領域がスリット状で幅が広いもの
であり、研磨用ガン1はノズル2の噴射領域の幅方向に
垂直の方向に表面に平行に一定速度で移動する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be specifically described below with reference to the accompanying drawings. FIG. 1 is a sectional view showing a polishing gun used in the method of the embodiment of the present invention.
The polishing gun 1 has a passage 3 for compressed air and a passage 4 for only abrasive grains, a mixture of air and abrasive grains or a mixture of water and abrasive grains. The nozzles 3 and 4 join in a mixing chamber 5 in the gun 1 and are ejected downward from a nozzle 2 thereunder. Also, nozzle 2
Is a slit having a wide ejection area of the mixed liquid, and the polishing gun 1 moves at a constant speed parallel to the surface in a direction perpendicular to the width direction of the ejection area of the nozzle 2.

【0009】研磨砥粒の中心粒径は20乃至60μmで
ある。研磨砥粒の中心粒径が60μmより大きい場合
は、加工後の表面粗さが大きくなり、目的とする仕様を
満足しない。また、研磨砥粒の中心粒径が20μmより
小さい場合は、加工効率が低下する。研磨砥粒の種類は
定性的には、被加工物より硬く、多角形をしたものであ
れば適用可能であるが、具体例としては、SiC(炭化
珪素)及びZrO2(ジルコニア)等のセラミックス粉
又は金属酸化物又はダイヤモンド粉等がある。
The center particle diameter of the abrasive grains is 20 to 60 μm. If the center particle size of the abrasive grains is larger than 60 μm, the surface roughness after processing becomes large, and the intended specifications are not satisfied. When the center particle diameter of the abrasive grains is smaller than 20 μm, the processing efficiency is reduced. The type of abrasive grains can be qualitatively applied as long as it is harder than the workpiece and has a polygonal shape. Specific examples include ceramics such as SiC (silicon carbide) and ZrO 2 (zirconia). Powder, metal oxide or diamond powder.

【0010】このように構成された研磨用ガン1を使用
して、磁気ディスク用基板6を研磨する場合は、研磨砥
粒のみ又は水と研磨砥粒との混合液を通路4を介して混
合室5に一定の速度で供給し、加圧された圧縮空気を通
路3を介して混合室に送り込む。これにより、水と研磨
砥粒の混合液を圧縮空気によりノズル2からディスク基
板6に向けて吹き付ける。
When the magnetic disk substrate 6 is polished using the polishing gun 1 configured as described above, only the abrasive grains or a mixture of water and abrasive grains is mixed through the passage 4. The mixture is supplied to the chamber 5 at a constant speed, and pressurized compressed air is sent into the mixing chamber through the passage 3. Thus, a mixture of water and abrasive grains is sprayed from the nozzle 2 toward the disk substrate 6 by compressed air.

【0011】このように、本実施例においては、研磨砥
粒のみ又は水に混合された研磨砥粒を圧縮空気の噴出エ
ネルギにより高速でディスク基板6に吹き付けて、ディ
スク基板6の表面を研磨する。このため、本実施例によ
れば、極めて高速で硬質ガラス板のような硬い基板の表
面を研磨することができる。従って、本発明によれば、
研削法よりも更に高速での加工が可能であり、また加工
後の表面粗さが低くなることにより後加工が短縮され、
最終の表面仕上における研磨時間の短縮が可能である。
As described above, in this embodiment, the surface of the disk substrate 6 is polished by spraying only the abrasive particles or the abrasive particles mixed with water onto the disk substrate 6 at high speed by the ejection energy of the compressed air. . Therefore, according to this embodiment, the surface of a hard substrate such as a hard glass plate can be polished at an extremely high speed. Thus, according to the present invention,
Processing at a higher speed than the grinding method is possible, and post-processing is shortened by lowering the surface roughness after processing,
The polishing time in the final surface finish can be reduced.

【0012】なお、本実施例ではガンを一方向に動かし
て研磨したが、ガンの移動の向き並びにノズルの形状及
び寸法は任意に設定することができる。
In this embodiment, the polishing is performed by moving the gun in one direction. However, the moving direction of the gun and the shape and size of the nozzle can be arbitrarily set.

【0013】[0013]

【実施例】以下、本発明の実施例方法によりディスク基
板を研磨し、その研磨特性を比較例と比較して説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A disk substrate is polished by a method according to an embodiment of the present invention, and its polishing characteristics will be described in comparison with comparative examples.

【0014】研磨対象の基板として直径が2.5インチ
のガラス基板(結晶化ガラス)を使用した。研磨砥粒
(メディア)はアルミナ系の砥粒であり、その中心粒径
は下記表1のとおりである。その他の条件は液体(水)
の圧力を1.2kgf/mm2 、空気圧を2.5kgf/mm2、ガ
ンの送り速度を5mm/secとした。液体に対する研磨砥
粒の濃度は20体積%である。
A glass substrate (crystallized glass) having a diameter of 2.5 inches was used as a substrate to be polished. The abrasive grains (media) are alumina-based abrasive grains, and the center particle diameter is as shown in Table 1 below. Other conditions are liquid (water)
The pressure was 1.2 kgf / mm 2 , the air pressure was 2.5 kgf / mm 2 , and the feed rate of the gun was 5 mm / sec. The concentration of the abrasive grains in the liquid is 20% by volume.

【0015】なお、基板表面の研磨量が約240μmに
なる迄、研磨した。研磨用ガンのノズルは長さが90m
m、幅が2mmである。また、表1において、評価基準
は、研磨後の最大表面粗さ(Rmax)が5μmより小
さいものを◎、5〜10μmのものを○、10μmより
も大きいものを×とした。なお、研磨砥粒の中心粒径と
は、粒子個数の積算粒径分布の50%に対応する中位径
である(金属便覧第940〜941頁、14.4粉体の
性質、試験法、14・4・1粉体特性、(i)粒子径と
粒子径分布)。
The polishing was performed until the polishing amount on the substrate surface became about 240 μm. Polishing gun nozzle is 90m long
m, width 2 mm. In Table 1, the evaluation criteria were as follows: 最大 when the maximum surface roughness (Rmax) after polishing was less than 5 μm, ○ when it was 5 to 10 μm, and X when it was greater than 10 μm. The central particle diameter of the abrasive grains is a median diameter corresponding to 50% of the cumulative particle size distribution of the number of particles (Metal Handbook, pp. 940-941, properties of 14.4 powder, test method, 14.4.1 powder characteristics, (i) particle size and particle size distribution).

【0016】[0016]

【表1】 [Table 1]

【0017】この表1から明らかなように、実施例1乃
至4の場合は研磨砥粒が40乃至60μmであるので、
いずれも最大表面粗さが十分に小さい加工面が得られ
た。これに対し、比較例1乃至4においては加工後の表
面粗さが悪いものであった。
As is clear from Table 1, in the case of Examples 1 to 4, the abrasive grains are 40 to 60 μm.
In each case, processed surfaces with sufficiently small maximum surface roughness were obtained. On the other hand, in Comparative Examples 1 to 4, the surface roughness after processing was poor.

【0018】[0018]

【発明の効果】以上説明したように、本発明によれば、
研磨砥粒を加圧空気によりキャリアさせ、又は研磨砥粒
と液体との混合物を加圧空気によりキャリアさせてディ
スク基板に向けて吹き付けるので、高硬度のディスク基
板の表面を高い生産性で研磨することができる。
As described above, according to the present invention,
The abrasive grains are carried by the pressurized air, or the mixture of the abrasive grains and the liquid is carried by the pressurized air and blown toward the disk substrate, so that the surface of the hard disk substrate is polished with high productivity. be able to.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例方法にて使用する研磨用ガンの
構造を示す断面図である。
FIG. 1 is a sectional view showing a structure of a polishing gun used in a method according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1:研磨用ガン 2:ノズル 3:圧縮空気通路 4:水及び研磨砥粒の混合液 5:混合室 1: Polishing gun 2: Nozzle 3: Compressed air passage 4: Mixed liquid of water and abrasive grains 5: Mixing chamber

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 中心粒径が20乃至60μmの研磨砥粒
を加圧空気によりディスク基板に吹き付けることによ
り、前記ディスク基板の表面を研磨することを特徴とす
るディスク基板の研磨方法。
1. A method for polishing a disk substrate, comprising: polishing a surface of the disk substrate by blowing abrasive grains having a center particle diameter of 20 to 60 μm onto the disk substrate by pressurized air.
【請求項2】 中心粒径が20乃至60μmの研磨砥粒
と液体との混合液を加圧空気によりディスク基板に吹き
付けることにより、前記ディスク基板の表面を研磨する
ことを特徴とするディスク基板の研磨方法。
2. The disk substrate according to claim 1, wherein a surface of the disk substrate is polished by spraying a mixture of polishing abrasive particles having a center particle diameter of 20 to 60 μm and a liquid onto the disk substrate by pressurized air. Polishing method.
【請求項3】 前記ディスク基板は硬質ガラス基板であ
ることを特徴とする請求項1又は2に記載のディスク基
板の研磨方法。
3. The method according to claim 1, wherein the disk substrate is a hard glass substrate.
JP12383899A 1999-04-30 1999-04-30 Polishing method for disc substrate Pending JP2000317837A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12383899A JP2000317837A (en) 1999-04-30 1999-04-30 Polishing method for disc substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12383899A JP2000317837A (en) 1999-04-30 1999-04-30 Polishing method for disc substrate

Publications (1)

Publication Number Publication Date
JP2000317837A true JP2000317837A (en) 2000-11-21

Family

ID=14870644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12383899A Pending JP2000317837A (en) 1999-04-30 1999-04-30 Polishing method for disc substrate

Country Status (1)

Country Link
JP (1) JP2000317837A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014164130A (en) * 2013-02-25 2014-09-08 Synztec Co Ltd Polishing roll and fixing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014164130A (en) * 2013-02-25 2014-09-08 Synztec Co Ltd Polishing roll and fixing device

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