JP2000286185A - Spin chuck - Google Patents

Spin chuck

Info

Publication number
JP2000286185A
JP2000286185A JP9147499A JP9147499A JP2000286185A JP 2000286185 A JP2000286185 A JP 2000286185A JP 9147499 A JP9147499 A JP 9147499A JP 9147499 A JP9147499 A JP 9147499A JP 2000286185 A JP2000286185 A JP 2000286185A
Authority
JP
Japan
Prior art keywords
substrate
spin chuck
bottom plate
supporting
vacuum suction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9147499A
Other languages
Japanese (ja)
Inventor
Hironobu Nakamura
博亘 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP9147499A priority Critical patent/JP2000286185A/en
Publication of JP2000286185A publication Critical patent/JP2000286185A/en
Pending legal-status Critical Current

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Landscapes

  • Application Of Or Painting With Fluid Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Materials For Photolithography (AREA)
  • Coating Apparatus (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PROBLEM TO BE SOLVED: To eliminate accurate alignment of rotary direction between a spin chuck and a substrate, when carrying and fitting a substrate in a configuration where the spin chuck for retaining the substrate and rotating it for performing treatment onto the surface is supported only at the peripheral part of the reverse side of the substrate, to prevent a main part inside the reverse side from being contaminated, scratched, or the like. SOLUTION: A substrate-support member 59 that is provided on the upper surface of a bottom plate 57 is arranged, so that the main part on the lower surface of a substrate is lifted from the bottom plate 57 by supporting the lower surface peripheral edge part of a substrate W, a vacuum suction hole is provided on it for suction and friction force for preventing sliding, when accelerating or decelerating the rotation operation of a spin chuck, is obtained, and the need for the positional regulation of a regulation pin in a rotating direction for regulating the horizontal position of the substrate W to be placed is eliminated. Then the regulation pin is arranged on the same circle according to the diameter of the substrate W to be applied.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、スピンチャックに
関し、特に基板の一面をチャックして他面に処理を行う
ために回転するスピンチャックにおいて、一面の周辺部
のみをチャックして一面の内部の主要部分に汚れ、キズ
等をつけないようにしたスピンチャックに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spin chuck, and more particularly to a spin chuck which rotates to chuck one surface of a substrate and perform processing on the other surface. The present invention relates to a spin chuck in which a main part is not stained or scratched.

【0002】[0002]

【従来の技術】従来一般に、基板を保持して回転して基
板の表面に薬液の塗布等の処理を行うスピンチャックは
基板の裏面を真空吸着によって保持するように構成され
ている。ところが、その強い吸着力に起因して基板裏面
にチャック跡が残り、このチャック跡が前工程からの汚
染に加わり、基板表面の高さにズレを生じて、例えばフ
ォトレジストの露光時のフォーカス異常を発生させる問
題があった。また、基板の裏面に付着したパーティクル
が離脱し、カセットに収容する場合に、下側に収容され
ている基板の表面を汚染するとか、あるいは、基板搬送
装置に転移して他の基板を汚染するといった問題があっ
た。さらに、基板が半導体ウェーハの場合で、スピンチ
ャックで回転させて裏面に処理を行う場合には表側には
半導体装置が作り込まれているがこれらを不良品として
しまうといった問題があった。
2. Description of the Related Art Conventionally, a spin chuck which holds a substrate and rotates to perform processing such as application of a chemical solution on the surface of the substrate is configured to hold the back surface of the substrate by vacuum suction. However, due to the strong suction force, chuck marks are left on the back surface of the substrate, and the chuck marks add to the contamination from the previous process, causing a shift in the height of the substrate surface, for example, a focus error during photoresist exposure. There was a problem that caused. In addition, when particles attached to the back surface of the substrate separate and are accommodated in a cassette, they contaminate the surface of the substrate accommodated on the lower side, or transfer to the substrate transport device and contaminate other substrates. There was such a problem. Furthermore, in the case where the substrate is a semiconductor wafer and the back surface is processed by rotating with a spin chuck, there is a problem that the semiconductor devices are built on the front side, but these are rejected.

【0003】そこで、上述のような問題を回避するため
に、特開平8−222512号公報に提案がある。
In order to avoid the above-mentioned problem, there is a proposal in Japanese Patent Application Laid-Open No. Hei 8-222512.

【0004】そのスピンチャックを図面を用いて説明す
る。図4は要部の平面図、図5は要部の斜視図であり、
図6は拡大要部断面図である。電動サーボモータ(図示
せず)の駆動によって鉛直方向の軸芯周りで回転する回
転軸(図示せず)の上端に、基板Wの外周縁を載置して
保持するスピンチャック3が一体回転可能に取り付けら
れている。スピンチャック3は、回転軸(図示せず)に
一体回転可能に連結される底板7に、その周方向に所定
間隔を隔てて6本の規制ピン8…を設けるとともに、規
制ピン8…よりも回転中心側に基板Wを支持する3本の
ピン状の基板支持部材9…を設けて構成され、規制ピン
8…を基板Wの外周端縁に点接触させて基板Wの水平方
向の位置を規制するとともに、基板支持部材9…を基板
Wの裏面に点接触させて基板Wを支持するように構成さ
れている。規制部材8…のうちの所定の2本は、基板W
のオリエンテーションフラットの外周端縁に点接触して
基板Wに回転力を有効に伝達できるように設けられてい
る。
[0004] The spin chuck will be described with reference to the drawings. 4 is a plan view of a main part, and FIG. 5 is a perspective view of the main part.
FIG. 6 is an enlarged sectional view of an essential part. A spin chuck 3 that mounts and holds an outer peripheral edge of the substrate W on an upper end of a rotating shaft (not shown) that rotates around a vertical axis by driving an electric servomotor (not shown) can be integrally rotated. Attached to. The spin chuck 3 is provided with six regulating pins 8... At predetermined intervals in the circumferential direction on a bottom plate 7 connected to a rotating shaft (not shown) so as to be integrally rotatable. Three pin-shaped substrate support members 9 for supporting the substrate W are provided on the rotation center side, and the restricting pins 8 are brought into point contact with the outer peripheral edge of the substrate W to adjust the horizontal position of the substrate W. In addition to the restriction, the substrate W is configured to be brought into point contact with the back surface of the substrate W to support the substrate W. Two of the restricting members 8...
Are provided so that the rotational force can be effectively transmitted to the substrate W by making point contact with the outer peripheral edge of the orientation flat.

【0005】図6の要部の拡大断面図に示すように、底
板7の下向き面の所定の3箇所に下方に延びる筒体11
が取り付けられ、その筒体11…それぞれ内に基板支持
部材9の下方側が昇降可能に内嵌されるとともに、基板
支持部材9を下降側に変位するように付勢する圧縮コイ
ルスプリング12が設けられている。筒体11の下部に
開口13が形成され、その開口13の下方に対応させ
て、基板支持部材9に当接して上昇させる押圧部材14
が昇降可能に設けられるとともに押圧部材14にエアシ
リンダ15が連動連結されている。この押圧部材14と
エアシリンダ15とから成る構成を昇降手段と称する。
As shown in an enlarged sectional view of a main portion of FIG. 6, a cylindrical body 11 extending downward at three predetermined locations on the downward surface of the bottom plate 7 is provided.
A lower portion of the substrate support member 9 is fitted in the cylindrical body 11 so as to be able to move up and down, and a compression coil spring 12 for urging the substrate support member 9 to be displaced downward is provided. ing. An opening 13 is formed at a lower portion of the cylindrical body 11, and a pressing member 14 that is brought into contact with the substrate supporting member 9 and rises corresponding to a position below the opening 13.
Are provided so as to be able to move up and down, and an air cylinder 15 is connected to the pressing member 14 in an interlocking manner. The structure including the pressing member 14 and the air cylinder 15 is referred to as elevating means.

【0006】上記構成により、基板Wの搬入時には、ロ
ータリー・エンコーダなどにより所定位置の回転角度位
置で停止されたスピンチャック3に対して押圧部材14
を上昇させ、基板支持部材9に当接してそれを基板Wの
受け渡し位置まで上昇させる。そして、基板Wの受け渡
し後には、押圧部材14を筒体11外まで下降させて、
基板支持部材9に対して非当接状態にし、圧縮コイルス
プリング12の弾性復元力により基板支持部材9を下降
させ、基板Wを処理位置に下降する。この状態で、基板
Wを回転して例えばレジスト液の塗布を行う。次いで、
基板Wを搬出するときには、スピンチャック3の回転を
ロータリー・エンコーダなどにより所定の回転角度位置
で停止させ、スピンチャック3に対して押圧部材14を
上昇させ、基板支持部材9に当接してそれに支持された
基板Wを受け渡し位置まで上昇させて搬出する。
With the above structure, when the substrate W is loaded, the pressing member 14 is pressed against the spin chuck 3 stopped at a predetermined rotation angle position by a rotary encoder or the like.
Is raised, and is brought into contact with the substrate supporting member 9 to be raised to the transfer position of the substrate W. After the transfer of the substrate W, the pressing member 14 is lowered to the outside of the cylindrical body 11 to
The substrate supporting member 9 is brought into a non-contact state, the substrate supporting member 9 is lowered by the elastic restoring force of the compression coil spring 12, and the substrate W is lowered to the processing position. In this state, the substrate W is rotated to apply a resist solution, for example. Then
When the substrate W is carried out, the rotation of the spin chuck 3 is stopped at a predetermined rotation angle position by a rotary encoder or the like, the pressing member 14 is raised with respect to the spin chuck 3, and the substrate W comes into contact with the substrate support member 9 and is supported thereon. The transported substrate W is lifted to the transfer position and carried out.

【0007】[0007]

【発明が解決しようとする課題】このスピンチャック3
みによれば規制ピン8…で水平方向の位置規制を行うと
ともに、規制ピン8…よりも回転中心側(基板Wの周辺
部)に配置した3本のピン状の基板支持部材で基板Wを
下面より支持するするので基板Wの下面の主要な部分
(中よりの部分)は汚れたり傷ついたりしない。しかし
ながら、このスピンチャック3は真空吸着を行わないの
でその回転動作を良好に基板Wに伝えるべく図4に示す
ようにオリエンテーションフラットOFの位置を規制す
るように規制ピン8,8を設けて急速に回転が加速、減
速しても基板Wが滑りを生じないようにしている。従っ
て、これに基板Wを載置するにはスピンチャック3の回
転方向位置と、基板Wの回転方向位置を正確に合わせな
ければならない。そこで、ロータリー・エンコーダなど
により正確に所定の回転角度位置で停止させると共に、
そこに基板Wを搬送する装置も正確に基板Wの向きを制
御する機能を要する。即ちこのスピンチャック3を使用
する装置例えばフォトレジストの塗布装置は高度の停止
角度位置の制御を必要とし、簡単で安価な装置、例えば
人の手で基板を着脱するような簡単な装置には不向きで
ある。そこで、この発明は上記のスピンチャックと同様
に基板の下面の中心部主要な部分は汚れたり傷ついたり
しないものであって、基板の装着に際して基板の回転方
向位置とスピンチャックの回転方向位置とを高精度に位
置合わせすることを不要としたスピンチャックを提供す
る。
The spin chuck 3
According to the above description, the horizontal position is regulated by the regulating pins 8..., And the substrate W is supported by three pin-shaped substrate supporting members disposed on the rotation center side (peripheral portion of the substrate W) with respect to the regulating pins 8. Since the support is provided from the lower surface, the main portion (the middle portion) of the lower surface of the substrate W is not stained or damaged. However, since the spin chuck 3 does not perform vacuum suction, regulating pins 8 are provided so as to regulate the position of the orientation flat OF as shown in FIG. The substrate W does not slip even when the rotation is accelerated or decelerated. Therefore, in order to place the substrate W thereon, the rotational position of the spin chuck 3 and the rotational position of the substrate W must be accurately aligned. Therefore, while accurately stopping at a predetermined rotation angle position using a rotary encoder, etc.,
The device for transporting the substrate W also needs a function of accurately controlling the direction of the substrate W. That is, an apparatus using the spin chuck 3, for example, a photoresist coating apparatus requires a high degree of control of a stop angle position, and is not suitable for a simple and inexpensive apparatus, for example, a simple apparatus for attaching and detaching a substrate by hand. It is. Therefore, in the present invention, similar to the above-mentioned spin chuck, the main part at the center of the lower surface of the substrate does not become dirty or damaged, and the rotational direction position of the substrate and the rotational direction position of the spin chuck at the time of mounting the substrate are different. Provided is a spin chuck that does not require highly accurate alignment.

【0008】[0008]

【課題を解決するための手段】上記の課題を解決するた
めにこの発明は、回転軸の上端に一体に取り付けられて
回転自在な底板と、その上面に周方向に所定間隔を隔て
て複数立設され、載置される基板の水平方向位置を規制
する規制ピンと、底板の上面に設けられ載置される基板
の下面周縁部を支持して基板下面の主要部分を底板から
浮かせる基板支持部材と、基板支持部材の基板を支持す
る部位に設けた真空吸着孔とを具備することを特徴とす
るスピンチャックを提供する。上記の構成によれば下面
周縁部を支持して基板下面の主要部分を底板から浮かせ
るので基板下面の中心側主要部は汚れたり傷ついたりし
ない。そして、基板支持部材の基板を支持する部位に真
空吸着孔を設けたのでそこを吸着すればスピンチャック
の回転動作を基板に伝えるにたる摩擦力は得られる。そ
こで、基板の水平方向の位置規制を行う規制ピンは基板
の回転方向の位置規制を行う必要はない。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention provides a rotatable bottom plate integrally attached to the upper end of a rotating shaft, and a plurality of standing plates arranged on the upper surface thereof at predetermined intervals in a circumferential direction. A regulating pin that regulates the horizontal position of the mounted substrate, and a substrate supporting member that is provided on the upper surface of the bottom plate, supports the lower peripheral edge of the mounted substrate, and floats a main portion of the lower surface of the substrate from the bottom plate. A vacuum chuck hole provided at a portion of the substrate support member for supporting the substrate. According to the above configuration, the main portion of the lower surface of the substrate is supported from the bottom plate by supporting the peripheral portion of the lower surface, so that the main portion of the lower surface of the substrate on the center side is not stained or damaged. Since a vacuum suction hole is provided in a portion of the substrate support member that supports the substrate, if the vacuum suction hole is suctioned, a frictional force for transmitting the rotation operation of the spin chuck to the substrate can be obtained. Therefore, it is not necessary for the regulation pins for regulating the horizontal position of the substrate to regulate the rotational position of the substrate.

【0009】そこで、規制ピンは適用する基板の径に応
じて同じ円上に配置されているのが好ましい。そうすれ
ば、オリエンテーションフラットのある基板を搬送装着
するに際して、スピンチャックと基板との回転方向の位
置合わせを高精度に行う必要がなくなる。
Therefore, it is preferable that the restriction pins are arranged on the same circle according to the diameter of the substrate to be applied. This eliminates the necessity of performing high-accuracy alignment of the spin chuck and the substrate in the rotation direction when transporting and mounting the substrate having the orientation flat.

【0010】そして、基板支持部材は小さな接触面積で
支持する構造とし、その頂面に開口する真空吸着孔を有
して基板の外周部を支持する位置に周方向の複数個所に
配置しても良いし、基板の外周部を支持する環状形状で
あって、その支持面には周方向の複数個所に配置された
真空吸着孔を備えるようにも出来る。
The substrate supporting member is structured to support with a small contact area, has a vacuum suction hole opened on the top surface, and is arranged at a plurality of positions in the circumferential direction at positions supporting the outer peripheral portion of the substrate. Alternatively, the substrate may have an annular shape that supports the outer peripheral portion of the substrate, and the supporting surface may have vacuum suction holes arranged at a plurality of positions in the circumferential direction.

【0011】[0011]

【発明の実施の形態】この発明を図面を参照して説明す
る。図1はこの発明の一実施例の要部の平面図、図2は
そのA−A線での断面図、図3は図1におけるB−B線
での断面図である。電動サーボモータ(図示せず)の駆
動によって鉛直方向の軸芯周りで回転する回転軸51の
上端に、基板Wの外周縁を載置して保持するスピンチャ
ック53が一体回転可能に取り付けられている。スピン
チャック53は、回転軸51に一体回転可能に連結され
る底板57に、その周方向に所定間隔を隔てて6本の規
制ピン8…を設けるとともに、規制ピン8…よりも少し
回転中心側に基板Wを小さな接触面積で支持する基板支
持部材59…を6個所設けて構成され、規制ピン8…を
基板Wの外周端縁に点接触させて基板Wの水平方向の位
置を規制するとともに、基板支持部材59…を基板Wの
裏面に点接触させて基板Wを支持して基板Wの下面が底
板57に接触しないように構成されている。規制部材8
…は基板Wのオリエンテーションフラットに関係なく同
円上に配置されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described with reference to the drawings. FIG. 1 is a plan view of a main part of an embodiment of the present invention, FIG. 2 is a cross-sectional view taken along line AA, and FIG. 3 is a cross-sectional view taken along line BB in FIG. A spin chuck 53 that mounts and holds an outer peripheral edge of the substrate W is integrally rotatably attached to an upper end of a rotating shaft 51 that rotates around a vertical axis by driving of an electric servomotor (not shown). I have. The spin chuck 53 is provided with six regulating pins 8... At predetermined intervals in a circumferential direction on a bottom plate 57 connected to the rotating shaft 51 so as to be integrally rotatable, and is slightly closer to the rotation center than the regulating pins 8. Are provided at six locations for supporting the substrate W with a small contact area, and the restricting pins 8 are brought into point contact with the outer peripheral edge of the substrate W to regulate the horizontal position of the substrate W. , The substrate support members 59 are point-contacted to the back surface of the substrate W to support the substrate W so that the lower surface of the substrate W does not contact the bottom plate 57. Control member 8
Are arranged on the same circle regardless of the orientation flat of the substrate W.

【0012】基板支持部材59…はその頂面に開口する
真空吸着孔59aを有して真空吸着ノズルを構成してい
る。真空吸着孔59aは底板57、回転軸51内に設け
られた通気路57a、51aを介して吸気ポンプ(図示
せず)に接続する。
The substrate support members 59 have a vacuum suction hole 59a opened on the top surface thereof to form a vacuum suction nozzle. The vacuum suction holes 59a are connected to an intake pump (not shown) via bottom plates 57 and ventilation paths 57a and 51a provided in the rotating shaft 51.

【0013】上記構成により、基板Wの搬入時には、ス
ピンチャック53が正確に所定の回転角度位置で停止さ
れていなくても規制ピン8…は同円上に配置されている
ので基板Wのオリエンテーションフラットの方向を精度
良く合わせることなく搬入装着できる。即ち、オリエン
テーションフラット部がたまたま位置して真空吸着孔5
9aが塞がらず吸着出来ない事態をさける程度の精度で
良い。そして、真空吸着孔59aにより真空吸着すれば
基板支持部材59…上に基板Wは固定される。その吸着
力は基板下面全体を利用して吸着するものに比較すれば
かなり弱いが、スピンチャック53の加速、減速に際し
て滑りが生じない程度の摩擦が得られればよい。基板の
水平方向の規制は規制ピン8…で行う。
With the above structure, when the substrate W is carried in, the regulating pins 8 are arranged on the same circle even if the spin chuck 53 is not accurately stopped at a predetermined rotation angle position. Can be loaded and installed without accurately adjusting the direction of the camera. In other words, the orientation flat part happens to be positioned and the vacuum suction hole 5
The accuracy may be sufficient to avoid a situation where 9a is not blocked and cannot be absorbed. Then, the substrate W is fixed on the substrate supporting members 59 by vacuum suction through the vacuum suction holes 59a. The attraction force is considerably weaker than the attraction force utilizing the entire lower surface of the substrate, but it is sufficient that the friction to the extent that no slip occurs when the spin chuck 53 is accelerated or decelerated is obtained. The regulation of the substrate in the horizontal direction is performed by the regulation pins 8.

【0014】この状態で、基板Wを回転して例えばレジ
スト液の塗布を行う。次いで、基板Wを搬出するときに
は、スピンチャック53の回転を停止させ、真空吸着を
切り、基板Wを取り出す。
In this state, the substrate W is rotated to apply a resist solution, for example. Next, when the substrate W is carried out, the rotation of the spin chuck 53 is stopped, vacuum suction is cut off, and the substrate W is taken out.

【0015】このスピンチャック53によれば、基板支
持部材59…を基板Wの外周部を支持するように設けた
ので基板Wの下面中ほど主要部分にキズを付けたり汚し
たりすることがなくなる。そして、基板支持部材59…
を真空吸着ノズルとしたのでスピンチャック53の回転
動作の加速、減速時に基板Wが滑らない程度の摩擦がえ
られ、規制ピンをオリエンテーションフラットに合わせ
て配置する必要がなくなり同じ円上に配置すれば良く、
そうすれば基板の搬送装着に際しての高精度に位置合わ
せが不要となる利点を有する。
According to the spin chuck 53, since the substrate supporting members 59 are provided so as to support the outer peripheral portion of the substrate W, the main portion is not scratched or contaminated in the lower surface of the substrate W. Then, the substrate support members 59 ...
Is used as a vacuum suction nozzle, so that the rotation of the spin chuck 53 can be accelerated and decelerated so that the substrate W does not slip when it is decelerated, so that it is not necessary to arrange the regulating pins in alignment with the orientation flat. well,
In this case, there is an advantage that positioning is not required with high precision when carrying and mounting the substrate.

【0016】上記実施例では基板支持部材59…を基板
Wの外周部を点状に(接触面積小さく)支持する構造と
したが、基板Wの外周部を支える環状とすることもでき
る。その際真空吸着孔を複数個所に設けて吸着するよう
にすれば良い。
In the above embodiment, the substrate supporting members 59 are configured to support the outer peripheral portion of the substrate W in a point-like manner (with a small contact area). At this time, a plurality of vacuum suction holes may be provided so as to perform suction.

【0017】[0017]

【発明の効果】以上の説明のようにこの発明のスピンチ
ャックによれば、基板の外周部を支持して基板下面の主
要部を浮かせ汚れやキズの発生を防止し、しかも支持部
分で真空吸着するのでスピンチャックの回転運動を基板
に伝えるにたる摩擦力が得られ、規制ピンで基板の回転
方向の位置規制を行う必要がなくなる。
As described above, according to the spin chuck of the present invention, the outer peripheral portion of the substrate is supported, the main portion of the lower surface of the substrate is lifted to prevent the generation of dirt and scratches, and the supporting portion is vacuum-adsorbed. Therefore, a frictional force can be obtained to transmit the rotational movement of the spin chuck to the substrate, and it is not necessary to regulate the position of the substrate in the rotational direction with the regulating pin.

【0018】そこで、規制ピンを同じ円上に配設する
と、基板の搬送装着に際しての高精度での回転方向の位
置合わせが不要となり装置を簡略なものとする。
Therefore, when the regulating pins are arranged on the same circle, it is not necessary to perform high-precision positioning in the rotating direction when the substrate is transported and mounted, thereby simplifying the apparatus.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 この発明一実施例の要部平面図。FIG. 1 is a plan view of a main part of an embodiment of the present invention.

【図2】 そのA−A線での断面図。FIG. 2 is a cross-sectional view taken along line AA.

【図3】 図1のB−B線での断面図。FIG. 3 is a sectional view taken along line BB in FIG. 1;

【図4】 従来のスピンチャックの要部平面図。FIG. 4 is a plan view of a main part of a conventional spin chuck.

【図5】 その斜視図。FIG. 5 is a perspective view thereof.

【図6】 その要部断面図。FIG. 6 is a sectional view of a main part thereof.

【符号の説明】[Explanation of symbols]

8 規制ピン 51 回転軸 53 スピンチャック 57 底板 59 基板支持部材 59a 真空吸着孔 W 基板 8 Regulatory Pin 51 Rotating Shaft 53 Spin Chuck 57 Bottom Plate 59 Substrate Supporting Member 59a Vacuum Suction Hole W Substrate

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】回転軸の上端に一体に取り付けられて回転
自在な底板と、 その上面に周方向に所定間隔を隔てて複数立設され、載
置される基板の水平方向位置を規制する規制ピンと、 前記底板の上面に設けられ載置される基板の下面周縁部
を支持して基板下面の主要部分を前記底板から浮かせる
基板支持部材と、 前記基板支持部材の基板を支持する部位に設けた真空吸
着孔とを具備することを特徴とするスピンチャック。
A rotatable bottom plate integrally attached to an upper end of a rotating shaft; and a plurality of standing plates provided on a top surface of the bottom plate at predetermined intervals in a circumferential direction to regulate a horizontal position of a substrate to be placed. A pin, a substrate supporting member provided on the upper surface of the bottom plate, supporting a lower peripheral edge of the substrate to be placed, and allowing a main portion of the lower surface of the substrate to float from the bottom plate; and a portion of the substrate supporting member supporting the substrate. A spin chuck comprising a vacuum suction hole.
【請求項2】前記規制ピンは適用する基板の径に応じて
同じ円上に配置されていることを特徴とする請求項1に
記載のスピンチャック。
2. The spin chuck according to claim 1, wherein said regulating pins are arranged on the same circle in accordance with the diameter of a substrate to be applied.
【請求項3】前記基板支持部材は小さな接触面積で支持
する構造とし、その頂面に開口する真空吸着孔を有して
基板の外周部を支持する位置に周方向の複数個所に配置
されたことを特徴とする請求項1又は請求項2に記載の
スピンチャック。
3. The substrate supporting member has a structure in which it is supported with a small contact area, and has a vacuum suction hole opened on the top surface thereof, and is disposed at a plurality of positions in the circumferential direction at positions supporting the outer peripheral portion of the substrate. The spin chuck according to claim 1 or 2, wherein
【請求項4】前記基板支持部材は基板の外周部を支持す
る環状形状であって、その支持面には周方向の複数個所
に配置された真空吸着孔を備えることを特徴とする請求
項1又は請求項2に記載のスピンチャック。
4. The apparatus according to claim 1, wherein said substrate support member has an annular shape for supporting an outer peripheral portion of the substrate, and has a plurality of vacuum suction holes arranged at a plurality of positions in a circumferential direction on a support surface thereof. Or the spin chuck according to claim 2.
JP9147499A 1999-03-31 1999-03-31 Spin chuck Pending JP2000286185A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9147499A JP2000286185A (en) 1999-03-31 1999-03-31 Spin chuck

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9147499A JP2000286185A (en) 1999-03-31 1999-03-31 Spin chuck

Publications (1)

Publication Number Publication Date
JP2000286185A true JP2000286185A (en) 2000-10-13

Family

ID=14027405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9147499A Pending JP2000286185A (en) 1999-03-31 1999-03-31 Spin chuck

Country Status (1)

Country Link
JP (1) JP2000286185A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141921A (en) * 2005-11-15 2007-06-07 Seiko Epson Corp Conveying device, conveying method of electronic member, and manufacturing method of semiconductor device
KR100850123B1 (en) * 2006-12-22 2008-08-04 동부일렉트로닉스 주식회사 Wafer spin chuck
CN100437967C (en) * 2005-08-04 2008-11-26 爱德牌工程有限公司 Clamping device, substrate transmitting device, and on-line fpd automatic optical detection device
KR100889633B1 (en) * 2007-10-11 2009-03-20 세메스 주식회사 Chuck pin for fixing substrate
CN101916049A (en) * 2010-08-02 2010-12-15 友达光电股份有限公司 Workbench
CN103158916A (en) * 2011-12-09 2013-06-19 苏州工业园区高登威科技有限公司 Vacuum suction nozzle
CN103158918A (en) * 2011-12-09 2013-06-19 苏州工业园区高登威科技有限公司 Vacuum suction nozzle
KR101346780B1 (en) 2012-03-27 2014-01-02 배병성 Substrate holder for spin coater

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100437967C (en) * 2005-08-04 2008-11-26 爱德牌工程有限公司 Clamping device, substrate transmitting device, and on-line fpd automatic optical detection device
JP2007141921A (en) * 2005-11-15 2007-06-07 Seiko Epson Corp Conveying device, conveying method of electronic member, and manufacturing method of semiconductor device
JP4626494B2 (en) * 2005-11-15 2011-02-09 セイコーエプソン株式会社 Electronic member placement method
KR100850123B1 (en) * 2006-12-22 2008-08-04 동부일렉트로닉스 주식회사 Wafer spin chuck
KR100889633B1 (en) * 2007-10-11 2009-03-20 세메스 주식회사 Chuck pin for fixing substrate
CN101916049A (en) * 2010-08-02 2010-12-15 友达光电股份有限公司 Workbench
CN101916049B (en) * 2010-08-02 2012-04-25 友达光电股份有限公司 Workbench
CN103158916A (en) * 2011-12-09 2013-06-19 苏州工业园区高登威科技有限公司 Vacuum suction nozzle
CN103158918A (en) * 2011-12-09 2013-06-19 苏州工业园区高登威科技有限公司 Vacuum suction nozzle
KR101346780B1 (en) 2012-03-27 2014-01-02 배병성 Substrate holder for spin coater

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