JP2000258483A5 - - Google Patents
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- Publication number
- JP2000258483A5 JP2000258483A5 JP2000053749A JP2000053749A JP2000258483A5 JP 2000258483 A5 JP2000258483 A5 JP 2000258483A5 JP 2000053749 A JP2000053749 A JP 2000053749A JP 2000053749 A JP2000053749 A JP 2000053749A JP 2000258483 A5 JP2000258483 A5 JP 2000258483A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US259609 | 1994-06-14 | ||
| US09/259,609 US6324486B1 (en) | 1999-03-01 | 1999-03-01 | Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2000258483A JP2000258483A (ja) | 2000-09-22 |
| JP2000258483A5 true JP2000258483A5 (ja) | 2006-11-30 |
Family
ID=22985627
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000053749A Pending JP2000258483A (ja) | 1999-03-01 | 2000-02-29 | 実時間測定値の集合を適応学習するための方法及び自動試験システム |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6324486B1 (ja) |
| EP (1) | EP1039389B1 (ja) |
| JP (1) | JP2000258483A (ja) |
| DE (1) | DE60002518T2 (ja) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7308614B2 (en) | 2002-04-30 | 2007-12-11 | Honeywell International Inc. | Control sequencing and prognostics health monitoring for digital power conversion and load management |
| US6850426B2 (en) | 2002-04-30 | 2005-02-01 | Honeywell International Inc. | Synchronous and bi-directional variable frequency power conversion systems |
| US20070162446A1 (en) * | 2006-01-12 | 2007-07-12 | Appenzeller David P | Method of testing a multi-processor unit microprocessor |
| JP4941164B2 (ja) * | 2007-08-09 | 2012-05-30 | 横河電機株式会社 | 基準電圧校正回路及び方法 |
| US8643539B2 (en) * | 2008-11-19 | 2014-02-04 | Nokomis, Inc. | Advance manufacturing monitoring and diagnostic tool |
| US9032361B2 (en) * | 2011-12-15 | 2015-05-12 | Tata Consultancy Services Limited | Agile unit and regression testing framework for domain specific languages |
| JP5849923B2 (ja) * | 2012-10-18 | 2016-02-03 | 日本電産リード株式会社 | インピーダンス測定装置 |
| US9395268B2 (en) * | 2013-07-03 | 2016-07-19 | General Electric Company | Method and system to tolerance test a component |
| CN103592551B (zh) * | 2013-11-27 | 2015-10-14 | 中国电子科技集团公司第四十一研究所 | 一种基于状态快照保存、无缝恢复的测量方法 |
| CN104820147A (zh) * | 2015-04-23 | 2015-08-05 | 中国电子科技集团公司第四十一研究所 | 一种多维环境应力条件触发处理方法 |
| CN104931825A (zh) * | 2015-06-13 | 2015-09-23 | 复旦大学 | 一种用于器件光学和电学测量以及真空监测的集成设备 |
| JP2020003211A (ja) * | 2016-09-29 | 2020-01-09 | 株式会社村田製作所 | 容量測定回路及び容量測定システム |
| US10448864B1 (en) | 2017-02-24 | 2019-10-22 | Nokomis, Inc. | Apparatus and method to identify and measure gas concentrations |
| US11489847B1 (en) | 2018-02-14 | 2022-11-01 | Nokomis, Inc. | System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network |
| CN110795265B (zh) * | 2019-10-25 | 2021-04-02 | 东北大学 | 一种基于乐观容错方法的迭代器 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5202639A (en) | 1989-01-09 | 1993-04-13 | Schlumberger Technologies Limited | Method and apparatus for testing analogue circuits |
-
1999
- 1999-03-01 US US09/259,609 patent/US6324486B1/en not_active Expired - Fee Related
-
2000
- 2000-02-21 DE DE60002518T patent/DE60002518T2/de not_active Expired - Fee Related
- 2000-02-21 EP EP00301326A patent/EP1039389B1/en not_active Expired - Lifetime
- 2000-02-29 JP JP2000053749A patent/JP2000258483A/ja active Pending