JP2000206255A5 - - Google Patents

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Publication number
JP2000206255A5
JP2000206255A5 JP1999001905A JP190599A JP2000206255A5 JP 2000206255 A5 JP2000206255 A5 JP 2000206255A5 JP 1999001905 A JP1999001905 A JP 1999001905A JP 190599 A JP190599 A JP 190599A JP 2000206255 A5 JP2000206255 A5 JP 2000206255A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP1999001905A
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JP2000206255A (ja
JP4216387B2 (ja
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Priority to JP190599A priority Critical patent/JP4216387B2/ja
Priority claimed from JP190599A external-priority patent/JP4216387B2/ja
Publication of JP2000206255A publication Critical patent/JP2000206255A/ja
Publication of JP2000206255A5 publication Critical patent/JP2000206255A5/ja
Application granted granted Critical
Publication of JP4216387B2 publication Critical patent/JP4216387B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP190599A 1999-01-07 1999-01-07 Ｘ線検出器 Expired - Fee Related JP4216387B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP190599A JP4216387B2 (ja) 1999-01-07 1999-01-07 Ｘ線検出器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP190599A JP4216387B2 (ja) 1999-01-07 1999-01-07 Ｘ線検出器

Publications (3)

Publication Number Publication Date
JP2000206255A JP2000206255A (ja) 2000-07-28
JP2000206255A5 true JP2000206255A5 (ja) 2006-02-23
JP4216387B2 JP4216387B2 (ja) 2009-01-28

Family

ID=11514604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP190599A Expired - Fee Related JP4216387B2 (ja) 1999-01-07 1999-01-07 Ｘ線検出器

Country Status (1)

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JP (1) JP4216387B2 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100428795B1 (ko) * 2000-11-24 2004-04-28 삼성전자주식회사 빠른 초기화를 수행하는 엑스선 검출기
JP2004037382A (ja) * 2002-07-05 2004-02-05 Toshiba Corp 放射線検出器及び放射線診断装置
JP4540301B2 (ja) * 2003-05-20 2010-09-08 三菱電機株式会社 放射線モニタ
US7091491B2 (en) * 2004-05-14 2006-08-15 General Electric Company Method and means for reducing electromagnetic noise induced in X-ray detectors
JP2009186268A (ja) * 2008-02-05 2009-08-20 Fujifilm Corp 画像検出装置
KR100969707B1 (ko) 2008-06-17 2010-07-14 주식회사바텍 Ｘ선 이미지센서의 옵셋 레벨 안정화방법
JP2011214886A (ja) * 2010-03-31 2011-10-27 Fujifilm Corp 放射線画像処理装置
KR101809542B1 (ko) 2011-12-26 2017-12-18 삼성전자주식회사 스위칭 회로, 이를 포함하는 전하량 검출 증폭기 및 광자 계수 검출 장치

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