JP2000164503A - Rotation processor - Google Patents

Rotation processor

Info

Publication number
JP2000164503A
JP2000164503A JP33937298A JP33937298A JP2000164503A JP 2000164503 A JP2000164503 A JP 2000164503A JP 33937298 A JP33937298 A JP 33937298A JP 33937298 A JP33937298 A JP 33937298A JP 2000164503 A JP2000164503 A JP 2000164503A
Authority
JP
Japan
Prior art keywords
substrate
cup
chuck
liquid
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33937298A
Other languages
Japanese (ja)
Other versions
JP3712099B2 (en
Inventor
Futoshi Shimai
太 島井
Koichi Nagasawa
耕一 永澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to JP33937298A priority Critical patent/JP3712099B2/en
Publication of JP2000164503A publication Critical patent/JP2000164503A/en
Application granted granted Critical
Publication of JP3712099B2 publication Critical patent/JP3712099B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Coating Apparatus (AREA)

Abstract

PROBLEM TO BE SOLVED: To validly collect fluid which flows into a substrate or the shaft of a chuck. SOLUTION: A bottom part 5 of a cup 3 is provided as a double structure constituted of an upper plate 14 and a lower plate 15, and the inside part is obtained as a trap space S. Also, an inside rectifying ring 18 used at development processing to a substrate W in a small dimension is mounted on an upper support piece 17c so that position adjustment can be attained, and an outside rectifying ring 20 to be used at development processing through a support piece 19 to a substrate W in a large dimension is mounted on the inside of an outside wall 4 of the cup 3 capable of being position adjustable.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はガラス基板や半導体
ウェーハ等の基板に対し、現像液、洗浄液、SOG溶
液、レジスト溶液等を塗布する回転処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a rotary processing apparatus for applying a developing solution, a cleaning solution, an SOG solution, a resist solution and the like to a substrate such as a glass substrate or a semiconductor wafer.

【0002】[0002]

【従来の技術】ガラス基板や半導体ウェーハ等の基板を
回転せしめるとともに、基板の表面に現像液等の液体を
供給して所定の処理を行う装置として、特開平8−32
1460号公報に開示される装置が知られている。
2. Description of the Related Art An apparatus for rotating a substrate such as a glass substrate or a semiconductor wafer and supplying a liquid such as a developing solution to the surface of the substrate to perform a predetermined process is disclosed in Japanese Patent Application Laid-Open No. 8-32.
An apparatus disclosed in 1460 is known.

【0003】この装置は、固定されたカップ内に基板を
保持して回転せしめるチャックを配置するとともに、カ
ップ外側に平面視で四角形をなすケース(外カップ)を
配置し、このケース底面とカップ底面との間を迂回通路
とし、この迂回通路を介して清浄な空気を基板の下面側
に供給し、供給した清浄な空気を基板下面に沿って径方
向外側に導くようにしている。
In this apparatus, a chuck for holding and rotating a substrate in a fixed cup is arranged, and a case (outer cup) having a quadrangular shape in a plan view is arranged outside the cup. Is provided as a detour passage, clean air is supplied to the lower surface side of the substrate via the detour passage, and the supplied clean air is guided radially outward along the lower surface of the substrate.

【0004】また、上記装置にあっては、排液ダクトと
排気ダクトを別々に設け、排液ダクトはカップの外周部
からケース底面を貫通して下方に垂下し、排気ダクトは
前記排液ダクトよりも径方向内側部においてケース底面
を貫通して下方に垂下している。
Further, in the above apparatus, a drain duct and an exhaust duct are separately provided, the drain duct penetrates downward from the outer peripheral portion of the cup through the bottom of the case, and the exhaust duct is the drain duct. At the inner side in the radial direction, it penetrates the case bottom surface and hangs downward.

【0005】[0005]

【発明が解決しようとする課題】上述した従来の回転処
理装置にあっては、基板から飛散した処理液を回収する
ため、カップ内壁面自体をガイド面としているが、例え
ば、回転処理装置によって現像を行う場合、基板の回転
速度が遅いため、カップ内壁面に当る液体の勢いが弱
く、却って回収しにくい。特に大寸法の基板に対し現像
処理を行う場合には、カップの径も大きくなるので、カ
ップ内壁面に当る前に、他の箇所に付着し、回収しにく
い。
In the above-mentioned conventional rotary processing apparatus, the inner wall surface of the cup itself is used as a guide surface in order to collect the processing liquid scattered from the substrate. In this case, since the rotation speed of the substrate is low, the force of the liquid hitting the inner wall surface of the cup is weak, and it is rather difficult to collect the liquid. In particular, when the developing process is performed on a large-sized substrate, the diameter of the cup increases, so that it adheres to other parts before hitting the inner wall surface of the cup, and is difficult to collect.

【0006】特に、大寸法の基板に対し処理を行える大
口径のカップを用いて、小寸法のガラス基板に対し現像
処理を施す場合には、基板からカップ内壁までの距離が
離れすぎているので、更に回収効率が落ちる。
In particular, when a large-sized cup capable of processing a large-sized substrate is used for developing a small-sized glass substrate, the distance from the substrate to the inner wall of the cup is too large. , Further reducing the collection efficiency.

【0007】一方、処理の際に回転しているのは基板だ
けでなく、チャック及びチャックの軸も回転している。
このため、チャックの軸まで廻り込んだ液体が軸の回転
によって飛散し、カップ底面の裏側等に付着し、これが
乾燥して微細な粒子になって、基板表面に落下すること
もある。また、回転軸の回転によって生じる細かいパー
ティクル等が基板表面に落下することもある。
On the other hand, not only the substrate but also the chuck and the shaft of the chuck are rotating during the processing.
For this reason, the liquid that has reached the axis of the chuck is scattered by the rotation of the axis, adheres to the back side of the bottom surface of the cup, or the like, and is dried to become fine particles, which may fall on the substrate surface. Further, fine particles or the like generated by the rotation of the rotating shaft may fall on the substrate surface.

【0008】[0008]

【課題を解決するための手段】上記課題のうち、基板か
ら飛散する液体を有効に回収すべく、請求項1に記載の
発明は、回転処理装置のカップに、基板から飛散した液
体を回収するための回収口を設けるとともに、カップ外
周壁の内側に基板から飛散した液体を回収口に導く外側
整流リングを取り付けた。
According to the first aspect of the present invention, in order to effectively collect the liquid scattered from the substrate, the liquid scattered from the substrate is collected in a cup of a rotary processing apparatus. And an outer rectifying ring that guides the liquid scattered from the substrate to the recovery port was provided inside the outer peripheral wall of the cup.

【0009】大型の基板を処理する回転処理装置にあっ
ては、前記外側整流リングの内側に内側整流リングを着
脱可能に設けることで、従来寸法の基板に対してもその
まま対応できる。
In a rotary processing apparatus for processing a large-sized substrate, by providing an inner rectifying ring detachably inside the outer rectifying ring, it is possible to cope with a substrate having a conventional size as it is.

【0010】また、上記課題のうち、チャックの回転軸
から飛散する液体を有効に回収すべく、請求項3に記載
の発明は、回転処理装置のカップの底部をチャックの回
転軸に向かって開口する二重構造とし、この二重構造の
内部をチャックの回転軸から飛散する液体や回転軸の回
転によって生じるパーティクル等を回収するトラップ空
間とした。
In order to effectively collect the liquid scattered from the rotating shaft of the chuck, the invention according to claim 3 is to open the bottom of the cup of the rotary processing apparatus toward the rotating shaft of the chuck. The inside of this double structure was used as a trap space for collecting liquid scattered from the rotating shaft of the chuck, particles generated by rotation of the rotating shaft, and the like.

【0011】上記の回転処理装置において、前記トラッ
プ空間を径方向外側に向かって下方に傾斜せしめること
で、液体の回収が更に有効になされる。
In the above-mentioned rotary processing apparatus, the liquid can be more effectively recovered by inclining the trap space downward toward the outside in the radial direction.

【0012】[0012]

【発明の実施の形態】以下に本発明の実施の形態を添付
図面に基づいて説明する。ここで、図1は本発明に係る
回転処理装置の全体側面図、図2は同回転処理装置の平
面図、図3は同回転処理装置のAーA線拡大縦断面図、
図4は図3の要部拡大図である。
Embodiments of the present invention will be described below with reference to the accompanying drawings. Here, FIG. 1 is an overall side view of the rotation processing apparatus according to the present invention, FIG. 2 is a plan view of the rotation processing apparatus, FIG.
FIG. 4 is an enlarged view of a main part of FIG.

【0013】図1に示すように、本発明に係る回転処理
装置1はダクトD及びフィルタFからなる清浄空気の吹
出し部の下方に配置され、また床Gはすのこ状になって
おり、そのまま清浄空気が下方に抜ける構造になってお
り、微細な塵が現像処理中に表面に付着しにくい雰囲気
になっている。
As shown in FIG. 1, a rotary processing apparatus 1 according to the present invention is disposed below a clean air blowing portion including a duct D and a filter F, and a floor G is shaped like a saw-tooth. The structure allows air to escape downward, creating an atmosphere in which fine dust hardly adheres to the surface during development processing.

【0014】回転処理装置1は、平面視で矩形状をなす
ケース2内にリング状カップ3を配置している。このカ
ップ3は外側壁4と底部5から構成され、外側壁4は上
方に向かって徐々にその径が小さくなり、上端開口には
整流筒6が設けられている。
In the rotation processing device 1, a ring-shaped cup 3 is arranged in a case 2 having a rectangular shape in plan view. The cup 3 is composed of an outer wall 4 and a bottom portion 5. The outer wall 4 gradually decreases in diameter upward, and a rectifying cylinder 6 is provided at the upper end opening.

【0015】整流筒6はシリンダユニット7にて昇降可
能とされ、回転処理装置1内に基板Wを投入する際には
下降して基板Wの搬入の邪魔にならないようにし、現像
処理中は上昇し、カップ3内に乱流が生じにくくしてい
る。
The rectifying cylinder 6 can be moved up and down by a cylinder unit 7 so as to be lowered when the substrate W is loaded into the rotary processing apparatus 1 so as not to hinder the loading of the substrate W, and to be raised during the development processing. However, turbulence is hardly generated in the cup 3.

【0016】一方、前記カップ3の底部5は上板14と
下板15からなる二重構造となっている。これら上板1
4及び下板15は平面視でスピンナー軸9を囲むドーナ
ッツ状をなし、上板14の表面にはフッ素樹脂コーティ
ングを施し、表面に落下した現像液がスムーズに流れる
ようにし、また、上板14及び下板15にて囲まれる空
間はスピンナー軸9に向かって開口8が形成されたトラ
ップ空間Sとされている。
On the other hand, the bottom 5 of the cup 3 has a double structure consisting of an upper plate 14 and a lower plate 15. These upper plates 1
The lower plate 4 and the lower plate 15 have a donut shape surrounding the spinner shaft 9 in a plan view, and the surface of the upper plate 14 is coated with a fluororesin so that the developer dropped on the surface flows smoothly. And a space surrounded by the lower plate 15 is a trap space S in which an opening 8 is formed toward the spinner axis 9.

【0017】ここで、上板14及び下板15の一方のみ
を用いた場合には不利が生じる。即ち、下板15を省略
すると、スピンナー軸9まで廻り込んだ液体が回転によ
って上板14の裏面に向かって飛散し、付着した液体が
乾燥すると、微細な粒子となって基板表面に廻り込んで
落下するおそれがあり、上板14を省略すると、カップ
内の空間が大きくなり過ぎて乱流を発生する。
Here, a disadvantage occurs when only one of the upper plate 14 and the lower plate 15 is used. That is, if the lower plate 15 is omitted, the liquid that has reached the spinner shaft 9 is scattered toward the back surface of the upper plate 14 by rotation, and when the attached liquid is dried, it becomes fine particles and goes around the substrate surface. If the upper plate 14 is omitted, the space inside the cup becomes too large and turbulence is generated.

【0018】上述したように、トラップ空間Sは主とし
てスピンナー軸9まで廻り込んだ液体を回収する空間で
ある。また、下板15に1個以上のドレン排出口16
を、上板14と下板15が下方に傾斜し合流するところ
に複数個の排液排出口26を設けている。前記ドレン排
出口16の開口部を下板15より3mm以上高くすれ
ば、液体はドレン排出口16の中には入らずに排液排出
口26より排出されることになり、排気系の汚染が防止
できる。また、トラップ空間S自体が径方向外側に向か
って下方に傾斜しているため、一旦トラップ空間S内に
回収された液体が軸受けの部分に廻り込むことがない。
As described above, the trap space S is a space for mainly collecting the liquid that has reached the spinner axis 9. Also, one or more drain outlets 16
A plurality of drain outlets 26 are provided where the upper plate 14 and the lower plate 15 are inclined downward and merge. If the opening of the drain outlet 16 is higher than the lower plate 15 by 3 mm or more, the liquid is discharged from the drain outlet 26 without entering the drain outlet 16, and contamination of the exhaust system is reduced. Can be prevented. Further, since the trap space S itself is inclined downward toward the outside in the radial direction, the liquid once collected in the trap space S does not go around the bearing portion.

【0019】前記スピンナー軸9はベース10に取り付
けたモータ11にて回転せしめられるとともにシリンダ
ユニット12の作動で昇降動可能とされ、更にスピンナ
ー軸9の上端には基板Wを吸着保持するチャック13が
取り付けられている。
The spinner shaft 9 is rotated by a motor 11 mounted on a base 10 and can be moved up and down by the operation of a cylinder unit 12. Further, a chuck 13 for sucking and holding the substrate W is provided on the upper end of the spinner shaft 9. Installed.

【0020】また、前記上板14及び下板15は支持片
17を介して前記ベース10に取り付けられている。支
持片17は下部支持片17a、中間支持片17b及び上
部支持片17cからなり、下部支持片17a上に下板1
5をボルト等で固着し、中間支持片17b上に上板14
をボルト等で固着し、上部支持片17cに小寸法の基板
Wに現像処理を施す際に使用する内側整流リング18を
位置調整可能に取り付けている。
The upper plate 14 and the lower plate 15 are attached to the base 10 via support pieces 17. The support piece 17 includes a lower support piece 17a, an intermediate support piece 17b, and an upper support piece 17c, and the lower plate 1 is placed on the lower support piece 17a.
5 is fixed with bolts or the like, and the upper plate 14 is placed on the intermediate support piece 17b.
Are fixed by bolts or the like, and an inner rectifying ring 18 used when developing a small-sized substrate W is mounted on the upper support piece 17c so as to be position-adjustable.

【0021】また、前記カップ3の側壁4内側には、支
持片19を介して大寸法の基板Wに現像処理を施す際に
使用する外側整流リング20を位置調整可能に取り付け
ている。尚、大寸法の基板Wに現像処理を施す際には、
前記上部支持片17cを中間支持片17bから外すこと
で、内側整流リング18をカップ3内から取り外してお
く。
On the inner side of the side wall 4 of the cup 3, an outer rectifying ring 20 used for performing development processing on a large-sized substrate W via a support piece 19 is attached so as to be adjustable in position. When developing a large-sized substrate W,
By removing the upper support piece 17c from the intermediate support piece 17b, the inner rectifying ring 18 is removed from the inside of the cup 3.

【0022】一方、ケース2内とリング状カップ3内と
は回収口21を介して連通しており、特にケース2の四
隅部のうちの少なくとも一隅部の底面には、排気兼排液
口22が形成され、この排気兼排液口22内には金網な
どから構成される異物回収部材23が、着脱可能に設け
られている。
On the other hand, the inside of the case 2 and the inside of the ring-shaped cup 3 communicate with each other through a recovery port 21. In particular, at least one of the four corners of the case 2 has an exhaust / drain port 22 on the bottom surface. In the exhaust / drain port 22, a foreign matter collecting member 23 made of a wire mesh or the like is detachably provided.

【0023】また、排気兼排液口22上部にはリング状
カップ3内からの気体及び液体を排気兼排液口22に誘
導する整流板24が配置され、更に、排気兼排液口22
の上方のケース2の上面にはメンテナンス口25が形成
されている。
A rectifying plate 24 for guiding gas and liquid from the inside of the ring-shaped cup 3 to the exhaust / drain port 22 is disposed above the exhaust / drain port 22.
A maintenance port 25 is formed on the upper surface of the case 2 above.

【0024】以上において、露光処理が終了した基板W
に現像処理を施す場合を例にとって説明すると、シリン
ダユニット12の作動でスピンナー軸9とともにチャッ
ク13を上昇せしめ、また同時にシリンダユニット7の
作動で整流筒6を下降せしめた状態で、基板Wを側方か
ら搬送してきてチャック13上に載置する。
In the above, the substrate W after the exposure processing has been completed.
When the cylinder unit 12 is operated to raise the chuck 13 together with the spinner shaft 9 and at the same time the cylinder unit 7 is operated to lower the rectifying cylinder 6, the substrate W And is placed on the chuck 13.

【0025】この後、シリンダユニット12を逆方向に
作動させて、チャック13を下降せしめ、更に図示しな
いノズルから基板W表面に現像液を供給し液盛りする。
そして、回転処理直前にシリンダユニット7を逆方向に
作動させて整流筒6を上昇せしめる。現像液の供給ノズ
ルとしては、例えば、スリットノズルが好ましい。
Thereafter, the cylinder unit 12 is operated in the reverse direction to lower the chuck 13, and a developing solution is supplied to the surface of the substrate W from a nozzle (not shown) so as to be filled.
Then, immediately before the rotation processing, the cylinder unit 7 is operated in the reverse direction to raise the flow straightening cylinder 6. As the supply nozzle for the developer, for example, a slit nozzle is preferable.

【0026】上記のように基板W表面に現像液を液盛り
して所定時間経過したならば、モータ11を駆動して基
板Wを回転せしめ、基板W上に盛られた現像液を除去す
る。このときの回転速度は5〜200rpmとする。ま
た、回転時間は0.1〜10秒とする。
After a predetermined period of time has elapsed since the developing solution was applied to the surface of the substrate W as described above, the motor 11 is driven to rotate the substrate W, and the developing solution applied on the substrate W is removed. The rotation speed at this time is 5 to 200 rpm. The rotation time is set to 0.1 to 10 seconds.

【0027】この回転速度は、現像液を乾燥させる際の
回転速度に比べて極めて低速であり、このように低速で
回転せしめることで、基板Wから遠心力により除去され
る現像液の速度を遅くし、基板Wから飛散する現像液の
うちの多くの割合の現像液がカップ底部5を構成する上
板14上に落下し、上板14の傾斜に沿って径方向外側
に向かって流れ、排液の排出口26を介して図示しない
現像液回収ポケット内に流れ込み、ポンプの駆動でタン
クに回収され、再利用に供される。
This rotation speed is extremely low as compared with the rotation speed at the time of drying the developing solution. By rotating at such a low speed, the speed of the developing solution removed from the substrate W by centrifugal force is reduced. Then, a large proportion of the developer scattered from the substrate W falls on the upper plate 14 constituting the cup bottom 5, flows radially outward along the inclination of the upper plate 14, and is discharged. The liquid flows into a developer collection pocket (not shown) via the liquid discharge port 26, is collected in a tank by driving a pump, and is reused.

【0028】回収されなかった現像液及び排気は整流板
24に導かれて排気兼排液口22から外部に排出され
る。また、万一、基板Wが破損した場合には、小さな破
片が異物回収部材23内に回収されるので、基板Wの回
転を停止した後、メンテナンス口25から手を差し込ん
で異物回収部材23を取り外し、異物回収部材23内に
入った破片を取り除き、再び異物回収部材23を排気兼
排液口22にセットし、次の処理に備える。
The unrecovered developer and exhaust gas are guided to the current plate 24 and discharged from the exhaust / drain port 22 to the outside. If the substrate W is damaged, small debris is collected in the foreign matter collecting member 23. Therefore, after the rotation of the substrate W is stopped, a hand is inserted through the maintenance port 25 to remove the foreign matter collecting member 23. The foreign matter collecting member 23 is removed, and the debris that has entered the foreign matter collecting member 23 is removed. The foreign matter collecting member 23 is set in the exhaust / drain port 22 again to prepare for the next process.

【0029】[0029]

【発明の効果】以上に説明したように本発明によれば、
回転処理装置のカップに、基板から飛散した液体を回収
するための回収口を設けるとともに、カップ外周壁の内
側に基板から飛散した液体を回収口に導く外側整流リン
グを取り付けたので、基板から飛散する液体を有効に回
収できる。特に、外側整流リングの内側に内側整流リン
グを着脱可能に設けることで、基板寸法の大小に拘ら
ず、液体を有効に回収できる。
According to the present invention as described above,
A recovery port for collecting liquid scattered from the substrate is provided in the cup of the rotary processing device, and an outer rectifying ring that guides the liquid scattered from the substrate to the recovery port is attached inside the outer peripheral wall of the cup, so that the liquid scatters from the substrate. Liquid can be effectively recovered. Particularly, by providing the inner rectifying ring detachably inside the outer rectifying ring, the liquid can be effectively collected regardless of the size of the substrate.

【0030】また、本発明によれば、回転処理装置のカ
ップの底部をチャックの回転軸に向かって開口する二重
構造とし、この二重構造の内部をチャックの回転軸に廻
り込んだ液体や、塗布液の乾燥によって発生する粒子、
さらに回転軸の回転によって生じるパーティクル等を回
収するトラップ空間としたので、これらを有効に回収す
ることができる。特に、前記トラップ空間を径方向外側
に向かって下方に傾斜せしめることで、液体の回収が更
に有効になされる。
Further, according to the present invention, the bottom of the cup of the rotary processing device has a double structure that opens toward the rotation axis of the chuck, and the inside of the double structure is formed by a liquid or the like that has passed around the rotation axis of the chuck. , Particles generated by drying of the coating liquid,
Further, since a trap space for collecting particles and the like generated by the rotation of the rotating shaft is provided, these can be effectively collected. In particular, by inclining the trap space downward toward the outside in the radial direction, the liquid can be more effectively collected.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る回転処理装置の全体側面図FIG. 1 is an overall side view of a rotation processing apparatus according to the present invention.

【図2】同回転処理装置の平面図FIG. 2 is a plan view of the rotation processing apparatus.

【図3】同回転処理装置のA−A拡大縦断面図FIG. 3 is an enlarged vertical sectional view of the rotary processing device taken along line AA.

【図4】図3の要部拡大図FIG. 4 is an enlarged view of a main part of FIG. 3;

【符号の説明】[Explanation of symbols]

1…回転処理装置、2…矩形状ケース、3…リング状カ
ップ、4…カップの側壁、5…カップの底部、6…整流
筒、7,12…シリンダユニット、8…開口、9…スピ
ンナー軸、10…ベース、11…モータ、13…チャッ
ク、14…上板、15…下板、16…ドレン排出口、1
7…支持片、18…内側整流リング、20…外側整流リ
ング、21…回収口、22…排気兼排液口、23…異物
回収部材、24…整流板、25…メンテナンス口、26
…排液の排出口、S…トラップ空間。
DESCRIPTION OF SYMBOLS 1 ... Rotating apparatus, 2 ... Rectangular case, 3 ... Ring-shaped cup, 4 ... Cup side wall, 5 ... Cup bottom, 6 ... Rectifying cylinder, 7, 12 ... Cylinder unit, 8 ... Opening, 9 ... Spinner shaft Reference numeral 10: base, 11: motor, 13: chuck, 14: upper plate, 15: lower plate, 16: drain outlet, 1
7 ... support piece, 18 ... inner rectifying ring, 20 ... outer rectifying ring, 21 ... recovery port, 22 ... exhaust / drainage port, 23 ... foreign matter recovery member, 24 ... rectifier plate, 25 ... maintenance port, 26
… The drain outlet, S… trap space.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 カップ内にチャックを配置し、このチャ
ックで基板を保持して回転せしめることで基板表面に滴
下した液体を基板表面全体に供給するようにした回転処
理装置において、前記カップには基板から飛散した液体
を回収するための回収口が設けられ、また、カップ外周
壁の内側には基板から飛散した液体を回収口に導く外側
整流リングが取り付けられていることを特徴とする回転
処理装置。
In a rotary processing apparatus, a chuck is disposed in a cup, and the substrate is held and rotated by the chuck to supply a liquid dropped on the substrate surface to the entire substrate surface. A rotation port provided with a recovery port for recovering the liquid scattered from the substrate, and an outer rectifying ring for guiding the liquid scattered from the substrate to the recovery port provided inside the outer peripheral wall of the cup; apparatus.
【請求項2】 請求項1に記載の回転処理装置におい
て、前記外側整流リングの内側には内側整流リングが着
脱可能に設けられていることを特徴とする回転処理装
置。
2. The rotation processing apparatus according to claim 1, wherein an inner rectification ring is detachably provided inside the outer rectification ring.
【請求項3】 カップ内にチャックを配置し、このチャ
ックで基板を保持して回転せしめることで基板表面に滴
下した液体を基板表面全体に供給するようにした回転処
理装置において、前記カップの底部をチャックの回転軸
に向かって開口する二重構造とし、この二重構造の内部
をチャックの回転軸から飛散する液体や回転軸から発生
するパーティクル等を回収するトラップ空間としたこと
を特徴とする回転処理装置。
3. A rotary processing apparatus in which a chuck is disposed in a cup, and the substrate is held and rotated by the chuck to supply a liquid dropped on the substrate surface to the entire substrate surface. Has a double structure that opens toward the rotation axis of the chuck, and the interior of the double structure is a trap space for collecting liquid scattered from the rotation axis of the chuck, particles generated from the rotation axis, and the like. Rotation processing device.
【請求項4】 請求項3に記載の回転処理装置におい
て、前記トラップ空間は径方向外側に向かって下方に傾
斜していることを特徴とする回転処理装置。
4. The rotation processing apparatus according to claim 3, wherein the trap space is inclined downward toward the outside in the radial direction.
JP33937298A 1998-11-30 1998-11-30 Rotation processing device Expired - Fee Related JP3712099B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33937298A JP3712099B2 (en) 1998-11-30 1998-11-30 Rotation processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33937298A JP3712099B2 (en) 1998-11-30 1998-11-30 Rotation processing device

Publications (2)

Publication Number Publication Date
JP2000164503A true JP2000164503A (en) 2000-06-16
JP3712099B2 JP3712099B2 (en) 2005-11-02

Family

ID=18326848

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33937298A Expired - Fee Related JP3712099B2 (en) 1998-11-30 1998-11-30 Rotation processing device

Country Status (1)

Country Link
JP (1) JP3712099B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010147371A (en) * 2008-12-22 2010-07-01 Sokudo Co Ltd Coating processing apparatus and substrate processing apparatus
JP2012033886A (en) * 2010-07-02 2012-02-16 Tokyo Electron Ltd Substrate processing system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010147371A (en) * 2008-12-22 2010-07-01 Sokudo Co Ltd Coating processing apparatus and substrate processing apparatus
JP2012033886A (en) * 2010-07-02 2012-02-16 Tokyo Electron Ltd Substrate processing system

Also Published As

Publication number Publication date
JP3712099B2 (en) 2005-11-02

Similar Documents

Publication Publication Date Title
JP5156114B2 (en) Liquid processing equipment
US5829156A (en) Spin dryer apparatus
JP3102831B2 (en) Rotary processing equipment
JP3476305B2 (en) Rotary substrate processing equipment
JP2007044686A (en) Spin processor of substrate
JP3945569B2 (en) Development device
JP2007287999A (en) Liquid processing device
JP4933945B2 (en) Liquid processing equipment
JP3396377B2 (en) Substrate processing equipment
JP2005530605A (en) Apparatus for liquid treatment of disk-like objects
JP2000164503A (en) Rotation processor
JP4804407B2 (en) Liquid processing equipment
JP5036415B2 (en) Liquid processing apparatus and liquid processing method
JP3559987B2 (en) Rotary processing equipment
JPH0888168A (en) Spinner
JPH11305450A (en) Developing device and developing method
JP4447673B2 (en) Spin processing equipment
JPH10309509A (en) Rotary substrate treating device and substrate treating method
JP2907387B2 (en) Rotary processing equipment
JP4727080B2 (en) Spin processing equipment
JP4430197B2 (en) Spin processing equipment
JP4476042B2 (en) Rotary cup applicator
JPH0557839U (en) Substrate rotary development processing equipment
JP3429074B2 (en) Substrate rotation processing equipment
JP3172645B2 (en) Rotary coating device

Legal Events

Date Code Title Description
A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20041005

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20041221

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20041227

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20050809

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20050810

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080826

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090826

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100826

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100826

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110826

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120826

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120826

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130826

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140826

Year of fee payment: 9

LAPS Cancellation because of no payment of annual fees