JP2000119089A - Single crystal pulling apparatus - Google Patents

Single crystal pulling apparatus

Info

Publication number
JP2000119089A
JP2000119089A JP10288209A JP28820998A JP2000119089A JP 2000119089 A JP2000119089 A JP 2000119089A JP 10288209 A JP10288209 A JP 10288209A JP 28820998 A JP28820998 A JP 28820998A JP 2000119089 A JP2000119089 A JP 2000119089A
Authority
JP
Japan
Prior art keywords
single crystal
quartz glass
radiation shield
pulling apparatus
crystal pulling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10288209A
Other languages
Japanese (ja)
Other versions
JP3670493B2 (en
Inventor
Shunichiro Matsuyama
俊一郎 松山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP28820998A priority Critical patent/JP3670493B2/en
Publication of JP2000119089A publication Critical patent/JP2000119089A/en
Application granted granted Critical
Publication of JP3670493B2 publication Critical patent/JP3670493B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PROBLEM TO BE SOLVED: To speed up the growth of a single crystal and also to lengthen the lifetime of a radiation shield by forming beveled part so as to reduce the diameter of cylindrical part of the radiation shield having the shape of a frustum of a cone and having an opening for a single crystal to pass through. SOLUTION: When a single crystal pulling apparatus has a three-layered radiation shield 10 including a heat-insulating material installed above a silicon melt surface 13 for the purpose of effectively shutting out primary radiant heat from the melt 3 to a single crystal 20, of retaining the temperature of the conical part of the shield 10 so as to be low and of effectively shutting out secondary radiant heat from the conical part to the single crystal 20, the temperature gradient of the single crystal 20 in its axial direction increases and high-speed crystal pulling is made to become possible at high rate of single crystal. Effective exhaust is carried out by beveling or rounding the outskirts of the bottom of the shield 10 (e.g. by forming a cylindrical arc) so as to enlarge the breather path, and therefore it is possible to prevent SiO2 from sticking to the shield 10 and also to prevent the SiO2 from dropping from the shield 10 to the melt surface 13 thus inducing the dislocation.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は単結晶引上装置に係
わり、特に輻射シールドを改良した単結晶引上装置に関
する。
The present invention relates to a single crystal pulling apparatus, and more particularly to a single crystal pulling apparatus having an improved radiation shield.

【0002】[0002]

【従来の技術】一般にシリコンウェーハ用の単結晶引上
げは、チョクラルスキー法(CZ法)により行われてい
る。
2. Description of the Related Art In general, a single crystal for a silicon wafer is pulled by a Czochralski method (CZ method).

【0003】従来の単結晶引上装置において、単結晶引
上げ速度の低下を防ぐため等の目的で図4に示されるよ
うに、単結晶引上装置60の石英ガラスルツボ61の上
方に石英ガラスルツボ61やシリコン融液62の融液表
面63から単結晶64への輻射熱を遮蔽し、単結晶引上
げ速度の低下を防ぐため、単結晶64を囲繞するように
1層の金属板により形成された逆截頭円錐形状の輻射シ
ールド65を設けている。
In a conventional single crystal pulling apparatus, a quartz glass crucible 61 is placed above a quartz glass crucible 61 of a single crystal pulling apparatus 60, as shown in FIG. In order to shield the radiant heat from the melt surface 63 of the silicon melt 61 or the silicon melt 62 to the single crystal 64 and prevent the single crystal pulling speed from decreasing, an inverse formed by a single-layer metal plate so as to surround the single crystal 64 A radiation shield 65 having a truncated cone shape is provided.

【0004】このような従来の単結晶引上装置60にあ
っては、単結晶引上げ速度の低下を防止する効果はある
が、融液表面63から単結晶64に向けて反射される反
射熱により、あるいは輻射シールド65自体が高温に加
熱される結果、二次輻射熱が単結晶64に向けて放射さ
れ、単結晶64に対する冷却効果が不足して結晶品質の
低下が避けられず、また十分な高速引上げが得られな
い。
[0004] Such a conventional single crystal pulling apparatus 60 has the effect of preventing the single crystal pulling speed from being lowered, but the heat generated by the reflection from the surface 63 of the melt toward the single crystal 64. Alternatively, as a result of the radiation shield 65 itself being heated to a high temperature, the secondary radiation heat is radiated toward the single crystal 64, and the cooling effect on the single crystal 64 is insufficient, so that the deterioration of the crystal quality is unavoidable. I cannot get a lift.

【0005】上述従来形状の輻射シールド65を有する
単結晶引上装置60を改良するものとして、特公平5−
35715号公報に記載され、図5に示すような形状の
輻射シールド70を有する単結晶引上装置71が提案さ
れている。図5に示すような従来の単結晶引上装置71
の輻射シールド70は、この輻射シールド70の内面側
72と外面側73の間に、融液表面74に近づくに従っ
て、一部または全体に亘って厚さを大きくした断熱材7
5を設けたものである。このような輻射シールド70を
有する単結晶引上装置71は輻射熱の断熱性能が向上し
結晶成長速度の高速化は容易に図れるが、単結晶引上装
置71内を満たす不活性ガスは輻射シールド70の下端
部76と融液表面74間に形成される空間距離d2およ
び輻射シールド70の外面側73と石英ガラスルツボ7
7の内壁面78間に形成される空間距離d3を通過する
が、このとき流れ方向が水平方向から垂直上昇方向に変
わる下方のL字部79では、ガス流れに乱れを生じ、さ
らに通気路の断面積が小さいことから、ガス流れの乱れ
が増幅され、効果的な排気がなされなくなる。排気が不
十分になる結果、石英ガラスルツボ77から発生し、不
活性ガス中に含まれたSiO2 が輻射シールド70、特
にL字部79に付着し、輻射シールド70の短寿命化や
SiO2 の融液表面74への落下による転位の誘発を招
き、単結晶引上げの生産性を低下させる問題があった。
As an improvement of the single crystal pulling apparatus 60 having the radiation shield 65 of the conventional shape described above, Japanese Patent Publication No.
No. 35715 discloses a single crystal pulling apparatus 71 having a radiation shield 70 having a shape as shown in FIG. Conventional single crystal pulling apparatus 71 as shown in FIG.
The radiation shield 70 has a thickness between the inner surface 72 and the outer surface 73 of the radiation shield 70, the thickness of the heat insulating material 7 partially or entirely increased as approaching the melt surface 74.
5 is provided. The single crystal pulling apparatus 71 having such a radiation shield 70 improves the heat insulation performance of radiant heat and can easily increase the crystal growth rate. However, the inert gas filling the single crystal pulling apparatus 71 uses the radiation shield 70. Distance d2 formed between the lower end 76 of the glass and the melt surface 74, the outer surface 73 of the radiation shield 70 and the quartz glass crucible 7
7 passes through a space distance d3 formed between the inner wall surfaces 78, and at this time, in the lower L-shaped portion 79 in which the flow direction changes from the horizontal direction to the vertical ascending direction, the gas flow is disturbed, and the gas flow is further reduced. Since the cross-sectional area is small, turbulence of the gas flow is amplified, and effective exhaust is not performed. Results exhaust gas becomes insufficient, generated from a quartz glass crucible 77, SiO 2 is radiation shield 70 contained in an inert gas, in particular adhered to the L-shaped portion 79, the short life and SiO 2 of the radiation shield 70 This causes the dislocation to be induced by dropping on the melt surface 74, which lowers the productivity of pulling a single crystal.

【0006】[0006]

【発明が解決しようとする課題】そこで、結晶成長速度
の高速化が容易に図れ、かつ、不活性ガスの効果的な排
気がなされ、不活性ガス中に含まれたSiO2 により輻
射シールドの短寿命化を防ぎ、さらに、SiO2 の融液
表面への落下を防ぎ単結晶引上げの生産性を高めた単結
晶引上装置が要望されていた。
Therefore, it is possible to easily increase the crystal growth rate, effectively exhaust the inert gas, and shorten the radiation shield by SiO 2 contained in the inert gas. There has been a demand for a single crystal pulling apparatus which prevents the life of the single crystal and further prevents the SiO 2 from dropping onto the surface of the melt to increase the productivity of pulling the single crystal.

【0007】本発明は上述した事情を考慮してなされた
もので、単結晶の高速引上げが可能で、かつ、転位の誘
発を防いで単結晶引上げの生産性を高め、さらに輻射シ
ールドの長寿命化を図った単結晶引上装置を提供するこ
とを目的とする。
The present invention has been made in consideration of the above circumstances, and enables a single crystal to be pulled at a high speed, prevents the occurrence of dislocations, increases the productivity of the pulling of a single crystal, and has a long service life of a radiation shield. It is an object of the present invention to provide a single crystal pulling apparatus which has been developed.

【0008】[0008]

【課題を解決するための手段】上述目的を達成するため
になされた本願請求項1の発明は、炉体内に設けられた
石英ガラスルツボを加熱してこの石英ガラスルツボに装
填されたポリシリコンを溶融し、半導体単結晶を引上げ
る単結晶引上装置において、前記石英ガラスルツボの上
方に輻射シールドを設置し、この輻射シールドは、単結
晶が貫通する開口部を有する逆截頭円錐形状の円錐部
と、この円錐部の下端に連通し、円錐部の下端から放射
状に水平外方に延び、かつ前記ポリシリコン融液表面と
の間に通気路を形成するようにポリシリコン融液表面と
対向して設けられた水平部と、前記石英ガラスルツボの
内表面との間に通気路を形成するように石英ガラスルツ
ボの内表面に対向する円筒状の直胴部と、この直胴部と
円錐部および水平部で形成される中空部に充填された断
熱材とよりなり、前記水平部と直胴部の連通部に直胴部
が単結晶の中心線方向に向かって縮径するように設けら
れた角取部を形成したことを特徴とする単結晶引上装置
であることを要旨としている。
Means for Solving the Problems According to the first aspect of the present invention, which has been made to attain the above object, a quartz glass crucible provided in a furnace is heated to remove polysilicon loaded in the quartz glass crucible. In a single crystal pulling apparatus for melting and pulling a semiconductor single crystal, a radiation shield is provided above the quartz glass crucible, and the radiation shield has an inverted frustoconical cone having an opening through which the single crystal penetrates. Portion, and communicates with the lower end of the conical portion, extends radially outward from the lower end of the conical portion, and faces the polysilicon melt surface so as to form an air passage between the polysilicon melt surface. And a cylindrical straight body facing the inner surface of the quartz glass crucible so as to form a ventilation path between the horizontal portion and the inner surface of the quartz glass crucible; Section and horizontal section A chamfered portion made of a heat insulating material filled in a hollow portion formed and provided at a communicating portion between the horizontal portion and the straight body portion such that the straight body portion is reduced in diameter toward the center line direction of the single crystal. The present invention is characterized in that the apparatus is a single crystal pulling apparatus characterized by forming.

【0009】本願請求項2の発明は、前記角取部を円弧
部で形成したことを特徴とする請求項1に記載の単結晶
引上装置であることを要旨としている。
The gist of the invention of claim 2 of the present application is the single crystal pulling apparatus according to claim 1, wherein the chamfered portion is formed by an arc portion.

【0010】本願請求項3の発明は、前記角取部を円弧
部で形成し、この円弧部の曲率半径が、ポリシリコン融
液表面と水平部間に形成される通気路および石英ガラス
ルツボの内表面と直胴部間に形成される通気路の空間距
離よりも大きいことを特徴とする請求項1に記載の単結
晶引上装置であることを要旨としている。
According to a third aspect of the present invention, the chamfered portion is formed by a circular arc portion, and the radius of curvature of the circular arc portion is defined by a ventilation path formed between the surface of the polysilicon melt and the horizontal portion and a quartz glass crucible. The gist of the invention is a single crystal pulling apparatus according to claim 1, wherein the distance is larger than a space distance of an air passage formed between the inner surface and the straight body portion.

【0011】本願請求項4の発明は、前記角取部を傾斜
部で形成したことを特徴とする請求項1に記載の単結晶
引上装置であることを要旨としている。
According to a fourth aspect of the present invention, there is provided a single crystal pulling apparatus according to the first aspect, wherein the chamfered portion is formed by an inclined portion.

【0012】本願請求項5の発明は、前記角取部を傾斜
部で形成し、この傾斜部の水平投影長さおよび垂直投影
長さをポリシリコン融液表面と水平部間に形成される通
気路および石英ガラスルツボの内表面と直胴部間に形成
される通気路の空間距離よりも大きくしたことを特徴と
する請求項4に記載の単結晶引上装置であることを要旨
としている。
According to a fifth aspect of the present invention, the chamfered portion is formed by an inclined portion, and the horizontal projection length and the vertical projection length of the inclined portion are adjusted by the ventilation formed between the surface of the polysilicon melt and the horizontal portion. The gist of the invention is a single crystal pulling apparatus according to claim 4, wherein the clearance is larger than a space distance of a passage and an air passage formed between the inner surface of the quartz glass crucible and the straight body.

【0013】[0013]

【発明の実施の形態】以下、本発明に係わる単結晶引上
装置の第1の実施の形態について添付図面に基づき説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of a single crystal pulling apparatus according to the present invention will be described below with reference to the accompanying drawings.

【0014】図1は本発明に係わる単結晶引上装置1
で、この引上装置1は水冷された炉体2と、この炉体2
に収納され原料であるポリシリコンを溶融し溶融シリコ
ン3にする石英ガラスルツボ4と、この石英ガラスルツ
ボ4を保持する黒鉛ルツボ5と、この黒鉛ルツボ5を囲
繞するヒータ6とを有している。引上装置1は内側に石
英ガラスルツボ4が外側に黒鉛ルツボ5が配置されて二
重層構造に構成されている。この黒鉛ルツボ5は炉体2
を貫通し、モータ(図示せず)に結合されて回転され、
かつ昇降装置(図示せず)によって昇降されるルツボ回
転軸8に取り付けられている。
FIG. 1 shows a single crystal pulling apparatus 1 according to the present invention.
The lifting apparatus 1 comprises a water-cooled furnace 2 and a furnace 2
It has a quartz glass crucible 4 which melts polysilicon as a raw material and is made into molten silicon 3, a graphite crucible 5 holding the quartz glass crucible 4, and a heater 6 surrounding the graphite crucible 5. . The pulling apparatus 1 has a double-layer structure in which a quartz glass crucible 4 is disposed inside and a graphite crucible 5 is disposed outside. This graphite crucible 5 is
And is coupled to a motor (not shown) and rotated,
And it is attached to a crucible rotating shaft 8 which is raised and lowered by a lifting device (not shown).

【0015】このルツボ回転軸7により回転される石英
ガラスルツボ4の上方には、単結晶引上げのためのシー
ド8が取り付けられた引上げ用のワイヤー9が設けられ
ている。このワイヤー9は炉体2外に設けられモータ
(図示せず)により付勢されワイヤー9を巻き取ると共
に回転させるワイヤー回転装置(図示せず)が取り付け
られている。
Above the quartz glass crucible 4 rotated by the crucible rotating shaft 7, a pulling wire 9 to which a seed 8 for pulling a single crystal is attached is provided. The wire 9 is provided outside the furnace body 2 and is equipped with a wire rotating device (not shown) that is urged by a motor (not shown) to wind up and rotate the wire 9.

【0016】また、石英ガラスルツボ4およびシリコン
融液3の上方には、このシリコン融液3からの熱輻射を
防止し、かつ炉体2内を流れる不活性ガス、例えばアル
ゴンガス(以下Arという。)の通気を制御する輻射シ
ールド10が設けられている。
Above the quartz glass crucible 4 and the silicon melt 3, heat radiation from the silicon melt 3 is prevented, and an inert gas such as argon gas (hereinafter referred to as Ar) flowing in the furnace body 2. .) Is provided.

【0017】図2に拡大して示すように、輻射シールド
10は、輻射シールド10の内面部11を形成し、単結
晶20が貫通する開口部12を有する逆截頭円錐形状の
円錐部11と、この円錐部11の下端に連通しこの円錐
部11の下端から放射状に水平外方に延び、かつ前記融
液表面13に対向する水平部14と、前記石英ガラスル
ツボ4の内表面15に対向し垂直に延びる円筒状の直胴
部16と、この直胴部16と前記円錐部11および水平
部14で形成される中空部17に充填された断熱材18
とより形成されている。従って、輻射シールド10は円
錐部11と直胴部16と断熱材18で3重層に形成さ
れ、断熱性が強化されている。
As shown in FIG. 2 in an enlarged manner, the radiation shield 10 forms an inner surface portion 11 of the radiation shield 10 and has an inverted truncated cone-shaped conical portion 11 having an opening 12 through which a single crystal 20 penetrates. A horizontal portion 14 communicating with a lower end of the conical portion 11 and extending radially outward from the lower end of the conical portion 11 and facing the melt surface 13 and facing an inner surface 15 of the quartz glass crucible 4. A vertically extending cylindrical body 16, and a heat insulating material 18 filled in a hollow part 17 formed by the body 16, the conical part 11 and the horizontal part 14.
And more. Therefore, the radiation shield 10 is formed in a three-layer structure with the conical portion 11, the straight body portion 16, and the heat insulating material 18, and the heat insulating property is enhanced.

【0018】さらに、水平部14と直胴部16が連通す
る連通部19には直胴部16が単結晶20の中心線方向
に向かって縮径するように設けられた角取部、例えば円
筒状の円弧部19が形成されている。
Further, in a communicating portion 19 in which the horizontal portion 14 communicates with the straight body portion 16, a chamfered portion provided with the straight body portion 16 to decrease in diameter toward the center line of the single crystal 20, for example, a cylindrical portion A circular arc portion 19 is formed.

【0019】また、円錐部11と直胴部16の上端部2
2、23からは、各々放射状に水平外方に延びる環状、
鍔状あるいはフランジ形状のリム部24、25が設けら
れ、これらの環状リム部24、25から下方に延びる円
筒状の支持部26とで断熱材27充填用の中空部28が
形成されるように設けられている。
The upper end 2 of the conical portion 11 and the straight body 16
From 2, 23, an annular ring extending radially and horizontally outwardly,
A flange-shaped or flange-shaped rim portion 24, 25 is provided, and a hollow portion 28 for filling a heat insulating material 27 is formed by a cylindrical support portion 26 extending downward from the annular rim portion 24, 25. Is provided.

【0020】上述のように単結晶20の中心線方向に向
かって縮径するように設けられた円筒状の円弧部19
は、この円弧部19の外側面の水平投影長さはA、垂直
投影長さはBに設計されており、すなわちA=Bで円弧
部19の曲率半径になるように設計されている。
As described above, the cylindrical arc portion 19 provided so as to reduce the diameter in the direction of the center line of the single crystal 20.
Is designed so that the horizontal projection length of the outer surface of the arc portion 19 is A and the vertical projection length is B, that is, A = B, so that the radius of curvature of the arc portion 19 is obtained.

【0021】一方、輻射シールド10の取付は、開口部
12の内側壁面30と単結晶20の外壁側壁31間に空
間距離D1の通気路32、回転軸7を上昇させることに
より常時ほぼ一定の高さに維持される融液表面13と水
平部14間に空間距離D2の通気路33、および直胴部
16と石英ガラスルツボ4の内壁面15間に空間距離D
3の通気路34が形成されるように支持部26を介して
炉体2の取付部35に取り付けられている。
On the other hand, the radiation shield 10 is always mounted at a substantially constant height by raising the air passage 32 and the rotating shaft 7 having a space distance D1 between the inner wall surface 30 of the opening 12 and the outer wall side wall 31 of the single crystal 20. The air passage 33 having a space distance D2 between the melt surface 13 and the horizontal portion 14 maintained at this time, and the space distance D between the straight body portion 16 and the inner wall surface 15 of the quartz glass crucible 4.
It is attached to the attachment part 35 of the furnace body 2 via the support part 26 so that three ventilation paths 34 are formed.

【0022】ここで各空間距離の間にA=B>D2、D
3の関係が成り立つように輻射シールド10の取り付け
る。
Here, A = B> D2, D during each spatial distance.
The radiation shield 10 is attached so that the relationship of 3 is satisfied.

【0023】なお、36は炉体2の炉底部37に設けら
れた排気口である。
Reference numeral 36 denotes an exhaust port provided in the furnace bottom 37 of the furnace body 2.

【0024】本発明に係わる単結晶引上装置1は上述の
ような構造になっているから、シリコン単結晶20を引
上げるには、ナゲット状ポリシリコンを石英ガラスルツ
ボ4に入れ、Arを炉体2の上方より炉体2内に流入さ
せ、ヒータ6を付勢して石英ガラスルツボ4を加熱し、
モータを付勢してこのモータに結合された回転軸7を回
転させて石英ガラスルツボ4を回転させる。
Since the single crystal pulling apparatus 1 according to the present invention has the above-described structure, in order to pull up the silicon single crystal 20, nugget-like polysilicon is put into a quartz glass crucible 4, and Ar is placed in a furnace. The quartz glass crucible 4 is heated by energizing the heater 6 and flowing into the furnace body 2 from above the body 2,
The motor is energized to rotate the rotating shaft 7 connected to the motor, thereby rotating the quartz glass crucible 4.

【0025】一定時間が経過した後、シード軸9を下ろ
し、種結晶を融液表面13に接触させ、単結晶20を成
長させ、単結晶20を引上げる。
After a certain period of time, the seed shaft 9 is lowered, and the seed crystal is brought into contact with the melt surface 13 to grow the single crystal 20 and pull up the single crystal 20.

【0026】この単結晶引上げ工程において、輻射シー
ルド10が融液表面13の上方に設けられているので、
シリコン融液3から単結晶20の一次輻射熱は効果的に
遮断される。さらに輻射シールド10は断熱材18を含
む3重層で形成されているので、輻射シールド10の円
錐部11の温度は低く抑えられ、この円錐部11から単
結晶20への二次輻射熱も効果的に遮断され、単結晶2
0の縦軸方向の温度勾配が大きくなり、高速引上げで単
結晶化率の高い結晶引上げが可能となる。
In the single crystal pulling step, since the radiation shield 10 is provided above the melt surface 13,
Primary radiant heat of the single crystal 20 from the silicon melt 3 is effectively blocked. Further, since the radiation shield 10 is formed of a triple layer including the heat insulating material 18, the temperature of the conical portion 11 of the radiation shield 10 is kept low, and the secondary radiation heat from the conical portion 11 to the single crystal 20 is also effectively reduced. Cut off, single crystal 2
The temperature gradient in the direction of the vertical axis of 0 becomes large, and a crystal with a high single crystallization ratio can be pulled at a high speed.

【0027】一方、炉体2上部から導入された不活性ガ
ス、例えばArはシード軸10、シリコン単結晶20に
沿って降下し、輻射シールド10に設けられた開口部1
2に形成される通気路32さらに通気路33および通気
路34を経て、炉体2の底部38に設けられた排気口1
2から炉体2外に排出される。
On the other hand, an inert gas, eg, Ar, introduced from the upper part of the furnace body 2 descends along the seed shaft 10 and the silicon single crystal 20, and the opening 1 provided in the radiation shield 10
The exhaust port 1 provided in the bottom portion 38 of the furnace body 2 through the ventilation path 32 formed in the furnace body 2 and the ventilation path 33 and the ventilation path 34
2 is discharged out of the furnace body 2.

【0028】上述のようなArの炉体2流通過程におい
て、通気路33と通気路34間に形成されるコーナ部、
すなわちArの流れ方向が水平方向から垂直上昇方向に
変わる位置、輻射シールド10の底部外周側に円弧部1
9を周方向に設け通気路33と通気路34を拡大したの
で、Arの流れに乱れが生じることがなく排気が十分効
果的に行われ、一層単結晶化率の高い結晶引上げが可能
となる。
In the process of flowing the Ar furnace body 2 as described above, a corner portion formed between the ventilation path 33 and the ventilation path 34,
That is, the arc portion 1 is located at the position where the flow direction of Ar changes from the horizontal direction to the vertical ascending direction, and at the bottom outer periphery of the radiation shield 10.
Since the gas passages 9 and 9 are provided in the circumferential direction and the gas passages 33 and 34 are enlarged, the exhaust gas is sufficiently efficiently exhausted without disturbing the flow of Ar, and the crystal pulling with a higher single crystallization rate can be performed. .

【0029】さらに、輻射シールド10は底部外周側に
円弧部19を設け、通気路33と通気路34を拡大し排
気が十分効果的に行われるようにしたので、SiO2
輻射シールド10に付着するのを防止して輻射シールド
10の長寿命化を可能にし、さらに輻射シールド10に
付着したSiO2 が融液表面13に落下して転位の誘発
を招くこともなく単結晶化率の高い結晶引上げが可能と
なる。
Further, the radiation shield 10 is provided with an arc portion 19 on the outer peripheral side of the bottom portion, and the ventilation path 33 and the ventilation path 34 are enlarged so that exhaust can be performed sufficiently effectively, so that SiO 2 adheres to the radiation shield 10. To prevent the radiation shield 10 from prolonging its life, and furthermore, a crystal having a high single crystallization rate without causing SiO 2 attached to the radiation shield 10 to fall on the melt surface 13 to induce dislocation. Pulling is possible.

【0030】次に、本発明に係わる単結晶引上装置の他
の実施の形態について説明する。
Next, another embodiment of the single crystal pulling apparatus according to the present invention will be described.

【0031】図3に示すように本発明に係わる単結晶引
上装置38は、上述の実施の形態とほほ同様の構造を有
し、石英ガラスルツボ39およびシリコン融液40の上
方には、輻射シールド41が設けられている。図3に示
すように、輻射シールド41は、単結晶42が貫通する
開口部43を有する逆截頭円錐形状の内側の円錐部44
と、直胴部45と、この直胴部45と円錐部44間に介
設された断熱材46の3重層で形成されている。
As shown in FIG. 3, a single crystal pulling apparatus 38 according to the present invention has a structure almost similar to that of the above-described embodiment, and a radiation shield is provided above a quartz glass crucible 39 and a silicon melt 40. 41 are provided. As shown in FIG. 3, the radiation shield 41 has an inner truncated cone 44 having an inverted truncated cone shape having an opening 43 through which the single crystal 42 penetrates.
And a three-layer structure of a straight body part 45 and a heat insulating material 46 interposed between the straight body part 45 and the conical part 44.

【0032】さらに、内側の円錐部44と外側の直胴部
45間には水平部47と、この水平部47に連通し直胴
部45が単結晶42の中心線方向に向かって縮径するよ
うに設けられた面取状の角取部、例えば傾斜部48が設
けられ、この傾斜部48により水平部47の角取りがな
されている。
Further, a horizontal portion 47 is provided between the inner conical portion 44 and the outer straight body portion 45, and the straight body portion 45 communicates with the horizontal portion 47 so that the diameter of the straight body portion 45 decreases in the direction of the center line of the single crystal 42. A chamfer-shaped chamfered portion, for example, an inclined portion 48 is provided, and the horizontal portion 47 is chamfered by the inclined portion 48.

【0033】上述のように単結晶42の中心線方向に向
かって縮径するように設けられた傾斜部48は、この傾
斜部48の外側面の水平投影長さはE、垂直投影長さは
Fに設計されている。
As described above, the inclined portion 48 provided so as to reduce the diameter toward the center line direction of the single crystal 42 has a horizontal projection length of E on the outer surface of the inclined portion 48 and a vertical projection length of Designed for F.

【0034】一方、輻射シールド41の取付は、開口部
43の壁面部50と単結晶42の側壁51間に空間距離
L1の通気路52、回転軸53を上昇させることにより
常時ほぼ一定の高さに維持される融液表面54と水平部
47間に空間距離L2の通気路55、および直胴部45
と石英ガラスルツボ39の内壁面56間に空間距離L3
の通気路57が形成されるように取付部(図示せず)を
介して支持板(図示せず)に取り付けられている。ここ
で各空間距離の間にE、F>L2、L3の関係が成り立
つように輻射シールド41を取り付ける。
On the other hand, the radiation shield 41 is always mounted at a substantially constant height by raising the ventilation path 52 and the rotating shaft 53 having a space distance L1 between the wall surface 50 of the opening 43 and the side wall 51 of the single crystal 42. Between the melt surface 54 and the horizontal portion 47 maintained at a constant distance L2 and the straight body portion 45
Distance L3 between the inner wall surface 56 of the quartz glass crucible 39 and
Is attached to a support plate (not shown) via an attachment portion (not shown) so that the ventilation path 57 is formed. Here, the radiation shield 41 is attached so that the relationship of E, F> L2, L3 is satisfied between the respective spatial distances.

【0035】輻射シールド41は上述のような構造にな
っているから、不活性ガス、例えばArの炉体58の通
気過程において、通気路55と通気路57間に形成され
るコーナ部59、すなわちArの流れ方向が水平方向か
ら垂直上昇方向に変わる位置に傾斜部48を設け角取り
をして通気路55、通気路57を拡大したので、Arの
流れに乱れが生じることがなく排気が十分効果的に行わ
れ、一層単結晶化率の高い結晶引上げが可能となる。
Since the radiation shield 41 has the above-described structure, a corner portion 59 formed between the ventilation path 55 and the ventilation path 57 during the ventilation of the inert gas, for example, Ar, through the furnace body 58, that is, An inclined portion 48 is provided at a position where the flow direction of Ar changes from the horizontal direction to the vertical ascending direction, and the ventilation path 55 and the ventilation path 57 are widened by chamfering, so that the Ar flow is not disturbed and exhaust is sufficient. Effectively performed, a crystal can be pulled with a higher single crystallization ratio.

【0036】さらに、SiO2 が輻射シールド41に付
着するのを防止して輻射シールド41の長寿命化を可能
にし、さらに輻射シールド41に付着したSiO2 が融
液表面54に落下して転位の誘発を招くこともなく単結
晶化率の高い結晶引上げが可能となる。
Further, it is possible to prevent the SiO 2 from adhering to the radiation shield 41 to prolong the life of the radiation shield 41, and the SiO 2 adhering to the radiation shield 41 drops on the melt surface 54 to cause dislocation. A crystal having a high single crystallization ratio can be pulled without causing induction.

【0037】[0037]

【実施例】[実施例] (試験方法):第1の実施の形態の単結晶引上装置にお
いて、円弧部の外側面の水平投影長さA、垂直投影長さ
BをA=B、融液表面と水平部間の通気路の空間距離D
2および直胴部と石英ガラスルツボの内壁面間の通気路
の空間距離D3としたとき、各空間距離の間にA=B>
D2、D3の関係が成り立つように輻射シールドの取り
付け、単結晶引上げ試験を行った。
EXAMPLES [Examples] (Testing method): In the single crystal pulling apparatus of the first embodiment, the horizontal projection length A and the vertical projection length B of the outer surface of the arc portion are A = B, and Spatial distance D of air passage between liquid surface and horizontal part
2 and the space distance D3 of the ventilation path between the straight body portion and the inner wall surface of the quartz glass crucible, A = B>
A radiation shield was attached and a single crystal pulling test was performed so that the relationship of D2 and D3 was satisfied.

【0038】(試験結果):実施例は、従来の単層構造
の輻射シールド(図4)を用いて単結晶を引上げた場合
に比べて、単結晶引上げ速度が50%向上した。また、
単結晶化率は100%であった。このように、引上げ速
度については大幅な改善がみられ、単結晶化率も100
%と好結果を得た。さらに、引上げ直後の輻射シールド
を観察したが、輻射シールドのどの部分にも一切SiO
2 が付着されておらず、効果的な排気がなされているこ
とが立証された。
(Test result): In the example, the single crystal pulling speed was improved by 50% as compared with the case where the single crystal was pulled using the conventional radiation shield having a single layer structure (FIG. 4). Also,
The single crystallization ratio was 100%. As described above, the pulling rate was greatly improved, and the single crystallization ratio was 100%.
% And good results. Furthermore, the radiation shield was observed immediately after pulling up.
No 2 was deposited, demonstrating effective exhaust.

【0039】[比較例] (試験方法):実施例同様の試験であるが、各空間距離
の間にA=B<D2、D3の関係が成り立つように輻射
シールドの取り付け、単結晶引上げ試験を行った。
[Comparative Example] (Test method): The test is the same as that of the embodiment, except that a radiation shield is attached and a single crystal pull-up test is performed so that the relationship of A = B <D2, D3 is established between the respective spatial distances. went.

【0040】(試験結果):従来の単層構造の輻射シー
ルドを単結晶を引上げた場合に比べて、単結晶引上げ速
度が50%向上した。単結晶化率は82%であった。こ
のように、引上げ速度については大幅か改善がみられる
が、引上げ直後の輻射シールドを観察では、輻射シール
ドの円錐部下部にSiO2 の付着が確認され、効果的な
排気がなされていないことが確認された。この円錐部下
部に付着したSiO2が、融液表面に落下し、単結晶の
転位発生の原因となり、単結晶化率が82%に低下した
と考えられる。
(Test result): The single crystal pulling speed was improved by 50% as compared with the case where a single crystal was pulled from the conventional radiation shield having a single layer structure. The single crystallization ratio was 82%. Thus, although significant or improvement is observed for the pulling rate, the observed radiation shield immediately after pulling, adhesion of SiO 2 is confirmed in the conical part the lower part of the radiation shield, that the effective exhaust has not been made confirmed. It is considered that the SiO 2 adhered to the lower portion of the conical portion dropped on the surface of the melt, causing dislocation of the single crystal, and the single crystallization ratio was reduced to 82%.

【0041】[0041]

【発明の効果】本発明に係わる単結晶引上装置は、輻射
シールドを3重層にしたので、融液表面、輻射シールド
から単結晶への熱輻射は効果的に遮断され、単結晶の縦
軸方向の温度勾配が大きくなり、高速引上げで単結晶化
率の高い結晶引上げが可能となる。さらに、通気路と通
気路との連通部に角取部を設け、通気路を拡大すること
により十分な排気を行い、一層単結晶化率の高い結晶引
上げを可能にし、またSiO2 が輻射シールドに付着す
るのを防止して、輻射シールドの長寿命化を図り、さら
に輻射シールドに付着したSiO2 が融液表面に落下し
て単結晶の転位の誘発を防止して単結晶化率の高い結晶
引上げが可能とした。
In the single crystal pulling apparatus according to the present invention, the radiation shield is formed as a triple layer, so that heat radiation from the melt surface and the radiation shield to the single crystal is effectively blocked, and the vertical axis of the single crystal. The temperature gradient in the direction becomes large, and a crystal with a high single crystallization ratio can be pulled at a high speed. In addition, a chamfered portion is provided in the communicating portion between the ventilation passages, and the ventilation passage is expanded to perform sufficient exhaust, thereby enabling a crystal to be pulled with a higher single crystallization rate, and a SiO 2 radiation shield. To prevent radiation from sticking to the radiation shield, prolong the life of the radiation shield, and prevent the SiO 2 adhered to the radiation shield from falling on the melt surface to prevent the dislocation of the single crystal from being induced, thereby increasing the single crystal crystallization rate. Crystal pulling is possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係わる単結晶引上装置の概略図。FIG. 1 is a schematic diagram of a single crystal pulling apparatus according to the present invention.

【図2】図1の要部を拡大して示した断面図。FIG. 2 is an enlarged sectional view showing a main part of FIG. 1;

【図3】本発明に係わる単結晶引上装置の他に実施の形
態の要部を拡大して示した断面図。
FIG. 3 is an enlarged sectional view showing a main part of the embodiment other than the single crystal pulling apparatus according to the present invention.

【図4】従来の単結晶引上装置の概略図。FIG. 4 is a schematic diagram of a conventional single crystal pulling apparatus.

【図5】従来の単結晶引上装置の概略図。FIG. 5 is a schematic diagram of a conventional single crystal pulling apparatus.

【符号の説明】[Explanation of symbols]

1 単結晶引上装置 2 炉体 3 溶融シリコン 4 石英ガラスルツボ 5 黒鉛ルツボ 6 ヒータ 7 ルツボ回転軸 8 シード 9 ワイヤー 10 輻射シールド 11 内面部 12 開口部 13 融液表面 14 水平部 15 内表面 16 直胴部 17 中空部 18 断熱材 19 連通部(円弧部) 20 単結晶 21 中心線 22 端部 23 端部 24 環状リム部 25 環状リム部 26 支持部 27 断熱材 28 中空部 30 壁面 31 側壁 32 通気路 33 通気路 34 通気路 35 取付部 36 排気口 37 炉底部 38 単結晶引上装置 39 石英ガラスルツボ 40 シリコン融液 41 輻射シールド 42 単結晶 43 開口部 44 円錐部 45 直胴部 46 断熱材 47 水平部 48 傾斜部 50 壁面部 51 側壁 52 通気路 53 回転軸 54 融液表面 55 通気路 56 内壁面 57 通気路 58 炉体 59 コーナ部 60 単結晶引上装置 61 石英ガラスルツボ 62 シリコン融液 63 融液表面 64 単結晶 65 輻射シールド 70 輻射シールド 71 単結晶引上装置 72 内面側 73 外面側 74 融液表面 75 断熱材 76 下端部 77 石英ガラスルツボ 78 内壁面 79 L字部 DESCRIPTION OF SYMBOLS 1 Single crystal pulling apparatus 2 Furnace body 3 Fused silicon 4 Quartz glass crucible 5 Graphite crucible 6 Heater 7 Crucible rotation axis 8 Seed 9 Wire 10 Radiation shield 11 Inner surface part 12 Opening part 13 Melt surface 14 Horizontal part 15 Inner surface 16 Direct Body 17 Hollow part 18 Insulating material 19 Communication part (arc part) 20 Single crystal 21 Center line 22 End part 23 End part 24 Annular rim part 25 Annular rim part 26 Support part 27 Insulating material 28 Hollow part 30 Wall surface 31 Side wall 32 Ventilation Path 33 Ventilation path 34 Ventilation path 35 Attachment part 36 Exhaust port 37 Furnace bottom 38 Single crystal pulling device 39 Quartz glass crucible 40 Silicon melt 41 Radiation shield 42 Single crystal 43 Opening 44 Conical part 45 Straight body part 46 Thermal insulation material 47 Horizontal section 48 Inclined section 50 Wall section 51 Side wall 52 Ventilation path 53 Rotating shaft 54 Melt surface 55 Ventilation path 5 Reference Signs List 6 inner wall surface 57 ventilation path 58 furnace body 59 corner part 60 single crystal pulling device 61 quartz glass crucible 62 silicon melt 63 melt surface 64 single crystal 65 radiation shield 70 radiation shield 71 single crystal pulling device 72 inner surface 73 outer surface Side 74 Surface of melt 75 Insulation material 76 Lower end 77 Quartz glass crucible 78 Inner wall surface 79 L-shaped part

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 炉体内に設けられた石英ガラスルツボを
加熱してこの石英ガラスルツボに装填されたポリシリコ
ンを溶融し、半導体単結晶を引上げる単結晶引上装置に
おいて、前記石英ガラスルツボの上方に輻射シールドを
設置し、この輻射シールドは、単結晶が貫通する開口部
を有する逆截頭円錐形状の円錐部と、この円錐部の下端
に連通し、円錐部の下端から放射状に水平外方に延び、
かつ前記ポリシリコン融液表面との間に通気路を形成す
るようにポリシリコン融液表面と対向して設けられた水
平部と、前記石英ガラスルツボの内表面との間に通気路
を形成するように石英ガラスルツボの内表面に対向する
円筒状の直胴部と、この直胴部と円錐部および水平部で
形成される中空部に充填された断熱材とよりなり、前記
水平部と直胴部の連通部に直胴部が単結晶の中心線方向
に向かって縮径するように設けられた角取部を形成した
ことを特徴とする単結晶引上装置。
1. A single crystal pulling apparatus for heating a quartz glass crucible provided in a furnace body to melt polysilicon loaded in the quartz glass crucible and pull up a semiconductor single crystal, wherein the quartz glass crucible is A radiation shield is installed above, and this radiation shield communicates with the inverted truncated cone-shaped conical portion having an opening through which the single crystal penetrates, and communicates with the lower end of the conical portion. Extending toward
And forming an air passage between a horizontal portion provided to face the polysilicon melt surface so as to form an air passage between the polysilicon melt surface and the inner surface of the quartz glass crucible. And a heat insulating material filled in a hollow portion formed by the cylindrical portion, the conical portion, and the horizontal portion. The cylindrical portion directly faces the inner surface of the quartz glass crucible. A single crystal pulling apparatus, characterized in that a chamfered portion is provided in the communicating portion of the body so that the straight body is reduced in diameter toward the center line of the single crystal.
【請求項2】 前記角取部を円弧部で形成したことを特
徴とする請求項1に記載の単結晶引上装置。
2. The single crystal pulling apparatus according to claim 1, wherein the chamfered portion is formed by an arc portion.
【請求項3】 前記角取部を円弧部で形成し、この円弧
部の曲率半径が、ポリシリコン融液表面と水平部間に形
成される通気路および石英ガラスルツボの内表面と直胴
部間に形成される通気路の空間距離よりも大きいことを
特徴とする請求項1に記載の単結晶引上装置。
3. The chamfered portion is formed by an arc portion, and the radius of curvature of the arc portion is defined by a ventilation path formed between the surface of the polysilicon melt and the horizontal portion, the inner surface of the quartz glass crucible, and the straight body portion. 2. The single crystal pulling apparatus according to claim 1, wherein the distance is larger than a spatial distance of an air passage formed therebetween.
【請求項4】 前記角取部を傾斜部で形成したことを特
徴とする請求項1に記載の単結晶引上装置。
4. The single crystal pulling apparatus according to claim 1, wherein the chamfered portion is formed by an inclined portion.
【請求項5】 前記角取部を傾斜部で形成し、この傾斜
部の水平投影長さおよび垂直投影長さをポリシリコン融
液表面と水平部間に形成される通気路および石英ガラス
ルツボの内表面と直胴部間に形成される通気路の空間距
離よりも大きくしたことを特徴とする請求項4に記載の
単結晶引上装置。
5. The chamfered portion is formed by an inclined portion, and a horizontal projection length and a vertical projection length of the inclined portion are determined by a ventilation path formed between the surface of the polysilicon melt and the horizontal portion and a quartz glass crucible. 5. The single crystal pulling apparatus according to claim 4, wherein the distance is larger than a space distance of an air passage formed between the inner surface and the straight body portion.
JP28820998A 1998-10-09 1998-10-09 Single crystal pulling device Expired - Lifetime JP3670493B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28820998A JP3670493B2 (en) 1998-10-09 1998-10-09 Single crystal pulling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28820998A JP3670493B2 (en) 1998-10-09 1998-10-09 Single crystal pulling device

Publications (2)

Publication Number Publication Date
JP2000119089A true JP2000119089A (en) 2000-04-25
JP3670493B2 JP3670493B2 (en) 2005-07-13

Family

ID=17727243

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Application Number Title Priority Date Filing Date
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Country Link
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Cited By (13)

* Cited by examiner, † Cited by third party
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KR100411571B1 (en) * 2000-11-27 2003-12-18 주식회사 실트론 Growing apparatus of a single crystal ingot
US7077905B2 (en) 2002-09-13 2006-07-18 Toshiba Ceramics Co., Ltd. Apparatus for pulling a single crystal
JP2007290961A (en) * 2001-06-28 2007-11-08 Samsung Electronics Co Ltd Czochralski puller for manufacturing single crystal silicon ingot
CN100371506C (en) * 2005-03-28 2008-02-27 荀建华 heat preservation device of single crystal furnace
JP2008159781A (en) * 2006-12-22 2008-07-10 Sharp Corp Method of manufacturing solid-phase sheet and radiation reflector using method
CN100430531C (en) * 2000-09-29 2008-11-05 三星电子株式会社 Czochralski pullers
JP2009040681A (en) * 1999-11-13 2009-02-26 Samsung Electronics Co Ltd Czochralski puller for manufacturing monocrystalline silicon ingot
US8048221B2 (en) 2006-01-20 2011-11-01 Stoddard Nathan G Methods and apparatuses for manufacturing monocrystalline cast silicon and monocrystalline cast silicon bodies for photovoltaics
US8440157B2 (en) 2007-07-20 2013-05-14 Amg Idealcast Solar Corporation Methods and apparatuses for manufacturing cast silicon from seed crystals
US8591649B2 (en) 2007-07-25 2013-11-26 Advanced Metallurgical Group Idealcast Solar Corp. Methods for manufacturing geometric multi-crystalline cast materials
US8709154B2 (en) 2007-07-25 2014-04-29 Amg Idealcast Solar Corporation Methods for manufacturing monocrystalline or near-monocrystalline cast materials
KR20150060690A (en) 2012-10-03 2015-06-03 신에쯔 한도타이 가부시키가이샤 Silicon single crystal growing apparatus and silicon single crystal growing method
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JP2009040681A (en) * 1999-11-13 2009-02-26 Samsung Electronics Co Ltd Czochralski puller for manufacturing monocrystalline silicon ingot
CN100430531C (en) * 2000-09-29 2008-11-05 三星电子株式会社 Czochralski pullers
DE10157453B4 (en) * 2000-11-27 2005-07-14 Siltron Inc., Gumi Device for growing a monocrystalline blank
KR100411571B1 (en) * 2000-11-27 2003-12-18 주식회사 실트론 Growing apparatus of a single crystal ingot
JP2007290961A (en) * 2001-06-28 2007-11-08 Samsung Electronics Co Ltd Czochralski puller for manufacturing single crystal silicon ingot
US7077905B2 (en) 2002-09-13 2006-07-18 Toshiba Ceramics Co., Ltd. Apparatus for pulling a single crystal
CN100371506C (en) * 2005-03-28 2008-02-27 荀建华 heat preservation device of single crystal furnace
US8048221B2 (en) 2006-01-20 2011-11-01 Stoddard Nathan G Methods and apparatuses for manufacturing monocrystalline cast silicon and monocrystalline cast silicon bodies for photovoltaics
US8628614B2 (en) 2006-01-20 2014-01-14 Amg Idealcast Solar Corporation Methods and apparatus for manufacturing monocrystalline cast silicon and monocrystalline cast silicon bodies for photovoltaics
US8951344B2 (en) 2006-01-20 2015-02-10 Amg Idealcast Solar Corporation Methods and apparatuses for manufacturing geometric multicrystalline cast silicon and geometric multicrystalline cast silicon bodies for photovoltaics
JP2008159781A (en) * 2006-12-22 2008-07-10 Sharp Corp Method of manufacturing solid-phase sheet and radiation reflector using method
US8440157B2 (en) 2007-07-20 2013-05-14 Amg Idealcast Solar Corporation Methods and apparatuses for manufacturing cast silicon from seed crystals
US8591649B2 (en) 2007-07-25 2013-11-26 Advanced Metallurgical Group Idealcast Solar Corp. Methods for manufacturing geometric multi-crystalline cast materials
US8709154B2 (en) 2007-07-25 2014-04-29 Amg Idealcast Solar Corporation Methods for manufacturing monocrystalline or near-monocrystalline cast materials
KR20150060690A (en) 2012-10-03 2015-06-03 신에쯔 한도타이 가부시키가이샤 Silicon single crystal growing apparatus and silicon single crystal growing method
US9783912B2 (en) 2012-10-03 2017-10-10 Shin-Etsu Handotai Co., Ltd. Silicon single crystal growing apparatus and method for growing silicon single crystal
DE112013004069B4 (en) 2012-10-03 2023-02-02 Shin-Etsu Handotai Co., Ltd. Apparatus for growing a silicon single crystal and method for growing a silicon single crystal
JP2016538226A (en) * 2013-12-03 2016-12-08 エルジー・シルトロン・インコーポレーテッド Single crystal growth equipment
US10066315B2 (en) 2013-12-03 2018-09-04 Sk Siltron Co., Ltd. Single crystal growing apparatus

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