JP2000115976A - Taping winding type linear connected part - Google Patents

Taping winding type linear connected part

Info

Publication number
JP2000115976A
JP2000115976A JP10274646A JP27464698A JP2000115976A JP 2000115976 A JP2000115976 A JP 2000115976A JP 10274646 A JP10274646 A JP 10274646A JP 27464698 A JP27464698 A JP 27464698A JP 2000115976 A JP2000115976 A JP 2000115976A
Authority
JP
Japan
Prior art keywords
layer
tape
semiconductive
rubber
semiconductive layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10274646A
Other languages
Japanese (ja)
Inventor
Satoru Tanaka
悟 田中
Toshiya Matsui
俊哉 松井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Tokyo Electric Power Company Holdings Inc
Original Assignee
Furukawa Electric Co Ltd
Tokyo Electric Power Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd, Tokyo Electric Power Co Inc filed Critical Furukawa Electric Co Ltd
Priority to JP10274646A priority Critical patent/JP2000115976A/en
Publication of JP2000115976A publication Critical patent/JP2000115976A/en
Pending legal-status Critical Current

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  • Processing Of Terminals (AREA)

Abstract

PROBLEM TO BE SOLVED: To improve the breakdown strength by preventing voids from removing on the interface between an internal semi-conductive layer and a cable insulator, and the interface between a reinforcement insulating layer and an external semi-conductive layer. SOLUTION: A cable insulator 2 at the end of a rubber and plastic insulating power cable is peeled off, to which a cable conductor 1 is jointed. An internal semi-conductive layer 4, a reinforcement insulating layer 5, an external semi- conductive layer 6, a metallic layer 7 for shielding, and a press-wound layer 8 are wound in order. Semi-conductive tape consisting of unvulcanized rubber is used as the internal semi-conductive layer 4 and the external semi-conductive layer 6 of a taping type linear connected part.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ゴム・プラスチッ
ク絶縁電力ケーブルの接続に適用されるテープ巻き式直
線接続部に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tape-winding type linear connection portion applied to connection of a rubber-plastic insulated power cable.

【0002】[0002]

【従来の技術】ゴム・プラスチック絶縁電力ケーブル用
のテープ巻き式直線接続部は、図3に示すように、接続
する両ケーブルの端部のケーブル絶縁体2を斜めに剥離
し、それぞれのケーブル導体1を導体スリーブ3に挿通
し、導体スリーブ3を圧縮して接続する。そして、その
外側に加硫した半導電ゴムのテープを巻き付けて内部半
導電層10を形成し、その外側に絶縁ゴムのテープを巻
き付けて補強絶縁層5を形成する。さらに、その外側に
加硫した半導電ゴムのテープを巻き付けて外部半導電層
11を形成し、シールドメッシュテープ等の遮蔽用金属
層7を巻き付け、その上から押え巻き層8で押さえつけ
る。
2. Description of the Related Art As shown in FIG. 3, a tape-winding type linear connecting portion for a rubber / plastic insulated power cable, as shown in FIG. 1 is inserted into the conductor sleeve 3, and the conductor sleeve 3 is compressed and connected. Then, a vulcanized semiconductive rubber tape is wound around the outside to form the internal semiconductive layer 10, and an insulating rubber tape is wound around the outside to form the reinforcing insulating layer 5. Further, a vulcanized semiconductive rubber tape is wrapped around the outside to form an external semiconductive layer 11, and a shielding metal layer 7 such as a shield mesh tape is wrapped around the outer semiconductive layer 11.

【0003】絶縁ゴムには、例えば、自己融着性を有す
るエチレンプロピレンゴムを用い、絶縁ゴムテープに張
力をかけて引き延ばした状態で巻いていく。そして、そ
れによる半径方向内側への加圧力によってテープ層間の
密着性を良好に保持するとともに、自己融着性により時
間の経過とともにテープ同士が融着することによって密
着性を向上させている。テープ巻き式直線接続部ではテ
ープ巻き当初に必然的にテープ層間にボイドが発生す
る。ボイドがそのまま残留すると、電圧が印加された時
にこのボイド部分で放電を起こし、さらに電気トリーが
発生して耐電圧性能の劣化、さらには絶縁破壊に至る。
それに対して、上記加圧力や自己融着あるいは加熱によ
る融着促進によって界面の密着力を上げることにより、
ボイドを押しつぶしてその大きさを小さくし、ボイドの
個数を減らすことによって良好な耐電圧性能が維持され
るようにしている。
As the insulating rubber, for example, ethylene propylene rubber having self-fusing property is used, and the insulating rubber tape is wound under tension while being stretched. The adhesive force between the tape layers is favorably maintained by the radially inner pressing force, and the adhesiveness is improved by the self-fusing property of the tapes being fused together over time. In the tape winding type linear connection part, voids are inevitably generated between the tape layers at the beginning of the tape winding. If the voids remain as they are, discharge occurs in the voids when a voltage is applied, and furthermore, an electrical tree is generated, leading to deterioration of withstand voltage performance and further to dielectric breakdown.
On the other hand, by increasing the adhesion at the interface by promoting the fusion by the above-mentioned pressing force or self-fusion or heating,
By crushing the voids to reduce the size thereof and reducing the number of voids, good withstand voltage performance is maintained.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記し
た従来のテープ巻き式直線接続部では、内部半導電層1
0や外部半導電層11に自己融着性のない加硫した半導
電性テープを使用していた。そのため、内部半導電層1
0とケーブル絶縁体2の界面、及び、補強絶縁層5と外
部半導電層11の界面が、加熱処理や押え巻き層による
外側からの加圧力によっても融着せず、それらの界面に
ボイドが残留して耐電圧性能の低下が避けられないとい
う問題点があった。
However, in the above-mentioned conventional tape-winding type linear connection portion, the internal semiconductive layer 1 is not provided.
A vulcanized semiconductive tape having no self-fusing property was used for the outer semiconductive layer 11 and the outer semiconductive layer 11. Therefore, the inner semiconductive layer 1
0 and the interface between the cable insulator 2 and the interface between the reinforcing insulating layer 5 and the external semiconductive layer 11 are not fused by the heat treatment or the externally applied pressure by the press-winding layer, and voids remain at those interfaces. Thus, there is a problem that a decrease in withstand voltage performance cannot be avoided.

【0005】本発明は、そのような問題点を解決し、半
導電層と絶縁層との界面にボイドが残留しないようにし
て、耐電圧性能を向上させることを目的とするものであ
る。
An object of the present invention is to solve such a problem and to improve the withstand voltage performance by preventing voids from remaining at the interface between the semiconductive layer and the insulating layer.

【0006】[0006]

【課題を解決するための手段】前記課題を解決するた
め、請求項1に記載のテープ巻き式直線接続部は、端部
のケーブル絶縁体を剥離し、ケーブル導体を接続した上
に順次内部半導電層、補強絶縁層、外部半導電層、押え
巻き層を形成したゴム・プラスチック絶縁電力ケーブル
用のテープ巻き式直線接続部において、前記外部半導電
層として非加硫ゴムからなる半導電性テープを用いたこ
とを特徴とする。このようにすると、補強絶縁層と外部
半導電層の界面にボイドが残留しないようになり、耐電
圧性能が向上する。
According to a first aspect of the present invention, there is provided a tape-connecting linear connection portion according to the first aspect, wherein a cable insulator at an end portion is peeled off, a cable conductor is connected, and an inner half is sequentially connected. A semiconductive tape made of non-vulcanized rubber as the external semiconductive layer in a tape-wound linear connection portion for a rubber / plastic insulated power cable having a conductive layer, a reinforcing insulating layer, an external semiconductive layer, and a press-winding layer formed thereon. Is used. This prevents voids from remaining at the interface between the reinforcing insulating layer and the external semiconductive layer, and improves the withstand voltage performance.

【0007】そして、請求項2に記載のテープ巻き式直
線接続部は、前記外部半導電層を、非加硫ゴムからなる
半導電性テープを巻き付け、その外側に加硫ゴムからな
る半導電性テープを巻き付けて形成し、その外側に遮蔽
用金属層を巻き付けたことを特徴とする。このようにす
ると、遮蔽用金属層の外部半導電層内への食い込みを防
止することができる。
According to a second aspect of the present invention, in the tape winding type linear connecting portion, the outer semiconductive layer is formed by winding a semiconductive tape made of a non-vulcanized rubber, and a semiconductive tape made of a vulcanized rubber outside. The tape is formed by winding, and a shielding metal layer is wound around the tape. This can prevent the shielding metal layer from penetrating into the external semiconductive layer.

【0008】また、請求項3に記載のテープ巻き式直線
接続部は、前記内部半導電層として非加硫ゴムからなる
半導電性テープを用いたことを特徴とする。このように
すると、内部半導電層とケーブル絶縁体との界面にもボ
イドが残留しないようになり、耐電圧性能がより一層向
上する。
[0008] The tape-wound linear connecting portion according to claim 3 is characterized in that a semiconductive tape made of non-vulcanized rubber is used as the internal semiconductive layer. In this case, no void remains at the interface between the internal semiconductive layer and the cable insulator, and the withstand voltage performance is further improved.

【0009】[0009]

【発明の実施の形態】以下、本発明の実施の形態を図面
に基づいて詳細に説明する。図1は、本発明の第1実施
形態を示す図である。符号は、図3のものに対応してお
り、4は内部半導電層、6は外部半導電層である。
Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 is a diagram showing a first embodiment of the present invention. The reference numerals correspond to those in FIG. 3, wherein 4 is an inner semiconductive layer and 6 is an outer semiconductive layer.

【0010】従来のテープ巻き式直線接続部では、内部
半導電層及び外部半導電層に加硫した半導電性ゴムテー
プを用いていたが、本発明では、内部半導電層4,外部
半導電層6に、非加硫ゴム、すなわち、加硫されておら
ず、かつ加硫剤が入っていないゴムからなる半導電性テ
ープを用いる。このゴムとしては、エチレンプロピレン
ゴムを用いることができる。
[0010] In the conventional tape wound linear connection portion, a semiconductive rubber tape vulcanized on the inner semiconductive layer and the outer semiconductive layer is used. For 6, a semiconductive tape made of non-vulcanized rubber, that is, rubber that is not vulcanized and contains no vulcanizing agent is used. Ethylene propylene rubber can be used as this rubber.

【0011】非加硫半導電性ゴムテープは加硫されてい
ないことから、可塑性があり、外側からの加圧力や加熱
処理により、容易に変形する。そのため、例えば、階段
状や凸凹のある補強絶縁層5の外側にそれを巻き付けて
外部半導電層6を形成すると、巻き付けた当初に補強絶
縁層5と非加硫ゴムテープとの界面や非加硫ゴムテープ
同士の界面にボイドが生じても、それらのボイドは次第
に潰れてゆき、最後には消滅する。このボイド消滅を促
進するために、外部半導電層6の外側から適度な加圧力
を与えるための押え巻き層8を形成したり、さらに押え
巻き層8を形成した後で90〜150℃程度の温度で数
十分程度の加熱処理を加えるというような手段を用いる
ことができる。
Since the non-vulcanized semiconductive rubber tape is not vulcanized, it has plasticity and is easily deformed by external pressure or heat treatment. Therefore, for example, when the outer semiconductive layer 6 is formed by winding it around the outside of the stepped or uneven reinforcing insulating layer 5, the interface between the reinforcing insulating layer 5 and the non-vulcanized rubber tape or the non-vulcanized Even if voids occur at the interface between the rubber tapes, those voids gradually collapse and eventually disappear. In order to promote the disappearance of the voids, a press-winding layer 8 for applying an appropriate pressing force from outside of the external semiconductive layer 6 is formed, and after the press-winding layer 8 is further formed, the pressure is reduced to about 90 to 150 ° C. Means such as applying a heat treatment of several tens of minutes at a temperature can be used.

【0012】本発明により、テープ巻き式直線接続部の
耐電圧性能がどの程度向上したかを示したのが表1であ
る。
Table 1 shows to what extent the withstand voltage performance of the tape-wound linear connection part was improved by the present invention.

【0013】[0013]

【表1】 [Table 1]

【0014】このデータはケーブル絶縁厚9mm、導体サ
イズ200sq用のテープ巻き式直線接続部で得られたも
のである。補強絶縁層厚さは30mmである。本発明品で
は内部半導電層4及び外部半導電層6をいずれも、0.
5mm厚×25mm幅の非加硫半導電性エチレンプロピレン
ゴムテープを巻き付けて形成した。半導電層の厚さは内
部半導電層を約2mm、外部半導電層を約4mmとした。こ
れに対して、従来技術の試料では両半導電層を同サイズ
の加硫半導電性エチレンプロピレンゴムテープを巻き付
けて形成し、厚さは上記に合わせた。耐電圧性能は補強
絶縁厚さに対する平均電界(kV/mm)、すなわち、部分
放電発生電圧または交流破壊電圧を補強絶縁厚さで割っ
た値で表示している。表1から、本発明品の部分放電開
始電界及び交流破壊電界は従来技術と比較して、それぞ
れ約6割も向上していることがわかる。
This data was obtained at a tape-wrapped linear connection for a cable insulation thickness of 9 mm and a conductor size of 200 sq. The thickness of the reinforcing insulating layer is 30 mm. In the product of the present invention, both the inner semiconductive layer 4 and the outer semiconductive layer 6 have a thickness of 0.
It was formed by winding a non-vulcanized semiconductive ethylene propylene rubber tape having a thickness of 5 mm and a width of 25 mm. The thickness of the semiconductive layer was about 2 mm for the inner semiconductive layer and about 4 mm for the outer semiconductive layer. On the other hand, in the sample of the prior art, both semiconductive layers were formed by winding a vulcanized semiconductive ethylene propylene rubber tape of the same size, and the thickness was adjusted to the above. The withstand voltage performance is represented by an average electric field (kV / mm) with respect to the reinforcing insulation thickness, that is, a value obtained by dividing a partial discharge generation voltage or an AC breakdown voltage by the reinforcing insulation thickness. From Table 1, it is understood that the partial discharge starting electric field and the AC breakdown electric field of the product of the present invention are improved by about 60%, respectively, as compared with the prior art.

【0015】ところで、外部半導電層6の上に遮蔽用金
属層7が直接形成され、その外側を押え巻き層8により
押さえつけると、外部半導電層6を形成している非加硫
半導電性ゴムテープが変形して絶縁層との間のボイドが
潰れていく一方で、シールドメッシュテープよりなる遮
蔽用金属層7が柔らかい外部半導電層6の中にくい込ん
でいく現象も進行する。その食い込みが過度に進行し、
遮蔽用金属層7が外部半導電層6を貫通し、補強絶縁層
5にまで達してしまうと、その部分が金属突起となり、
耐電圧性能が著しく低下してしまうことになる。それを
防止するために、この実施形態では外部半導電層6の厚
さを、例えば、内部半導電層4の厚さの2倍の約4mmと
厚くする必要がある。
By the way, when the shielding metal layer 7 is formed directly on the outer semiconductive layer 6 and its outside is pressed down by the presser winding layer 8, the non-vulcanized semiconductive layer forming the outer semiconductive layer 6 is formed. While the rubber tape is deformed and the void between the insulating layer and the insulating layer is crushed, a phenomenon in which the shielding metal layer 7 made of a shielded mesh tape enters into the soft outer semiconductive layer 6 also progresses. The bite progressed excessively,
When the shielding metal layer 7 penetrates the external semiconductive layer 6 and reaches the reinforcing insulating layer 5, the portion becomes a metal protrusion,
The withstand voltage performance will be significantly reduced. In order to prevent this, in this embodiment, the thickness of the outer semiconductive layer 6 needs to be as thick as, for example, about 4 mm, which is twice the thickness of the inner semiconductive layer 4.

【0016】図2は、本発明の第2実施形態を示す図で
ある。符号は、図1のものに対応している。この実施形
態では、外部半導電層を、非加硫ゴムからなる外部半導
電層6−1と、加硫ゴムからなる外部半導電層6−2と
の2層構造にしている。外部半導電層6−1は、補強絶
縁層5の外側に非加硫半導電性ゴムテープを巻き付けて
形成し、外部半導電層6−2は、その外側に加硫半導電
性ゴムテープを巻き付けて形成する。その結果、非加硫
半導電性ゴムテープよりなる外部半導電層6−1とシー
ルドメッシュテープ等よりなる遮蔽用金属層7の間に、
加硫半導電性ゴムテープよりなる外部半導電層6−2が
介在される。
FIG. 2 is a diagram showing a second embodiment of the present invention. The reference numerals correspond to those in FIG. In this embodiment, the external semiconductive layer has a two-layer structure of an external semiconductive layer 6-1 made of non-vulcanized rubber and an external semiconductive layer 6-2 made of vulcanized rubber. The outer semiconductive layer 6-1 is formed by winding a non-vulcanized semiconductive rubber tape around the reinforcing insulating layer 5, and the outer semiconductive layer 6-2 is formed by winding a vulcanized semiconductive rubber tape around the outside. Form. As a result, between the outer semiconductive layer 6-1 made of a non-vulcanized semiconductive rubber tape and the shielding metal layer 7 made of a shield mesh tape or the like,
An external semiconductive layer 6-2 made of a vulcanized semiconductive rubber tape is interposed.

【0017】前記第1実施形態では、外部半導電層6の
厚さを内部半導電層4の厚さの2倍にして、遮蔽用金属
層7の外部半導電層6への食い込みによる耐電圧性能の
低下を防止するようにしていた。それで防止対策として
は十分であるが、問題は半導電性テープの価格が高いた
め、コスト高になる点にある。その点を解消するため、
この第2実施形態では、シールドメッシュテープが食い
込まず、増してや貫通することのない、硬い加硫半導電
性ゴムテープよりなる外部半導電層6−2を、非加硫半
導電性ゴムテープよりなる外部半導電層6−1と遮蔽用
金属層7との間に形成することとした。このようにすれ
ば、例えば、非加硫半導電性ゴムテープよりなる外部半
導電層6−1と、その上の加硫半導電性ゴムテープより
なる外部半導電層6−2の厚さをそれぞれ約1mmとし、
合計で約2mmとすることでコストを低減できる.
In the first embodiment, the thickness of the outer semiconductive layer 6 is made twice as large as the thickness of the inner semiconductive layer 4 so that the withstand voltage caused by the penetration of the shielding metal layer 7 into the outer semiconductive layer 6. The performance was prevented from lowering. Although this is sufficient as a preventive measure, the problem is that the cost of the semiconductive tape is high and the cost is high. To eliminate that point,
In the second embodiment, the outer semiconductive layer 6-2 made of a hard vulcanized semiconductive rubber tape, which does not penetrate the shield mesh tape and does not penetrate further, is made of a non-vulcanized semiconductive rubber tape. It is formed between the external semiconductive layer 6-1 and the shielding metal layer 7. By doing so, for example, the thickness of the outer semiconductive layer 6-1 made of a non-vulcanized semiconductive rubber tape and the thickness of the outer semiconductive layer 6-2 made of a vulcanized semiconductive rubber tape on each of them are reduced by about 1mm
The cost can be reduced by setting the total to about 2 mm.

【0018】[0018]

【発明の効果】本発明は、以上説明したように構成され
ているので、次に記載するような効果を奏する。すなわ
ち、請求項1に記載のテープ巻き式直線接続部は、外部
半導電層として非加硫ゴムからなる半導電性テープを用
いたので、補強絶縁層と外部半導電層の界面にボイドが
残留しないようになり、耐電圧性能を向上させることが
できる。内部及び外部半導電層の全部または絶縁層と接
する一部に、例えばエチレンプロピレンゴムからなる非
加硫半導電性テープを使用することにより、半導電層と
絶縁鳥の界面にテープ巻き付け当初必然的にできるボイ
ドを外部からの加圧力や加熱処理の助けを借りて、消滅
させて、耐電圧性能を向上させる効果がある。
Since the present invention is configured as described above, it has the following effects. That is, in the tape-wound linear connecting portion according to claim 1, since a semiconductive tape made of non-vulcanized rubber is used as the external semiconductive layer, voids remain at the interface between the reinforcing insulating layer and the external semiconductive layer. And the withstand voltage performance can be improved. By using a non-vulcanized semiconductive tape made of, for example, ethylene propylene rubber for all or part of the inner and outer semiconductive layers that are in contact with the insulating layer, it is necessary to initially wind the tape around the interface between the semiconductive layer and the insulating bird. With the help of external pressure and heat treatment, the voids formed can be eliminated to improve the withstand voltage performance.

【0019】そして、請求項2に記載のテープ巻き式直
線接続部は、外部半導電層を、非加硫ゴムからなる半導
電性テープを巻き付け、その外側に加硫ゴムからなる半
導電性テープを巻き付けて形成し、その外側に遮蔽用金
属層を巻き付けるようにしたので、遮蔽用金属層の外部
半導電層内への食い込みを防止することができる。
According to a second aspect of the present invention, there is provided a tape-connecting linear connecting portion, wherein an external semiconductive layer is formed by winding a semiconductive tape made of a non-vulcanized rubber, and a semiconductive tape made of a vulcanized rubber on the outside thereof. Is formed, and the shielding metal layer is wound around the outside, so that it is possible to prevent the shielding metal layer from biting into the external semiconductive layer.

【0020】また、請求項3に記載のテープ巻き式直線
接続部は、内部半導電層として非加硫ゴムからなる半導
電性テープを用いたので、内部半導電層とケーブル絶縁
体との界面にもボイドが残留しないようになり、耐電圧
性能をより一層向上させることができる。
Further, in the tape wound linear connecting portion according to the third aspect, since the semiconductive tape made of non-vulcanized rubber is used as the internal semiconductive layer, the interface between the internal semiconductive layer and the cable insulator is used. Also, no void remains, and the withstand voltage performance can be further improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1実施形態を示す図である。FIG. 1 is a diagram showing a first embodiment of the present invention.

【図2】本発明の第2実施形態を示す図である。FIG. 2 is a diagram showing a second embodiment of the present invention.

【図3】従来のテープ巻き式直線接続部を示す図であ
る。
FIG. 3 is a view showing a conventional tape-winding type linear connecting portion.

【符号の説明】[Explanation of symbols]

1…ケーブル導体 2…ケーブル絶縁体 3…導体スリーブ 4…内部半導電層 5…補強絶縁層 6…外部半導電層 7…遮蔽用金属層 8…押え巻き層 DESCRIPTION OF SYMBOLS 1 ... Cable conductor 2 ... Cable insulator 3 ... Conductor sleeve 4 ... Inner semiconductive layer 5 ... Reinforcement insulating layer 6 ... External semiconductive layer 7 ... Shielding metal layer 8 ... Holding layer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 松井 俊哉 神奈川県横浜市鶴見区江ヶ崎町4番1号 東京電力株式会社電力技術研究所内 Fターム(参考) 5G355 AA03 BA04 BA17 CA22 5G375 AA02 BA26 BB45 CA02 CA13 CB03 CB04 CB17 CB38 CB55 DB11  ────────────────────────────────────────────────── ─── Continued on the front page (72) Inventor Toshiya Matsui 4-1 Egasaki-cho, Tsurumi-ku, Yokohama-shi, Kanagawa Prefecture F-term in the Electric Power Research Laboratory, Tokyo Electric Power Company 5G355 AA03 BA04 BA17 CA22 5G375 AA02 BA26 BB45 CA02 CA13 CB03 CB04 CB17 CB38 CB55 DB11

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 端部のケーブル絶縁体を剥離し、ケーブ
ル導体を接続した上に順次内部半導電層、補強絶縁層、
外部半導電層、押え巻き層を形成したゴム・プラスチッ
ク絶縁電力ケーブル用のテープ巻き式直線接続部におい
て、前記外部半導電層として非加硫ゴムからなる半導電
性テープを用いたことを特徴とするテープ巻き式直線接
続部。
1. A cable insulator at an end is peeled off, a cable conductor is connected, and an internal semiconductive layer, a reinforcing insulating layer,
In an external semiconductive layer, a tape-wound linear connection portion for a rubber / plastic insulated power cable having a press-winding layer formed thereon, a semiconductive tape made of non-vulcanized rubber is used as the external semiconductive layer. Tape-wrapped straight connection.
【請求項2】 前記外部半導電層を、非加硫ゴムからな
る半導電性テープを巻き付け、その外側に加硫ゴムから
なる半導電性テープを巻き付けて形成し、その外側に遮
蔽用金属層を巻き付けたことを特徴とする請求項1記載
のテープ巻き式直線接続部。
2. The external semiconductive layer is formed by wrapping a semiconductive tape made of non-vulcanized rubber, wrapping a semiconductive tape made of vulcanized rubber around the outside, and forming a shielding metal layer outside the outside. 2. The tape-wound linear connection section according to claim 1, wherein
【請求項3】 前記内部半導電層として非加硫ゴムから
なる半導電性テープを用いたことを特徴とする請求項1
又は2記載のテープ巻き式直線接続部。
3. The semiconductor device according to claim 1, wherein a semiconductive tape made of non-vulcanized rubber is used as said internal semiconductive layer.
Or a tape-winding type linear connecting portion according to 2.
JP10274646A 1998-09-29 1998-09-29 Taping winding type linear connected part Pending JP2000115976A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10274646A JP2000115976A (en) 1998-09-29 1998-09-29 Taping winding type linear connected part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10274646A JP2000115976A (en) 1998-09-29 1998-09-29 Taping winding type linear connected part

Publications (1)

Publication Number Publication Date
JP2000115976A true JP2000115976A (en) 2000-04-21

Family

ID=17544613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10274646A Pending JP2000115976A (en) 1998-09-29 1998-09-29 Taping winding type linear connected part

Country Status (1)

Country Link
JP (1) JP2000115976A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02155416A (en) * 1988-12-03 1990-06-14 Fujikura Ltd Molded joint method of cable
JPH05105849A (en) * 1991-10-17 1993-04-27 Furukawa Electric Co Ltd:The Adhesive tape
JPH05314814A (en) * 1992-05-11 1993-11-26 Furukawa Electric Co Ltd:The Semiconductive self welding composition

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02155416A (en) * 1988-12-03 1990-06-14 Fujikura Ltd Molded joint method of cable
JPH05105849A (en) * 1991-10-17 1993-04-27 Furukawa Electric Co Ltd:The Adhesive tape
JPH05314814A (en) * 1992-05-11 1993-11-26 Furukawa Electric Co Ltd:The Semiconductive self welding composition

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