JP2000115644A5 - Solid-state image sensor and imaging method - Google Patents
Solid-state image sensor and imaging method Download PDFInfo
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- JP2000115644A5 JP2000115644A5 JP1998282942A JP28294298A JP2000115644A5 JP 2000115644 A5 JP2000115644 A5 JP 2000115644A5 JP 1998282942 A JP1998282942 A JP 1998282942A JP 28294298 A JP28294298 A JP 28294298A JP 2000115644 A5 JP2000115644 A5 JP 2000115644A5
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- 238000003384 imaging method Methods 0.000 title claims description 10
- 230000002950 deficient Effects 0.000 claims description 25
- 238000001514 detection method Methods 0.000 claims description 4
Description
【０００７】
【課題を解決するための手段】
本発明は上記課題に鑑みなされたものであって、固体撮像素子の撮像領域を、複数の領域に分割する領域分割手段と、前記領域分割手段により分割された領域の各々について、欠陥画素と、該欠陥画素の出力信号レベルとを検出する欠陥画素検出手段と、前記欠陥画素の欠陥に関する情報を記憶する記憶手段と、前記領域分割手段により分割された領域について欠陥補正の優先度を設定する優先度設定手段と、前記優先度設定手段により設定された領域の優先順であって、さらに、前記欠陥画素検出手段により検出された欠陥画素の出力信号のレベル順に従って、欠陥画素の出力信号を前記記憶手段に記憶されている、欠陥に関する情報に基づいて補正する欠陥補正手段とを具備した固体撮像装置を構成して、上記課題を解決する。
また、本発明は、固体撮像素子の撮像領域を、複数の領域に分割する領域分割ステップと、前記領域分割ステップで分割された領域の各々について、欠陥画素と、該欠陥画素の出力信号レベルとを検出する欠陥画素検出ステップと、前記欠陥画素の欠陥に関する情報を記憶する記憶ステップと、前記領域分割ステップで分割された領域について欠陥補正の優先度を設定する優先度設定ステップと、前記優先度設定ステップで設定された領域の優先順であって、さらに、前記欠陥画素検出ステップで検出された欠陥画素の出力信号のレベル順に従って、欠陥画素の出力信号を前記記憶ステップで記憶されている、欠陥に関する情報に基づいて補正する欠陥補正ステップとを具備した撮像方法である。
0007
[Means for solving problems]
The present invention has been made in view of the above problems, and each of the region dividing means for dividing the imaging region of the solid-state image sensor into a plurality of regions and the region divided by the region dividing means has defective pixels. Priority for setting the priority of defect correction for the defect pixel detecting means for detecting the output signal level of the defective pixel, the storage means for storing the information about the defect of the defective pixel, and the region divided by the region dividing means. The output signal of the defective pixel is displayed in the order of priority of the degree setting means and the area set by the priority setting means, and further according to the level order of the output signal of the defective pixel detected by the defective pixel detecting means. The above problem is solved by configuring a solid-state image pickup device including a defect correction means that is stored in the storage means and corrects based on information about the defect.
Further, in the present invention, the defect pixel and the output signal level of the defective pixel are used for each of the region division step for dividing the imaging region of the solid-state image sensor into a plurality of regions and the region divided by the region division step. A defect pixel detection step for detecting a defect pixel, a storage step for storing information about defects in the defective pixel, a priority setting step for setting a defect correction priority for a region divided by the region division step, and the priority. The output signal of the defective pixel is stored in the storage step in the order of priority of the area set in the setting step and further in the order of the level of the output signal of the defective pixel detected in the defective pixel detection step. This is an imaging method including a defect correction step for correcting based on information on defects.
Claims (2)
前記領域分割手段により分割された領域の各々について、欠陥画素と、該欠陥画素の出力信号レベルとを検出する欠陥画素検出手段と、
前記欠陥画素の欠陥に関する情報を記憶する記憶手段と、
前記領域分割手段により分割された領域について欠陥補正の優先度を設定する優先度設定手段と、
前記優先度設定手段により設定された領域の優先順であって、さらに、前記欠陥画素検出手段により検出された欠陥画素の出力信号のレベル順に従って、欠陥画素の出力信号を前記記憶手段に記憶されている、欠陥に関する情報に基づいて補正する欠陥補正手段と
を具備したことを特徴とする固体撮像装置。Area dividing means for dividing the imaging area of the solid-state imaging device into a plurality of areas;
For each of the areas divided by the area dividing means, a defective pixel detecting means for detecting a defective pixel and an output signal level of the defective pixel;
Storage means for storing information about defects of the defective pixels;
Priority setting means for setting defect correction priority for the area divided by the area dividing means;
In accordance with the priority order of the areas set by the priority setting means, and further according to the level order of the output signals of the defective pixels detected by the defective pixel detection means, the output signals of the defective pixels are stored in the storage means. A solid-state imaging device comprising: a defect correcting unit that corrects the defect based on information on the defect.
前記領域分割ステップで分割された領域の各々について、欠陥画素と、該欠陥画素の出力信号レベルとを検出する欠陥画素検出ステップと、A defective pixel detecting step for detecting a defective pixel and an output signal level of the defective pixel for each of the regions divided in the region dividing step;
前記欠陥画素の欠陥に関する情報を記憶する記憶ステップと、A storage step of storing information relating to the defect of the defective pixel;
前記領域分割ステップで分割された領域について欠陥補正の優先度を設定する優先度設定ステップと、A priority setting step for setting the priority of defect correction for the region divided in the region dividing step;
前記優先度設定ステップで設定された領域の優先順であって、さらに、前記欠陥画素検出ステップで検出された欠陥画素の出力信号のレベル順に従って、欠陥画素の出力信号を前記記憶ステップで記憶されている、欠陥に関する情報に基づいて補正する欠陥補正ステップとThe output signal of the defective pixel is stored in the storage step according to the priority order of the areas set in the priority setting step, and further according to the level order of the output signal of the defective pixel detected in the defective pixel detection step. A defect correction step for correcting the defect based on the defect information;
を具備したことを特徴とする撮像方法。An imaging method comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10282942A JP2000115644A (en) | 1998-10-05 | 1998-10-05 | Solid-state image pickup device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10282942A JP2000115644A (en) | 1998-10-05 | 1998-10-05 | Solid-state image pickup device |
Publications (2)
| Publication Number | Publication Date |
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| JP2000115644A JP2000115644A (en) | 2000-04-21 |
| JP2000115644A5 true JP2000115644A5 (en) | 2005-10-13 |
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| JP10282942A Pending JP2000115644A (en) | 1998-10-05 | 1998-10-05 | Solid-state image pickup device |
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Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008011567A (en) * | 1999-10-27 | 2008-01-17 | Sanyo Electric Co Ltd | Image signal processing device |
| JP4515627B2 (en) * | 2000-12-08 | 2010-08-04 | オリンパス株式会社 | Imaging device |
| CN100395586C (en) * | 2003-05-09 | 2008-06-18 | 奥林巴斯株式会社 | Defect correction device and defect correction method |
| JP4598180B2 (en) * | 2003-11-28 | 2010-12-15 | Ｈｏｙａ株式会社 | Defective pixel detection device, defective pixel detection method, and defective pixel detection program |
| JP5188255B2 (en) * | 2008-04-30 | 2013-04-24 | 富士フイルム株式会社 | Radiation imaging apparatus and image defect detection method |
| JP5147537B2 (en) * | 2008-05-21 | 2013-02-20 | キヤノン株式会社 | IMAGING DEVICE AND IMAGING DEVICE CONTROL METHOD |
| JP5245642B2 (en) * | 2008-08-21 | 2013-07-24 | 株式会社ニコン | Imaging apparatus and defect correction apparatus |
| JP2010249621A (en) * | 2009-04-15 | 2010-11-04 | Shimadzu Corp | Two-dimensional image detector |
| JP5147789B2 (en) * | 2009-07-13 | 2013-02-20 | キヤノン株式会社 | Imaging apparatus and control method thereof |
| JP2011135532A (en) * | 2009-12-25 | 2011-07-07 | Toshiba Corp | Head-separated type camera apparatus |
| JP2013211636A (en) * | 2012-03-30 | 2013-10-10 | Nikon Corp | Imaging device and imaging program |
| JP5247922B2 (en) * | 2012-09-04 | 2013-07-24 | キヤノン株式会社 | Imaging apparatus and control method thereof |
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1998
- 1998-10-05 JP JP10282942A patent/JP2000115644A/en active Pending
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