JP2000042902A - Polishing tool, and polishing work method using the tool - Google Patents

Polishing tool, and polishing work method using the tool

Info

Publication number
JP2000042902A
JP2000042902A JP22658798A JP22658798A JP2000042902A JP 2000042902 A JP2000042902 A JP 2000042902A JP 22658798 A JP22658798 A JP 22658798A JP 22658798 A JP22658798 A JP 22658798A JP 2000042902 A JP2000042902 A JP 2000042902A
Authority
JP
Japan
Prior art keywords
polishing
polisher
pitch
polishing tool
tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22658798A
Other languages
Japanese (ja)
Inventor
Kenichi Kawaguchi
健一 川口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP22658798A priority Critical patent/JP2000042902A/en
Publication of JP2000042902A publication Critical patent/JP2000042902A/en
Pending legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a polishing work method for simply and efficiently removing fine weaviness existing on a surface to be worked by using a polisher other than pitch, to obtain a highly precise smooth surface. SOLUTION: A polisher 11 composed of relatively soft material is supported by pitch 11 in a polishing tool 1. The polisher 11 of the polishing tool 1 is pressed onto the surface 3a to be worked of an optical element 3, while supplying abrasive liquid 7 including a free abrasive grain to the polisher 11. Relative movement is imparted between the surface 3a and the polisher 11 to make the surface 3a into a smooth surface.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、被加工面を高度に
平滑な面に研磨するのに用いる研磨用工具及びそれを用
いる研磨加工方法に関する。特には、レンズや反射ミラ
ー等の光学素子あるいはレンズ成型用の超精密金型等の
研磨加工に用いるのに好適な研磨用工具等に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing tool used for polishing a surface to be processed to a highly smooth surface and a polishing method using the same. In particular, the present invention relates to a polishing tool or the like suitable for polishing an optical element such as a lens or a reflection mirror or an ultra-precision mold for molding a lens.

【0002】[0002]

【従来の技術】カメラや精密光学機器で用いられるレン
ズの加工における最終工程となる仕上げ研磨加工を例に
採って従来技術を説明する。この加工工程では、石油ピ
ッチを加熱して揮発成分を除き適度に硬化させたピッチ
(ストレートアスファルトピッチ)と呼ばれる粘弾性体
が、ポリシャ材料として広く使用されている。
2. Description of the Related Art The prior art will be described by taking, as an example, a finish polishing process which is a final step in processing a lens used in a camera or a precision optical instrument. In this processing step, a viscoelastic body called a pitch (straight asphalt pitch) obtained by heating a petroleum pitch to remove volatile components and appropriately cure it is widely used as a polisher material.

【0003】図2は、従来のピッチをポリシャに用いた
研磨用工具を模式的に示す断面図である。回転軸27を
有する台金25上にピッチ粘弾性体の層23が形成され
ている。このピッチ層23の表面である研磨作業面21
aを、被加工物31の被加工面31aを反転させた形状
に成形する。そして、遊離砥粒を含む研磨液37を、ノ
ズル35からピッチと被加工面との間に供給しながら、
被加工面31aと研磨作業面21aに相対的な加工運動
(回転や揺動)を与える。その際、遊離砥粒が被加工面
31aの微細な凸部を選択的に加工して被加工面31a
が平滑化される。
FIG. 2 is a cross-sectional view schematically showing a conventional polishing tool using a pitch as a polisher. A pitch viscoelastic layer 23 is formed on a base metal 25 having a rotation shaft 27. Polishing work surface 21 which is the surface of pitch layer 23
a is formed into a shape in which the processing surface 31a of the workpiece 31 is inverted. Then, while supplying the polishing liquid 37 containing free abrasive grains from the nozzle 35 between the pitch and the surface to be processed,
A relative processing motion (rotation or swing) is given to the work surface 31a and the polishing work surface 21a. At this time, the loose abrasive selectively processes the fine projections of the processing surface 31a to form the processing surface 31a.
Is smoothed.

【0004】例えば、光学部品の中でも特殊な高品質と
高精度鏡面を要求される、半導体デバイス用の微細パタ
ーンに係わる投影露光用高級レンズなどの短波長用光学
ガラスレンズの研磨加工には、酸化セリウム砥粒を水に
分散させた研磨剤とともに、ポリシャとしてピッチ粘弾
性体(ストレートアスファルトピッチ)を貼り付けた研
磨皿(研磨用工具)を使用する。
For example, in polishing a short wavelength optical glass lens such as a high-grade projection exposure lens relating to a fine pattern for a semiconductor device, which requires a special high quality and a high precision mirror surface among optical components, oxidation is required. A polishing plate (polishing tool) on which a pitch viscoelastic body (straight asphalt pitch) is attached as a polisher is used together with an abrasive in which cerium abrasive particles are dispersed in water.

【0005】ピッチの優れた特徴として、まず第一に、
残存すると問題となる微小うねり(リップル)の除去が
可能である。第二に、仕上げ研磨の工程において波長の
異なる新たな微小うねりを生成しない、ということであ
る。これら2点により、うねりのない高精度平滑面が得
られる。ここで、問題となる微小うねりとは、主に研削
加工等の前加工工程で発生したうねりを指す。このうね
りは、高精度光学部品、特に短波長用の光学素子では光
の散乱や吸収の要因となり、光学性能の低下を引き起こ
す。
[0005] As an excellent feature of pitch, first of all,
It is possible to remove minute undulations (ripples) that may cause a problem if they remain. Secondly, in the finish polishing step, no new minute waviness having a different wavelength is generated. With these two points, a high-precision smooth surface without undulation can be obtained. Here, the problematic undulation mainly refers to undulation generated in a pre-processing step such as grinding. This undulation causes scattering or absorption of light in a high-precision optical component, particularly an optical element for a short wavelength, and causes a decrease in optical performance.

【0006】うねり除去のメカニズムに関しては未だ不
明確な部分も多く残されているが、次のように考えられ
ている。すなわち、ピッチ粘弾性体は表面の微視的領域
で軟質であり、かつそれがポリシャ全面に渡って均一で
ある。そのため、被加工面上にあるマクロな凹凸(形状
誤差)には追従し、ポリシャ接触面積の安定とそれに係
わる均一な圧力分布状態を実現する。これがいわゆる
“当たり”が良い状態である。この当たりの良い状態の
研磨作業面(ポリシャ作業面)が被加工面の平滑化に伴
いマクロ的に平滑化していく過程で、ミクロ的な微小う
ねりが除去されていき被加工面が平滑化していく、と考
えられる。
Although there are still many unclear parts regarding the undulation removal mechanism, it is considered as follows. That is, the pitch viscoelastic body is soft in a microscopic region of the surface and is uniform over the entire polisher. Therefore, it follows macro asperities (shape errors) on the surface to be processed, and realizes a stable polisher contact area and a uniform pressure distribution state related thereto. This is the so-called "hit" condition. In the process in which the polishing work surface (polisher work surface) in a good condition is macroscopically smoothed as the work surface is smoothed, micro undulations are removed and the work surface is smoothed. It is thought to go.

【0007】以上はピッチ粘弾性体が有する形状追従性
(被加工面形状へのフィッティング性)についての特性
を示している。さらにピッチが有する高精度平滑加工へ
のもう一つの大きな利点として、減衰性能に優れている
ことが挙げられる。研磨装置の精度や環境に起因する機
械的振動及びポリシャ面の振れなどは、研磨加工の際の
機械的作用を強調し、平滑化プロセスの妨げになるばか
りでなく、新たな微小うねりの生成を引き起こす。
The above description shows the characteristics of the shape viscoelastic body with respect to the shape following property (fitting property to the shape of the work surface). Another great advantage of the pitch for high precision smoothing is that it has excellent damping performance. The mechanical vibration and wobbles of the polisher due to the accuracy and environment of the polishing equipment emphasize the mechanical action during polishing, not only hinder the smoothing process but also generate new minute waviness. cause.

【0008】この微小うねり(ミクロな形状誤差)を生
む要因として考えられる機械的振動という問題に対し
て、ピッチ粘弾性体の有する減衰性能が有効に作用す
る。すなわち、ポリシャとなるピッチ自体が、機械的振
動、例えば研磨装置と研磨用工具との取り付け部に生ず
るガタなどを吸収し、振動の研磨作業面への伝達を妨げ
る作用がある。この作用により、新たなうねりの発生が
抑制されると推察できる。以上のような特徴ゆえに、ピ
ッチがポリシャ材料として光学ガラスの高精度平滑加工
に広く使用されてきた。
[0008] The damping performance of the pitch viscoelastic material effectively acts on the problem of mechanical vibration which can be considered as a factor that causes this minute waviness (micro shape error). That is, the pitch itself, which serves as a polisher, has an effect of absorbing mechanical vibration, for example, backlash generated at a mounting portion between the polishing apparatus and the polishing tool, and preventing transmission of the vibration to the polishing work surface. It can be inferred that this action suppresses the occurrence of new undulations. Due to the above characteristics, the pitch has been widely used as a polisher material for high-precision smoothing of optical glass.

【0009】一方、光学ガラス以外の光学部品材料、例
えば短波長用のミラー/反射鏡に用いられるセラミック
ス材料などを研磨加工する場合は、上述のピッチを用い
ないのが一般的であった。というのは、セラミックス材
料の加工の場合、研磨砥粒にはダイヤモンド粉末や、仕
上げ研磨用のメカノケミカルポリシング用砥粒(例え
ば、窒化珪素の被加工物には酸化鉄の砥粒、炭化珪素の
被加工物には酸化クロムの砥粒、ジルコニウムの被加工
物には酸化珪素の砥粒など)のように、酸化セリウム以
外の砥粒が用いられることが多い。そしてポリシャ材料
も被加工物の硬さや使用する砥粒との相性を考慮して、
合成樹脂やアクリルニトリル樹脂や、テフロン等の比較
的硬いピッチ以外のポリシャを使用し加工が行われてい
る。というのは、メカノケミカルポリシングでは加工熱
が生じてピッチが軟化して形状を保てなくなるおそれが
あるからである。
On the other hand, when polishing an optical component material other than the optical glass, for example, a ceramic material used for a mirror / reflection mirror for short wavelengths, it is common to not use the above-mentioned pitch. That is, in the case of processing a ceramic material, diamond powder is used for polishing abrasive grains, and abrasive grains for mechanochemical polishing for finish polishing (for example, abrasive grains of iron oxide and silicon carbide are used for a workpiece of silicon nitride). Abrasive grains other than cerium oxide are often used, such as chromium oxide abrasive grains for a workpiece and silicon oxide abrasive grains for a zirconium workpiece. And the polisher material also considers the hardness of the workpiece and the compatibility with the abrasive grains used,
Processing is performed using a polisher other than a relatively hard pitch, such as synthetic resin, acrylonitrile resin, or Teflon. This is because in mechanochemical polishing, processing heat may be generated, and the pitch may be softened and the shape may not be maintained.

【0010】[0010]

【発明が解決しようとする課題】しかるに、前記の従来
技術には以下のような欠点がある。(1)ピッチ以外の
ポリシャ材料は形状追従機能に欠けフィッティング性に
劣る。前述の合成樹脂材料などの、ピッチ以外のポリシ
ャ材料には、ピッチ特有の粘弾性特性がない。そのた
め、ピッチのように当初凹凸がある被加工面に良好にな
じみ(フィッティングし)、被加工面の状態変化になら
って平滑に変化していくというような作用(R形状追従
機能)は、前述のピッチ以外のポリシャ材料には期待で
きない。ピッチ以外のポリシャ材料は形状追従機能に欠
けフィッティング性に劣ると、研磨作業面と被加工面の
“当たり”(接触面積)にばらつきや不均一が生じる。
通常、研磨用工具は一定荷重で加圧されているため、こ
の“当たり”のばらつきが圧力の偏差を招き、新たなう
ねりを生成する要因となってしまう。
However, the above-mentioned prior art has the following disadvantages. (1) The polisher material other than the pitch lacks the shape following function and is inferior in fitting property. Polisher materials other than pitch, such as the aforementioned synthetic resin materials, do not have viscoelastic properties specific to pitch. For this reason, the function of smoothly fitting (fitting) a work surface having irregularities at first such as a pitch and smoothly changing in accordance with a change in the state of the work surface (R shape following function) is described above. Cannot be expected for polisher materials other than the pitch. If the polisher material other than the pitch lacks the shape-following function and is inferior in the fitting property, the "contact" (contact area) between the polished work surface and the work surface varies and becomes non-uniform.
Usually, since the polishing tool is pressurized with a constant load, the variation in the "hit" causes a pressure deviation, which is a factor for generating a new undulation.

【0011】(2)ピッチ以外のポリシャ材料は減衰能
特性でも劣る。また、ピッチに比べ合成樹脂材料は減衰
能特性でも劣るため、機械的振動を吸収することができ
ず、研磨作業面に機械的振動が伝達してしまう。そのた
め、前述の、研磨面の状態変化にならって平滑化しない
という問題と、被加工面への振動の伝達という問題が重
なり、実際の研磨では「びびり」現象を起こすことが多
く、新たなうねりを生む要因となっている。
(2) The polisher material other than the pitch is inferior in the damping ability characteristic. Further, since the synthetic resin material is inferior in the damping ability characteristic as compared with the pitch, it cannot absorb mechanical vibration, and mechanical vibration is transmitted to the polishing work surface. For this reason, the problem of not smoothing following the change in the state of the polished surface and the problem of transmitting vibration to the surface to be processed overlap, and in actual polishing, "chattering" often occurs, and a new undulation Is a factor that produces

【0012】この問題に対して、経験的に合成樹脂ポリ
シャの厚さを薄くし(0.5mm〜2mm程度)、その下に
厚さ数mmの薄板状のフェルトなどを緩衝材として配置し
複層構造とすることで「びびり現象」に対処し、研磨加
工を行っていた。図3は、従来のフェルトの緩衝層を有
する研磨用工具の構成を模式的に示す断面図である。軸
63を有する台金61の上面に、接着剤59を介してフ
ェルト57を貼り付ける。その上に、接着剤55を介し
てポリシャ材53を貼り付ける。このようにして研磨用
工具51を構成している。
To solve this problem, the thickness of the synthetic resin polisher is empirically reduced (about 0.5 mm to 2 mm), and a thin sheet-like felt having a thickness of several mm is disposed as a cushioning material thereunder. By using a layered structure, the "chamber phenomenon" was dealt with and polishing was performed. FIG. 3 is a cross-sectional view schematically showing a configuration of a conventional polishing tool having a felt buffer layer. The felt 57 is attached to the upper surface of the base metal 61 having the shaft 63 via the adhesive 59. A polisher material 53 is adhered thereon via an adhesive 55. Thus, the polishing tool 51 is configured.

【0013】しかし、フェルト材料はピッチに比較して
変形後の弾性回復が遅く、ヤング率が小さい(柔らか
い)。このような理由から、フェルト材料を用いた場合
には、被加工面に対するR形状の追従性が悪く、当たり
が不均一になる。そのため、新たなうねりを生じたり、
前加工の研削加工により達成された被加工面の形状精度
をかえって劣化させてしまうという大きな欠陥があっ
た。
However, the felt material has a slower elastic recovery after deformation and a smaller Young's modulus (softer) than the pitch. For these reasons, when a felt material is used, the followability of the R shape to the surface to be processed is poor, and the hit becomes uneven. Therefore, a new swell may occur,
There is a major defect that the shape accuracy of the work surface achieved by the pre-processing grinding process is rather deteriorated.

【0014】さらに、通常はフェルト材料は薄板状(シ
ート状)でしか市販されていないため、球面光学部品加
工用の球面台金に貼り付ける際に不均一な部分(しわ、
ムラ)ができたり、球面形状領域で部分的に伸縮のばら
つきができるなどの問題があり、緩衝材料としての良好
な効果を得るのが難しかった。
Furthermore, since the felt material is usually only commercially available in the form of a thin plate (sheet), when it is applied to a spherical metal base for processing a spherical optical component, uneven portions (wrinkles,
However, there is a problem that unevenness is generated, and a variation in expansion and contraction partially occurs in a spherical shape region, and it is difficult to obtain a good effect as a buffer material.

【0015】加えて、台金とフェルト下面及びフェルト
上面とポリシャ下面の接合には、接着剤や両面テープな
どが用いられていたが、接着剤を均一に塗るノウハウな
どは技能に依存し手間を要する。また両面テープは剥が
れやすいなどの問題も併せてあった。
In addition, adhesives and double-sided tapes have been used for joining the base metal to the lower surface of the felt and the upper surface of the felt and the lower surface of the polisher. However, know-how for applying the adhesive evenly depends on the skill and requires time and effort. It costs. In addition, there was a problem that the double-sided tape was easily peeled off.

【0016】(3)さらに最近になって、ある一部のガ
ラス材料では、砥粒としての酸化セリウムとポリシャと
してのピッチが、研磨後も付着物として被加工面に残留
し汚染するために、光学性能(例えば透過率)の低下・
劣化を起こすことが指摘されている。
(3) More recently, in some glass materials, cerium oxide as abrasive grains and pitch as polisher remain as contaminants on the surface to be processed after polishing and become contaminated. Reduction of optical performance (eg transmittance)
It has been pointed out that deterioration occurs.

【0017】以上のような理由から、ピッチ以外のポリ
シャ材料を用いた研磨用工具による光学素子の平滑化研
磨加工技術の確立が求められている。本発明は、このよ
うな問題点を鑑みてなされたものであり、被加工面上に
存在する微小うねりを、ピッチ以外のポリシャを用いて
簡便にしかも効率よく除去し、高精度平滑面を得る研磨
用工具及びそれを用いた研磨加工方法を提供することを
目的とする。
For the reasons described above, there is a demand for the establishment of a technique for smoothing and polishing optical elements by a polishing tool using a polisher material other than pitch. The present invention has been made in view of such a problem, and a fine undulation existing on a surface to be processed is easily and efficiently removed using a polisher other than a pitch to obtain a highly accurate smooth surface. An object of the present invention is to provide a polishing tool and a polishing method using the same.

【0018】[0018]

【課題を解決するための手段】上記課題を解決するた
め、本発明の研磨用工具は、 比較的柔軟な材料からな
るポリシャをピッチ等の粘弾性体で支持したことを特徴
とする。
In order to solve the above problems, a polishing tool according to the present invention is characterized in that a polisher made of a relatively soft material is supported by a viscoelastic body such as a pitch.

【0019】本発明の研磨加工方法は、 比較的柔軟な
材料からなるポリシャをピッチ等の粘弾性体で支持した
研磨用工具を準備し、 この研磨用工具のポリシャに遊
離砥粒を含む研磨液を供給しながら光学素子の被加工面
に押し当て、 被加工面とポリシャ間に相対的な運動を
与え、被加工面上に存在する微小うねりを除去して光学
素子の被加工面を平滑面とすることを特徴とする。
According to the polishing method of the present invention, there is provided a polishing tool in which a polisher made of a relatively soft material is supported by a viscoelastic body such as a pitch, and a polishing liquid containing free abrasive grains is contained in the polisher of the polishing tool. Is applied to the surface of the optical element to be processed, and a relative motion is applied between the surface to be processed and the polisher to remove minute undulations present on the surface to be processed and to smooth the surface to be processed of the optical element. It is characterized by the following.

【0020】[0020]

【発明の実施の形態】以下、図面を参照しつつ説明す
る。図1は、本発明の1実施例に係る研磨用工具とそれ
を用いて光学素子を加工する様子を模式的に示す断面図
である。この例の研磨用工具1は、図の下から上に向か
って、台金15、ピッチ粘弾性体層13及びポリシャ1
1の3層からなる。この例の台金15は、中央部がやや
凸に盛り上がった、鋳鉄等からなる円盤である。台金1
5の下面の中央部には、一体の軸17が下方に突設され
ている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a cross-sectional view schematically showing a polishing tool according to one embodiment of the present invention and how an optical element is processed using the polishing tool. The polishing tool 1 of this example includes a base 15, a pitch viscoelastic layer 13 and a polisher 1
1 is composed of three layers. The base metal 15 in this example is a disk made of cast iron or the like, whose central portion is slightly raised. Mount 1
In the center of the lower surface of 5, an integral shaft 17 protrudes downward.

【0021】ピッチ粘弾性体層13は、台金15の上に
積層されている。このピッチ粘弾性体層13は、被加工
面に対して形状追従機能と外乱に対する減衰機能を新た
に加える。
The pitch viscoelastic layer 13 is laminated on the base metal 15. The pitch viscoelastic layer 13 newly adds a shape following function and a function of attenuating disturbance to the surface to be processed.

【0022】ピッチ粘弾性体層13の上には、合成樹脂
シートからなるポリシャ11が貼り付けられている。こ
の例ではポリシャ11の厚さは0.5mmである。このピ
ッチ層13の表面である研磨作業面1aを、被加工物3
の被加工面3aを反転させた形状に成形する。そして、
遊離砥粒を含む研磨液7を、ノズル5からピッチと被加
工面との間に供給しながら、被加工面3aと研磨作業面
1aに相対的な加工運動(回転や揺動)を与える。その
際、遊離砥粒が被加工面3aの微細な凸部を選択的に加
工して被加工面3aが平滑化される。
On the pitch viscoelastic layer 13, a polisher 11 made of a synthetic resin sheet is adhered. In this example, the thickness of the polisher 11 is 0.5 mm. The polishing work surface 1a, which is the surface of the pitch layer 13, is
Is formed into an inverted shape of the surface 3a to be processed. And
While supplying the polishing liquid 7 containing loose abrasive particles from the nozzle 5 between the pitch and the processing surface, a relative processing motion (rotation or swing) is applied to the processing surface 3a and the polishing work surface 1a. At this time, the free abrasive grains selectively process fine projections on the surface 3a to be processed, thereby smoothing the surface 3a to be processed.

【0023】次に、この例の研磨用工具の調整方法につ
いて説明する。ピッチ粘弾性体層13の配置、貼り付け
は、通常のピッチポリシャ製作方法と同じく、ピッチを
台金15の上に盛りつけた後に、両者を加熱しピッチを
軟化させ、別に用意した成型用の凹型(図示されず)を
用いてピッチ粘弾性体層13の上面をR形状に成形す
る。次にピッチ粘弾性体層13と台金15を軟化温度よ
り手前の温度まで再度加熱し、ポリシャ11を配置し貼
り付ける。
Next, a method of adjusting the polishing tool of this embodiment will be described. The arrangement and attachment of the pitch viscoelastic body layer 13 are performed in the same manner as in a normal pitch polisher manufacturing method. The upper surface of the pitch viscoelastic body layer 13 is formed into an R shape using (not shown). Next, the pitch viscoelastic body layer 13 and the base metal 15 are heated again to a temperature lower than the softening temperature, and the polisher 11 is arranged and attached.

【0024】この方法によれば、ピッチは加熱された状
態で粘着性を有するためにピッチ自身が接着剤の役割を
なし、特に接着剤を別途用意する必要がない。この実施
例の方法によれば、ポリシャ材料を接着するのに要する
手間や技能、ノウハウ、接着剤のムラによる研磨性能の
良否などがなくなり、研磨用工具製作が容易になる。
According to this method, since the pitch has tackiness in a heated state, the pitch itself functions as an adhesive, and it is not particularly necessary to separately prepare an adhesive. According to the method of this embodiment, the labor and skill required for bonding the polisher material, the know-how, the quality of the polishing performance due to the unevenness of the adhesive, and the like are eliminated, and the production of the polishing tool is facilitated.

【0025】なお、本実施例ではシート状に成形、市販
されている合成樹脂材料を使用したが、硬化前の樹脂を
ピッチ上に塗布後、やはり成形用の型を用いてR形状を
成形しつつ硬化させ、研磨用工具とすることも可能であ
る。この方法によれば、ポリシャの厚さを調整できた
り、複雑な形状への対応も可能となるという利点があ
る。
In this embodiment, a synthetic resin material which is formed into a sheet shape and which is commercially available is used. However, after the resin before curing is applied on the pitch, an R shape is formed using a molding die. It is also possible to cure while polishing to obtain a polishing tool. According to this method, there is an advantage that the thickness of the polisher can be adjusted and a complicated shape can be handled.

【0026】本実施例の研磨用工具及びダイヤモンド砥
粒(平均粒径1μm )を用い、オスカー型研磨装置にお
いて、セラミックス材料(炭化珪素)の球面加工を行っ
たところ、微小うねりのない良好な平滑面を得られるこ
とが確認できた。なお、形状追従機能を考慮し、ピッチ
粘弾性体層13には、針入度20度の軟らか目のピッチ
を用いた。
Using the polishing tool of the present embodiment and diamond abrasive grains (average particle size: 1 μm), spherical machining of ceramic material (silicon carbide) was performed in an Oscar-type polishing apparatus. It was confirmed that a surface could be obtained. In addition, in consideration of the shape following function, the pitch viscoelastic body layer 13 used a soft-eyed pitch having a penetration of 20 degrees.

【0027】[0027]

【発明の効果】以上の説明から明らかなように、本発明
によれば、被加工面上に存在する微小うねりを、ピッチ
以外のポリシャを用いて簡便にしかも効率よく除去し、
高精度平滑面を得る研磨用工具及びそれを用いた研磨加
工方法を提供できる。
As is apparent from the above description, according to the present invention, fine undulations existing on the surface to be processed can be easily and efficiently removed using a polisher other than the pitch.
A polishing tool for obtaining a high-precision smooth surface and a polishing method using the same can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の1実施例に係る研磨用工具とそれを用
いて光学素子を加工する様子を模式的に示す断面図であ
る。
FIG. 1 is a cross-sectional view schematically showing a polishing tool according to one embodiment of the present invention and a state of processing an optical element using the polishing tool.

【図2】従来のピッチをポリシャに用いた研磨用工具を
模式的に示す断面図である。
FIG. 2 is a cross-sectional view schematically showing a conventional polishing tool using a pitch as a polisher.

【図3】従来のフェルトの緩衝層を有する研磨用工具の
構成を模式的に示す断面図である。
FIG. 3 is a cross-sectional view schematically showing a configuration of a conventional polishing tool having a felt buffer layer.

【符号の説明】[Explanation of symbols]

1 研磨用工具 1a 研磨作業面 3 被加工物 3a 被加工面 5 ノズル 7 研磨液 11 ポリシャ 13 ピッチ粘弾
性体層 15 台金 17 軸
DESCRIPTION OF SYMBOLS 1 Polishing tool 1a Polishing work surface 3 Workpiece 3a Workpiece surface 5 Nozzle 7 Polishing liquid 11 Polisher 13 Pitch viscoelastic layer 15 Base metal 17 axis

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 比較的柔軟な材料からなるポリシャをピ
ッチ等の粘弾性体で支持したことを特徴とする研磨用工
具。
1. A polishing tool wherein a polisher made of a relatively soft material is supported by a viscoelastic body such as a pitch.
【請求項2】 比較的柔軟な材料からなるポリシャをピ
ッチ等の粘弾性体で支持した研磨用工具を準備し、 この研磨用工具のポリシャに遊離砥粒を含む研磨液を供
給しながら光学素子の被加工面に押し当て、 被加工面とポリシャ間に相対的な運動を与え、被加工面
上に存在する微小うねりを除去して光学素子の被加工面
を平滑面とすることを特徴とする研磨加工方法。
2. A polishing tool in which a polisher made of a relatively flexible material is supported by a viscoelastic body such as a pitch, and an optical element is supplied while supplying a polishing liquid containing free abrasive grains to the polisher of the polishing tool. The surface of the optical element is smoothed by applying relative motion between the surface to be processed and the polisher to remove minute undulations present on the surface to be processed. Polishing method.
JP22658798A 1998-07-28 1998-07-28 Polishing tool, and polishing work method using the tool Pending JP2000042902A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22658798A JP2000042902A (en) 1998-07-28 1998-07-28 Polishing tool, and polishing work method using the tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22658798A JP2000042902A (en) 1998-07-28 1998-07-28 Polishing tool, and polishing work method using the tool

Publications (1)

Publication Number Publication Date
JP2000042902A true JP2000042902A (en) 2000-02-15

Family

ID=16847525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22658798A Pending JP2000042902A (en) 1998-07-28 1998-07-28 Polishing tool, and polishing work method using the tool

Country Status (1)

Country Link
JP (1) JP2000042902A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005144621A (en) * 2003-11-18 2005-06-09 Soc Europeenne De Systemes Optiques Finish grinding method
CN107971875A (en) * 2017-11-24 2018-05-01 中国建筑材料科学研究总院有限公司 A kind of multilayer polishing glue and its preparation method and application

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005144621A (en) * 2003-11-18 2005-06-09 Soc Europeenne De Systemes Optiques Finish grinding method
CN107971875A (en) * 2017-11-24 2018-05-01 中国建筑材料科学研究总院有限公司 A kind of multilayer polishing glue and its preparation method and application
CN107971875B (en) * 2017-11-24 2019-09-06 中国建筑材料科学研究总院有限公司 A kind of multilayer polishing glue and its preparation method and application

Similar Documents

Publication Publication Date Title
JP5166037B2 (en) Grinding wheel
TWI683785B (en) Rectangular substrate for imprint lithography and making method
JPH0426982B2 (en)
KR100692357B1 (en) Method and apparatus for leveling process and manufacturing method for semiconductor device
JPH0569310A (en) Device for grinding mirror surface of wafer
JP6252098B2 (en) Square mold substrate
KR20040031071A (en) Grinding work holding disk, work grinding device and grinding method
TW200300053A (en) Method of polishing wafer and polishing pad for polishing wafer
US7137866B2 (en) Polishing apparatus and method for producing semiconductors using the apparatus
JP2000042902A (en) Polishing tool, and polishing work method using the tool
JP2016046326A (en) Method for manufacturing structure for mold manufacturing, and method for manufacturing mold
WO2000025981A1 (en) Unpolished work holding board and production method thereof and work polishing method and device
JPH10217076A (en) Work method of disk substrate, work device and outer peripheral blade grinding wheel used in this work method
JPH11333677A (en) Polishing device for substrate
US7166013B2 (en) Polishing apparatus and method for producing semiconductors using the apparatus
JP2001310330A (en) Mold and molding thereof
JPH09180389A (en) Magnetic head slider production device and magnetic head slider production
JPH08107093A (en) Working method for semiconductor substrate
US7175515B2 (en) Static pad conditioner
JP3467483B2 (en) Fixed abrasive structure for precision polishing
JP2968443B2 (en) Method for measuring polishing accuracy of semiconductor wafer
JPH08174395A (en) Manufacture of high flat glass base plate
JP3137359B2 (en) Wrapping actuator
JP2000354944A (en) Convex spherical surface polishing method of ferrule for optical connector
JPH1148128A (en) Polishing pad, polishing method for plate-like material using same

Legal Events

Date Code Title Description
RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20040720