JP2000009405A - Method and instrument for measuring interval between parallel flat plates - Google Patents

Method and instrument for measuring interval between parallel flat plates

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Publication number
JP2000009405A
JP2000009405A JP17870598A JP17870598A JP2000009405A JP 2000009405 A JP2000009405 A JP 2000009405A JP 17870598 A JP17870598 A JP 17870598A JP 17870598 A JP17870598 A JP 17870598A JP 2000009405 A JP2000009405 A JP 2000009405A
Authority
JP
Japan
Prior art keywords
parallel
rotation
interval
tip
rotation angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP17870598A
Other languages
Japanese (ja)
Inventor
Motonari Takebayashi
基成 竹林
Atsuhiko Suda
敦彦 須田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Electric Corp
Original Assignee
Kokusai Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Electric Corp filed Critical Kokusai Electric Corp
Priority to JP17870598A priority Critical patent/JP2000009405A/en
Publication of JP2000009405A publication Critical patent/JP2000009405A/en
Withdrawn legal-status Critical Current

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  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method by which the interval between parallel flat plates can be measured easily through such a simple operation as rotation. SOLUTION: In the method for measuring the interval between parallel flat plates, the interval between parallel flat plates is measured in such a way that a bar-like pipe having a prescribed length is rotated around a fixed center of rotation so that the radius of gyration of the front end of the piece may become constant (L) and the angles of rotation (θ1 and θ2) of the front end of the piece until the front end comes into contact with the lower surface of the upper flat plate and the uppers surface of the lower flat plate (e.g. the upper electrode 4 and the lower electrode 5) from a horizontal state are detected. Then the interval between the flat plates is measured based on the detected angles of rotation.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、平行平板間隔測
定方法及びその測定器具に関し、例えば、プラズマ処理
装置の対向して設置された平行平板電極の間隔を測定す
るための電極間隔測定方法及びその測定器具に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring the distance between parallel plates and a measuring instrument therefor. It relates to a measuring instrument.

【0002】[0002]

【従来の技術】従来の電極間隔測定器具の一例として、
平行平板型プラズマCVD装置に使用されている電極間
隔測定器具について説明する。図6は、電極間隔測定器
具を示す斜視図、図7はその測定方法を示す説明図であ
る。電極間隔測定器具6は、図6に示されるように中央
に貫通穴1aを有する短円柱状の土台1と、この貫通穴
1aを挿通自在に挿入されたピン2と、このピン2を任
意の位置で固定保持するピン止めネジ3から構成されて
いる。
2. Description of the Related Art As an example of a conventional electrode spacing measuring instrument,
An electrode spacing measuring instrument used in a parallel plate type plasma CVD apparatus will be described. FIG. 6 is a perspective view showing an electrode spacing measuring instrument, and FIG. 7 is an explanatory view showing a measuring method thereof. As shown in FIG. 6, the electrode gap measuring instrument 6 has a short columnar base 1 having a through hole 1a in the center, a pin 2 inserted through the through hole 1a, and an arbitrary pin 2. It is composed of a pin fixing screw 3 fixedly held at a position.

【0003】以上の電極間隔測定器具による測定方法
は、以下の通りである。なお、ここでは、プラズマ処理
装置の反応室7内に設けられた平行平板間隔である上電
極4と下電極5との間の距離(図7(b)の状態の距
離)を測定する場合について説明する。
[0003] The measuring method using the above-mentioned electrode spacing measuring instrument is as follows. Here, the case where the distance between the upper electrode 4 and the lower electrode 5 (the distance in the state of FIG. 7B), which is the distance between the parallel plates provided in the reaction chamber 7 of the plasma processing apparatus, is measured. explain.

【0004】(1)まず、器具6を対向した電極4、5
の間に置く(図7(a))。 (2)下電極5を上昇させ、器具のピン2を押し下げ
る。(図7(b))。 (3)下電極5を下降させる。器具のピン2は押し下げ
られたままの状態なので、器具を取り出し、ピン2の頭
から土台1の底面1bまでをノギスで測定すると、図7
(b)での電極間隔が測定できる。
(1) First, the electrodes 4, 5 facing the instrument 6
(FIG. 7A). (2) Raise the lower electrode 5 and push down the pin 2 of the instrument. (FIG. 7 (b)). (3) Lower electrode 5 is lowered. Since the pin 2 of the device is kept pressed down, the device is taken out, and the distance from the head of the pin 2 to the bottom surface 1b of the base 1 is measured with a caliper.
The electrode spacing in (b) can be measured.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、従来の
電極間隔測定器具は、以下のような問題点を有する。 (1)反応室7内が高温のとき、高温に耐える材質で器
具を作成しなければならない。さらに器具6を取り出す
とき、高温になっているため危険である。 (2)器具6が安定した状態で置かれなければならない
(段差があると正確に測定できない)。 (3)器具6の土台1の高さによっては、狭い間隔が測
定できない。すなわち土台1の高さよりも小さな間隔を
測定することはできない。 (4)反応性ガス雰囲気中は器具6が劣化する。
However, the conventional electrode spacing measuring instrument has the following problems. (1) When the temperature inside the reaction chamber 7 is high, the equipment must be made of a material that can withstand the high temperature. Further, when taking out the device 6, it is dangerous because the temperature is high. (2) The instrument 6 must be placed in a stable state (measurement cannot be made accurately if there is a step). (3) Depending on the height of the base 1 of the instrument 6, a narrow interval cannot be measured. That is, an interval smaller than the height of the base 1 cannot be measured. (4) The instrument 6 deteriorates in a reactive gas atmosphere.

【0006】そこで、この発明の目的は、従来技術の問
題点である(1)〜(4)を解決し、簡便に平行平板の
間隔を測定することのできる電極間隔測定器具を提供す
ることにある。
An object of the present invention is to solve the problems (1) to (4) of the prior art and to provide an electrode spacing measuring instrument capable of easily measuring the spacing between parallel plates. is there.

【0007】[0007]

【課題を解決するための手段】上述した課題を解決する
ため、この発明に係る平行平板間隔測定方法は、平行平
板間で所定長さを有する棒状片(折曲部10a)を、位
置が固定された回転中心に対して、その先端の回転半径
が一定(L)となるように回転せしめ、前記先端が水平
状態から前記平行平板の上下それぞれ(例えば上電極4
と下電極5)の平面に当接するまでの回転角(θ1 、θ
2 )を検出して、検出された回転角に基づいて前記平行
平板間の間隔長さを測定するようにしてなるものであ
る。
In order to solve the above-mentioned problems, a parallel plate interval measuring method according to the present invention is characterized in that a bar-shaped piece (bent portion 10a) having a predetermined length is fixed between parallel plates. With respect to the rotation center thus set, the tip is rotated so that the rotation radius of the tip becomes constant (L).
And the rotation angles (θ 1 , θ) until they contact the plane of the lower electrode 5)
2 ) is detected, and the length of the interval between the parallel plates is measured based on the detected rotation angle.

【0008】先端の回転半径Lの棒状片を電極面と水平
になるように設置し、この棒状片の先端が上電極、下電
極と当接するまでの回転角をそれぞれθ1 、θ2 とする
と平行平板の間隔Hは以下のように求めることができ
る。平行平板間隔 H=L×(sinθ1°+sinθ2
°)
A rod-shaped piece having a rotation radius L at the tip is set so as to be horizontal to the electrode surface, and the rotation angles until the tip of the rod-shaped piece contacts the upper electrode and the lower electrode are θ 1 and θ 2 , respectively. The interval H between the parallel plates can be determined as follows. Parallel plate interval H = L × (sin θ 1 ° + sin θ 2
°)

【0009】また、この発明に係る平行平板間隔測定器
具は、柄部10bと、該柄部10bに対して先端が折曲
げられてなる折曲部10aと、前記柄部10bを支持す
るための棒状支持部10cとを備え、前記折曲部10a
は平行平板間に平行(水平)になるよう挿入され、前記
棒状支持部10cは前記平行平板間近傍に軸回転可能に
支持され、前記棒状支持部10cを軸回転させることに
より、前記折曲部10a先端を前記軸に対する垂直平面
内の一定の回転半径上で回転させるようにしてなる平行
平板間隔測定器具であって、前記折曲部10a先端が水
平状態から前記平行平板の上下それぞれの平面に当接す
るまでの回転角θ1 、θ2 を、前記棒状支持部の軸回転
角度を検出することにより検出して、この検出された回
転角に基づいて前記平行平板間の長さを測定するように
してなるものである。
Further, the parallel plate spacing measuring instrument according to the present invention has a handle 10b, a bent portion 10a having a tip bent with respect to the handle 10b, and a support for supporting the handle 10b. A rod-shaped support portion 10c;
Is inserted between the parallel plates so as to be parallel (horizontal), and the rod-shaped support portion 10c is rotatably supported in the vicinity of the parallel plates. A parallel plate interval measuring instrument configured to rotate a tip of a 10a on a constant radius of rotation in a plane perpendicular to the axis, wherein the bent portion 10a is moved from a horizontal state to upper and lower planes of the parallel plate. Rotation angles θ 1 and θ 2 until contact are detected by detecting a shaft rotation angle of the rod-shaped support portion, and a length between the parallel plates is measured based on the detected rotation angle. It becomes something.

【0010】なお、実施の形態においては、かかる平行
平板間隔測定器具10と、棒状支持部10cの回転角度
を検出する角度検出部(歯車止め24、歯車(大)2
1、歯車(小)22、ポテンショメータ23)とを備え
た平行平板間隔測定装置として示されている。また、平
行平板間隔測定器具10の棒状支持部10cはその内部
に冷却用のパイプ9が設けられ、このパイプ9内に冷却
水が循環される。
In the embodiment, the parallel plate interval measuring instrument 10 and an angle detecting section (gear stopper 24, gear (large) 2) for detecting a rotation angle of the rod-shaped support section 10c are provided.
1, a gear (small) 22 and a potentiometer 23). Further, a cooling pipe 9 is provided inside the rod-shaped support portion 10c of the parallel plate interval measuring instrument 10, and cooling water is circulated in the pipe 9.

【0011】[0011]

【発明の実施の形態】以下、この発明の実施の形態とし
て、この発明を平行平板型プラズマCVD装置に適用し
た場合に例にとり、図を用いて説明する。図1は器具を
示す平面図(a)、側面図(b)である。この器具10
は図1に示すように、先端がL型に90度に折り曲げら
れたアルミ棒に、冷却用のパイプ9を取り付けただけの
簡単な構造である。器具10は長さLを有する折曲部1
0aと、折曲部10aに続く柄部10bと、柄部10b
に続く棒状支持部10cとからなり、この棒状支持部1
0cに冷却用のパイプ9が挿入されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described with reference to the drawings, taking an example in which the present invention is applied to a parallel plate type plasma CVD apparatus. FIG. 1 is a plan view (a) and a side view (b) showing an instrument. This instrument 10
1 has a simple structure in which a cooling pipe 9 is attached to an aluminum rod whose tip is bent at 90 degrees in an L-shape, as shown in FIG. The device 10 has a bent portion 1 having a length L.
0a, a handle 10b following the bent portion 10a, and a handle 10b
And a rod-shaped support portion 10c following the
A cooling pipe 9 is inserted into 0c.

【0012】図2はこの器具の反応室への取付け、使用
方法を示す図である。反応室7側壁7aに穴7bを設け
ると共に、フランジ11及びフランジ12を取り付け
る。このフランジ11、12にはそれぞれ穴11a,1
2aを設け、この穴11a,12aより器具10を棒状
支持部10cの中間まで挿入する。器具10はこれら穴
に回転可能に支持される。フランジ12の穴12aの周
縁及びこの穴12aに挿入支持されるアルミ棒の所定箇
所には、折曲部が上下両極間で水平となっていることが
分かるようにマーカが設けられ、あるいは後述するよう
なポテンショメータが設けられている。また、側壁7a
とフランジ11との間、フランジ11とフランジ12の
間、及びフランジ12と器具の棒状支持部10cとの間
にはシール用のOリング13、14、及び15を設けて
いる。
FIG. 2 is a view showing how this device is attached to a reaction chamber and how to use it. A hole 7b is provided in the side wall 7a of the reaction chamber 7, and a flange 11 and a flange 12 are attached. The flanges 11 and 12 have holes 11a and 1 respectively.
2a is provided, and the device 10 is inserted through the holes 11a and 12a to the middle of the rod-shaped support portion 10c. The device 10 is rotatably supported in these holes. Markers are provided at the periphery of the hole 12a of the flange 12 and at a predetermined position of the aluminum rod inserted and supported in the hole 12a so that the bent portion can be seen to be horizontal between the upper and lower poles, or described later. Such a potentiometer is provided. Also, the side wall 7a
O-rings 13, 14, and 15 for sealing are provided between the flange 11 and the flange 11, between the flange 11 and the flange 12, and between the flange 12 and the rod-shaped support portion 10c of the instrument.

【0013】棒状支持部10cの端部より棒状支持部1
0c内に挿入されるパイプ9内には冷却水が循環され、
反応室内が高温の場合にも、器具が高温となるのを防止
しすることで測定可能とされている。
From the end of the rod-shaped support 10c, the rod-shaped support 1
Cooling water is circulated in the pipe 9 inserted in the
Even when the temperature in the reaction chamber is high, the measurement can be performed by preventing the temperature of the apparatus from becoming high.

【0014】以下、図3を用いて電極間の測定方法を示
す。 (1)器具10を折曲部10aが水平となるように取り
付けた後、この器具10を回転させて、上電極4と接触
させる。この接触したところを基準とする。 (2)間隔測定器具10を回転させ、折曲部10aの先
端を上,下電極4,5と接触させる。このとき、間隔測
定器具10が上,下電極4,5に当接するまでに回転し
た角度θ1 、θ2 を記録する。 (3)間隔測定器具10のL部の長さをL(mm)とす
ると、電極間隔は以下のように求まる。 (4)なお、以上の操作を器具10の挿入量、すなわち
棒状支持部10cの支持位置を変えながら行うことによ
り複数箇所の電極間隔を測定でき、線上における間隔長
さの分布状態を知ることができる。
Hereinafter, a measuring method between the electrodes will be described with reference to FIG. (1) After mounting the device 10 so that the bent portion 10 a is horizontal, the device 10 is rotated to make contact with the upper electrode 4. This contact point is used as a reference. (2) The interval measuring instrument 10 is rotated, and the tip of the bent portion 10a is brought into contact with the upper and lower electrodes 4 and 5. At this time, the angles θ 1 and θ 2 rotated until the interval measuring instrument 10 comes into contact with the upper and lower electrodes 4 and 5 are recorded. (3) Assuming that the length of the L portion of the interval measuring instrument 10 is L (mm), the electrode interval is obtained as follows. (4) By performing the above operation while changing the insertion amount of the tool 10, that is, changing the support position of the rod-shaped support portion 10c, it is possible to measure a plurality of electrode intervals, and to know the distribution of the interval length on the line. it can.

【0015】 電極間隔=L×(sinθ1°+sinθ2°)Electrode spacing = L × (sin θ 1 ° + sin θ 2 °)

【0016】上述した回転角度θ1 、θ2 の検出につい
て、高精度が必要な場合の角度検出方法について、図4
を用いて説明する。図4のように、間隔測定器具10に
歯車(大)21を歯車止め24を用いて固定する。この
歯車21に歯車(小)22を歯合させ、この歯車22に
ポテンショメータ23を取付け、間隔測定器具10の回
転を歯車21、22を通してポテンショメータ23に伝
えるようにする。
FIG. 4 shows a method of detecting the rotation angles θ 1 and θ 2 when high accuracy is required.
This will be described with reference to FIG. As shown in FIG. 4, a gear (large) 21 is fixed to the distance measuring instrument 10 using a gear stopper 24. A gear (small) 22 is meshed with the gear 21 and a potentiometer 23 is attached to the gear 22 so that the rotation of the interval measuring instrument 10 is transmitted to the potentiometer 23 through the gears 21 and 22.

【0017】このような構成において、ポテンショメー
タ23が回転すると、出力される電圧が変化する。つま
り、間隔測定器具10の回転角度が、ポテンショメータ
23の出力電圧変化として測定できるので、精密に回転
角度が分かる。
In such a configuration, when the potentiometer 23 rotates, the output voltage changes. That is, since the rotation angle of the interval measuring instrument 10 can be measured as a change in the output voltage of the potentiometer 23, the rotation angle can be accurately determined.

【0018】器具10の材質としては、ガスによる劣化
を防ぐ材質として、例えばアルミを用いたが、Si
4 ,N2 O,N2 ,C2 6 ,O2 ガスをプロセスで
用いる場合は、器具の材質アルミにアルマイト処理をす
る。以上のように平行平板プラズマCVD装置の電極間
隔を反応室外から間隔測定器具10を回転させ、その回
転角度より算出できる。
As a material of the device 10, for example, aluminum was used as a material for preventing deterioration due to gas.
When H 4 , N 2 O, N 2 , C 2 F 6 , or O 2 gas is used in the process, the aluminum material of the fixture is subjected to alumite treatment. As described above, the electrode interval of the parallel plate plasma CVD apparatus can be calculated from the rotation angle by rotating the interval measuring instrument 10 from outside the reaction chamber.

【0019】図5は上述した平行平板間隔測定器具10
A,10B,10Cを例えば3個用いて平行平板の平行
度、平行平板間隔の分布状態を測定する形態を示したも
のである。この場合、各器具10A,10B,10C
は、それぞれ反応室7の側壁7aに取り付けられたフラ
ンジ11Aと、このフランジ11Aに対して取り付けら
れた、フランジ12A,12B,12Cそれぞれに取り
付けられる。この場合も、図1に対応する適所が、それ
ぞれOリング13A,14A〜14C,15A〜15C
によりシールされる。そして、各器具10A,10B,
10Cをその長さ方向に移動させつつ、各位置で平板間
隔を測定することで、平行平板の平行度、平行平板間隔
の分布状態を測定ようにしたものである。
FIG. 5 shows a parallel plate distance measuring instrument 10 described above.
This figure shows an embodiment in which the parallelism of parallel plates and the distribution of parallel plate intervals are measured using, for example, three A, 10B and 10C. In this case, each device 10A, 10B, 10C
Are attached to the flange 11A attached to the side wall 7a of the reaction chamber 7 and the flanges 12A, 12B, 12C attached to the flange 11A. Also in this case, the appropriate places corresponding to FIG. 1 are O-rings 13A, 14A to 14C, and 15A to 15C, respectively.
Sealed by And each appliance 10A, 10B,
The parallelism of the parallel plates and the distribution state of the parallel plate intervals are measured by measuring the plate interval at each position while moving 10C in the length direction.

【0020】[0020]

【発明の効果】以上の説明より明らかなように、この発
明に係る平行平板間隔測定方法は、平行平板間で所定長
さを有する棒状片を、位置が固定されれた回転中心に対
して、その先端の回転半径が一定となるように回転せし
め、前記先端が前記平行平板の一方の平面から他方の平
面に当接するまでの回転角を検出して、検出された回転
角に基づいて前記平行平板間の長さを測定するようにし
たため、また、この発明に係る平行平板間隔測定器具
は、柄部と、該柄部に対して先端が折曲げられてなる折
曲部と、前記柄部を支持するための棒状支持部とを備
え、前記折曲部は平行平板間に挿入され、前記支持部は
前記平行平板間近傍に軸回転可能に支持され、前記棒状
支持部を軸回転させることにより、前記折曲部先端を前
記軸に対する垂直平面内の一定の回転半径上で回転させ
るようにしてなり、前記折曲部先端が前記平行平板の一
方の平面から他方の平面に当接するまでの回転角を、前
記支持部の軸回転角度を検出することにより検出して、
この検出された回転角に基づいて前記平行平板間の長さ
を測定するようにしてなるため、間隔測定器具を平行平
板間に挿入し、回転させるという簡単な操作により、平
行平板間隔を測定でき、もって、取り扱い、使用方法が
簡単で、容易に平行平板間隔を測定することができると
いう効果を奏する。
As is apparent from the above description, the method for measuring the interval between parallel plates according to the present invention uses the rod-shaped piece having a predetermined length between the parallel plates with respect to the rotation center whose position is fixed. The tip is rotated so that the rotation radius of the tip is constant, the rotation angle from when the tip abuts on one plane of the parallel plate to the other plane is detected, and the parallelism is determined based on the detected rotation angle. Since the length between the flat plates is measured, the parallel plate interval measuring instrument according to the present invention further comprises a handle, a bent portion having a tip bent with respect to the handle, and the handle. A rod-shaped support portion for supporting the rod-shaped support portion, wherein the bent portion is inserted between the parallel plates, and the support portion is rotatably supported in the vicinity of the space between the parallel plates, and rotates the rod-shaped support portion. Thereby, the tip of the bent portion is perpendicular to the axis. The rotation angle from the one flat surface of the parallel plate to the other flat plate is detected by detecting the rotation angle of the support portion. By detecting
Since the length between the parallel plates is measured based on the detected rotation angle, the interval between the parallel plates can be measured by a simple operation of inserting the interval measuring instrument between the parallel plates and rotating. Thus, there is an effect that the handling and use method is simple, and the interval between the parallel plates can be easily measured.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の実施の形態における平行平板間隔測
定器具を示す平面図(a)、側面図(b)である。
FIG. 1 is a plan view (a) and a side view (b) showing a parallel plate spacing measuring instrument according to an embodiment of the present invention.

【図2】平行平板間隔測定器具の取付状態を示す平面図
である。
FIG. 2 is a plan view showing an attached state of a parallel plate interval measuring instrument.

【図3】間隔測定の原理を示す説明図である。FIG. 3 is an explanatory diagram showing the principle of interval measurement.

【図4】高精度な回転角度測定の一例を示す側面図であ
る。
FIG. 4 is a side view showing an example of highly accurate rotation angle measurement.

【図5】平行平板間隔の分布状態測定を示す平面図であ
る。
FIG. 5 is a plan view showing distribution state measurement of a parallel plate interval.

【図6】従来の平行平板間隔測定器具を示す斜視図であ
る。
FIG. 6 is a perspective view showing a conventional parallel plate spacing measuring instrument.

【図7】従来の平行平板間隔測定方法を示す説明図であ
る。
FIG. 7 is an explanatory view showing a conventional parallel plate interval measuring method.

【符号の説明】[Explanation of symbols]

4 上電極 5 下電極 7 反応室 9 パイプ 10 平行平板間隔測定器具 10a 折曲部 10b 柄部 10c 棒状支持部 Reference Signs List 4 upper electrode 5 lower electrode 7 reaction chamber 9 pipe 10 parallel plate interval measuring instrument 10a bent portion 10b handle portion 10c rod-shaped support portion

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 平行平板間で所定長さを有する棒状片
を、位置が固定された回転中心に対して、その先端の回
転半径が一定となるように回転せしめ、前記先端が前記
平行平板の一方の平面から他方の平面に当接するまでの
回転角を検出して、検出された回転角に基づいて前記平
行平板間の長さを測定するようにしてなる平行平板間隔
測定方法。
1. A bar-shaped piece having a predetermined length between parallel flat plates is rotated with respect to a rotation center having a fixed position so that a rotation radius at a tip thereof is constant, and the tip is formed of the parallel plate. A parallel plate interval measuring method, wherein a rotation angle from one plane to contact with the other plane is detected, and the length between the parallel plates is measured based on the detected rotation angle.
【請求項2】 柄部と、該柄部に対して先端が折曲げら
れてなる折曲部と、前記柄部を支持するための棒状支持
部とを備え、前記折曲部は平行平板間に挿入され、前記
支持部は前記平行平板間近傍に軸回転可能に支持され、
前記棒状支持部を軸回転させることにより、前記折曲部
先端を前記軸に対する垂直平面内の一定の回転半径上で
回転させるようにしてなる平行平板間回転部隔測定器具
であって、 前記折曲部先端が前記平行平板の一方の平面から他方の
平面に当接するまでの回転角を、前記支持部の軸回転角
度を検出することにより検出して、この検出された回転
角に基づいて前記平行平板間の長さを測定するようにし
てなる平行平板間隔測定器具。
2. A handle portion, a bent portion having a tip bent with respect to the handle portion, and a rod-shaped support portion for supporting the handle portion, wherein the bent portion is formed between parallel flat plates. The support portion is supported rotatably in the vicinity of between the parallel plates,
An instrument for measuring a rotation distance between parallel plates, wherein the tip of the bent part is rotated on a constant radius of rotation in a plane perpendicular to the axis by rotating the rod-shaped support part. The rotation angle until the tip of the curved portion abuts from one plane to the other plane of the parallel plate is detected by detecting the axis rotation angle of the support section, and based on the detected rotation angle, A parallel plate spacing measuring instrument for measuring the length between parallel plates.
JP17870598A 1998-06-25 1998-06-25 Method and instrument for measuring interval between parallel flat plates Withdrawn JP2000009405A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17870598A JP2000009405A (en) 1998-06-25 1998-06-25 Method and instrument for measuring interval between parallel flat plates

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17870598A JP2000009405A (en) 1998-06-25 1998-06-25 Method and instrument for measuring interval between parallel flat plates

Publications (1)

Publication Number Publication Date
JP2000009405A true JP2000009405A (en) 2000-01-14

Family

ID=16053129

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17870598A Withdrawn JP2000009405A (en) 1998-06-25 1998-06-25 Method and instrument for measuring interval between parallel flat plates

Country Status (1)

Country Link
JP (1) JP2000009405A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017087186A (en) * 2015-11-16 2017-05-25 株式会社Screenホールディングス Coating device, manufacturing apparatus and measuring method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017087186A (en) * 2015-11-16 2017-05-25 株式会社Screenホールディングス Coating device, manufacturing apparatus and measuring method
WO2017086078A1 (en) * 2015-11-16 2017-05-26 株式会社Screenホールディングス Coating device, manufacturing device, and measurement method

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