ITMI20032056A1 - METHOD FOR DETECTING SLIGHTLY DISTINGUISHABLE THIN COATINGS. - Google Patents

METHOD FOR DETECTING SLIGHTLY DISTINGUISHABLE THIN COATINGS.

Info

Publication number
ITMI20032056A1
ITMI20032056A1 ITMI20032056A ITMI20032056A1 IT MI20032056 A1 ITMI20032056 A1 IT MI20032056A1 IT MI20032056 A ITMI20032056 A IT MI20032056A IT MI20032056 A1 ITMI20032056 A1 IT MI20032056A1
Authority
IT
Italy
Prior art keywords
thin coatings
slightly distinguishable
detecting
detecting slightly
distinguishable thin
Prior art date
Application number
Other languages
Italian (it)
Inventor
Michel Pichon
Original Assignee
Saint Gobain Vitrage S A Ora Saint Gobain Glass
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain Vitrage S A Ora Saint Gobain Glass filed Critical Saint Gobain Vitrage S A Ora Saint Gobain Glass
Publication of ITMI20032056A1 publication Critical patent/ITMI20032056A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
ITMI20032056 2002-10-23 2003-10-22 METHOD FOR DETECTING SLIGHTLY DISTINGUISHABLE THIN COATINGS. ITMI20032056A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0213200A FR2846421B1 (en) 2002-10-23 2002-10-23 METHOD FOR DETECTING VERY LOW VISIBLE THIN FILMS

Publications (1)

Publication Number Publication Date
ITMI20032056A1 true ITMI20032056A1 (en) 2004-04-24

Family

ID=29559190

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI20032056 ITMI20032056A1 (en) 2002-10-23 2003-10-22 METHOD FOR DETECTING SLIGHTLY DISTINGUISHABLE THIN COATINGS.

Country Status (7)

Country Link
AT (1) AT413154B (en)
BE (1) BE1015745A3 (en)
DE (2) DE10349169B4 (en)
ES (1) ES2219190B2 (en)
FR (1) FR2846421B1 (en)
GB (1) GB2398119B (en)
IT (1) ITMI20032056A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004037555B4 (en) * 2004-08-03 2012-09-06 Erlus Aktiengesellschaft Method for non-contact and / or non-destructive testing of a photocatalytic surface coating

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4284356A (en) * 1979-09-26 1981-08-18 Ppg Industries, Inc. Method of and apparatus for comparing surface reflectivity
US4591271A (en) * 1983-03-21 1986-05-27 Byers Donald W Method and apparatus for coating detection and surface evaluation
US5391891A (en) * 1990-02-28 1995-02-21 Leopold Kostal Gmbh & Co. Kg Moisture sensing device
US5196906A (en) * 1990-06-29 1993-03-23 Tma Technologies, Inc. Modular scatterometer with interchangeable scanning heads
JPH08233532A (en) * 1995-02-27 1996-09-13 Suinku:Kk Inspection of transparent electrode
US5966214A (en) * 1998-05-12 1999-10-12 Electronic Design To Market, Inc. Gauge for measuring glass thickness and glass pane spacing
WO2000071971A1 (en) * 1999-05-24 2000-11-30 Luxtron Corporation Optical techniques for measuring layer thicknesses
US6683695B1 (en) * 1999-07-21 2004-01-27 Electronic Design To Market, Inc. Method and apparatus for detecting properties of reflective transparent surface coatings on a sheet of transparent material
JP3852557B2 (en) * 2000-09-08 2006-11-29 オムロン株式会社 Film thickness measuring method and film thickness sensor using the method
AT410257B (en) * 2000-10-23 2003-03-25 Mte Innovative Measurement Sol DEVICE FOR CHECKING AND CHECKING A SINGLE GLASS PANEL OR INSULATING GLASS ELEMENT

Also Published As

Publication number Publication date
BE1015745A3 (en) 2005-08-02
IE20030776A1 (en) 2004-05-05
FR2846421B1 (en) 2004-12-17
DE10349169A1 (en) 2004-05-06
FR2846421A1 (en) 2004-04-30
DE20316224U1 (en) 2004-03-04
GB2398119A (en) 2004-08-11
GB2398119B (en) 2006-04-19
ES2219190B2 (en) 2005-12-16
GB0324462D0 (en) 2003-11-19
DE10349169B4 (en) 2008-05-21
ES2219190A1 (en) 2004-11-16
AT413154B (en) 2005-11-15
ATA16902003A (en) 2005-04-15

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