GB2398119B - Method of detecting very barely discernible thin coatings - Google Patents

Method of detecting very barely discernible thin coatings

Info

Publication number
GB2398119B
GB2398119B GB0324462A GB0324462A GB2398119B GB 2398119 B GB2398119 B GB 2398119B GB 0324462 A GB0324462 A GB 0324462A GB 0324462 A GB0324462 A GB 0324462A GB 2398119 B GB2398119 B GB 2398119B
Authority
GB
United Kingdom
Prior art keywords
detecting
thin coatings
barely discernible
discernible thin
barely
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0324462A
Other versions
GB0324462D0 (en
GB2398119A (en
Inventor
Michel Pichon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Saint Gobain Glass France SAS
Compagnie de Saint Gobain SA
Original Assignee
Saint Gobain Glass France SAS
Compagnie de Saint Gobain SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain Glass France SAS, Compagnie de Saint Gobain SA filed Critical Saint Gobain Glass France SAS
Publication of GB0324462D0 publication Critical patent/GB0324462D0/en
Publication of GB2398119A publication Critical patent/GB2398119A/en
Application granted granted Critical
Publication of GB2398119B publication Critical patent/GB2398119B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Surface Treatment Of Glass (AREA)
GB0324462A 2002-10-23 2003-10-21 Method of detecting very barely discernible thin coatings Expired - Fee Related GB2398119B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0213200A FR2846421B1 (en) 2002-10-23 2002-10-23 METHOD FOR DETECTING VERY LOW VISIBLE THIN FILMS

Publications (3)

Publication Number Publication Date
GB0324462D0 GB0324462D0 (en) 2003-11-19
GB2398119A GB2398119A (en) 2004-08-11
GB2398119B true GB2398119B (en) 2006-04-19

Family

ID=29559190

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0324462A Expired - Fee Related GB2398119B (en) 2002-10-23 2003-10-21 Method of detecting very barely discernible thin coatings

Country Status (7)

Country Link
AT (1) AT413154B (en)
BE (1) BE1015745A3 (en)
DE (2) DE10349169B4 (en)
ES (1) ES2219190B2 (en)
FR (1) FR2846421B1 (en)
GB (1) GB2398119B (en)
IT (1) ITMI20032056A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004037555B4 (en) * 2004-08-03 2012-09-06 Erlus Aktiengesellschaft Method for non-contact and / or non-destructive testing of a photocatalytic surface coating

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5196906A (en) * 1990-06-29 1993-03-23 Tma Technologies, Inc. Modular scatterometer with interchangeable scanning heads
US5391891A (en) * 1990-02-28 1995-02-21 Leopold Kostal Gmbh & Co. Kg Moisture sensing device
JPH08233532A (en) * 1995-02-27 1996-09-13 Suinku:Kk Inspection of transparent electrode
US5966214A (en) * 1998-05-12 1999-10-12 Electronic Design To Market, Inc. Gauge for measuring glass thickness and glass pane spacing
WO2000071971A1 (en) * 1999-05-24 2000-11-30 Luxtron Corporation Optical techniques for measuring layer thicknesses
WO2001007882A1 (en) * 1999-07-21 2001-02-01 Electronic Design To Market, Inc. Method and apparatus for detecting properties of reflective transparent surface coatings on a sheet of transparent material
JP2002081916A (en) * 2000-09-08 2002-03-22 Omron Corp Film thickness measuring method and film thickness sensor using the same
WO2002035181A1 (en) * 2000-10-23 2002-05-02 Sensor-Tech Messtechnik Gmbh Device for inspecting and testing a single glass pane, an insulating glass element or a laminated glass

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4284356A (en) * 1979-09-26 1981-08-18 Ppg Industries, Inc. Method of and apparatus for comparing surface reflectivity
US4591271A (en) * 1983-03-21 1986-05-27 Byers Donald W Method and apparatus for coating detection and surface evaluation

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5391891A (en) * 1990-02-28 1995-02-21 Leopold Kostal Gmbh & Co. Kg Moisture sensing device
US5196906A (en) * 1990-06-29 1993-03-23 Tma Technologies, Inc. Modular scatterometer with interchangeable scanning heads
JPH08233532A (en) * 1995-02-27 1996-09-13 Suinku:Kk Inspection of transparent electrode
US5966214A (en) * 1998-05-12 1999-10-12 Electronic Design To Market, Inc. Gauge for measuring glass thickness and glass pane spacing
WO2000071971A1 (en) * 1999-05-24 2000-11-30 Luxtron Corporation Optical techniques for measuring layer thicknesses
WO2001007882A1 (en) * 1999-07-21 2001-02-01 Electronic Design To Market, Inc. Method and apparatus for detecting properties of reflective transparent surface coatings on a sheet of transparent material
JP2002081916A (en) * 2000-09-08 2002-03-22 Omron Corp Film thickness measuring method and film thickness sensor using the same
WO2002035181A1 (en) * 2000-10-23 2002-05-02 Sensor-Tech Messtechnik Gmbh Device for inspecting and testing a single glass pane, an insulating glass element or a laminated glass

Also Published As

Publication number Publication date
ES2219190B2 (en) 2005-12-16
DE10349169B4 (en) 2008-05-21
GB0324462D0 (en) 2003-11-19
AT413154B (en) 2005-11-15
IE20030776A1 (en) 2004-05-05
DE20316224U1 (en) 2004-03-04
BE1015745A3 (en) 2005-08-02
FR2846421A1 (en) 2004-04-30
GB2398119A (en) 2004-08-11
ES2219190A1 (en) 2004-11-16
ATA16902003A (en) 2005-04-15
ITMI20032056A1 (en) 2004-04-24
FR2846421B1 (en) 2004-12-17
DE10349169A1 (en) 2004-05-06

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20081021