IT949932B - Sistema e disposizione per la dia gnosi dei guasti in apparecchi comandati da impulsi elettrici ritmici - Google Patents

Sistema e disposizione per la dia gnosi dei guasti in apparecchi comandati da impulsi elettrici ritmici

Info

Publication number
IT949932B
IT949932B IT21496/72A IT2149672A IT949932B IT 949932 B IT949932 B IT 949932B IT 21496/72 A IT21496/72 A IT 21496/72A IT 2149672 A IT2149672 A IT 2149672A IT 949932 B IT949932 B IT 949932B
Authority
IT
Italy
Prior art keywords
faults
arrangement
electric pulses
devices controlled
gnosis
Prior art date
Application number
IT21496/72A
Other languages
English (en)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19712111493 external-priority patent/DE2111493C3/de
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of IT949932B publication Critical patent/IT949932B/it

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
IT21496/72A 1971-03-10 1972-03-07 Sistema e disposizione per la dia gnosi dei guasti in apparecchi comandati da impulsi elettrici ritmici IT949932B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19712111493 DE2111493C3 (de) 1971-03-10 Verfahren und Anordnung zur Fehlerdiagnose bei taktgesteuerten Geräten

Publications (1)

Publication Number Publication Date
IT949932B true IT949932B (it) 1973-06-11

Family

ID=5801110

Family Applications (1)

Application Number Title Priority Date Filing Date
IT21496/72A IT949932B (it) 1971-03-10 1972-03-07 Sistema e disposizione per la dia gnosi dei guasti in apparecchi comandati da impulsi elettrici ritmici

Country Status (7)

Country Link
US (1) US3814920A (it)
BE (1) BE780518A (it)
FR (1) FR2128290B1 (it)
GB (1) GB1388619A (it)
IT (1) IT949932B (it)
LU (1) LU64920A1 (it)
NL (1) NL164405C (it)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4122995A (en) * 1977-08-02 1978-10-31 Burroughs Corporation Asynchronous digital circuit testing system
US4204114A (en) * 1978-02-24 1980-05-20 Gould Inc. Method and apparatus for comparing logic functions by acquiring signals one at a time from circuit nodes
US4312066A (en) * 1979-12-28 1982-01-19 International Business Machines Corporation Diagnostic/debug machine architecture
US4317412A (en) * 1980-06-25 1982-03-02 International Business Machines Corporation Control system and method for testing print hammers in a high speed printer
US4359771A (en) * 1980-07-25 1982-11-16 Honeywell Information Systems Inc. Method and apparatus for testing and verifying the operation of error control apparatus within a memory
FR2512980B1 (it) * 1981-09-14 1983-12-23 Aero Etudes Conseils
US4564943A (en) * 1983-07-05 1986-01-14 International Business Machines System path stressing
US4779273A (en) * 1984-06-14 1988-10-18 Data General Corporation Apparatus for self-testing a digital logic circuit

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3387276A (en) * 1965-08-13 1968-06-04 Sperry Rand Corp Off-line memory test
US3497685A (en) * 1965-11-03 1970-02-24 Ibm Fault location system
US3453601A (en) * 1966-10-18 1969-07-01 Philco Ford Corp Two speed arithmetic calculator
US3588483A (en) * 1968-03-14 1971-06-28 Robert J Lesniewski Variable digital processor including a register for shifting and rotating bits in either direction
DE1951861A1 (de) * 1968-10-17 1970-08-06 Gen Electric Information Syste Verfahren und Anordnung zur automatischen UEberpruefung von Karten mit gedruckten Schaltungen
FR2054724A5 (it) * 1969-07-24 1971-05-07 Sperry Rand Corp
US3673397A (en) * 1970-10-02 1972-06-27 Singer Co Circuit tester

Also Published As

Publication number Publication date
NL164405C (nl) 1980-12-15
GB1388619A (en) 1975-03-26
BE780518A (fr) 1972-09-11
LU64920A1 (it) 1972-12-07
FR2128290B1 (it) 1974-09-27
NL164405B (nl) 1980-07-15
US3814920A (en) 1974-06-04
DE2111493A1 (de) 1972-09-21
NL7202867A (it) 1972-09-12
DE2111493B2 (de) 1975-06-26
FR2128290A1 (it) 1972-10-20

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