IT201900024946A1 - Testa di misura con un contatto migliorato tra sonde di contatto e fori guida - Google Patents
Testa di misura con un contatto migliorato tra sonde di contatto e fori guidaInfo
- Publication number
- IT201900024946A1 IT201900024946A1 IT102019000024946A IT201900024946A IT201900024946A1 IT 201900024946 A1 IT201900024946 A1 IT 201900024946A1 IT 102019000024946 A IT102019000024946 A IT 102019000024946A IT 201900024946 A IT201900024946 A IT 201900024946A IT 201900024946 A1 IT201900024946 A1 IT 201900024946A1
- Authority
- IT
- Italy
- Prior art keywords
- contact
- guide holes
- probe head
- improved
- probes
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT102019000024946A IT201900024946A1 (it) | 2019-12-20 | 2019-12-20 | Testa di misura con un contatto migliorato tra sonde di contatto e fori guida |
PCT/EP2020/086962 WO2021123120A1 (en) | 2019-12-20 | 2020-12-18 | A testing head with an improved contact between contact probes and guide holes |
JP2022537769A JP2023507475A (ja) | 2019-12-20 | 2020-12-18 | コンタクトプローブとガイド穴との間の改善された接触を備えた試験ヘッド |
KR1020227024760A KR20220116267A (ko) | 2019-12-20 | 2020-12-18 | 콘택 프로브와 가이드 홀 사이의 콘택이 향상된 테스트 헤드 |
US17/783,452 US20230029150A1 (en) | 2019-12-20 | 2020-12-18 | A testing head with an improved contact between contact probes and guide holes |
CN202080088536.7A CN114829951A (zh) | 2019-12-20 | 2020-12-18 | 接触探针和引导孔之间的接触改进型测试头 |
TW109145116A TW202124973A (zh) | 2019-12-20 | 2020-12-18 | 在接觸探針與導孔之間具有改善接觸的測試頭 |
EP20829922.2A EP4078197A1 (en) | 2019-12-20 | 2020-12-18 | A testing head with an improved contact between contact probes and guide holes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT102019000024946A IT201900024946A1 (it) | 2019-12-20 | 2019-12-20 | Testa di misura con un contatto migliorato tra sonde di contatto e fori guida |
Publications (1)
Publication Number | Publication Date |
---|---|
IT201900024946A1 true IT201900024946A1 (it) | 2021-06-20 |
Family
ID=70228511
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT102019000024946A IT201900024946A1 (it) | 2019-12-20 | 2019-12-20 | Testa di misura con un contatto migliorato tra sonde di contatto e fori guida |
Country Status (8)
Country | Link |
---|---|
US (1) | US20230029150A1 (it) |
EP (1) | EP4078197A1 (it) |
JP (1) | JP2023507475A (it) |
KR (1) | KR20220116267A (it) |
CN (1) | CN114829951A (it) |
IT (1) | IT201900024946A1 (it) |
TW (1) | TW202124973A (it) |
WO (1) | WO2021123120A1 (it) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT202000030194A1 (it) * | 2020-12-09 | 2022-06-09 | Technoprobe Spa | Sonda di contatto per teste di misura di dispositivi elettronici e relativa testa di misura |
IT202100032882A1 (it) * | 2021-12-29 | 2023-06-29 | Technoprobe Spa | Sonda di contatto per teste di misura di dispositivi elettronici e relativa testa di misura |
CN116840526B (zh) * | 2023-09-01 | 2023-10-31 | 江苏协和电子股份有限公司 | 一种针头、使用该针头的pcb板检测设备及使用方法 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020048954A1 (en) * | 1998-11-30 | 2002-04-25 | Yu Zhou | Contact structure and production method thereof and probe contact assembly using same |
WO2008100101A1 (en) * | 2007-02-16 | 2008-08-21 | Phicom Corporation | Probe card including a plurality of connectors and method of bonding the connectors to a substrate of the probe card |
US20120295490A1 (en) * | 2011-05-17 | 2012-11-22 | Richard Schneider | Inter-board connection system with compliant flexible pin deformation prevention |
US20140118016A1 (en) * | 2012-10-31 | 2014-05-01 | Formfactor, Inc. | Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide Holes |
EP2924446A1 (en) * | 2014-03-25 | 2015-09-30 | MPI Corporation | Vertical probe device |
WO2016087369A2 (en) * | 2014-12-04 | 2016-06-09 | Technoprobe S.P.A. | Testing head comprising vertical probes |
WO2018108777A1 (en) * | 2016-12-16 | 2018-06-21 | Technoprobe S.P.A. | Probe head for a testing apparatus of electronic devices with enhanced filtering properties |
WO2018108790A1 (en) * | 2016-12-16 | 2018-06-21 | Technoprobe S.P.A. | Testing head having improved frequency properties |
WO2018153963A1 (en) * | 2017-02-24 | 2018-08-30 | Technoprobe S.P.A. | Vertical probe testing head with improved frequency properties |
WO2019091946A1 (en) * | 2017-11-09 | 2019-05-16 | Technoprobe S.P.A. | Contact probe for a testing head for testing high-frequency devices |
-
2019
- 2019-12-20 IT IT102019000024946A patent/IT201900024946A1/it unknown
-
2020
- 2020-12-18 JP JP2022537769A patent/JP2023507475A/ja active Pending
- 2020-12-18 TW TW109145116A patent/TW202124973A/zh unknown
- 2020-12-18 KR KR1020227024760A patent/KR20220116267A/ko active Search and Examination
- 2020-12-18 EP EP20829922.2A patent/EP4078197A1/en active Pending
- 2020-12-18 US US17/783,452 patent/US20230029150A1/en active Pending
- 2020-12-18 CN CN202080088536.7A patent/CN114829951A/zh active Pending
- 2020-12-18 WO PCT/EP2020/086962 patent/WO2021123120A1/en unknown
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020048954A1 (en) * | 1998-11-30 | 2002-04-25 | Yu Zhou | Contact structure and production method thereof and probe contact assembly using same |
WO2008100101A1 (en) * | 2007-02-16 | 2008-08-21 | Phicom Corporation | Probe card including a plurality of connectors and method of bonding the connectors to a substrate of the probe card |
US20120295490A1 (en) * | 2011-05-17 | 2012-11-22 | Richard Schneider | Inter-board connection system with compliant flexible pin deformation prevention |
US20140118016A1 (en) * | 2012-10-31 | 2014-05-01 | Formfactor, Inc. | Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide Holes |
EP2924446A1 (en) * | 2014-03-25 | 2015-09-30 | MPI Corporation | Vertical probe device |
WO2016087369A2 (en) * | 2014-12-04 | 2016-06-09 | Technoprobe S.P.A. | Testing head comprising vertical probes |
WO2018108777A1 (en) * | 2016-12-16 | 2018-06-21 | Technoprobe S.P.A. | Probe head for a testing apparatus of electronic devices with enhanced filtering properties |
WO2018108790A1 (en) * | 2016-12-16 | 2018-06-21 | Technoprobe S.P.A. | Testing head having improved frequency properties |
WO2018153963A1 (en) * | 2017-02-24 | 2018-08-30 | Technoprobe S.P.A. | Vertical probe testing head with improved frequency properties |
WO2019091946A1 (en) * | 2017-11-09 | 2019-05-16 | Technoprobe S.P.A. | Contact probe for a testing head for testing high-frequency devices |
Also Published As
Publication number | Publication date |
---|---|
CN114829951A (zh) | 2022-07-29 |
KR20220116267A (ko) | 2022-08-22 |
JP2023507475A (ja) | 2023-02-22 |
TW202124973A (zh) | 2021-07-01 |
US20230029150A1 (en) | 2023-01-26 |
EP4078197A1 (en) | 2022-10-26 |
WO2021123120A1 (en) | 2021-06-24 |
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