IT1316271B1 - Generatore di impulsi compensato in tensione e temperatura. - Google Patents

Generatore di impulsi compensato in tensione e temperatura.

Info

Publication number
IT1316271B1
IT1316271B1 IT2000RM000700A ITRM20000700A IT1316271B1 IT 1316271 B1 IT1316271 B1 IT 1316271B1 IT 2000RM000700 A IT2000RM000700 A IT 2000RM000700A IT RM20000700 A ITRM20000700 A IT RM20000700A IT 1316271 B1 IT1316271 B1 IT 1316271B1
Authority
IT
Italy
Prior art keywords
voltage
pulse generator
temperature compensated
compensated pulse
temperature
Prior art date
Application number
IT2000RM000700A
Other languages
English (en)
Inventor
Giulio G Marotta
Tomaso Vali
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Priority to IT2000RM000700A priority Critical patent/IT1316271B1/it
Publication of ITRM20000700A0 publication Critical patent/ITRM20000700A0/it
Priority to US10/032,277 priority patent/US6643192B2/en
Publication of ITRM20000700A1 publication Critical patent/ITRM20000700A1/it
Application granted granted Critical
Publication of IT1316271B1 publication Critical patent/IT1316271B1/it
Priority to US10/642,958 priority patent/US6807111B2/en
Priority to US10/703,322 priority patent/US6981237B2/en
Priority to US10/703,880 priority patent/US6949957B2/en
Priority to US10/932,858 priority patent/US6898131B2/en
Priority to US11/288,471 priority patent/US20060077078A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/011—Modifications of generator to compensate for variations in physical values, e.g. voltage, temperature
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/023—Generators characterised by the type of circuit or by the means used for producing pulses by the use of differential amplifiers or comparators, with internal or external positive feedback
    • H03K3/0231—Astable circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K4/00—Generating pulses having essentially a finite slope or stepped portions
    • H03K4/06—Generating pulses having essentially a finite slope or stepped portions having triangular shape
    • H03K4/08—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
    • H03K4/48—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices
    • H03K4/50—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices in which a sawtooth voltage is produced across a capacitor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits
IT2000RM000700A 2000-12-28 2000-12-28 Generatore di impulsi compensato in tensione e temperatura. IT1316271B1 (it)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IT2000RM000700A IT1316271B1 (it) 2000-12-28 2000-12-28 Generatore di impulsi compensato in tensione e temperatura.
US10/032,277 US6643192B2 (en) 2000-12-28 2001-12-21 Voltage and temperature compensated pulse generator
US10/642,958 US6807111B2 (en) 2000-12-28 2003-08-18 Voltage and temperature compensated pulse generator
US10/703,322 US6981237B2 (en) 2000-12-28 2003-11-07 Command user interface with programmable decoder
US10/703,880 US6949957B2 (en) 2000-12-28 2003-11-07 Command user interface with programmable decoder
US10/932,858 US6898131B2 (en) 2000-12-28 2004-09-02 Voltage and temperature compensated pulse generator
US11/288,471 US20060077078A1 (en) 2000-12-28 2005-11-29 Command user interface with programmable decoder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2000RM000700A IT1316271B1 (it) 2000-12-28 2000-12-28 Generatore di impulsi compensato in tensione e temperatura.

Publications (3)

Publication Number Publication Date
ITRM20000700A0 ITRM20000700A0 (it) 2000-12-28
ITRM20000700A1 ITRM20000700A1 (it) 2002-06-28
IT1316271B1 true IT1316271B1 (it) 2003-04-03

Family

ID=11455083

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2000RM000700A IT1316271B1 (it) 2000-12-28 2000-12-28 Generatore di impulsi compensato in tensione e temperatura.

Country Status (2)

Country Link
US (3) US6643192B2 (it)
IT (1) IT1316271B1 (it)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6529421B1 (en) 2001-08-28 2003-03-04 Micron Technology, Inc. SRAM array with temperature-compensated threshold voltage
US6781907B2 (en) 2002-06-06 2004-08-24 Micron Technology, Inc. Temperature compensated T-RAM memory device and method
US6687165B1 (en) * 2002-12-26 2004-02-03 Micron Technology, Inc. Temperature-compensated output buffer circuit
KR100521385B1 (ko) * 2003-12-15 2005-10-12 삼성전자주식회사 고전압 발생 회로 및 그것을 포함한 반도체 메모리 장치
US7116588B2 (en) * 2004-09-01 2006-10-03 Micron Technology, Inc. Low supply voltage temperature compensated reference voltage generator and method
KR100933797B1 (ko) * 2005-12-29 2009-12-24 주식회사 하이닉스반도체 반도체 메모리 소자의 승압전압 레벨 감지기
US7518930B2 (en) * 2006-04-21 2009-04-14 Sandisk Corporation Method for generating and adjusting selected word line voltage
US7269092B1 (en) * 2006-04-21 2007-09-11 Sandisk Corporation Circuitry and device for generating and adjusting selected word line voltage
US7436724B2 (en) * 2006-08-04 2008-10-14 Sandisk Corporation Method and system for independent control of voltage and its temperature co-efficient in non-volatile memory devices
US7447093B2 (en) * 2006-12-29 2008-11-04 Sandisk Corporation Method for controlling voltage in non-volatile memory systems
US7403434B1 (en) * 2006-12-29 2008-07-22 Sandisk Corporation System for controlling voltage in non-volatile memory systems
US8339843B2 (en) * 2010-12-17 2012-12-25 Honeywell International Inc. Generating a temperature-compensated write current for a magnetic memory cell
US8547746B2 (en) 2011-02-24 2013-10-01 Micron Technology, Inc. Voltage generation and adjustment in a memory device
US9368212B1 (en) 2015-03-26 2016-06-14 Micron Technology, Inc. Memory with temperature coefficient trimming
KR102377453B1 (ko) 2015-11-05 2022-03-23 삼성전자주식회사 불 휘발성 메모리 장치 및 그것의 동작 방법

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5545983A (en) * 1992-03-02 1996-08-13 Seiko Epson Corporation Displacement sensor with temperature compensation by combining outputs in a predetermined ratio
US5373227A (en) 1993-03-26 1994-12-13 Micron Semiconductor, Inc. Control circuit responsive to its supply voltage level
JPH0746082A (ja) * 1993-07-30 1995-02-14 Nippondenso Co Ltd フィルタ回路
US5650966A (en) * 1995-11-01 1997-07-22 Advanced Micro Devices, Inc. Temperature compensated reference for overerase correction circuitry in a flash memory
JP3648304B2 (ja) * 1995-11-17 2005-05-18 株式会社東芝 不揮発性半導体記憶装置
US5644538A (en) 1996-03-01 1997-07-01 Micron Technology, Inc. Circuit and method for controllng the duration of pulses in a control signal from an electronic system
US5729169A (en) 1996-07-10 1998-03-17 Micron Quantum Devices, Inc. Controllable one-shot circuit and method for controlling operation of memory circuit using same
US6087876A (en) 1999-01-13 2000-07-11 Analog Devices, Inc. Time delay generator and method
US6163225A (en) * 1999-05-05 2000-12-19 Intel Corporation Method and apparatus for achieving low standby power using a positive temperature correlated clock frequency
JP3954245B2 (ja) * 1999-07-22 2007-08-08 株式会社東芝 電圧発生回路
US6269026B1 (en) * 2000-02-29 2001-07-31 Advanced Micro Devices, Inc. Charge sharing to help boost the wordlines during APDE verify
US6542437B1 (en) * 2000-08-14 2003-04-01 Rui Chen Laser pointer with built-in accessories
US6765372B2 (en) * 2001-12-14 2004-07-20 Intersil Americas Inc. Programmable current-sensing circuit providing continuous temperature compensation for DC-DC Converter

Also Published As

Publication number Publication date
US20050024951A1 (en) 2005-02-03
US6898131B2 (en) 2005-05-24
ITRM20000700A0 (it) 2000-12-28
US20030012058A1 (en) 2003-01-16
US6807111B2 (en) 2004-10-19
ITRM20000700A1 (it) 2002-06-28
US6643192B2 (en) 2003-11-04
US20040037130A1 (en) 2004-02-26

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