IT1313225B1 - Dispositivo di misura di una tensione analogica, in particolare peruna architettura di memoria non volatile, e relativo metodo di misura. - Google Patents
Dispositivo di misura di una tensione analogica, in particolare peruna architettura di memoria non volatile, e relativo metodo di misura.Info
- Publication number
- IT1313225B1 IT1313225B1 IT1999MI001474A ITMI991474A IT1313225B1 IT 1313225 B1 IT1313225 B1 IT 1313225B1 IT 1999MI001474 A IT1999MI001474 A IT 1999MI001474A IT MI991474 A ITMI991474 A IT MI991474A IT 1313225 B1 IT1313225 B1 IT 1313225B1
- Authority
- IT
- Italy
- Prior art keywords
- measurement
- measuring device
- volatile memory
- analog voltage
- related method
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5004—Voltage
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT1999MI001474A IT1313225B1 (it) | 1999-07-02 | 1999-07-02 | Dispositivo di misura di una tensione analogica, in particolare peruna architettura di memoria non volatile, e relativo metodo di misura. |
US09/608,847 US6507183B1 (en) | 1999-07-02 | 2000-06-29 | Method and a device for measuring an analog voltage in a non-volatile memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT1999MI001474A IT1313225B1 (it) | 1999-07-02 | 1999-07-02 | Dispositivo di misura di una tensione analogica, in particolare peruna architettura di memoria non volatile, e relativo metodo di misura. |
Publications (3)
Publication Number | Publication Date |
---|---|
ITMI991474A0 ITMI991474A0 (it) | 1999-07-02 |
ITMI991474A1 ITMI991474A1 (it) | 2001-01-02 |
IT1313225B1 true IT1313225B1 (it) | 2002-06-17 |
Family
ID=11383276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT1999MI001474A IT1313225B1 (it) | 1999-07-02 | 1999-07-02 | Dispositivo di misura di una tensione analogica, in particolare peruna architettura di memoria non volatile, e relativo metodo di misura. |
Country Status (2)
Country | Link |
---|---|
US (1) | US6507183B1 (it) |
IT (1) | IT1313225B1 (it) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6724658B2 (en) * | 2001-01-15 | 2004-04-20 | Stmicroelectronics S.R.L. | Method and circuit for generating reference voltages for reading a multilevel memory cell |
US20030056124A1 (en) * | 2001-09-19 | 2003-03-20 | Amick Brian W. | Digital-based mechanism for determining voltage |
KR100506450B1 (ko) * | 2003-01-24 | 2005-08-05 | 주식회사 하이닉스반도체 | 불휘발성 강유전체 메모리를 이용한 테스트 모드 제어 장치 |
TWI268355B (en) * | 2005-03-24 | 2006-12-11 | Via Tech Inc | Voltage monitor circuit management system with capable of reading the contents of the register through a bus |
KR100824141B1 (ko) * | 2006-09-29 | 2008-04-21 | 주식회사 하이닉스반도체 | 반도체 메모리 소자 |
US8212544B2 (en) * | 2007-08-13 | 2012-07-03 | SK hynix, Inc. | Semiconductor integrated circuit having level regulation for reference voltage |
KR20090036395A (ko) * | 2007-10-09 | 2009-04-14 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 기준 전압 인식회로 |
JP5446112B2 (ja) * | 2008-03-31 | 2014-03-19 | 富士通セミコンダクター株式会社 | 半導体装置及び半導体装置の動作監視方法 |
IT1391466B1 (it) * | 2008-07-09 | 2011-12-23 | Micron Technology Inc | Rilevamento di una cella di memoria tramite tensione negativa |
US11016679B2 (en) * | 2018-06-29 | 2021-05-25 | Seagate Technology Llc | Balanced die set execution in a data storage system |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3696403A (en) * | 1970-11-25 | 1972-10-03 | Gordon Eng Co | Low level conversion system |
US5815435A (en) * | 1995-10-10 | 1998-09-29 | Information Storage Devices, Inc. | Storage cell for analog recording and playback |
US5805507A (en) * | 1996-10-01 | 1998-09-08 | Microchip Technology Incorporated | Voltage reference generator for EPROM memory array |
US6094368A (en) * | 1999-03-04 | 2000-07-25 | Invox Technology | Auto-tracking write and read processes for multi-bit-per-cell non-volatile memories |
US6429641B1 (en) * | 2000-05-26 | 2002-08-06 | International Business Machines Corporation | Power booster and current measuring unit |
-
1999
- 1999-07-02 IT IT1999MI001474A patent/IT1313225B1/it active
-
2000
- 2000-06-29 US US09/608,847 patent/US6507183B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
ITMI991474A0 (it) | 1999-07-02 |
ITMI991474A1 (it) | 2001-01-02 |
US6507183B1 (en) | 2003-01-14 |
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