IT1291926B1 - Sistema di rivelazione di radiazione infrarossa basato su sensori in silicio amorfo e sue leghe - Google Patents
Sistema di rivelazione di radiazione infrarossa basato su sensori in silicio amorfo e sue legheInfo
- Publication number
- IT1291926B1 IT1291926B1 IT97RM000341A ITRM970341A IT1291926B1 IT 1291926 B1 IT1291926 B1 IT 1291926B1 IT 97RM000341 A IT97RM000341 A IT 97RM000341A IT RM970341 A ITRM970341 A IT RM970341A IT 1291926 B1 IT1291926 B1 IT 1291926B1
- Authority
- IT
- Italy
- Prior art keywords
- alloys
- detection system
- amorphous silicon
- system based
- infrared radiation
- Prior art date
Links
- 229910045601 alloy Inorganic materials 0.000 title 1
- 239000000956 alloy Substances 0.000 title 1
- 229910021417 amorphous silicon Inorganic materials 0.000 title 1
- 238000001514 detection method Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/1016—Devices sensitive to infrared, visible or ultraviolet radiation comprising transparent or semitransparent devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
- H01L31/1055—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type the devices comprising amorphous materials of Group IV of the Periodic Table
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
- Glass Compositions (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT97RM000341A IT1291926B1 (it) | 1997-06-06 | 1997-06-06 | Sistema di rivelazione di radiazione infrarossa basato su sensori in silicio amorfo e sue leghe |
DE69802234T DE69802234T2 (de) | 1997-06-06 | 1998-05-29 | Aus amorphem Silizium und Legierungen bestehendes Infrarot-Detektor Bauelement |
EP98830334A EP0883194B1 (en) | 1997-06-06 | 1998-05-29 | System of infrared radiation detection based on sensors of amorpous silicon and its alloys |
US09/088,302 US6169284B1 (en) | 1997-06-06 | 1998-06-01 | System of infrared radiation detection based on sensors of amorphous silicon and its alloys |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT97RM000341A IT1291926B1 (it) | 1997-06-06 | 1997-06-06 | Sistema di rivelazione di radiazione infrarossa basato su sensori in silicio amorfo e sue leghe |
Publications (3)
Publication Number | Publication Date |
---|---|
ITRM970341A0 ITRM970341A0 (it) | 1997-06-06 |
ITRM970341A1 ITRM970341A1 (it) | 1998-12-06 |
IT1291926B1 true IT1291926B1 (it) | 1999-01-21 |
Family
ID=11405119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT97RM000341A IT1291926B1 (it) | 1997-06-06 | 1997-06-06 | Sistema di rivelazione di radiazione infrarossa basato su sensori in silicio amorfo e sue leghe |
Country Status (4)
Country | Link |
---|---|
US (1) | US6169284B1 (it) |
EP (1) | EP0883194B1 (it) |
DE (1) | DE69802234T2 (it) |
IT (1) | IT1291926B1 (it) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6879014B2 (en) | 2000-03-20 | 2005-04-12 | Aegis Semiconductor, Inc. | Semitransparent optical detector including a polycrystalline layer and method of making |
AU2001287284A1 (en) * | 2000-03-20 | 2001-10-08 | Aegis Semiconductor | A semitransparent optical detector including a silicon and germanium alloy and method of making |
US6670599B2 (en) | 2000-03-27 | 2003-12-30 | Aegis Semiconductor, Inc. | Semitransparent optical detector on a flexible substrate and method of making |
FR2817439B1 (fr) * | 2000-11-30 | 2003-01-24 | Commissariat Energie Atomique | Dispositif de detection de rayonnement infra-rouge |
TW512524B (en) * | 2001-01-19 | 2002-12-01 | Nat Science Council | Fabrication of amorphous silicon/amorphous silicon gemine NI1PI2N infrared position defectors |
CN100354699C (zh) | 2001-08-02 | 2007-12-12 | 伊吉斯半导体公司 | 可调谐光学仪器 |
JP4218261B2 (ja) * | 2002-06-11 | 2009-02-04 | ダイキン工業株式会社 | ポンプユニット |
US20050136177A1 (en) * | 2003-08-25 | 2005-06-23 | Anthony Hesse | Method for coloring landscaping materials using foamable dry colorant |
US7221827B2 (en) | 2003-09-08 | 2007-05-22 | Aegis Semiconductor, Inc. | Tunable dispersion compensator |
NO321281B1 (no) * | 2004-09-15 | 2006-04-18 | Sintef | Infrarod kilde |
US8884241B2 (en) | 2011-09-08 | 2014-11-11 | Freescale Semiconductor, Inc. | Incident capacitive sensor |
US8933711B2 (en) * | 2011-09-08 | 2015-01-13 | Freescale Semiconductor, Inc. | Capacitive sensor radiation measurement |
CN103247675B (zh) * | 2013-05-23 | 2016-07-13 | 哈尔滨工业大学 | 具备光电转换和放大功能的异质结三极管 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1272248B (it) * | 1994-05-12 | 1997-06-16 | Univ Roma | Fotorivelatore a spettro variabile controllato in tensione, per applicazioni di rivelazione e ricostruzione di immagini bidimensionalia colori |
IT1277856B1 (it) * | 1995-02-09 | 1997-11-12 | Univ Roma | Rivelatore di radiazione ultravioletta in film sottile, con opzione di elevata selettivita' spettrale. |
-
1997
- 1997-06-06 IT IT97RM000341A patent/IT1291926B1/it active IP Right Grant
-
1998
- 1998-05-29 EP EP98830334A patent/EP0883194B1/en not_active Expired - Lifetime
- 1998-05-29 DE DE69802234T patent/DE69802234T2/de not_active Expired - Fee Related
- 1998-06-01 US US09/088,302 patent/US6169284B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ITRM970341A1 (it) | 1998-12-06 |
US6169284B1 (en) | 2001-01-02 |
EP0883194A1 (en) | 1998-12-09 |
EP0883194B1 (en) | 2001-10-31 |
DE69802234D1 (de) | 2001-12-06 |
ITRM970341A0 (it) | 1997-06-06 |
DE69802234T2 (de) | 2002-07-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
0001 | Granted |