IT1135137B - Monitore dell spessore di una pellicola sottile - Google Patents

Monitore dell spessore di una pellicola sottile

Info

Publication number
IT1135137B
IT1135137B IT19275/81A IT1927581A IT1135137B IT 1135137 B IT1135137 B IT 1135137B IT 19275/81 A IT19275/81 A IT 19275/81A IT 1927581 A IT1927581 A IT 1927581A IT 1135137 B IT1135137 B IT 1135137B
Authority
IT
Italy
Prior art keywords
thick film
film monitor
monitor
thick
film
Prior art date
Application number
IT19275/81A
Other languages
English (en)
Other versions
IT8119275A0 (it
Inventor
John Riddle Sandercock
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rca Corp filed Critical Rca Corp
Publication of IT8119275A0 publication Critical patent/IT8119275A0/it
Application granted granted Critical
Publication of IT1135137B publication Critical patent/IT1135137B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT19275/81A 1980-02-08 1981-01-22 Monitore dell spessore di una pellicola sottile IT1135137B (it)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11996880A 1980-02-08 1980-02-08
US06/181,990 US4355903A (en) 1980-02-08 1980-08-28 Thin film thickness monitor

Publications (2)

Publication Number Publication Date
IT8119275A0 IT8119275A0 (it) 1981-01-22
IT1135137B true IT1135137B (it) 1986-08-20

Family

ID=26817907

Family Applications (1)

Application Number Title Priority Date Filing Date
IT19275/81A IT1135137B (it) 1980-02-08 1981-01-22 Monitore dell spessore di una pellicola sottile

Country Status (5)

Country Link
US (1) US4355903A (it)
CH (1) CH653766A5 (it)
DE (1) DE3103082A1 (it)
GB (1) GB2069130B (it)
IT (1) IT1135137B (it)

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US4555767A (en) * 1982-05-27 1985-11-26 International Business Machines Corporation Method and apparatus for measuring thickness of epitaxial layer by infrared reflectance
US4458518A (en) * 1982-07-01 1984-07-10 Medasonics, Inc. Apparatus and method for calibrating a photoplethysmograph
FI823028A0 (fi) * 1982-09-01 1982-09-01 Kalevi Juhani Kalliomaeki Foerfarande foer maetning av korta straeckor med en interferometer som utnyttjar icke-koherent ljus, samt foer utfoerande av foerfarandet avsedd interferometer
US4645351A (en) * 1983-06-01 1987-02-24 Fuji Photo Film Co., Ltd. Methods and apparatus for discriminating between the front and back surfaces of films
DE3419463C1 (de) * 1984-05-24 1985-09-12 Sagax Instrument AB, Sundbyberg Vorrichtung zur Erfassung von Stoffeigenschaften von Probenoberflaechen
JPS6175203A (ja) * 1984-09-20 1986-04-17 Oak Seisakusho:Kk 膜厚測定装置
JPS6157805U (it) * 1984-09-20 1986-04-18
JPS61217705A (ja) * 1985-03-22 1986-09-27 Dainippon Screen Mfg Co Ltd 膜厚測定装置
GB8527235D0 (en) * 1985-11-05 1985-12-11 Ici Plc Measuring instrument
US4676936A (en) * 1985-12-23 1987-06-30 The Dow Chemical Company Controlled coextrusion of barrier sheet
GB8601176D0 (en) * 1986-01-17 1986-02-19 Infrared Eng Ltd Sensing
US4999014A (en) * 1989-05-04 1991-03-12 Therma-Wave, Inc. Method and apparatus for measuring thickness of thin films
US5003823A (en) * 1989-08-21 1991-04-02 Sundstrand Corporation Noncontact rotating liquid film thickness sensor
DE4110230A1 (de) * 1991-03-28 1992-10-01 Zeiss Carl Fa Vorrichtung zur interferometrischen messung der dicke einer transparenten schicht
US5241366A (en) * 1992-03-04 1993-08-31 Tencor Instruments Thin film thickness monitor
US5337150A (en) * 1992-08-04 1994-08-09 Hughes Aircraft Company Apparatus and method for performing thin film layer thickness metrology using a correlation reflectometer
GB9219450D0 (en) * 1992-09-15 1992-10-28 Glaverbel Thin film thickness monitoring and control
US7075649B1 (en) 1995-09-20 2006-07-11 J.A. Woollam Co. Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibration
US7215424B1 (en) 1998-03-03 2007-05-08 J.A. Woollam Co., Inc. Broadband ellipsometer or polarimeter system including at least one multiple element lens
US7518725B1 (en) 1995-09-20 2009-04-14 J.A. Woollam Co., Inc. Temperature controlled lens
US7193710B1 (en) 1995-09-20 2007-03-20 J.A. Woollam Co., Inc. Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses
KR100252220B1 (ko) 1997-06-25 2000-04-15 윤종용 반도체장치의산화막두께표준시료및그제조방법
DE19757706C2 (de) * 1997-12-23 2002-01-24 Jandratek Gmbh Substrat, Vorrichtung und Verfahren zur schnellen Auswertung von Bindungsreaktionen durch interferometrische Schichtdickenmessung
US5889592A (en) * 1998-03-18 1999-03-30 Zawaideh; Emad Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films
US5999267A (en) * 1999-03-08 1999-12-07 Zawaideh; Emad Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films
US6392756B1 (en) 1999-06-18 2002-05-21 N&K Technology, Inc. Method and apparatus for optically determining physical parameters of thin films deposited on a complex substrate
US6091485A (en) * 1999-12-15 2000-07-18 N & K Technology, Inc. Method and apparatus for optically determining physical parameters of underlayers
US7345762B1 (en) 2000-05-30 2008-03-18 J.A. Woollam Co., Inc. Control of beam spot size in ellipsometer and the like systems
US7535566B1 (en) 2000-09-05 2009-05-19 J.A. Woollam Co., Inc. Beam chromatic shifting and directing means
US6795184B1 (en) 2001-04-06 2004-09-21 J.A. Woollam Co., Inc Odd bounce image rotation system in ellipsometer systems
US6713753B1 (en) 2001-07-03 2004-03-30 Nanometrics Incorporated Combination of normal and oblique incidence polarimetry for the characterization of gratings
US7869057B2 (en) 2002-09-09 2011-01-11 Zygo Corporation Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis
US7139081B2 (en) * 2002-09-09 2006-11-21 Zygo Corporation Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
US7324214B2 (en) * 2003-03-06 2008-01-29 Zygo Corporation Interferometer and method for measuring characteristics of optically unresolved surface features
US7106454B2 (en) 2003-03-06 2006-09-12 Zygo Corporation Profiling complex surface structures using scanning interferometry
US6970255B1 (en) * 2003-04-23 2005-11-29 Nanometrics Incorporated Encoder measurement based on layer thickness
JP5340539B2 (ja) * 2003-09-15 2013-11-13 ザイゴ コーポレーション 表面の干渉分析のための方法およびシステムならびに関連する応用例
TWI335417B (en) * 2003-10-27 2011-01-01 Zygo Corp Method and apparatus for thin film measurement
KR100665003B1 (ko) * 2004-12-07 2007-01-09 삼성전기주식회사 금속표면 상의 유기도막 두께 측정방법
WO2006069255A2 (en) * 2004-12-22 2006-06-29 Kla-Tencor Technologies Corp. Methods and systems for controlling variation in dimensions of patterned features across a wafer
US7884947B2 (en) 2005-01-20 2011-02-08 Zygo Corporation Interferometry for determining characteristics of an object surface, with spatially coherent illumination
US7446882B2 (en) * 2005-01-20 2008-11-04 Zygo Corporation Interferometer for determining characteristics of an object surface
WO2006125131A2 (en) * 2005-05-19 2006-11-23 Zygo Corporation Analyzing low-coherence interferometry signals for thin film structures
WO2007044786A2 (en) 2005-10-11 2007-04-19 Zygo Corporation Interferometry method and system including spectral decomposition
WO2008011510A2 (en) 2006-07-21 2008-01-24 Zygo Corporation Compensation of systematic effects in low coherence interferometry
WO2008080127A2 (en) 2006-12-22 2008-07-03 Zygo Corporation Apparatus and method for measuring characteristics of surface features
US7889355B2 (en) 2007-01-31 2011-02-15 Zygo Corporation Interferometry for lateral metrology
US7619746B2 (en) 2007-07-19 2009-11-17 Zygo Corporation Generating model signals for interferometry
US8072611B2 (en) 2007-10-12 2011-12-06 Zygo Corporation Interferometric analysis of under-resolved features
US7978337B2 (en) 2007-11-13 2011-07-12 Zygo Corporation Interferometer utilizing polarization scanning
WO2009079334A2 (en) * 2007-12-14 2009-06-25 Zygo Corporation Analyzing surface structure using scanning interferometry
US8120781B2 (en) 2008-11-26 2012-02-21 Zygo Corporation Interferometric systems and methods featuring spectral analysis of unevenly sampled data
US8488119B2 (en) 2009-02-27 2013-07-16 J.A. Woollam Co., Inc. Terahertz-infrared ellipsometer system, and method of use
US8736838B2 (en) 2009-02-27 2014-05-27 J.A. Woollam Co., Inc. Terahertz ellipsometer system, and method of use
US8169611B2 (en) 2009-02-27 2012-05-01 University Of Nebraska Board Of Regents Terahertz-infrared ellipsometer system, and method of use
US8416408B1 (en) 2009-02-27 2013-04-09 J.A. Woollam Co., Inc. Terahertz-infrared ellipsometer system, and method of use
US8934096B2 (en) 2009-02-27 2015-01-13 University Of Nebraska Board Of Regents Terahertz-infrared ellipsometer system, and method of use
US8564777B1 (en) 2010-08-16 2013-10-22 J.A. Woollam Co., Inc. System and method for compensating detector non-idealities
KR102659670B1 (ko) * 2019-07-31 2024-04-19 에스케이하이닉스 주식회사 두께 측정 장치 및 방법

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Publication number Priority date Publication date Assignee Title
US2338981A (en) * 1939-06-06 1944-01-11 Straub Harald Method and device for measuring the thickness of light transmitting layers
US2331027A (en) * 1941-08-13 1943-10-05 William H Harrison Optical wedge
US2518647A (en) * 1948-01-07 1950-08-15 Celanese Corp Interferometer means for thickness measurements
US2578859A (en) * 1949-06-24 1951-12-18 Celanese Corp Light directing means in a system for measuring thickness of transparent sheets
US2655073A (en) * 1950-09-23 1953-10-13 Celanese Corp Optical thickness gauge
US2587282A (en) * 1951-02-27 1952-02-26 Gen Electric Step gauge for measuring thickness of thin films
US2666355A (en) * 1951-10-12 1954-01-19 Hans J Trurnit Method of studying chemical reactions by measuring interfacial film thicknesses
US3319515A (en) * 1963-08-27 1967-05-16 Du Pont Interferometric optical phase discrimination apparatus
US3601492A (en) * 1967-11-20 1971-08-24 Monsanto Co Apparatus for measuring film thickness
US3551056A (en) * 1969-01-15 1970-12-29 Ibm Apparatus for automatically measuring the thickness of transparent films on silicon wafers
DE1930111C3 (de) * 1969-06-13 1975-02-20 Vierling, Oskar, Prof. Dr.Phil.Habil., 8553 Ebermannstadt Optische Vorrichtung zum Messen der Bewegung von gegeneinander bewegten Teilen
US3869211A (en) * 1972-06-29 1975-03-04 Canon Kk Instrument for measuring thickness of thin film
DD108383A1 (it) * 1973-11-09 1974-09-12

Also Published As

Publication number Publication date
DE3103082A1 (de) 1982-01-14
GB2069130B (en) 1983-08-24
DE3103082C2 (it) 1992-05-21
GB2069130A (en) 1981-08-19
CH653766A5 (de) 1986-01-15
IT8119275A0 (it) 1981-01-22
US4355903A (en) 1982-10-26

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19960129