IT1109829B - Processo di fabbricazione di cercuiti integrati - Google Patents

Processo di fabbricazione di cercuiti integrati

Info

Publication number
IT1109829B
IT1109829B IT24892/78A IT2489278A IT1109829B IT 1109829 B IT1109829 B IT 1109829B IT 24892/78 A IT24892/78 A IT 24892/78A IT 2489278 A IT2489278 A IT 2489278A IT 1109829 B IT1109829 B IT 1109829B
Authority
IT
Italy
Prior art keywords
findings
integrated
building process
building
integrated findings
Prior art date
Application number
IT24892/78A
Other languages
English (en)
Other versions
IT7824892A0 (it
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of IT7824892A0 publication Critical patent/IT7824892A0/it
Application granted granted Critical
Publication of IT1109829B publication Critical patent/IT1109829B/it

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/20—Masks or mask blanks for imaging by charged particle beam [CPB] radiation, e.g. by electron beam; Preparation thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0332—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their composition, e.g. multilayer masks, materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0334—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604—Chemical etching
    • H01L21/30608—Anisotropic liquid etching
IT24892/78A 1977-07-05 1978-06-23 Processo di fabbricazione di cercuiti integrati IT1109829B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US81294177A 1977-07-05 1977-07-05

Publications (2)

Publication Number Publication Date
IT7824892A0 IT7824892A0 (it) 1978-06-23
IT1109829B true IT1109829B (it) 1985-12-23

Family

ID=25211042

Family Applications (1)

Application Number Title Priority Date Filing Date
IT24892/78A IT1109829B (it) 1977-07-05 1978-06-23 Processo di fabbricazione di cercuiti integrati

Country Status (4)

Country Link
EP (1) EP0001038B1 (it)
JP (1) JPS5414680A (it)
DE (1) DE2860999D1 (it)
IT (1) IT1109829B (it)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2922416A1 (de) * 1979-06-01 1980-12-11 Ibm Deutschland Schattenwurfmaske zum strukturieren von oberflaechenbereichen und verfahren zu ihrer herstellung
EP0048291B1 (de) * 1980-09-19 1985-07-03 Ibm Deutschland Gmbh Struktur mit einem eine durchgehende Öffnung aufweisenden Siliciumkörper und Verfahren zu ihrer Herstellung
DE3267491D1 (en) * 1981-03-02 1986-01-02 Bbc Brown Boveri & Cie Process for doping semiconductor bodies for the production of semiconductor devices
DE3176643D1 (en) * 1981-10-30 1988-03-10 Ibm Deutschland Shadow projecting mask for ion implantation and lithography by ion beam radiation
US4482427A (en) * 1984-05-21 1984-11-13 International Business Machines Corporation Process for forming via holes having sloped walls
DE3476281D1 (en) * 1984-07-16 1989-02-23 Ibm Deutschland Process to repair transmission masks
EP0237844A1 (de) * 1986-03-18 1987-09-23 BBC Brown Boveri AG Verfahren zur Herstellung einer Abdeckschicht für die Halbleitertechnik sowie Verwendung der Abdeckschicht
JP2725319B2 (ja) * 1988-11-07 1998-03-11 富士通株式会社 荷電粒子線マスクの製造方法
US5234781A (en) * 1988-11-07 1993-08-10 Fujitsu Limited Mask for lithographic patterning and a method of manufacturing the same
US4919749A (en) * 1989-05-26 1990-04-24 Nanostructures, Inc. Method for making high resolution silicon shadow masks
JP2506019B2 (ja) * 1991-04-25 1996-06-12 富士通株式会社 透過マスクの製造方法
US5326426A (en) * 1991-11-14 1994-07-05 Tam Andrew C Undercut membrane mask for high energy photon patterning
US6335534B1 (en) 1998-04-17 2002-01-01 Kabushiki Kaisha Toshiba Ion implantation apparatus, ion generating apparatus and semiconductor manufacturing method with ion implantation processes
DE10017422A1 (de) * 2000-04-07 2001-10-11 Bosch Gmbh Robert Mikromechanisches Bauelement und entsprechendes Herstellungverfahren

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1235077A (en) * 1969-05-07 1971-06-09 Standard Telephones Cables Ltd Improvements in or relating to pressure transducers
US4013502A (en) * 1973-06-18 1977-03-22 Texas Instruments Incorporated Stencil process for high resolution pattern replication
DE2359511A1 (de) * 1973-11-29 1975-06-05 Siemens Ag Verfahren zum lokalisierten aetzen von siliciumkristallen
US4021276A (en) * 1975-12-29 1977-05-03 Western Electric Company, Inc. Method of making rib-structure shadow mask for ion implantation

Also Published As

Publication number Publication date
JPS5414680A (en) 1979-02-03
JPS6158974B2 (it) 1986-12-13
EP0001038A1 (de) 1979-03-21
EP0001038B1 (de) 1981-09-02
IT7824892A0 (it) 1978-06-23
DE2860999D1 (en) 1981-11-26

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