IT1078514B - Birefringent ellipsometer for beam analysis in photoelasticity - relating a measured to a known signal for accurate comparison - Google Patents

Birefringent ellipsometer for beam analysis in photoelasticity - relating a measured to a known signal for accurate comparison

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Publication number
IT1078514B
IT1078514B IT4165176A IT4165176A IT1078514B IT 1078514 B IT1078514 B IT 1078514B IT 4165176 A IT4165176 A IT 4165176A IT 4165176 A IT4165176 A IT 4165176A IT 1078514 B IT1078514 B IT 1078514B
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IT
Italy
Prior art keywords
measured
ppm
emf
signal
photoelasticity
Prior art date
Application number
IT4165176A
Other languages
Italian (it)
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Priority to IT4165176A priority Critical patent/IT1078514B/en
Application granted granted Critical
Publication of IT1078514B publication Critical patent/IT1078514B/en

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  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Abstract

Appts. to display the concn of oxygen in ppm in a fluidmedium, esp. sodium. The oxygen concn. is measured by a solid electrolyte electrochemical cell which is connected to a circuit. This circuit reacts to the EMF signal developed by the cell, to measure the oxygen concn. in the fluid by determining C in the equation C = log-1 (K1-E)/K2 , where C is an electric signal indicating the oxygen concn. in ppm, E the signal corresponding to the EMF, K1 a constant corresponding to the signal of EMF from the solid electrolyte electrochemical cell for an oxygen concn. of 1 ppm, and K2 a constant corresp. to the slope of the line establishing the realtion between the EMF signal and log C. A second circuit is connected to he first to display in ppm this oxygen concn. in the fluid.
IT4165176A 1976-09-13 1976-09-13 Birefringent ellipsometer for beam analysis in photoelasticity - relating a measured to a known signal for accurate comparison IT1078514B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
IT4165176A IT1078514B (en) 1976-09-13 1976-09-13 Birefringent ellipsometer for beam analysis in photoelasticity - relating a measured to a known signal for accurate comparison

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT4165176A IT1078514B (en) 1976-09-13 1976-09-13 Birefringent ellipsometer for beam analysis in photoelasticity - relating a measured to a known signal for accurate comparison

Publications (1)

Publication Number Publication Date
IT1078514B true IT1078514B (en) 1985-05-08

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ID=11252561

Family Applications (1)

Application Number Title Priority Date Filing Date
IT4165176A IT1078514B (en) 1976-09-13 1976-09-13 Birefringent ellipsometer for beam analysis in photoelasticity - relating a measured to a known signal for accurate comparison

Country Status (1)

Country Link
IT (1) IT1078514B (en)

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