IN2014DE02527A - - Google Patents

Info

Publication number
IN2014DE02527A
IN2014DE02527A IN2527DE2014A IN2014DE02527A IN 2014DE02527 A IN2014DE02527 A IN 2014DE02527A IN 2527DE2014 A IN2527DE2014 A IN 2527DE2014A IN 2014DE02527 A IN2014DE02527 A IN 2014DE02527A
Authority
IN
India
Prior art keywords
voltage
photoconductive material
residual charge
applying
during
Prior art date
Application number
Other languages
English (en)
Inventor
Kim Young
Kim Sunil
Park Jaechul
Lee Kangho
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of IN2014DE02527A publication Critical patent/IN2014DE02527A/en

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G15/00—Apparatus for electrographic processes using a charge pattern
    • G03G15/22—Apparatus for electrographic processes using a charge pattern involving the combination of more than one step according to groups G03G13/02 - G03G13/20
    • G03G15/221—Machines other than electrographic copiers, e.g. electrophotographic cameras, electrostatic typewriters
    • G03G15/222—Machines for handling xeroradiographic images, e.g. xeroradiographic processors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
IN2527DE2014 2013-09-04 2014-09-03 IN2014DE02527A (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR20130106307A KR20150027636A (ko) 2013-09-04 2013-09-04 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치

Publications (1)

Publication Number Publication Date
IN2014DE02527A true IN2014DE02527A (enrdf_load_stackoverflow) 2015-06-26

Family

ID=51535325

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2527DE2014 IN2014DE02527A (enrdf_load_stackoverflow) 2013-09-04 2014-09-03

Country Status (5)

Country Link
US (1) US9961754B2 (enrdf_load_stackoverflow)
EP (1) EP2846199A1 (enrdf_load_stackoverflow)
KR (1) KR20150027636A (enrdf_load_stackoverflow)
CN (1) CN104414667A (enrdf_load_stackoverflow)
IN (1) IN2014DE02527A (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102116321B1 (ko) * 2013-12-04 2020-05-28 주식회사 레이언스 엑스선 디텍터 및 이를 이용한 엑스선 영상장치와 이의 구동방법
KR20160047314A (ko) * 2014-10-22 2016-05-02 삼성전자주식회사 방사선 검출기 및 방사선 검출기 구동 방법
CN105655364B (zh) * 2015-12-28 2018-09-25 上海奕瑞光电子科技股份有限公司 一种基于行间重叠的电荷补偿方法
CN111107285B (zh) * 2018-10-29 2022-04-12 和鑫光电股份有限公司 X光探测器以及使用x光探测器拍摄影像的方法
CN113710495B (zh) 2019-04-03 2023-05-09 株式会社理光 液体排出装置和液体排出设备
US11245860B2 (en) * 2019-12-13 2022-02-08 Varian Medical Systems International Ag Reduction of image lag in an X-ray detector panel
WO2025080048A1 (ko) * 2023-10-13 2025-04-17 주식회사 레이언스 엑스선 디텍터

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2627922B1 (fr) * 1988-02-26 1990-06-22 Thomson Csf Matrice photosensible a deux diodes par point, sans conducteur specifique de remise a niveau
US5661309A (en) * 1992-12-23 1997-08-26 Sterling Diagnostic Imaging, Inc. Electronic cassette for recording X-ray images
US5510626A (en) * 1994-06-22 1996-04-23 Minnesota Mining And Manufacturing Company System and method for conditioning a radiation detector
US5563421A (en) * 1995-06-07 1996-10-08 Sterling Diagnostic Imaging, Inc. Apparatus and method for eliminating residual charges in an image capture panel
CA2184667C (en) * 1996-09-03 2000-06-20 Bradley Trent Polischuk Multilayer plate for x-ray imaging and method of producing same
CA2200532C (en) * 1997-03-20 2002-02-26 Benoit Adam X-ray image erasure method
US5969360A (en) * 1997-11-26 1999-10-19 Direct Radiography Corp. Readout sequence for residual image elimination in a radiation detection panel
JP3181874B2 (ja) 1998-02-02 2001-07-03 セイコーインスツルメンツ株式会社 イメージセンサー
KR100524081B1 (ko) 1999-03-25 2005-10-26 엘지.필립스 엘시디 주식회사 엑스레이 영상 감지소자
DE19934980B4 (de) 1999-07-26 2004-02-12 Siemens Ag Röntgendiagnostikeinrichtung mit einem flächenförmigen Röntgenbildwandler mit Rückseitenbeleuchtung
KR100361470B1 (ko) 1999-12-31 2002-11-21 엘지.필립스 엘시디 주식회사 엑스-선 이미지 촬영장치 및 그 구동방법
KR100394461B1 (ko) 2001-02-14 2003-08-09 주식회사 디알텍 디지털 ｘ선 촬영 패널
CA2363663C (en) * 2001-11-22 2004-10-19 Ftni Inc. Direct conversion flat panel x-ray detector with automatic cancellation of ghost images
JP2007129347A (ja) * 2005-11-01 2007-05-24 Fujifilm Corp 放射線固体検出器の残留電荷消去方法、および放射線画像記録読取装置
JP5405093B2 (ja) 2008-12-05 2014-02-05 富士フイルム株式会社 画像処理装置及び画像処理方法
KR20110019158A (ko) 2009-08-19 2011-02-25 (주)디알젬 엑스선 제너레이터 시스템
WO2012034229A1 (en) * 2010-09-13 2012-03-22 Thunder Bay Regional Research Institute Systems and methods for resetting photoconductive x-ray imaging detectors
US20150103975A1 (en) * 2013-10-11 2015-04-16 National Chiao Tung University X-ray image sensor and x-ray image sensor system using the same

Also Published As

Publication number Publication date
US9961754B2 (en) 2018-05-01
US20150063544A1 (en) 2015-03-05
CN104414667A (zh) 2015-03-18
KR20150027636A (ko) 2015-03-12
EP2846199A1 (en) 2015-03-11

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