IN2014CN02540A - - Google Patents

Info

Publication number
IN2014CN02540A
IN2014CN02540A IN2540CHN2014A IN2014CN02540A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A IN 2540CHN2014 A IN2540CHN2014 A IN 2540CHN2014A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A
Authority
IN
India
Prior art keywords
heights
test pulses
signal indicative
generate
pulses
Prior art date
Application number
Other languages
English (en)
Inventor
Booker Roger Steadman
Randall Peter Luhta
Christoph Herrmann
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN02540A publication Critical patent/IN2014CN02540A/en

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
IN2540CHN2014 2011-10-19 2012-10-12 IN2014CN02540A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161548749P 2011-10-19 2011-10-19
PCT/IB2012/055554 WO2013057645A2 (fr) 2011-10-19 2012-10-12 Détecteur de comptage de photons

Publications (1)

Publication Number Publication Date
IN2014CN02540A true IN2014CN02540A (fr) 2015-08-07

Family

ID=47428774

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2540CHN2014 IN2014CN02540A (fr) 2011-10-19 2012-10-12

Country Status (7)

Country Link
US (1) US9301378B2 (fr)
EP (2) EP2745143B1 (fr)
JP (1) JP2014530704A (fr)
CN (1) CN103890610B (fr)
IN (1) IN2014CN02540A (fr)
RU (1) RU2594602C2 (fr)
WO (1) WO2013057645A2 (fr)

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JP6242683B2 (ja) * 2012-12-27 2017-12-06 東芝メディカルシステムズ株式会社 Ｘ線ｃｔ装置及び制御方法
WO2014163187A1 (fr) * 2013-04-04 2014-10-09 株式会社 東芝 Appareil de tomodensitométrie aux rayons x
EP2871496B1 (fr) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Détecteur de rayonnement et appareil de tomographie assistée par ordinateur utilisant celui-ci
US9759822B2 (en) 2013-11-27 2017-09-12 Koninklijke Philips N.V. Detection device for detecting photons and method therefore
KR101635980B1 (ko) * 2013-12-30 2016-07-05 삼성전자주식회사 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치
US10788594B2 (en) * 2014-09-02 2020-09-29 Koninklijke Philips N.V. Window-based spectrum measurement in a spectral CT detector
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
EP3218876B1 (fr) * 2014-11-10 2020-04-08 Prismatic Sensors AB Imagerie par rayons x sur la base de données d'image provenant d'un détecteur de rayons x multi-bac de comptage de photons
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
WO2016087423A1 (fr) * 2014-12-05 2016-06-09 Koninklijke Philips N.V. Dispositif de détecteur de rayons x pour rayonnement de rayons x à angle incliné
JP6277331B1 (ja) * 2014-12-11 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線検出器、イメージング装置及び較正方法
RU2699307C2 (ru) 2014-12-16 2019-09-04 Конинклейке Филипс Н.В. Определение смещения базовой линии детектора фотонов
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
US10725188B2 (en) * 2015-10-20 2020-07-28 Koninklijke Philips N.V. Polarization correction for direct conversion x-ray detectors
KR102405926B1 (ko) * 2015-11-12 2022-06-07 프리스매틱 센서즈 에이비 시간 오프셋된 심도 구획부를 구비한 에지-온 검출기를 사용하는 고해상도 전산화 단층촬영(high-resolution computed tomography using edge-on detectors with temporally offset depth-segments)
JP6786709B2 (ja) * 2016-08-31 2020-11-18 プリズマティック、センサーズ、アクチボラグＰｒｉｓｍａｔｉｃ Ｓｅｎｓｏｒｓ Ａｂ 変換器の相対利得およびオフセットを推定するための方法およびシステム
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
CN106989835B (zh) * 2017-04-12 2023-07-11 东北大学 基于压缩感知的光子计数x射线能谱探测装置及成像系统
JP2019010426A (ja) * 2017-06-30 2019-01-24 ゼネラル・エレクトリック・カンパニイ 放射線断層撮影装置およびプログラム
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
CN108897030B (zh) * 2018-05-09 2020-12-25 中国科学院近代物理研究所 信号的定时提取装置及方法
CN108903961A (zh) * 2018-07-19 2018-11-30 深圳市倍康美医疗电子商务有限公司 一种cbct成像方法、存储介质及系统
US11219114B2 (en) * 2018-10-03 2022-01-04 Konica Minolta, Inc. Radiation generation control device, radiation generation control system, and radiography system
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
CN110412644A (zh) * 2019-08-14 2019-11-05 苏州瑞迈斯医疗科技有限公司 光子计数方法和装置
CN110456404B (zh) * 2019-08-14 2023-07-28 苏州瑞迈斯科技有限公司 辐射探测装置和成像系统

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Also Published As

Publication number Publication date
CN103890610A (zh) 2014-06-25
EP2745143A2 (fr) 2014-06-25
EP3290959B1 (fr) 2020-05-27
US20140254749A1 (en) 2014-09-11
EP2745143B1 (fr) 2019-04-03
RU2014119870A (ru) 2015-11-27
US9301378B2 (en) 2016-03-29
WO2013057645A3 (fr) 2014-03-06
RU2594602C2 (ru) 2016-08-20
JP2014530704A (ja) 2014-11-20
EP3290959A1 (fr) 2018-03-07
WO2013057645A2 (fr) 2013-04-25
CN103890610B (zh) 2017-08-29

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