IN2012DN01351A - - Google Patents

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Publication number
IN2012DN01351A
IN2012DN01351A IN1351DEN2012A IN2012DN01351A IN 2012DN01351 A IN2012DN01351 A IN 2012DN01351A IN 1351DEN2012 A IN1351DEN2012 A IN 1351DEN2012A IN 2012DN01351 A IN2012DN01351 A IN 2012DN01351A
Authority
IN
India
Prior art keywords
direct
values
photovoltaic system
current
current path
Prior art date
Application number
Inventor
Pamer Andreas
Ritzberger Gunter
Oberzaucher Friedrich
Original Assignee
Fronius Int Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fronius Int Gmbh filed Critical Fronius Int Gmbh
Publication of IN2012DN01351A publication Critical patent/IN2012DN01351A/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H1/00—Details of emergency protective circuit arrangements
    • H02H1/0007—Details of emergency protective circuit arrangements concerning the detecting means
    • H02H1/0015—Using arc detectors
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/08—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current
    • H02H3/087—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current for dc applications
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photovoltaic Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Inverter Devices (AREA)

Abstract

The invention relates to a method for detecting arcs in a direct-current path of a photovoltaic system, wherein values of a current (IDC) Of the direct-current path are detected during a repeating time frame (7) and a mean value (8) is generated, and such a photovoltaic system. In order to reliably detect arcs by means of a component of the photovoltaic system, values of a voltage (UDC), of the direct-current path are detected during the time frame (7) and a mean value (8, 81) is generated, and at least one detection signal (9) and at least one detection threshold (10) are continuously calculated based on the mean values (8, 8') for the current (IDC) and the voltage (UDC) by means of a calculation method.
IN1351DEN2012 2009-08-14 2010-06-02 IN2012DN01351A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AT0128509A AT509251A1 (en) 2009-08-14 2009-08-14 4 EXPERTS IN THE FIELD OF ARC FLASH IN PHOTOVOLTAIC PLANTS AND ONE SUCH PHOTOVOLTAIC PLANT
PCT/AT2010/000194 WO2011017721A1 (en) 2009-08-14 2010-06-02 Method for detecting arcs in photovoltaic systems and such a photovoltaic system

Publications (1)

Publication Number Publication Date
IN2012DN01351A true IN2012DN01351A (en) 2015-06-05

Family

ID=42670514

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1351DEN2012 IN2012DN01351A (en) 2009-08-14 2010-06-02

Country Status (10)

Country Link
US (1) US8576520B2 (en)
EP (1) EP2464986B1 (en)
JP (1) JP5393891B2 (en)
KR (1) KR101354643B1 (en)
CN (1) CN102472789B (en)
AT (1) AT509251A1 (en)
AU (1) AU2010282204B2 (en)
BR (1) BR112012003368B1 (en)
IN (1) IN2012DN01351A (en)
WO (1) WO2011017721A1 (en)

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Also Published As

Publication number Publication date
CN102472789B (en) 2015-02-18
BR112012003368A2 (en) 2016-02-16
KR101354643B1 (en) 2014-01-21
AT509251A1 (en) 2011-07-15
WO2011017721A1 (en) 2011-02-17
KR20120066636A (en) 2012-06-22
AU2010282204B2 (en) 2014-06-12
BR112012003368B1 (en) 2019-06-25
CN102472789A (en) 2012-05-23
AU2010282204A1 (en) 2012-03-01
EP2464986A1 (en) 2012-06-20
JP5393891B2 (en) 2014-01-22
US8576520B2 (en) 2013-11-05
EP2464986B1 (en) 2014-02-26
US20120134058A1 (en) 2012-05-31
JP2013502054A (en) 2013-01-17

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