IN2012DE01076A - - Google Patents

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Publication number
IN2012DE01076A
IN2012DE01076A IN1076DE2012A IN2012DE01076A IN 2012DE01076 A IN2012DE01076 A IN 2012DE01076A IN 1076DE2012 A IN1076DE2012 A IN 1076DE2012A IN 2012DE01076 A IN2012DE01076 A IN 2012DE01076A
Authority
IN
India
Prior art keywords
optical system
target
linearly polarized
polarized light
respect
Prior art date
Application number
Other languages
English (en)
Inventor
Tao Li
Guiju Song
Kevin George Harding
Dongmin Yang
Zirong Zhai
Jie Han
Gil Abramovich
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of IN2012DE01076A publication Critical patent/IN2012DE01076A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/24Instruments or systems for viewing the inside of hollow bodies, e.g. fibrescopes
    • G02B23/2407Optical details
    • G02B23/2423Optical details of the distal end
    • G02B23/243Objectives for endoscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0075Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. increasing, the depth of field or depth of focus
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/286Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3083Birefringent or phase retarding elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Astronomy & Astrophysics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Lenses (AREA)
IN1076DE2012 2011-04-18 2012-04-09 IN2012DE01076A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110096267.1A CN102749332B (zh) 2011-04-18 2011-04-18 光学系统和光学检测装置以及检测方法

Publications (1)

Publication Number Publication Date
IN2012DE01076A true IN2012DE01076A (pt) 2015-07-31

Family

ID=46298221

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1076DE2012 IN2012DE01076A (pt) 2011-04-18 2012-04-09

Country Status (4)

Country Link
US (1) US9188543B2 (pt)
EP (1) EP2515100A1 (pt)
CN (1) CN102749332B (pt)
IN (1) IN2012DE01076A (pt)

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* Cited by examiner, † Cited by third party
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CN103033942B (zh) 2011-09-29 2015-07-15 通用电气公司 光学成像系统和方法以及孔径光阑组合和孔径元件
TWI625551B (zh) 2013-03-15 2018-06-01 傲思丹度科技公司 具有改良之視角深度及解析度之三維光場顯示器及方法
CN103558188B (zh) * 2013-07-11 2016-03-02 福建华映显示科技有限公司 侦测装置及侦测方法
CN103607542B (zh) * 2013-11-30 2017-04-12 深圳市金立通信设备有限公司 一种图像处理方法、装置以及照相设备
CA2933870C (en) * 2013-12-17 2021-11-23 Picometrix, Llc System for transmitting and receiving electromagnetic radiation
CN105467714B (zh) * 2014-09-05 2018-11-30 深圳超多维科技有限公司 液晶透镜成像装置及液晶透镜成像方法
US10061129B2 (en) * 2015-03-15 2018-08-28 Kessler Optics and Photonics Solutions Ltd. Birefringent ocular for augmented reality imaging
WO2017008159A1 (en) * 2015-07-14 2017-01-19 Synergx Technologies Inc. Optical inspection system for transparent material
US9781316B2 (en) * 2015-12-14 2017-10-03 Htc Corporation Multi-focal length range image capturing device
US10153838B1 (en) * 2016-12-28 2018-12-11 Facebook, Inc. Quad tracker with birefringent optics
CN107506687B (zh) * 2017-07-17 2020-01-21 Oppo广东移动通信有限公司 活体检测方法及相关产品
TWI648524B (zh) * 2017-10-03 2019-01-21 財團法人工業技術研究院 多層材料加工裝置及其方法
JP7208253B2 (ja) * 2018-09-28 2023-01-18 i-PRO株式会社 内視鏡
CN110161596B (zh) * 2019-05-20 2021-07-23 河北工业大学 一种制作变焦液体微透镜的装置及方法
CN110530821B (zh) * 2019-09-16 2021-02-12 中国科学院福建物质结构研究所 一种光学材料折射率的测量装置及其测量方法
CN117055211B (zh) * 2023-08-30 2024-03-22 之江实验室 光学加密结构的设计方法及近远场多偏振态光学加密系统

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US4107520A (en) * 1977-06-06 1978-08-15 Honeywell Inc. Continuous focus proportional controller
JPS5470826A (en) * 1977-11-16 1979-06-07 Minolta Camera Co Ltd Wide-angle objective lens
JPS61160714A (ja) * 1985-01-09 1986-07-21 Canon Inc 焦点距離可変レンズ
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Also Published As

Publication number Publication date
US9188543B2 (en) 2015-11-17
US20130271763A1 (en) 2013-10-17
EP2515100A1 (en) 2012-10-24
CN102749332B (zh) 2015-08-26
CN102749332A (zh) 2012-10-24

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