IL93645A0 - Single beam ac interferometer - Google Patents
Single beam ac interferometerInfo
- Publication number
- IL93645A0 IL93645A0 IL93645A IL9364590A IL93645A0 IL 93645 A0 IL93645 A0 IL 93645A0 IL 93645 A IL93645 A IL 93645A IL 9364590 A IL9364590 A IL 9364590A IL 93645 A0 IL93645 A0 IL 93645A0
- Authority
- IL
- Israel
- Prior art keywords
- interferometer
- single beam
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/321,103 US4968144A (en) | 1989-03-09 | 1989-03-09 | Single beam AC interferometer |
Publications (1)
Publication Number | Publication Date |
---|---|
IL93645A0 true IL93645A0 (en) | 1990-12-23 |
Family
ID=23249191
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL93645A IL93645A0 (en) | 1989-03-09 | 1990-03-06 | Single beam ac interferometer |
Country Status (6)
Country | Link |
---|---|
US (1) | US4968144A (xx) |
EP (1) | EP0414889A4 (xx) |
JP (1) | JPH03504647A (xx) |
KR (1) | KR920700388A (xx) |
IL (1) | IL93645A0 (xx) |
WO (1) | WO1990010842A1 (xx) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5285260A (en) * | 1992-07-06 | 1994-02-08 | General Electric Company | Spectroscopic imaging system with ultrasonic detection of absorption of modulated electromagnetic radiation |
US5812261A (en) * | 1992-07-08 | 1998-09-22 | Active Impulse Systems, Inc. | Method and device for measuring the thickness of opaque and transparent films |
US5338924A (en) * | 1992-08-11 | 1994-08-16 | Lasa Industries, Inc. | Apparatus and method for automatic focusing of light using a fringe plate |
US5376793A (en) * | 1993-09-15 | 1994-12-27 | Stress Photonics, Inc. | Forced-diffusion thermal imaging apparatus and method |
US5719395A (en) * | 1996-09-12 | 1998-02-17 | Stress Photonics Inc. | Coating tolerant thermography |
US7123364B2 (en) * | 1998-02-25 | 2006-10-17 | Battelle Energy Alliance, Llc | Acoustic imaging microscope |
WO2000020841A1 (en) * | 1998-10-05 | 2000-04-13 | Kla-Tencor Corporation | Interferometric system for measurement disturbance of a sample |
US7305158B2 (en) | 2004-04-15 | 2007-12-04 | Davidson Instruments Inc. | Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a Fabry-Perot interferometer |
US7492463B2 (en) | 2004-04-15 | 2009-02-17 | Davidson Instruments Inc. | Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor |
EP1674833A3 (en) | 2004-12-21 | 2007-05-30 | Davidson Instruments, Inc. | Fiber optic sensor system |
US7835598B2 (en) | 2004-12-21 | 2010-11-16 | Halliburton Energy Services, Inc. | Multi-channel array processor |
US20060274323A1 (en) | 2005-03-16 | 2006-12-07 | Gibler William N | High intensity fabry-perot sensor |
US7359057B2 (en) * | 2005-08-26 | 2008-04-15 | Ball Aerospace & Technologies Corp. | Method and apparatus for measuring small shifts in optical wavelengths |
WO2007033069A2 (en) | 2005-09-13 | 2007-03-22 | Davidson Instruments Inc. | Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same |
US7684051B2 (en) | 2006-04-18 | 2010-03-23 | Halliburton Energy Services, Inc. | Fiber optic seismic sensor based on MEMS cantilever |
WO2007126475A2 (en) | 2006-04-26 | 2007-11-08 | Davidson Instruments, Inc. | Fiber optic mems seismic sensor with mass supported by hinged beams |
US8115937B2 (en) | 2006-08-16 | 2012-02-14 | Davidson Instruments | Methods and apparatus for measuring multiple Fabry-Perot gaps |
US7787128B2 (en) | 2007-01-24 | 2010-08-31 | Halliburton Energy Services, Inc. | Transducer for measuring environmental parameters |
EP2952884B1 (en) * | 2014-06-04 | 2019-07-03 | DCG Systems GmbH | Method for examination of a sample by means of the lock-in thermography |
DE102014108424B3 (de) | 2014-06-16 | 2015-06-11 | Johann Wolfgang Goethe-Universität | Nicht-invasive Stoffanalyse |
KR102634764B1 (ko) | 2015-12-09 | 2024-02-06 | 디아몬테크 아게 | 재료 분석을 위한 장치 및 방법 |
CN115290569A (zh) * | 2015-12-09 | 2022-11-04 | 迪亚蒙泰克股份有限公司 | 用于分析材料的装置和方法 |
CN105738304B (zh) * | 2016-03-02 | 2018-06-15 | 南京先进激光技术研究院 | 一种光热放大光谱检测装置和检测方法 |
CN114646536B (zh) * | 2022-05-23 | 2022-08-16 | 四川中铁二院环保科技有限公司 | 一种剪切数据自动记录仪 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4522510A (en) * | 1982-07-26 | 1985-06-11 | Therma-Wave, Inc. | Thin film thickness measurement with thermal waves |
JPS606860A (ja) * | 1983-06-15 | 1985-01-14 | Hitachi Ltd | 非接触式超音波探傷方法およびその装置 |
US4652757A (en) * | 1985-08-02 | 1987-03-24 | At&T Technologies, Inc. | Method and apparatus for optically determining defects in a semiconductor material |
US4790664A (en) * | 1985-08-16 | 1988-12-13 | Canon Kabushiki Kaisha | Device and method for measuring optical properties |
US4750822A (en) * | 1986-03-28 | 1988-06-14 | Therma-Wave, Inc. | Method and apparatus for optically detecting surface states in materials |
-
1989
- 1989-03-09 US US07/321,103 patent/US4968144A/en not_active Expired - Fee Related
-
1990
- 1990-02-28 JP JP2506246A patent/JPH03504647A/ja active Pending
- 1990-02-28 EP EP19900906617 patent/EP0414889A4/en not_active Withdrawn
- 1990-02-28 WO PCT/US1990/001149 patent/WO1990010842A1/en not_active Application Discontinuation
- 1990-02-28 KR KR1019900702414A patent/KR920700388A/ko not_active Application Discontinuation
- 1990-03-06 IL IL93645A patent/IL93645A0/xx unknown
Also Published As
Publication number | Publication date |
---|---|
EP0414889A4 (en) | 1992-04-15 |
WO1990010842A1 (en) | 1990-09-20 |
EP0414889A1 (en) | 1991-03-06 |
US4968144A (en) | 1990-11-06 |
JPH03504647A (ja) | 1991-10-09 |
KR920700388A (ko) | 1992-02-19 |
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