IL243167B - מקורות אור מרובים הניתנים להפרדה בבדיקה אופטית - Google Patents

מקורות אור מרובים הניתנים להפרדה בבדיקה אופטית

Info

Publication number
IL243167B
IL243167B IL243167A IL24316715A IL243167B IL 243167 B IL243167 B IL 243167B IL 243167 A IL243167 A IL 243167A IL 24316715 A IL24316715 A IL 24316715A IL 243167 B IL243167 B IL 243167B
Authority
IL
Israel
Prior art keywords
optical inspection
illumination sources
multiple illumination
separable multiple
separable
Prior art date
Application number
IL243167A
Other languages
English (en)
Other versions
IL243167A0 (he
Inventor
Gordon Noam
Cohen Itay
Tzhori Amir
Original Assignee
Gordon Noam
Cohen Itay
Tzhori Amir
Cims Suzhou Co Ltd
Camtek Imaging Tech Suzhou Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gordon Noam, Cohen Itay, Tzhori Amir, Cims Suzhou Co Ltd, Camtek Imaging Tech Suzhou Co Ltd filed Critical Gordon Noam
Publication of IL243167A0 publication Critical patent/IL243167A0/he
Publication of IL243167B publication Critical patent/IL243167B/he

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Input (AREA)
IL243167A 2014-12-18 2015-12-16 מקורות אור מרובים הניתנים להפרדה בבדיקה אופטית IL243167B (he)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201462093477P 2014-12-18 2014-12-18

Publications (2)

Publication Number Publication Date
IL243167A0 IL243167A0 (he) 2016-02-29
IL243167B true IL243167B (he) 2021-02-28

Family

ID=56822577

Family Applications (1)

Application Number Title Priority Date Filing Date
IL243167A IL243167B (he) 2014-12-18 2015-12-16 מקורות אור מרובים הניתנים להפרדה בבדיקה אופטית

Country Status (3)

Country Link
CN (1) CN205562358U (he)
IL (1) IL243167B (he)
TW (1) TWI711816B (he)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024224393A1 (en) * 2023-04-24 2024-10-31 Camtek Ltd Inspection system for edge and bevel inspection of semiconductor structures

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017115658A1 (de) * 2017-07-12 2019-01-17 Carl Zeiss Microscopy Gmbh Flackern bei Winkel-variabler Beleuchtung
CN109030495A (zh) * 2018-06-26 2018-12-18 大连鉴影光学科技有限公司 一种基于机器视觉技术的光学元件缺陷检测方法
CN111610195A (zh) * 2019-02-22 2020-09-01 上海微电子装备（集团）股份有限公司 一种缺陷检测装置
CN115015275B (zh) * 2022-07-11 2025-05-23 凌云光技术股份有限公司 一种缺陷检测装置
TWI881588B (zh) * 2023-12-11 2025-04-21 家碩科技股份有限公司 可消除電路表面金屬紋路的光學檢測系統

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20080035592A (ko) * 2005-11-28 2008-04-23 닛토덴코 가부시키가이샤 광학 보상층 부착 편광판 및 그것을 이용한 화상 표시 장치
US7567344B2 (en) * 2006-05-12 2009-07-28 Corning Incorporated Apparatus and method for characterizing defects in a transparent substrate
DE112009000832T5 (de) * 2008-04-04 2011-07-28 Nanda Technologies GmbH, 85716 System und Verfahren zur optischen Inspektion
CN203490180U (zh) * 2013-09-13 2014-03-19 楚天科技股份有限公司 自动灯检机异物检测装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024224393A1 (en) * 2023-04-24 2024-10-31 Camtek Ltd Inspection system for edge and bevel inspection of semiconductor structures
US12315206B2 (en) 2023-04-24 2025-05-27 Camtek Ltd Inspection system for edge and bevel inspection of semiconductor structures

Also Published As

Publication number Publication date
TWI711816B (zh) 2020-12-01
CN205562358U (zh) 2016-09-07
TW201629470A (zh) 2016-08-16
IL243167A0 (he) 2016-02-29

Similar Documents

Publication Publication Date Title
TWI560513B (en) Light source system
AU359523S (en) Light
AU359521S (en) Light
GB2524093B (en) Light fixture
AU359518S (en) Light
GB2528934B (en) Preform Optical Inspection
AU359522S (en) Light
EP3825605C0 (en) DIFFUSION OF LIGHT BY MEANS OF LIGHT SOURCES
GB2536418B (en) Improvements in light testing
IL243167A0 (he) מקורות אור מרובים הניתנים להפרדה בבדיקה אופטית
GB201620083D0 (en) Illumination apparatus
TWI562408B (en) Light source module
GB2527199B (en) Recessed light fixture
AU359516S (en) Light bulb
GB2531944B (en) Illumination unit
PL3012511T3 (pl) Oprawa oświetleniowa z lampą
GB201410669D0 (en) Light source
TWM489245U (en) Illuminating apparatus based on the illumination setting
HUE042176T2 (hu) Világító lencse készülék
AU359519S (en) Light
GB201420857D0 (en) Light fixture and module
GB201413306D0 (en) Light Fitting
AU362015S (en) LED light module - horizontal
AU362014S (en) LED light module - vertical
PL2995853T3 (pl) Lampa wisząca

Legal Events

Date Code Title Description
FF Patent granted
KB Patent renewed
KB Patent renewed