IL243084A0 - Tdi imaging system with variable voltage readout clock signals - Google Patents

Tdi imaging system with variable voltage readout clock signals

Info

Publication number
IL243084A0
IL243084A0 IL243084A IL24308415A IL243084A0 IL 243084 A0 IL243084 A0 IL 243084A0 IL 243084 A IL243084 A IL 243084A IL 24308415 A IL24308415 A IL 24308415A IL 243084 A0 IL243084 A0 IL 243084A0
Authority
IL
Israel
Prior art keywords
imaging system
clock signals
variable voltage
readout clock
voltage readout
Prior art date
Application number
IL243084A
Other languages
English (en)
Hebrew (he)
Original Assignee
Kla Tencor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kla Tencor Corp filed Critical Kla Tencor Corp
Publication of IL243084A0 publication Critical patent/IL243084A0/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501Semiconductor wafers
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/711Time delay and integration [TDI] registers; TDI shift registers

Landscapes

  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
IL243084A 2013-06-26 2015-12-22 Tdi imaging system with variable voltage readout clock signals IL243084A0 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361839768P 2013-06-26 2013-06-26
US14/308,383 US9658170B2 (en) 2013-06-26 2014-06-18 TDI imaging system with variable voltage readout clock signals
PCT/US2014/044411 WO2014210359A1 (en) 2013-06-26 2014-06-26 Tdi imaging system with variable voltage readout clock signals

Publications (1)

Publication Number Publication Date
IL243084A0 true IL243084A0 (en) 2016-02-29

Family

ID=52115216

Family Applications (1)

Application Number Title Priority Date Filing Date
IL243084A IL243084A0 (en) 2013-06-26 2015-12-22 Tdi imaging system with variable voltage readout clock signals

Country Status (5)

Country Link
US (1) US9658170B2 (enExample)
JP (1) JP6312822B2 (enExample)
IL (1) IL243084A0 (enExample)
TW (1) TWI605247B (enExample)
WO (1) WO2014210359A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3107281B1 (en) * 2015-06-17 2020-03-18 IMEC vzw Device for imaging and method for acquiring a time delay and integration image
KR102332942B1 (ko) * 2015-11-27 2021-12-01 에스케이하이닉스 주식회사 전력 소모 감소를 위한 카운팅 장치 및 그를 이용한 아날로그-디지털 변환 장치와 씨모스 이미지 센서
ES2854000T3 (es) * 2016-11-07 2021-09-20 Dnae Diagnostics Ltd Matriz ISFET
EP3534872B1 (en) 2016-12-20 2022-03-23 Colgate-Palmolive Company Two-phase oral care whitening compositions
US11263737B2 (en) * 2019-01-10 2022-03-01 Lam Research Corporation Defect classification and source analysis for semiconductor equipment
CN112055157B (zh) * 2020-09-21 2021-06-29 中国科学院长春光学精密机械与物理研究所 多组tdi成像的摄像同步性控制系统
DE102024111144A1 (de) * 2024-04-22 2025-10-23 Carl Zeiss Smt Gmbh Verfahren zum Betreiben einer Maskeninspektionsvorrichtung, EUV-Kamera, Maskeninspektionsvorrichtung, Computerprogrammprodukt

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6597446B2 (en) 2001-03-22 2003-07-22 Sentec Corporation Holographic scatterometer for detection and analysis of wafer surface deposits
US7952633B2 (en) 2004-11-18 2011-05-31 Kla-Tencor Technologies Corporation Apparatus for continuous clocking of TDI sensors
US7609309B2 (en) 2004-11-18 2009-10-27 Kla-Tencor Technologies Corporation Continuous clocking of TDI sensors
US8624971B2 (en) 2009-01-23 2014-01-07 Kla-Tencor Corporation TDI sensor modules with localized driving and signal processing circuitry for high speed inspection
WO2010148293A2 (en) 2009-06-19 2010-12-23 Kla-Tencor Corporation Euv high throughput inspection system for defect detection on patterned euv masks, mask blanks, and wafers
US9279774B2 (en) 2011-07-12 2016-03-08 Kla-Tencor Corp. Wafer inspection
WO2015120328A1 (en) * 2014-02-07 2015-08-13 Rambus Inc. Feedthrough-compensated image sensor

Also Published As

Publication number Publication date
US20150002655A1 (en) 2015-01-01
JP2016533063A (ja) 2016-10-20
TW201516393A (zh) 2015-05-01
WO2014210359A1 (en) 2014-12-31
TWI605247B (zh) 2017-11-11
JP6312822B2 (ja) 2018-04-18
US9658170B2 (en) 2017-05-23

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