IL154252A0 - Method and device for testing the operativeness of printed circuit boards - Google Patents

Method and device for testing the operativeness of printed circuit boards

Info

Publication number
IL154252A0
IL154252A0 IL15425201A IL15425201A IL154252A0 IL 154252 A0 IL154252 A0 IL 154252A0 IL 15425201 A IL15425201 A IL 15425201A IL 15425201 A IL15425201 A IL 15425201A IL 154252 A0 IL154252 A0 IL 154252A0
Authority
IL
Israel
Prior art keywords
current
circuit boards
testing
operativeness
printed circuit
Prior art date
Application number
IL15425201A
Other languages
English (en)
Original Assignee
Botest Systems Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Botest Systems Gmbh filed Critical Botest Systems Gmbh
Publication of IL154252A0 publication Critical patent/IL154252A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Selective Calling Equipment (AREA)
IL15425201A 2000-08-05 2001-08-01 Method and device for testing the operativeness of printed circuit boards IL154252A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10038313A DE10038313A1 (de) 2000-08-05 2000-08-05 Verfahren und Vorrichtung zur Prüfung von Leiterplatten auf Funktionsfähigkeit
PCT/EP2001/008882 WO2002012911A1 (de) 2000-08-05 2001-08-01 Verfahren und vorrichtung zur prüfung von leiterplatten auf funktionsfähigkeit

Publications (1)

Publication Number Publication Date
IL154252A0 true IL154252A0 (en) 2003-09-17

Family

ID=7651468

Family Applications (2)

Application Number Title Priority Date Filing Date
IL15425201A IL154252A0 (en) 2000-08-05 2001-08-01 Method and device for testing the operativeness of printed circuit boards
IL154252A IL154252A (en) 2000-08-05 2003-02-03 Method and device for examining the activity of printed circuit boards

Family Applications After (1)

Application Number Title Priority Date Filing Date
IL154252A IL154252A (en) 2000-08-05 2003-02-03 Method and device for examining the activity of printed circuit boards

Country Status (12)

Country Link
US (1) US7129720B2 (zh)
EP (1) EP1317674B1 (zh)
JP (1) JP2004506205A (zh)
KR (1) KR100750400B1 (zh)
CN (1) CN1170167C (zh)
AT (1) ATE330232T1 (zh)
AU (1) AU2001285859A1 (zh)
CA (1) CA2420119C (zh)
DE (2) DE10038313A1 (zh)
ES (1) ES2272531T3 (zh)
IL (2) IL154252A0 (zh)
WO (1) WO2002012911A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT507322B1 (de) * 2008-10-07 2011-07-15 Nanoident Technologies Ag Schaltvorrichtung zur elektrischen kontaktprüfung
DE102015105075A1 (de) * 2015-04-01 2016-10-06 Infineon Technologies Ag Stromsensor
CN105338729B (zh) * 2015-10-28 2018-09-04 北大方正集团有限公司 一种电路板及其屏蔽膜接地情况检测方法和检测装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0286814A3 (de) * 1987-03-31 1990-03-21 Siemens Aktiengesellschaft Ansteuereinrichtung
US5032788A (en) * 1989-06-26 1991-07-16 Digital Equipment Corp. Test cell for non-contact opens/shorts testing of electrical circuits
US5177437A (en) * 1990-08-08 1993-01-05 Photon Dynamics, Inc. High-density optically-addressable circuit board probe panel and method for use
JP2613980B2 (ja) * 1991-02-28 1997-05-28 シャープ株式会社 アクティブマトリクス基板検査装置及びアクティブマトリクス基板の検査方法
JP2730295B2 (ja) * 1991-01-21 1998-03-25 日本電気株式会社 基板検査装置
EP0508062B1 (de) * 1991-04-10 1995-07-19 atg test systems GmbH Verfahren und Vorrichtung zur Prüfung einer elektrischen Leiteranordnung
US5357194A (en) * 1993-06-28 1994-10-18 Orbotech Ltd. Testing bed and apparatus including same for testing printed circuit boards and other like articles
JPH07140209A (ja) * 1993-09-20 1995-06-02 Fujitsu Ltd 回路配線基板の検査装置およびその検査方法
US6369591B1 (en) * 1999-01-14 2002-04-09 Maniatech Incorporated Apparatus and method using photoelectric effect for testing electrical traces
US6590398B1 (en) * 2000-07-06 2003-07-08 Honeywell Advanced Circuits, Inc. Fixture-less bare board tester

Also Published As

Publication number Publication date
AU2001285859A1 (en) 2002-02-18
CN1170167C (zh) 2004-10-06
CN1446317A (zh) 2003-10-01
US7129720B2 (en) 2006-10-31
WO2002012911A1 (de) 2002-02-14
DE50110170D1 (de) 2006-07-27
US20040251889A1 (en) 2004-12-16
KR100750400B1 (ko) 2007-08-17
ATE330232T1 (de) 2006-07-15
IL154252A (en) 2007-12-03
ES2272531T3 (es) 2007-05-01
JP2004506205A (ja) 2004-02-26
KR20030029125A (ko) 2003-04-11
CA2420119C (en) 2009-12-22
DE10038313A1 (de) 2002-02-21
EP1317674A1 (de) 2003-06-11
EP1317674B1 (de) 2006-06-14
CA2420119A1 (en) 2003-02-04

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Legal Events

Date Code Title Description
FF Patent granted
KB Patent renewed