IL135686A - Dual-band rf test interface circuit - Google Patents

Dual-band rf test interface circuit

Info

Publication number
IL135686A
IL135686A IL13568698A IL13568698A IL135686A IL 135686 A IL135686 A IL 135686A IL 13568698 A IL13568698 A IL 13568698A IL 13568698 A IL13568698 A IL 13568698A IL 135686 A IL135686 A IL 135686A
Authority
IL
Israel
Prior art keywords
dual
band
interface circuit
test interface
test
Prior art date
Application number
IL13568698A
Other languages
English (en)
Other versions
IL135686A0 (en
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of IL135686A0 publication Critical patent/IL135686A0/xx
Publication of IL135686A publication Critical patent/IL135686A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Transceivers (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
IL13568698A 1997-10-29 1998-10-22 Dual-band rf test interface circuit IL135686A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/960,172 US6125107A (en) 1997-10-29 1997-10-29 Dual-band RF test interface circuit
PCT/US1998/022450 WO1999022250A1 (en) 1997-10-29 1998-10-22 Dual-band rf test interface circuit

Publications (2)

Publication Number Publication Date
IL135686A0 IL135686A0 (en) 2001-05-20
IL135686A true IL135686A (en) 2003-03-12

Family

ID=25502896

Family Applications (1)

Application Number Title Priority Date Filing Date
IL13568698A IL135686A (en) 1997-10-29 1998-10-22 Dual-band rf test interface circuit

Country Status (8)

Country Link
US (1) US6125107A (ko)
EP (1) EP1027613A1 (ko)
JP (1) JP2001521355A (ko)
KR (1) KR20010031615A (ko)
AU (1) AU742155B2 (ko)
CA (1) CA2308401A1 (ko)
IL (1) IL135686A (ko)
WO (1) WO1999022250A1 (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6785324B1 (en) * 1999-10-26 2004-08-31 Intersil Corporation Transceiver including reactive termination for enhanced cross-modulation performance and related methods
KR100353269B1 (ko) * 2000-12-05 2002-09-18 한국항공우주연구원 프로토타입 브이엑스아이 모듈을 이용한 알에프 신호조절장치
DE10110207A1 (de) * 2001-03-02 2002-09-26 Acterna Muenchen Gmbh Verfahren zum Testen einer Meßaufnahmeeinrichtung
EP1309103A1 (en) * 2001-10-31 2003-05-07 Nokia Corporation Antenna system for GSM/WLAN radio operation
US7324588B2 (en) * 2003-06-30 2008-01-29 Nokia Corporation Apparatus, and associated method, for testing a mobile terminal in test conditions that emulate an operating environment
KR101049725B1 (ko) 2004-10-11 2011-07-19 에스케이 텔레콤주식회사 Wcdma와 cdma-2000 시스템 간의 핸드오버를테스트하기 위한 무선 환경을 제공하는 방법 및 이를 위한동적 전파 시뮬레이터
US7315730B2 (en) * 2005-06-14 2008-01-01 Motorola, Inc. Architecture for a receiver front end having dual output low noise amplifier driving separate pre-selectors coupled to a transformer for single ended output
US8350642B2 (en) * 2008-07-10 2013-01-08 Anaren, Inc. Power splitter/combiner
US20110081876A1 (en) * 2009-10-05 2011-04-07 Research In Motion Limited Device with dual-band antenna tuned by tank network

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2685586A1 (fr) * 1991-12-19 1993-06-25 Sagem Dispositif d'aiguillage en frequence a adaptation d'impedance.
JPH06188622A (ja) * 1992-12-16 1994-07-08 Murata Mfg Co Ltd アンテナ共用器
US5504800A (en) * 1994-04-04 1996-04-02 Hughes Aircraft Company Cellular automated test set
US5652599A (en) * 1995-09-11 1997-07-29 Qualcomm Incorporated Dual-band antenna system
US5732330A (en) * 1996-07-02 1998-03-24 Ericsson Inc. Dual band transceiver

Also Published As

Publication number Publication date
CA2308401A1 (en) 1999-05-06
AU1117399A (en) 1999-05-17
WO1999022250A1 (en) 1999-05-06
JP2001521355A (ja) 2001-11-06
AU742155B2 (en) 2001-12-20
EP1027613A1 (en) 2000-08-16
KR20010031615A (ko) 2001-04-16
IL135686A0 (en) 2001-05-20
US6125107A (en) 2000-09-26

Similar Documents

Publication Publication Date Title
GB2335800B (en) RF circuit module
SG81987A1 (en) Integrated circuit test socket
IL126209A0 (en) Rf coaxial angle-connector part
GB9813002D0 (en) An antenna
DE69820392D1 (de) Hochfrequenzschaltung
GB2333669B (en) High-frequency circuit device
SG50865A1 (en) An integrated circuit chip
AU1285399A (en) High frequency measuring circuit
SG79979A1 (en) Semiconductor integrated circuit testing apparatus
TW391620U (en) Circuit arrangement
IL135686A0 (en) Dual-band rf test interface circuit
EP1018029A4 (en) PROGRAMMABLE FORMAT SWITCHING FOR AN INTEGRATED SHADOW TEST ASSEMBLY
EP1018026A4 (en) LOAD CIRCUIT FOR TESTER FOR INTEGRATED CIRCUIT
GB9910578D0 (en) Mixer circuit arrangements
IL126208A0 (en) Rf coaxial connector part
TW381804U (en) Circuit arrangement
GB2335578B (en) Add-compare selection circuit
GB9708798D0 (en) Antenna booster-mixer circuit
GB2331588B (en) Electrical test device
GB2370157A8 (en) Integrated circuit testing
TW317334U (en) Test circuit
GB9801123D0 (en) Mixer circuit
GB9706065D0 (en) Combined circuit testing aid
GB9910867D0 (en) Circuit testing
GB9812606D0 (en) Circuit testing

Legal Events

Date Code Title Description
FF Patent granted
RH1 Patent not in force