GB2370157A8 - Integrated circuit testing - Google Patents

Integrated circuit testing

Info

Publication number
GB2370157A8
GB2370157A8 GB0205797A GB0205797A GB2370157A8 GB 2370157 A8 GB2370157 A8 GB 2370157A8 GB 0205797 A GB0205797 A GB 0205797A GB 0205797 A GB0205797 A GB 0205797A GB 2370157 A8 GB2370157 A8 GB 2370157A8
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
circuit testing
testing
integrated
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB0205797A
Other versions
GB2370157A (en
GB2370157B (en
GB0205797D0 (en
Inventor
Kinichi Igarashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP9170400A external-priority patent/JP2990113B2/en
Application filed by NEC Corp filed Critical NEC Corp
Publication of GB0205797D0 publication Critical patent/GB0205797D0/en
Publication of GB2370157A publication Critical patent/GB2370157A/en
Publication of GB2370157A8 publication Critical patent/GB2370157A8/en
Application granted granted Critical
Publication of GB2370157B publication Critical patent/GB2370157B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
GB0205797A 1997-06-26 1998-06-24 Method for analyzing failure of semiconductor integrated circuits Expired - Fee Related GB2370157B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP9170400A JP2990113B2 (en) 1997-06-26 1997-06-26 Semiconductor substrate failure analysis apparatus and failure analysis method
GB9813665A GB2329757A (en) 1997-06-26 1998-06-24 Integrated circuit testing

Publications (4)

Publication Number Publication Date
GB0205797D0 GB0205797D0 (en) 2002-04-24
GB2370157A GB2370157A (en) 2002-06-19
GB2370157A8 true GB2370157A8 (en) 2002-07-01
GB2370157B GB2370157B (en) 2002-08-28

Family

ID=26313925

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0205797A Expired - Fee Related GB2370157B (en) 1997-06-26 1998-06-24 Method for analyzing failure of semiconductor integrated circuits

Country Status (1)

Country Link
GB (1) GB2370157B (en)

Also Published As

Publication number Publication date
GB2370157A (en) 2002-06-19
GB2370157B (en) 2002-08-28
GB0205797D0 (en) 2002-04-24

Similar Documents

Publication Publication Date Title
TW454989U (en) Integrated circuit test socket
IL123207A0 (en) Integrated circuit device
EP1043774A4 (en) Semiconductor integrated circuit
IL135194A0 (en) An integrated optical circuit
EP0943157A4 (en) Integrated electronic circuit
SG50865A1 (en) An integrated circuit chip
IL119960A0 (en) Integrated circuit chip
GB9812633D0 (en) Circuit device
GB9708786D0 (en) Elecrochemical sensing circuits
GB9916835D0 (en) IC testing device
GB2339502B (en) An integrated circuit device
GB9607528D0 (en) Integrated circuit processor
SG79979A1 (en) Semiconductor integrated circuit testing apparatus
GB9706154D0 (en) Circuit simulator
TW391620U (en) Circuit arrangement
EP1015900A4 (en) Integrated circuit tester having multiple period generators
GB2333182B (en) An integrated circuit package
EP1018026A4 (en) Load circuit for integrated circuit tester
GB9721082D0 (en) Integrated circuit
SG72735A1 (en) Test handler
HK1016383A1 (en) Telephone-system interface circuit
GB9406263D0 (en) Integrated circuit
HK73997A (en) Integrated circuit
SG67502A1 (en) Burn-in board
TW381804U (en) Circuit arrangement

Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040624