TW317334U - Test circuit - Google Patents

Test circuit

Info

Publication number
TW317334U
TW317334U TW086200090U TW86200090U TW317334U TW 317334 U TW317334 U TW 317334U TW 086200090 U TW086200090 U TW 086200090U TW 86200090 U TW86200090 U TW 86200090U TW 317334 U TW317334 U TW 317334U
Authority
TW
Taiwan
Prior art keywords
test circuit
test
circuit
Prior art date
Application number
TW086200090U
Other languages
Chinese (zh)
Inventor
Nan-Que Wang
Original Assignee
United Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Microelectronics Corp filed Critical United Microelectronics Corp
Priority to TW086200090U priority Critical patent/TW317334U/en
Publication of TW317334U publication Critical patent/TW317334U/en

Links

TW086200090U 1997-01-04 1997-01-04 Test circuit TW317334U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086200090U TW317334U (en) 1997-01-04 1997-01-04 Test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086200090U TW317334U (en) 1997-01-04 1997-01-04 Test circuit

Publications (1)

Publication Number Publication Date
TW317334U true TW317334U (en) 1997-10-01

Family

ID=54623869

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086200090U TW317334U (en) 1997-01-04 1997-01-04 Test circuit

Country Status (1)

Country Link
TW (1) TW317334U (en)

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