IL112511A0 - System for improving the total thickness variation of a wafer - Google Patents

System for improving the total thickness variation of a wafer

Info

Publication number
IL112511A0
IL112511A0 IL11251195A IL11251195A IL112511A0 IL 112511 A0 IL112511 A0 IL 112511A0 IL 11251195 A IL11251195 A IL 11251195A IL 11251195 A IL11251195 A IL 11251195A IL 112511 A0 IL112511 A0 IL 112511A0
Authority
IL
Israel
Prior art keywords
wafer
improving
total thickness
thickness variation
variation
Prior art date
Application number
IL11251195A
Other languages
English (en)
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of IL112511A0 publication Critical patent/IL112511A0/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
IL11251195A 1994-02-18 1995-02-01 System for improving the total thickness variation of a wafer IL112511A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US19893194A 1994-02-18 1994-02-18

Publications (1)

Publication Number Publication Date
IL112511A0 true IL112511A0 (en) 1995-05-26

Family

ID=22735496

Family Applications (1)

Application Number Title Priority Date Filing Date
IL11251195A IL112511A0 (en) 1994-02-18 1995-02-01 System for improving the total thickness variation of a wafer

Country Status (5)

Country Link
US (1) US6379490B1 (ja)
EP (1) EP0668614A3 (ja)
JP (1) JPH088237A (ja)
KR (1) KR950025950A (ja)
IL (1) IL112511A0 (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5665199A (en) * 1995-06-23 1997-09-09 Advanced Micro Devices, Inc. Methodology for developing product-specific interlayer dielectric polish processes
JPH1076464A (ja) * 1996-08-30 1998-03-24 Canon Inc 研磨方法及びそれを用いた研磨装置
WO1998044549A1 (en) * 1997-04-03 1998-10-08 Memc Electronic Materials, Inc. Flattening process for epitaxial semiconductor wafers
US6030887A (en) * 1998-02-26 2000-02-29 Memc Electronic Materials, Inc. Flattening process for epitaxial semiconductor wafers
TW432518B (en) * 1997-04-03 2001-05-01 Memc Electronic Materials Spa Flattening process for semiconductor wafers
US6885466B1 (en) * 1999-07-16 2005-04-26 Denso Corporation Method for measuring thickness of oxide film
US6200908B1 (en) 1999-08-04 2001-03-13 Memc Electronic Materials, Inc. Process for reducing waviness in semiconductor wafers
JP2003077838A (ja) * 2001-08-30 2003-03-14 Toshiba Corp 半導体製造装置のドライクリーニング時期判定システム、半導体製造装置のドライクリーニング方法、半導体製造装置のドライクリーニングシステム及び半導体装置の製造方法
US6500681B1 (en) * 2002-01-11 2002-12-31 Advanced Micro Devices, Inc. Run-to-run etch control by feeding forward measured metal thickness
US10226852B2 (en) * 2013-12-31 2019-03-12 Nova Measuring Instruments Ltd. Surface planarization system and method
WO2017115377A1 (en) 2015-12-31 2017-07-06 Nova Measuring Instruments Ltd. Method and system for processing patterned structures
GB2623533A (en) * 2022-10-18 2024-04-24 Spts Technologies Ltd Apparatus and method for reducing substrate thickness and surface roughness

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0817171B2 (ja) * 1990-12-31 1996-02-21 株式会社半導体エネルギー研究所 プラズマ発生装置およびそれを用いたエッチング方法
JPH0834198B2 (ja) * 1990-11-28 1996-03-29 信越半導体株式会社 Ｓｏｉ基板における単結晶薄膜層の膜厚制御方法
US5254830A (en) * 1991-05-07 1993-10-19 Hughes Aircraft Company System for removing material from semiconductor wafers using a contained plasma
DE9112033U1 (de) * 1991-09-23 1993-01-28 Zimmer, Johannes, Klagenfurt, Kärnten Rakeleinrichtung
US5291415A (en) * 1991-12-13 1994-03-01 Hughes Aircraft Company Method to determine tool paths for thinning and correcting errors in thickness profiles of films
US5302237A (en) * 1992-02-13 1994-04-12 The United States Of America As Represented By The Secretary Of Commerce Localized plasma processing
US5238532A (en) * 1992-02-27 1993-08-24 Hughes Aircraft Company Method and apparatus for removal of subsurface damage in semiconductor materials by plasma etching
US5308447A (en) * 1992-06-09 1994-05-03 Luxtron Corporation Endpoint and uniformity determinations in material layer processing through monitoring multiple surface regions across the layer
US5282921A (en) * 1992-06-16 1994-02-01 Hughes Aircraft Company Apparatus and method for optimally scanning a two-dimensional surface of one or more objects
US5375064A (en) * 1993-12-02 1994-12-20 Hughes Aircraft Company Method and apparatus for moving a material removal tool with low tool accelerations

Also Published As

Publication number Publication date
JPH088237A (ja) 1996-01-12
KR950025950A (ko) 1995-09-18
US6379490B1 (en) 2002-04-30
EP0668614A2 (en) 1995-08-23
EP0668614A3 (en) 1996-03-27

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