HUE042725T2 - Eljárás és készülék bevont felületek minõségének vizsgálatára - Google Patents

Eljárás és készülék bevont felületek minõségének vizsgálatára

Info

Publication number
HUE042725T2
HUE042725T2 HUE17171668A HUE17171668A HUE042725T2 HU E042725 T2 HUE042725 T2 HU E042725T2 HU E17171668 A HUE17171668 A HU E17171668A HU E17171668 A HUE17171668 A HU E17171668A HU E042725 T2 HUE042725 T2 HU E042725T2
Authority
HU
Hungary
Prior art keywords
testing
quality
coated surfaces
coated
Prior art date
Application number
HUE17171668A
Other languages
English (en)
Inventor
Maximilian Dropmann
Original Assignee
Grob Gmbh & Co Kg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Grob Gmbh & Co Kg filed Critical Grob Gmbh & Co Kg
Publication of HUE042725T2 publication Critical patent/HUE042725T2/hu

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
    • G01N15/0806—Details, e.g. sample holders, mounting samples for testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
    • G01N15/088—Investigating volume, surface area, size or distribution of pores; Porosimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
HUE17171668A 2017-05-18 2017-05-18 Eljárás és készülék bevont felületek minõségének vizsgálatára HUE042725T2 (hu)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP17171668.1A EP3404403B1 (de) 2017-05-18 2017-05-18 Verfahren und vorrichtung zur prüfung der qualität von beschichteten oberflächen

Publications (1)

Publication Number Publication Date
HUE042725T2 true HUE042725T2 (hu) 2019-07-29

Family

ID=58715095

Family Applications (1)

Application Number Title Priority Date Filing Date
HUE17171668A HUE042725T2 (hu) 2017-05-18 2017-05-18 Eljárás és készülék bevont felületek minõségének vizsgálatára

Country Status (4)

Country Link
US (1) US10677590B2 (hu)
EP (1) EP3404403B1 (hu)
CN (1) CN108931536B (hu)
HU (1) HUE042725T2 (hu)

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CN109580569A (zh) * 2018-12-28 2019-04-05 蜂巢能源科技有限公司 涂覆浆料的检测装置
DE102019113033A1 (de) * 2019-05-17 2019-09-05 Gehring Technologies Gmbh Vorrichtung zur Herstellung von beschichteten Oberflächen, insbesondere von reibungsarmen Zylinderbohrungen für Verbrennungsmotoren
CN111008967B (zh) * 2019-12-04 2023-05-12 华北电力大学 一种绝缘子rtv涂层缺陷识别方法
KR102256181B1 (ko) * 2019-12-30 2021-05-27 한국과학기술원 강구조물의 도막 상태 검사 및 평가 방법과 이를 위한 시스템
CN113063793B (zh) * 2021-03-25 2022-01-07 中山大学 一种钛合金表面涂层服役情况的图形化处理分析方法及其应用
CN114713398A (zh) * 2022-04-25 2022-07-08 广东云筹科技有限公司 金属表面涂层色差控制方法、装置、电子设备及存储介质
CN116912243B (zh) * 2023-09-12 2023-11-21 吉林大学第一医院 一种用于医疗用管的涂层质量检测方法及系统

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JP5257756B2 (ja) * 2007-12-05 2013-08-07 日産自動車株式会社 鉄系溶射被膜、その形成方法及び摺動部材
JP5648309B2 (ja) * 2010-03-31 2015-01-07 Ｊｆｅスチール株式会社 溶融亜鉛系めっき鋼板の製造方法
CN102183223A (zh) * 2011-01-13 2011-09-14 新兴铸管股份有限公司 一种判定金属锈蚀面积的方法
JP2012155010A (ja) * 2011-01-24 2012-08-16 Keyence Corp 顕微鏡システム、表面状態観察方法および表面状態観察プログラム
KR101297175B1 (ko) * 2011-03-10 2013-08-21 삼성에스디아이 주식회사 리튬 이차전지용 양극 활물질, 이의 제조방법 및 이를 이용한 리튬 이차전지
US9811019B2 (en) * 2011-06-29 2017-11-07 Canon Kabushiki Kaisha Magnetic carrier and two-component developer
CN103308530B (zh) * 2012-03-09 2015-04-01 致茂电子(苏州)有限公司 表面花纹的检测方法
EP2830783B1 (en) * 2012-03-28 2018-11-14 Akzo Nobel Coatings International B.V. Method for applying a powder coating
CN103575212A (zh) * 2012-08-09 2014-02-12 厦门钨业股份有限公司 一种pcb微型铣刀参数检测方法
JP6604722B2 (ja) * 2013-01-18 2019-11-13 株式会社フジミインコーポレーテッド 金属酸化物含有膜付き物品
EP2977364B1 (en) * 2013-03-19 2021-08-11 NGK Insulators, Ltd. Joined body, and production method therefor
CN103234487A (zh) * 2013-03-29 2013-08-07 吉林大学 植物叶片面积及叶片表面病斑面积的测量方法
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CN203908956U (zh) * 2013-10-25 2014-10-29 重庆锦和鸿科技有限公司 一种用于检测工件表面缺陷的系统
WO2016006039A1 (ja) * 2014-07-08 2016-01-14 日産自動車株式会社 欠陥検査装置及び生産システム
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WO2016103423A1 (ja) * 2014-12-25 2016-06-30 オリンパス株式会社 骨接合用インプラントとその製造方法
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MX2018003118A (es) * 2015-09-28 2018-06-06 Nippon Steel & Sumitomo Metal Corp Punzon y su metodo de manufactura.
JP7013871B2 (ja) * 2015-10-28 2022-02-01 住友金属鉱山株式会社 非水系電解質二次電池用正極活物質とその製造方法、非水系電解質二次電池用正極合材ペーストおよび非水系電解質二次電池
JP6545898B2 (ja) * 2016-03-31 2019-07-17 Ｊｘ金属株式会社 強磁性材スパッタリングターゲット

Also Published As

Publication number Publication date
US20180335301A1 (en) 2018-11-22
EP3404403A1 (de) 2018-11-21
US10677590B2 (en) 2020-06-09
CN108931536A (zh) 2018-12-04
CN108931536B (zh) 2021-08-06
EP3404403B1 (de) 2019-03-27

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