HK69776A - Improvements in or relating to a system for aligning two objects - Google Patents

Improvements in or relating to a system for aligning two objects

Info

Publication number
HK69776A
HK69776A HK697/76*UA HK69776A HK69776A HK 69776 A HK69776 A HK 69776A HK 69776 A HK69776 A HK 69776A HK 69776 A HK69776 A HK 69776A
Authority
HK
Hong Kong
Prior art keywords
aligning
relating
objects
Prior art date
Application number
HK697/76*UA
Other languages
English (en)
Original Assignee
Kasper Instruments
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kasper Instruments filed Critical Kasper Instruments
Publication of HK69776A publication Critical patent/HK69776A/xx

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D3/00—Control of position or direction
    • G05D3/12—Control of position or direction using feedback
    • G05D3/14—Control of position or direction using feedback using an analogue comparing device
    • G05D3/18—Control of position or direction using feedback using an analogue comparing device delivering a series of pulses
    • G05D3/183—Control of position or direction using feedback using an analogue comparing device delivering a series of pulses using stepping motor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0014—Image feed-back for automatic industrial control, e.g. robot with camera

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Theoretical Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
HK697/76*UA 1971-03-22 1976-11-04 Improvements in or relating to a system for aligning two objects HK69776A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12659771A 1971-03-22 1971-03-22

Publications (1)

Publication Number Publication Date
HK69776A true HK69776A (en) 1976-11-12

Family

ID=22425706

Family Applications (1)

Application Number Title Priority Date Filing Date
HK697/76*UA HK69776A (en) 1971-03-22 1976-11-04 Improvements in or relating to a system for aligning two objects

Country Status (5)

Country Link
US (1) US3683195A (xx)
JP (3) JPS5348077B1 (xx)
DE (2) DE2213171C3 (xx)
GB (1) GB1326178A (xx)
HK (1) HK69776A (xx)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3796497A (en) * 1971-12-01 1974-03-12 Ibm Optical alignment method and apparatus
US3943359A (en) * 1973-06-15 1976-03-09 Hitachi, Ltd. Apparatus for relatively positioning a plurality of objects by the use of a scanning optoelectric microscope
DE2335227A1 (de) * 1973-07-11 1975-01-30 Leitz Ernst Gmbh Verfahren zur ausrichtung der winkellage eines werkstueckes mit optisch erfassbaren strukturen relativ zu einer bezugsrichtung sowie einrichtungen zu dessen durchfuehrung
US3890508A (en) * 1973-12-28 1975-06-17 Texas Instruments Inc Workpiece alignment system
JPS607764B2 (ja) * 1976-04-28 1985-02-27 キヤノン株式会社 走査型光検出装置
US4097750A (en) * 1977-03-18 1978-06-27 General Motors Corporation Method of orienting objects using optically smeared images
DE2846316A1 (de) * 1978-10-24 1980-06-04 Siemens Ag Verfahren und vorrichtung zur automatischen ausrichtung von zwei aufeinander einzujustierenden objekten
US4687980A (en) * 1980-10-20 1987-08-18 Eaton Corporation X-Y addressable workpiece positioner and mask aligner using same
US4977361A (en) * 1978-06-26 1990-12-11 Eaton Corporation X-Y addressable workpiece positioner and mask aligner using same
DE2930979A1 (de) * 1979-07-31 1981-02-26 Optimetrix Corp Verfahren und vorrichtung zur zweidimensionalen positionierung eines werkstueckes
US4310743A (en) * 1979-09-24 1982-01-12 Hughes Aircraft Company Ion beam lithography process and apparatus using step-and-repeat exposure
EP0036026B1 (de) * 1980-03-10 1986-11-12 Eaton-Optimetrix Inc. Adressierbare Positioniervorrichtung
US4335313A (en) * 1980-05-12 1982-06-15 The Perkin-Elmer Corporation Method and apparatus for aligning an opaque mask with an integrated circuit wafer
US4357540A (en) * 1980-12-19 1982-11-02 International Business Machines Corporation Semiconductor device array mask inspection method and apparatus
US4397559A (en) * 1981-02-19 1983-08-09 University Of Pittsburgh Apparatus for processing electromagnetic radiation and method
JPS57183034A (en) * 1981-05-07 1982-11-11 Toshiba Corp Electron bean transfer device
JPS5882248A (ja) * 1981-11-12 1983-05-17 Canon Inc 自動整合装置
JPS5999721A (ja) * 1982-11-29 1984-06-08 Canon Inc マーク検出装置
JPS59172724A (ja) * 1983-03-22 1984-09-29 Canon Inc マーク検出装置
DE3336901A1 (de) * 1983-10-11 1985-04-18 Deutsche Itt Industries Gmbh, 7800 Freiburg Maskenmarkierung und substratmarkierung fuer ein verfahren zum justieren einer eine maskenmarkierung enthaltenden photomaske auf einer substratmarkierung
US4555968A (en) * 1984-06-07 1985-12-03 Preco Industries, Inc. Web fed die cutting press having automatic 3-axis die registration system
US4853880A (en) * 1985-08-23 1989-08-01 Canon Kabushiki Kaisha Device for positioning a semi-conductor wafer
JPS63178573U (xx) * 1987-05-11 1988-11-18
US4972498A (en) * 1988-07-07 1990-11-20 Grumman Aerospace Corporation Alignment system for an optical matched filter correlator
WO1991011056A1 (en) * 1990-01-18 1991-07-25 Spetsialnoe Konstruktorskoe Bjuro Radioelektronnoi Apparatury Instituta Radiofiziki I Elektroniki Akademii Nauk Armyanskoi Ssr Method and device for adjustment of photoelectric converter of shaft rotation angle into code
NL1036476A1 (nl) * 2008-02-01 2009-08-04 Asml Netherlands Bv Alignment mark and a method of aligning a substrate comprising such an alignment mark.

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497705A (en) * 1968-02-12 1970-02-24 Itek Corp Mask alignment system using radial patterns and flying spot scanning

Also Published As

Publication number Publication date
JPS54133077A (en) 1979-10-16
DE2213171A1 (de) 1972-10-19
US3683195A (en) 1972-08-08
GB1326178A (en) 1973-08-08
JPS5794942U (xx) 1982-06-11
DE2265346A1 (de) 1977-08-04
JPS5348077B1 (xx) 1978-12-26
DE2213171B2 (de) 1978-07-27
DE2213171C3 (de) 1979-04-05

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