HK1244879A1 - 用於檢測感興趣材料的非侵入檢查系統和方法 - Google Patents
用於檢測感興趣材料的非侵入檢查系統和方法Info
- Publication number
- HK1244879A1 HK1244879A1 HK18104307.0A HK18104307A HK1244879A1 HK 1244879 A1 HK1244879 A1 HK 1244879A1 HK 18104307 A HK18104307 A HK 18104307A HK 1244879 A1 HK1244879 A1 HK 1244879A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- detection
- methods
- inspection systems
- intrusive inspection
- interest
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/223—Mixed interrogation beams, e.g. using more than one type of radiation beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Chemical & Material Sciences (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Pulmonology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562104158P | 2015-01-16 | 2015-01-16 | |
| PCT/US2016/013441 WO2016115370A1 (en) | 2015-01-16 | 2016-01-14 | Non-intrusive inspection systems and methods for the detection of materials interest |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| HK1244879A1 true HK1244879A1 (zh) | 2018-08-17 |
Family
ID=56406396
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| HK18104307.0A HK1244879A1 (zh) | 2015-01-16 | 2018-03-29 | 用於檢測感興趣材料的非侵入檢查系統和方法 |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US20160223706A1 (zh) |
| EP (1) | EP3245498A4 (zh) |
| JP (1) | JP2018506032A (zh) |
| KR (1) | KR20170127412A (zh) |
| CN (1) | CN107407622A (zh) |
| AU (1) | AU2016206612A1 (zh) |
| BR (1) | BR112017015316A2 (zh) |
| CA (1) | CA2973721A1 (zh) |
| GB (1) | GB2550078B (zh) |
| HK (1) | HK1244879A1 (zh) |
| MX (1) | MX2017009323A (zh) |
| WO (1) | WO2016115370A1 (zh) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
| CN104204854B (zh) | 2012-02-14 | 2017-05-10 | 美国科技工程公司 | 使用波长偏移光纤耦合闪烁检测器进行x射线检查 |
| US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
| WO2016003547A1 (en) | 2014-06-30 | 2016-01-07 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
| FR3023001A1 (fr) * | 2014-06-30 | 2016-01-01 | Commissariat Energie Atomique | Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion. |
| FR3023000B1 (fr) * | 2014-06-30 | 2016-07-29 | Commissariat Energie Atomique | Procede et systeme d'analyse d'un objet par diffractometrie utilisant un spectre en diffusion et un spectre en transmission |
| US10330612B2 (en) | 2014-09-11 | 2019-06-25 | Applied Materials, Inc. | Multi-function x-ray metrology tool for production inspection/monitoring of thin films and multidimensional structures |
| GB2554566B (en) | 2015-03-20 | 2021-06-02 | Rapiscan Systems Inc | Hand-held portable backscatter inspection system |
| US10345479B2 (en) | 2015-09-16 | 2019-07-09 | Rapiscan Systems, Inc. | Portable X-ray scanner |
| CA3059061A1 (en) * | 2017-04-17 | 2018-10-25 | Rapiscan Systems, Inc. | X-ray tomography inspection systems and methods |
| CN107741433A (zh) * | 2017-09-26 | 2018-02-27 | 天津工业大学 | 一种基于神经网络物体分析的液体检测方法 |
| WO2019214724A1 (zh) | 2018-05-10 | 2019-11-14 | 同方威视技术股份有限公司 | 组合扫描x射线发生器、复合检查设备以及检查方法 |
| US10830911B2 (en) | 2018-06-20 | 2020-11-10 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
| CN109765630A (zh) * | 2019-01-31 | 2019-05-17 | 南京森林警察学院 | 一种综合检测毒品探测装置 |
| JP7177721B2 (ja) * | 2019-02-15 | 2022-11-24 | 日本信号株式会社 | 検査システム |
| JP6783347B1 (ja) * | 2019-05-27 | 2020-11-11 | Ckd株式会社 | 検査装置、包装シート製造装置及び包装シート製造方法 |
| CN112489849A (zh) * | 2019-09-11 | 2021-03-12 | 西门子医疗有限公司 | 计算机断层扫描设备的x射线射束光谱过滤的过滤器装置 |
| US11604152B2 (en) * | 2019-10-09 | 2023-03-14 | Baker Hughes Oilfield Operations Llc | Fast industrial computed tomography for large objects |
| US11058369B2 (en) * | 2019-11-15 | 2021-07-13 | GE Precision Healthcare LLC | Systems and methods for coherent scatter imaging using a segmented photon-counting detector for computed tomography |
| WO2021150964A1 (en) | 2020-01-23 | 2021-07-29 | Rapiscan Systems, Inc. | Systems and methods for compton scatter and/or pulse pileup detection |
| GB2595215A (en) * | 2020-05-15 | 2021-11-24 | Smiths Detection France S A S | Detection of liquid |
| US11193898B1 (en) | 2020-06-01 | 2021-12-07 | American Science And Engineering, Inc. | Systems and methods for controlling image contrast in an X-ray system |
| US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
| JP7449821B2 (ja) | 2020-08-26 | 2024-03-14 | 株式会社日立製作所 | 内部状態検査システム及び内部状態検査方法 |
| US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
| GB2605606B (en) | 2021-04-06 | 2023-11-15 | Halo X Ray Tech Limited | A screening system |
| CN113218973B (zh) * | 2021-05-31 | 2022-05-03 | 中国工程物理研究院激光聚变研究中心 | 微电爆炸相变状态检测装置 |
| CN115598157A (zh) * | 2021-06-25 | 2023-01-13 | 中国兵器工业第五九研究所（Cn） | 一种基于阵列探测的短波长特征x射线衍射装置和方法 |
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| JP2544431B2 (ja) * | 1988-03-07 | 1996-10-16 | 株式会社日立製作所 | 物体の密度等の測定方法と装置 |
| US5642393A (en) * | 1995-09-26 | 1997-06-24 | Vivid Technologies, Inc. | Detecting contraband by employing interactive multiprobe tomography |
| EP0898704A1 (en) * | 1997-01-24 | 1999-03-03 | Quanta Vision, Inc. | Inspection equipment using small-angle topography in determining an object's internal structure and composition |
| WO1999041676A1 (en) * | 1998-02-11 | 1999-08-19 | Analogic Corporation | Computed tomography apparatus and method for classifying objects |
| JP3572191B2 (ja) * | 1998-04-14 | 2004-09-29 | 株式会社日立製作所 | Ｘ線ｃｔスキャナ装置 |
| CN1156688C (zh) * | 2001-02-13 | 2004-07-07 | 北京一体通探测技术有限公司 | 大型客体无损断层成像检测系统 |
| WO2004074871A1 (en) * | 2003-02-24 | 2004-09-02 | Philips Intellectual Property & Standards Gmbh | Automatic material discrimination by using computer tomography |
| GB0525593D0 (en) * | 2005-12-16 | 2006-01-25 | Cxr Ltd | X-ray tomography inspection systems |
| CN101151523B (zh) * | 2005-02-22 | 2011-01-26 | 护照系统公司 | 在用于材料检测和成像的非侵入式集装箱检查中具有核共振荧光的接近单色的和可调谐的光子源 |
| CN101071111B (zh) * | 2006-05-08 | 2011-05-11 | 清华大学 | 一种多视角航空集装箱安全检查系统及方法 |
| US7957505B1 (en) * | 2007-03-12 | 2011-06-07 | The United States Of America As Represented By The United States Department Of Energy | X-ray radiography for container inspection |
| WO2009082762A1 (en) * | 2007-12-25 | 2009-07-02 | Rapiscan Security Products, Inc. | Improved security system for screening people |
| US20090168958A1 (en) * | 2008-01-02 | 2009-07-02 | Cristina Francesca Cozzini | Apparatus and method for identifying components in a container |
| US7844027B2 (en) * | 2008-02-22 | 2010-11-30 | Morpho Detection, Inc. | XRD-based false alarm resolution in megavoltage computed tomography systems |
| US7924978B2 (en) * | 2008-02-22 | 2011-04-12 | Morpho Detection Inc. | System and method for XRD-based threat detection |
| US8218837B2 (en) * | 2008-06-06 | 2012-07-10 | General Electric Company | Material composition detection from effective atomic number computation |
| US7835495B2 (en) * | 2008-10-31 | 2010-11-16 | Morpho Detection, Inc. | System and method for X-ray diffraction imaging |
| CN101509880A (zh) * | 2009-03-25 | 2009-08-19 | 公安部第一研究所 | 一种应用x射线的多效应探测融合技术的安全检查系统 |
| CN101598683B (zh) * | 2009-06-30 | 2011-03-16 | 中广核检测技术有限公司 | 核反应堆压力容器接管安全端焊缝检测设备及其气囊组件 |
| US8477904B2 (en) * | 2010-02-16 | 2013-07-02 | Panalytical B.V. | X-ray diffraction and computed tomography |
| US8582718B2 (en) * | 2010-11-30 | 2013-11-12 | Morpho Detection, Inc. | Method and system for deriving molecular interference functions from XRD profiles |
| JP6105833B2 (ja) * | 2011-04-08 | 2017-03-29 | 株式会社東芝 | Ｘ線検出器及びｘ線検査装置 |
| CN203275670U (zh) * | 2012-09-28 | 2013-11-06 | 深圳市鑫源通电子有限公司 | 一种基于大扇形束康普顿背散射扫描技术的检测车 |
-
2016
- 2016-01-14 BR BR112017015316-5A patent/BR112017015316A2/pt not_active Application Discontinuation
- 2016-01-14 CN CN201680014288.5A patent/CN107407622A/zh active Pending
- 2016-01-14 EP EP16737893.4A patent/EP3245498A4/en not_active Withdrawn
- 2016-01-14 KR KR1020177021828A patent/KR20170127412A/ko unknown
- 2016-01-14 CA CA2973721A patent/CA2973721A1/en not_active Abandoned
- 2016-01-14 GB GB1711376.2A patent/GB2550078B/en not_active Expired - Fee Related
- 2016-01-14 US US14/996,018 patent/US20160223706A1/en not_active Abandoned
- 2016-01-14 AU AU2016206612A patent/AU2016206612A1/en not_active Abandoned
- 2016-01-14 JP JP2017536576A patent/JP2018506032A/ja active Pending
- 2016-01-14 WO PCT/US2016/013441 patent/WO2016115370A1/en active Application Filing
- 2016-01-14 MX MX2017009323A patent/MX2017009323A/es unknown
-
2018
- 2018-03-29 HK HK18104307.0A patent/HK1244879A1/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| GB2550078B (en) | 2021-03-03 |
| GB201711376D0 (en) | 2017-08-30 |
| CA2973721A1 (en) | 2016-07-21 |
| US20160223706A1 (en) | 2016-08-04 |
| EP3245498A1 (en) | 2017-11-22 |
| EP3245498A4 (en) | 2018-08-22 |
| JP2018506032A (ja) | 2018-03-01 |
| MX2017009323A (es) | 2017-11-20 |
| CN107407622A (zh) | 2017-11-28 |
| KR20170127412A (ko) | 2017-11-21 |
| GB2550078A (en) | 2017-11-08 |
| BR112017015316A2 (pt) | 2018-07-10 |
| AU2016206612A1 (en) | 2017-08-03 |
| WO2016115370A1 (en) | 2016-07-21 |
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