HK1217760A1 - μ介子斷層掃描檢查中的初級和次級掃描 - Google Patents

μ介子斷層掃描檢查中的初級和次級掃描

Info

Publication number
HK1217760A1
HK1217760A1 HK16105669.1A HK16105669A HK1217760A1 HK 1217760 A1 HK1217760 A1 HK 1217760A1 HK 16105669 A HK16105669 A HK 16105669A HK 1217760 A1 HK1217760 A1 HK 1217760A1
Authority
HK
Hong Kong
Prior art keywords
primary
secondary scanning
muon tomography
tomography inspection
inspection
Prior art date
Application number
HK16105669.1A
Other languages
English (en)
Inventor
Michael James Sossong
Shawn Mckenney
Robert Whalen
Gary Blanpied
Andre Lehovich
Priscilla Kurnadi
Original Assignee
Decision Sciences Int Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Decision Sciences Int Corp filed Critical Decision Sciences Int Corp
Publication of HK1217760A1 publication Critical patent/HK1217760A1/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/167Measuring radioactive content of objects, e.g. contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Engineering & Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
HK16105669.1A 2012-08-21 2016-05-17 μ介子斷層掃描檢查中的初級和次級掃描 HK1217760A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261691642P 2012-08-21 2012-08-21
PCT/US2013/056035 WO2014051895A2 (en) 2012-08-21 2013-08-21 Primary and secondary scanning in muon tomography inspection

Publications (1)

Publication Number Publication Date
HK1217760A1 true HK1217760A1 (zh) 2017-01-20

Family

ID=50389111

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16105669.1A HK1217760A1 (zh) 2012-08-21 2016-05-17 μ介子斷層掃描檢查中的初級和次級掃描

Country Status (12)

Country Link
US (2) US9423362B2 (zh)
EP (1) EP2888579B1 (zh)
JP (1) JP6342399B2 (zh)
KR (1) KR102101051B1 (zh)
CN (1) CN105074440B (zh)
AU (1) AU2013324154B2 (zh)
CA (1) CA2882704C (zh)
ES (1) ES2656667T3 (zh)
HK (1) HK1217760A1 (zh)
IL (1) IL237353A0 (zh)
SG (1) SG11201501280UA (zh)
WO (1) WO2014051895A2 (zh)

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GB2534799B (en) * 2013-10-16 2020-09-02 Rapiscan Systems Inc Systems and methods for high-Z threat alarm resolution
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AU2015264759B2 (en) 2014-02-26 2018-07-26 Decision Sciences International Corporation Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons
CN104950338B (zh) * 2014-03-24 2020-11-24 北京君和信达科技有限公司 对移动目标进行辐射检查的系统和方法
US10042079B2 (en) 2014-05-07 2018-08-07 Decision Sciences International Corporation Image-based object detection and feature extraction from a reconstructed charged particle image of a volume of interest
WO2016025409A1 (en) * 2014-08-11 2016-02-18 Decision Sciences International Corporation Material discrimination using scattering and stopping of muons and electrons
US10215717B2 (en) 2014-08-28 2019-02-26 Decision Sciences International Corporation Detection of an object within a volume of interest
WO2016057348A1 (en) * 2014-10-07 2016-04-14 Decision Sciences International Corporation Charged particle tomography with improved momentum estimation
US10115199B2 (en) * 2014-10-08 2018-10-30 Decision Sciences International Corporation Image based object locator
JP6567296B2 (ja) * 2015-03-04 2019-08-28 株式会社東芝 内部物質特定装置および内部物質特定方法
WO2016141226A1 (en) * 2015-03-04 2016-09-09 Decision Sciences International Corporation Active charged particle tomography
WO2016145105A1 (en) * 2015-03-10 2016-09-15 Decision Sciences International Corporation Sensor fusion with muon detector arrays to augment tomographic imaging using ambient cosmic rays
JP6577308B2 (ja) * 2015-09-15 2019-09-18 株式会社東芝 核燃料含有物の測定装置及びその測定方法
CN105116463A (zh) 2015-09-22 2015-12-02 同方威视技术股份有限公司 安检通道以及安检装置
GB201517820D0 (en) * 2015-10-05 2015-11-25 Claiden Peter R Sub-atomic particle and photon detector
ITUB20155808A1 (it) * 2015-11-23 2017-05-23 Istituto Naz Di Astrofisica Apparato e metodo per l'ispezione non invasiva di corpi solidi mediante imaging muonico
CN105549103B (zh) 2016-01-22 2018-11-16 清华大学 基于宇宙射线的检查运动对象的方法、装置及系统
CN105700029B (zh) 2016-01-22 2018-11-16 清华大学 基于宇宙射线的检查对象的方法、装置及系统
KR102348360B1 (ko) * 2016-06-13 2022-01-10 디시젼 사이언시스 인터내셔날 코퍼레이션 항구에서의 화물 컨테이너들의 효율적인 프로세싱 및 스캐닝을 위한 검사 스캐너들의 통합
CN108169254A (zh) * 2016-12-07 2018-06-15 清华大学 检查设备和检查方法
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CN109490975A (zh) * 2018-11-07 2019-03-19 浙江大华技术股份有限公司 安检系统、方法、装置和存储介质
US11125905B2 (en) 2019-05-03 2021-09-21 Saudi Arabian Oil Company Methods for automated history matching utilizing muon tomography
CN115793077A (zh) * 2021-09-09 2023-03-14 同方威视技术股份有限公司 行李物品智能安检系统和方法

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Also Published As

Publication number Publication date
IL237353A0 (en) 2015-04-30
KR102101051B1 (ko) 2020-04-14
AU2013324154B2 (en) 2017-02-23
JP6342399B2 (ja) 2018-06-13
US20160356913A1 (en) 2016-12-08
EP2888579B1 (en) 2017-09-27
EP2888579A2 (en) 2015-07-01
US10228486B2 (en) 2019-03-12
EP2888579A4 (en) 2016-04-27
CA2882704A1 (en) 2014-04-03
JP2015529821A (ja) 2015-10-08
KR20170020732A (ko) 2017-02-24
US9423362B2 (en) 2016-08-23
CA2882704C (en) 2020-09-22
WO2014051895A3 (en) 2014-07-03
SG11201501280UA (en) 2015-04-29
CN105074440A (zh) 2015-11-18
AU2013324154A1 (en) 2015-03-12
WO2014051895A2 (en) 2014-04-03
US20150212014A1 (en) 2015-07-30
ES2656667T3 (es) 2018-02-28
CN105074440B (zh) 2018-05-22

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