ES2656667T3 - Escaneo primario y secundario en inspección de tomografía muónica - Google Patents
Escaneo primario y secundario en inspección de tomografía muónica Download PDFInfo
- Publication number
- ES2656667T3 ES2656667T3 ES13842125.0T ES13842125T ES2656667T3 ES 2656667 T3 ES2656667 T3 ES 2656667T3 ES 13842125 T ES13842125 T ES 13842125T ES 2656667 T3 ES2656667 T3 ES 2656667T3
- Authority
- ES
- Spain
- Prior art keywords
- muon tomography
- muon
- tomography scanner
- imaging
- scanner
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000003325 tomography Methods 0.000 title abstract 15
- 238000007689 inspection Methods 0.000 title abstract 3
- 238000003384 imaging method Methods 0.000 abstract 6
- 238000001514 detection method Methods 0.000 abstract 3
- 239000002245 particle Substances 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 2
- 238000013475 authorization Methods 0.000 abstract 1
- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/167—Measuring radioactive content of objects, e.g. contamination
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
Un método para inspeccionar objetos basados en tomografía muónica usando muones producidos por rayos cósmicos que comprende: operar un primer escáner de tomografía muónica (310) que incluye detectores de partículas cargadas de detección de posición (7, 8) para realizar un escaneo con imágenes de un objeto (301, 302, 303) bajo inspección por una primera duración de toma de imágenes para obtener una primera imagen de tomografía muónica del objeto entero; procesar la primera imagen de tomografía muónica del objeto entero para obtener información dentro del objeto; estando dicho método caracterizado porque comprende además generar una señal de autorización cuando el procesamiento de la primera imagen de tomografía muónica revela que no hay una región sospechosa dentro del objeto para dejar el escáner de tomografía muónica (310) listo para recibir el próximo objeto para inspección; cuando el procesamiento de la primera imagen de tomografía muónica revela una o más regiones sospechosas dentro del objeto, retirar el objeto del primer escáner de tomografía muónica para colocar el objeto en un segundo escáner de tomografía muónica separado (320) que incluye detectores de partículas cargadas de detección de posición para realizar un escaneo con imágenes del objeto por una segunda duración de toma de imágenes más larga que la primera duración de toma de imágenes para obtener una segunda imagen de tomografía muónica de solo cada región sospechosa del objeto sin tomar imágenes del objeto entero, en donde el segundo escáner de tomografía muónica (320) se configura para que tenga un área de toma de imágenes más pequeña cubierta por los detectores de partículas cargadas de detección de posición del segundo escáner de tomografía muónica (320) para obtener una imagen de solo una porción del objeto; y mientras se opera el segundo escáner de tomografía muónica (320) para inspeccionar adicionalmente el objeto con dicha o dichas regiones sospechosas, se opera el primer escáner de tomografía muónica (310) para recibir un próximo objeto para inspeccionar.
Description
Claims (1)
-
imagen1 imagen2 imagen3
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261691642P | 2012-08-21 | 2012-08-21 | |
US201261691642P | 2012-08-21 | ||
PCT/US2013/056035 WO2014051895A2 (en) | 2012-08-21 | 2013-08-21 | Primary and secondary scanning in muon tomography inspection |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2656667T3 true ES2656667T3 (es) | 2018-02-28 |
Family
ID=50389111
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES13842125.0T Active ES2656667T3 (es) | 2012-08-21 | 2013-08-21 | Escaneo primario y secundario en inspección de tomografía muónica |
Country Status (12)
Country | Link |
---|---|
US (2) | US9423362B2 (es) |
EP (1) | EP2888579B1 (es) |
JP (1) | JP6342399B2 (es) |
KR (1) | KR102101051B1 (es) |
CN (1) | CN105074440B (es) |
AU (1) | AU2013324154B2 (es) |
CA (1) | CA2882704C (es) |
ES (1) | ES2656667T3 (es) |
HK (1) | HK1217760A1 (es) |
IL (1) | IL237353A0 (es) |
SG (1) | SG11201501280UA (es) |
WO (1) | WO2014051895A2 (es) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9310323B2 (en) | 2009-05-16 | 2016-04-12 | Rapiscan Systems, Inc. | Systems and methods for high-Z threat alarm resolution |
DE102012107815A1 (de) * | 2012-08-24 | 2014-02-27 | Gottwald Port Technology Gmbh | Verfahren und System zum berührungslosen Kontrollieren von Containern, insbesondere ISO-Containern, innerhalb einer Umschlaganlage |
GB2534799B (en) * | 2013-10-16 | 2020-09-02 | Rapiscan Systems Inc | Systems and methods for high-Z threat alarm resolution |
US9557427B2 (en) | 2014-01-08 | 2017-01-31 | Rapiscan Systems, Inc. | Thin gap chamber neutron detectors |
US9915626B2 (en) | 2014-02-26 | 2018-03-13 | Decision Sciences International Corporation | Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons |
CN104950338B (zh) * | 2014-03-24 | 2020-11-24 | 北京君和信达科技有限公司 | 对移动目标进行辐射检查的系统和方法 |
US10042079B2 (en) | 2014-05-07 | 2018-08-07 | Decision Sciences International Corporation | Image-based object detection and feature extraction from a reconstructed charged particle image of a volume of interest |
US9841530B2 (en) | 2014-08-11 | 2017-12-12 | Decision Sciences International Corporation | Material discrimination using scattering and stopping of muons and electrons |
WO2016033564A1 (en) | 2014-08-28 | 2016-03-03 | Decision Sciences International Corporation | Detection of an object within a volume of interest |
US9588064B2 (en) * | 2014-10-07 | 2017-03-07 | Decision Sciences International Corporation | Charged particle tomography with improved momentum estimation |
US10115199B2 (en) * | 2014-10-08 | 2018-10-30 | Decision Sciences International Corporation | Image based object locator |
JP6567296B2 (ja) * | 2015-03-04 | 2019-08-28 | 株式会社東芝 | 内部物質特定装置および内部物質特定方法 |
US9817150B2 (en) | 2015-03-04 | 2017-11-14 | Decision Sciences International Corporation | Active charged particle tomography |
WO2016145105A1 (en) * | 2015-03-10 | 2016-09-15 | Decision Sciences International Corporation | Sensor fusion with muon detector arrays to augment tomographic imaging using ambient cosmic rays |
JP6577308B2 (ja) * | 2015-09-15 | 2019-09-18 | 株式会社東芝 | 核燃料含有物の測定装置及びその測定方法 |
CN105116463A (zh) | 2015-09-22 | 2015-12-02 | 同方威视技术股份有限公司 | 安检通道以及安检装置 |
GB201517820D0 (en) * | 2015-10-05 | 2015-11-25 | Claiden Peter R | Sub-atomic particle and photon detector |
ITUB20155808A1 (it) * | 2015-11-23 | 2017-05-23 | Istituto Naz Di Astrofisica | Apparato e metodo per l'ispezione non invasiva di corpi solidi mediante imaging muonico |
CN105700029B (zh) * | 2016-01-22 | 2018-11-16 | 清华大学 | 基于宇宙射线的检查对象的方法、装置及系统 |
CN105549103B (zh) | 2016-01-22 | 2018-11-16 | 清华大学 | 基于宇宙射线的检查运动对象的方法、装置及系统 |
WO2017218599A1 (en) * | 2016-06-13 | 2017-12-21 | Decision Sciences International Corporation | Integration of inspection scanners for efficient processing and scanning of cargo containers at a port |
CN108169254A (zh) * | 2016-12-07 | 2018-06-15 | 清华大学 | 检查设备和检查方法 |
US10381205B1 (en) | 2018-05-04 | 2019-08-13 | Douglas Electrical Components, Inc. | Muon drift tube and method of making same |
CN109490975A (zh) * | 2018-11-07 | 2019-03-19 | 浙江大华技术股份有限公司 | 安检系统、方法、装置和存储介质 |
US11125905B2 (en) | 2019-05-03 | 2021-09-21 | Saudi Arabian Oil Company | Methods for automated history matching utilizing muon tomography |
CN115793077A (zh) * | 2021-09-09 | 2023-03-14 | 同方威视技术股份有限公司 | 行李物品智能安检系统和方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000235007A (ja) * | 1999-02-15 | 2000-08-29 | Hitachi Engineering & Services Co Ltd | X線ctスキャナ装置およびx線貨物検査方法 |
US7220967B1 (en) * | 2003-08-13 | 2007-05-22 | Quintell Of Ohio, Llc | Method and apparatus for detection of radioactive material |
US7317195B2 (en) * | 2004-04-08 | 2008-01-08 | Eikman Edward A | Quantitative transmission/emission detector system and methods of detecting concealed radiation sources |
US7652254B2 (en) * | 2005-01-13 | 2010-01-26 | Celight, Inc. | Method and system for nuclear substance revealing using muon detection |
US20110101230A1 (en) * | 2005-02-04 | 2011-05-05 | Dan Inbar | Advanced SNM Detector |
US8173970B2 (en) * | 2005-02-04 | 2012-05-08 | Dan Inbar | Detection of nuclear materials |
CN101071110B (zh) * | 2006-05-08 | 2011-05-11 | 清华大学 | 一种基于螺旋扫描立体成像的货物安全检查方法 |
US7633062B2 (en) | 2006-10-27 | 2009-12-15 | Los Alamos National Security, Llc | Radiation portal monitor system and method |
WO2008127442A2 (en) * | 2007-01-04 | 2008-10-23 | Celight, Inc. | High z material detection system and method |
US7945105B1 (en) | 2008-04-07 | 2011-05-17 | Decision Sciences International Corporation | Automated target shape detection for vehicle muon tomography |
WO2009002602A2 (en) * | 2007-04-23 | 2008-12-31 | Los Alamos National Security, Llc | Imaging and sensing based on muon tomography |
KR101666688B1 (ko) * | 2008-02-25 | 2016-10-17 | 인터 유니버시티 리서치 인스티튜트 코포레이션 하이 에너지 엑셀레이터 리서치 오거나이제이션 | 복합 구조물의 비파괴 검사 장치 및 비파괴 검사 방법 |
RU2503953C2 (ru) * | 2008-08-27 | 2014-01-10 | ЛОС АЛАМОС НЭШНЛ СЕКЬЮРИТИ, ЭлЭлСи | Построение изображения по заряженным частицам, создаваемым космическими лучами |
JP5315044B2 (ja) * | 2008-12-26 | 2013-10-16 | シスメックス株式会社 | 検体検査装置 |
CN102483965B (zh) | 2009-05-26 | 2015-02-04 | 拉皮斯坎系统股份有限公司 | 识别特定目标项目的x 射线层析检查系统 |
KR101311787B1 (ko) * | 2011-05-30 | 2013-09-25 | 고려대학교 산학협력단 | 방사선을 이용한 물질 탐지 장치, 및 방법 |
-
2013
- 2013-08-21 SG SG11201501280UA patent/SG11201501280UA/en unknown
- 2013-08-21 US US14/423,381 patent/US9423362B2/en active Active
- 2013-08-21 EP EP13842125.0A patent/EP2888579B1/en active Active
- 2013-08-21 JP JP2015528630A patent/JP6342399B2/ja active Active
- 2013-08-21 AU AU2013324154A patent/AU2013324154B2/en active Active
- 2013-08-21 KR KR1020157007022A patent/KR102101051B1/ko active IP Right Grant
- 2013-08-21 WO PCT/US2013/056035 patent/WO2014051895A2/en active Application Filing
- 2013-08-21 CN CN201380055004.3A patent/CN105074440B/zh active Active
- 2013-08-21 CA CA2882704A patent/CA2882704C/en active Active
- 2013-08-21 ES ES13842125.0T patent/ES2656667T3/es active Active
-
2015
- 2015-02-22 IL IL237353A patent/IL237353A0/en active IP Right Grant
-
2016
- 2016-05-17 HK HK16105669.1A patent/HK1217760A1/zh unknown
- 2016-08-22 US US15/243,819 patent/US10228486B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20150212014A1 (en) | 2015-07-30 |
CN105074440B (zh) | 2018-05-22 |
JP2015529821A (ja) | 2015-10-08 |
AU2013324154B2 (en) | 2017-02-23 |
AU2013324154A1 (en) | 2015-03-12 |
CN105074440A (zh) | 2015-11-18 |
HK1217760A1 (zh) | 2017-01-20 |
EP2888579A4 (en) | 2016-04-27 |
IL237353A0 (en) | 2015-04-30 |
US9423362B2 (en) | 2016-08-23 |
KR20170020732A (ko) | 2017-02-24 |
CA2882704A1 (en) | 2014-04-03 |
SG11201501280UA (en) | 2015-04-29 |
WO2014051895A3 (en) | 2014-07-03 |
US10228486B2 (en) | 2019-03-12 |
EP2888579A2 (en) | 2015-07-01 |
JP6342399B2 (ja) | 2018-06-13 |
CA2882704C (en) | 2020-09-22 |
KR102101051B1 (ko) | 2020-04-14 |
US20160356913A1 (en) | 2016-12-08 |
WO2014051895A2 (en) | 2014-04-03 |
EP2888579B1 (en) | 2017-09-27 |
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