HK1211703A1 - An inspection device, method and system - Google Patents
An inspection device, method and systemInfo
- Publication number
- HK1211703A1 HK1211703A1 HK15112552.8A HK15112552A HK1211703A1 HK 1211703 A1 HK1211703 A1 HK 1211703A1 HK 15112552 A HK15112552 A HK 15112552A HK 1211703 A1 HK1211703 A1 HK 1211703A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- inspection device
- inspection
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/223—Mixed interrogation beams, e.g. using more than one type of radiation beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/643—Specific applications or type of materials object on conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Toxicology (AREA)
- Molecular Biology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410075765.1A CN104897703B (zh) | 2014-03-04 | 2014-03-04 | 检查设备、方法和系统 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1211703A1 true HK1211703A1 (en) | 2016-05-27 |
Family
ID=54030502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK15112552.8A HK1211703A1 (en) | 2014-03-04 | 2015-12-21 | An inspection device, method and system |
Country Status (11)
Country | Link |
---|---|
US (1) | US10408966B2 (ko) |
EP (1) | EP3115773B1 (ko) |
JP (1) | JP6306738B2 (ko) |
KR (1) | KR101862692B1 (ko) |
CN (1) | CN104897703B (ko) |
AU (2) | AU2015226613A1 (ko) |
BR (1) | BR112016016805B1 (ko) |
ES (1) | ES2871025T3 (ko) |
HK (1) | HK1211703A1 (ko) |
RU (1) | RU2636810C1 (ko) |
WO (1) | WO2015131802A1 (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106896121B (zh) | 2015-12-18 | 2019-07-05 | 清华大学 | 检测系统和方法 |
CN108414546A (zh) * | 2018-05-10 | 2018-08-17 | 同方威视技术股份有限公司 | 透射检查设备和检查方法 |
DE102019208888A1 (de) * | 2019-06-19 | 2020-12-24 | Friedrich-Alexander-Universität Erlangen-Nürnberg | Verfahren zur Herstellung eines Streustrahlkollimators, Streustrahlkollimator und Röntgengerät mit Streustrahlkollimator |
CN110428478B (zh) * | 2019-07-15 | 2021-09-24 | 清华大学 | 交替光源扇束x射线ct采样方法及装置 |
CN112433258A (zh) * | 2019-08-09 | 2021-03-02 | 同方威视技术股份有限公司 | 检查系统 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU1191796A1 (ru) * | 1983-12-27 | 1985-11-15 | Киевский Ордена Ленина Государственный Университет Им.Т.Г.Шевченко | Малоугловой рентгеновский дифрактометр |
US5263075A (en) * | 1992-01-13 | 1993-11-16 | Ion Track Instruments, Inc. | High angular resolution x-ray collimator |
GB2297835A (en) * | 1995-02-08 | 1996-08-14 | Secr Defence | Three dimensional detection of contraband using x rays |
CN1146890A (zh) * | 1995-03-30 | 1997-04-09 | 西门子公司 | 用于电子束x线断层成相的固定隔板准直器 |
RU2119659C1 (ru) * | 1997-01-24 | 1998-09-27 | Закрытое акционерное общество "Кванта Инвест" | Устройство для малоугловой топографии (варианты) |
JP2000235007A (ja) * | 1999-02-15 | 2000-08-29 | Hitachi Engineering & Services Co Ltd | X線ctスキャナ装置およびx線貨物検査方法 |
DE19954664B4 (de) * | 1999-11-13 | 2006-06-08 | Smiths Heimann Gmbh | Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien eines Gegenstandes |
ATE250761T1 (de) * | 2001-03-14 | 2003-10-15 | Yxlon Int X Ray Gmbh | Anordnung zum messen des impulsübertragungsspektrums von in einem untersuchungsbereich für behältnisse elastisch gestreuten röntgenquanten |
TW583463B (en) | 2002-11-07 | 2004-04-11 | Toppoly Optoelectronics Corp | Transflective liquid crystal display |
EP1609004A2 (en) * | 2003-04-02 | 2005-12-28 | Reveal Imaging Technologies, Inc. | System and method for detection of explosives in baggage |
US7092485B2 (en) * | 2003-05-27 | 2006-08-15 | Control Screening, Llc | X-ray inspection system for detecting explosives and other contraband |
WO2005120354A1 (en) * | 2004-06-07 | 2005-12-22 | Philips Intellectual Property & Standards Gmbh | Coherent-scatter computer tomograph |
US7697664B2 (en) * | 2006-05-15 | 2010-04-13 | Morpho Detection, Inc. | Systems and methods for determining an atomic number of a substance |
JP4860418B2 (ja) * | 2006-10-10 | 2012-01-25 | 株式会社リガク | X線光学系 |
US7742563B2 (en) * | 2008-09-10 | 2010-06-22 | Morpho Detection, Inc. | X-ray source and detector configuration for a non-translational x-ray diffraction system |
US20110188632A1 (en) * | 2010-02-03 | 2011-08-04 | Geoffrey Harding | Multiple plane multi-inverse fan-beam detection systems and method for using the same |
WO2012049590A1 (en) | 2010-10-13 | 2012-04-19 | Koninklijke Philips Electronics N.V. | Multi-modality compact bore imaging system |
NL2009049C2 (en) * | 2012-06-21 | 2013-12-24 | Entech Scient B V | Method and device for identifying unknown substances in an object. |
CN103330570B (zh) * | 2013-04-27 | 2016-06-08 | 中国人民解放军北京军区总医院 | X射线准直器、x射线准直系统及移动ct扫描仪 |
CN103385732A (zh) * | 2013-07-25 | 2013-11-13 | 中国科学院苏州生物医学工程技术研究所 | 一种静态ct扫描仪 |
CN203929678U (zh) * | 2014-03-04 | 2014-11-05 | 清华大学 | 检查设备和系统 |
-
2014
- 2014-03-04 CN CN201410075765.1A patent/CN104897703B/zh active Active
-
2015
- 2015-03-03 AU AU2015226613A patent/AU2015226613A1/en not_active Abandoned
- 2015-03-03 ES ES15759349T patent/ES2871025T3/es active Active
- 2015-03-03 KR KR1020167026749A patent/KR101862692B1/ko active IP Right Grant
- 2015-03-03 EP EP15759349.2A patent/EP3115773B1/en active Active
- 2015-03-03 US US15/122,659 patent/US10408966B2/en active Active
- 2015-03-03 JP JP2016558258A patent/JP6306738B2/ja active Active
- 2015-03-03 WO PCT/CN2015/073558 patent/WO2015131802A1/zh active Application Filing
- 2015-03-03 RU RU2016137612A patent/RU2636810C1/ru active
- 2015-03-03 BR BR112016016805-4A patent/BR112016016805B1/pt active IP Right Grant
- 2015-12-21 HK HK15112552.8A patent/HK1211703A1/xx unknown
-
2017
- 2017-11-22 AU AU2017265073A patent/AU2017265073B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
AU2017265073B2 (en) | 2019-04-18 |
BR112016016805B1 (pt) | 2020-10-20 |
CN104897703B (zh) | 2018-09-28 |
EP3115773A1 (en) | 2017-01-11 |
RU2636810C1 (ru) | 2017-11-28 |
KR101862692B1 (ko) | 2018-05-31 |
EP3115773B1 (en) | 2021-03-03 |
EP3115773A4 (en) | 2017-10-18 |
WO2015131802A1 (zh) | 2015-09-11 |
JP2016540999A (ja) | 2016-12-28 |
KR20160128365A (ko) | 2016-11-07 |
CN104897703A (zh) | 2015-09-09 |
AU2015226613A1 (en) | 2016-07-28 |
ES2871025T3 (es) | 2021-10-28 |
AU2017265073A1 (en) | 2017-12-14 |
US20170075026A1 (en) | 2017-03-16 |
US10408966B2 (en) | 2019-09-10 |
JP6306738B2 (ja) | 2018-04-04 |
BR112016016805A2 (pt) | 2018-06-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
IL249468B (en) | Test device, test method and method for preparing the device | |
GB2528554B (en) | Monitoring device, monitoring system, and monitoring method | |
HK1209522A1 (en) | Device and method for detection | |
EP3141432A4 (en) | Inspection device, inspection system, and inspection method | |
EP3190401A4 (en) | Inspection device and inspection method | |
EP3203217A4 (en) | Inspection device and inspection method | |
HK1244388A1 (zh) | 方法、裝置和系統 | |
GB201700989D0 (en) | Assembly, apparatus, system and method | |
EP3091778A4 (en) | Measurement method, configuration method, related device and system | |
GB2535091B (en) | Monitoring device, monitoring system, and monitoring method | |
GB2542079B (en) | Ranging measurement apparatus, methods, and systems | |
GB2545861B (en) | Combined NMR-resistivity measurement apparatus, systems, and methods | |
PT3210417T (pt) | Método e aparelho para adquirir informações de sistema | |
GB201417624D0 (en) | Apparatus, system and method | |
HK1211703A1 (en) | An inspection device, method and system | |
EP3109631A4 (en) | Surface-properties inspection/classification device, surface-properties inspection/classification system, and surface-properties inspection/classification method | |
GB201502394D0 (en) | Ranging method, ranging device, location device and location method | |
GB201502420D0 (en) | Ranging method, ranging device, location device and location method | |
EP2981148A4 (en) | METHOD, APPARATUS AND SYSTEM FOR MANAGING DEVICE | |
GB201402086D0 (en) | System and method for performing an operation | |
GB201611810D0 (en) | Measuring device, method and system | |
HK1219158A1 (zh) | 種服務處理方法及裝置 | |
EP3315594A4 (en) | INSPECTION SYSTEM, INSPECTION DEVICE AND INSPECTION PROCEDURES | |
GB201414572D0 (en) | Apparatus, System and Method | |
GB201406954D0 (en) | Notification system, method and device therefor |