CN104897703B - 检查设备、方法和系统 - Google Patents
检查设备、方法和系统 Download PDFInfo
- Publication number
- CN104897703B CN104897703B CN201410075765.1A CN201410075765A CN104897703B CN 104897703 B CN104897703 B CN 104897703B CN 201410075765 A CN201410075765 A CN 201410075765A CN 104897703 B CN104897703 B CN 104897703B
- Authority
- CN
- China
- Prior art keywords
- ray
- detector
- source
- checked
- scattered
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000007689 inspection Methods 0.000 claims abstract description 34
- 230000003595 spectral effect Effects 0.000 claims abstract description 24
- 239000000126 substance Substances 0.000 claims abstract description 23
- 238000012545 processing Methods 0.000 claims abstract description 17
- 239000000523 sample Substances 0.000 claims abstract description 13
- 230000003993 interaction Effects 0.000 claims abstract description 8
- 239000000463 material Substances 0.000 claims description 17
- 239000002360 explosive Substances 0.000 claims description 15
- 230000033001 locomotion Effects 0.000 claims description 10
- 238000010521 absorption reaction Methods 0.000 claims description 8
- 230000005540 biological transmission Effects 0.000 claims description 6
- 239000004744 fabric Substances 0.000 claims description 4
- 230000002745 absorbent Effects 0.000 claims description 3
- 239000002250 absorbent Substances 0.000 claims description 3
- 238000003384 imaging method Methods 0.000 claims description 3
- 230000005855 radiation Effects 0.000 claims description 3
- 238000013170 computed tomography imaging Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 description 33
- 238000013461 design Methods 0.000 description 18
- 238000010586 diagram Methods 0.000 description 11
- 230000001427 coherent effect Effects 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 5
- 229910004611 CdZnTe Inorganic materials 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 208000005168 Intussusception Diseases 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000036961 partial effect Effects 0.000 description 2
- 230000002829 reductive effect Effects 0.000 description 2
- PLXMOAALOJOTIY-FPTXNFDTSA-N Aesculin Natural products OC[C@@H]1[C@@H](O)[C@H](O)[C@@H](O)[C@H](O)[C@H]1Oc2cc3C=CC(=O)Oc3cc2O PLXMOAALOJOTIY-FPTXNFDTSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000000333 X-ray scattering Methods 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000035772 mutation Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/223—Mixed interrogation beams, e.g. using more than one type of radiation beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/643—Specific applications or type of materials object on conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Toxicology (AREA)
- Molecular Biology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (12)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410075765.1A CN104897703B (zh) | 2014-03-04 | 2014-03-04 | 检查设备、方法和系统 |
| JP2016558258A JP6306738B2 (ja) | 2014-03-04 | 2015-03-03 | 検査デバイス、方法およびシステム |
| PCT/CN2015/073558 WO2015131802A1 (zh) | 2014-03-04 | 2015-03-03 | 检查设备、方法和系统 |
| US15/122,659 US10408966B2 (en) | 2014-03-04 | 2015-03-03 | Inspection devices, inspection methods and inspection systems |
| BR112016016805-4A BR112016016805B1 (pt) | 2014-03-04 | 2015-03-03 | dispositivos de inspeção, métodos de inspeção e sistemas de inspeção |
| ES15759349T ES2871025T3 (es) | 2014-03-04 | 2015-03-03 | Dispositivo, método y sistema de inspección |
| KR1020167026749A KR101862692B1 (ko) | 2014-03-04 | 2015-03-03 | 검사 설비, 검사 방법 및 검사 시스템 |
| EP15759349.2A EP3115773B1 (en) | 2014-03-04 | 2015-03-03 | Inspection device, method and system |
| RU2016137612A RU2636810C1 (ru) | 2014-03-04 | 2015-03-03 | Устройства обследования, способы обследования и системы обследования |
| AU2015226613A AU2015226613A1 (en) | 2014-03-04 | 2015-03-03 | Inspection devices, inspection methods and inspection systems |
| HK15112552.8A HK1211703A1 (en) | 2014-03-04 | 2015-12-21 | An inspection device, method and system |
| AU2017265073A AU2017265073B2 (en) | 2014-03-04 | 2017-11-22 | Inspection devices, inspection methods and inspection systems |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410075765.1A CN104897703B (zh) | 2014-03-04 | 2014-03-04 | 检查设备、方法和系统 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104897703A CN104897703A (zh) | 2015-09-09 |
| CN104897703B true CN104897703B (zh) | 2018-09-28 |
Family
ID=54030502
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410075765.1A Active CN104897703B (zh) | 2014-03-04 | 2014-03-04 | 检查设备、方法和系统 |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US10408966B2 (ko) |
| EP (1) | EP3115773B1 (ko) |
| JP (1) | JP6306738B2 (ko) |
| KR (1) | KR101862692B1 (ko) |
| CN (1) | CN104897703B (ko) |
| AU (2) | AU2015226613A1 (ko) |
| BR (1) | BR112016016805B1 (ko) |
| ES (1) | ES2871025T3 (ko) |
| HK (1) | HK1211703A1 (ko) |
| RU (1) | RU2636810C1 (ko) |
| WO (1) | WO2015131802A1 (ko) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106896121B (zh) | 2015-12-18 | 2019-07-05 | 清华大学 | 检测系统和方法 |
| CN108414546A (zh) * | 2018-05-10 | 2018-08-17 | 同方威视技术股份有限公司 | 透射检查设备和检查方法 |
| DE102019208888A1 (de) * | 2019-06-19 | 2020-12-24 | Friedrich-Alexander-Universität Erlangen-Nürnberg | Verfahren zur Herstellung eines Streustrahlkollimators, Streustrahlkollimator und Röntgengerät mit Streustrahlkollimator |
| CN110428478B (zh) * | 2019-07-15 | 2021-09-24 | 清华大学 | 交替光源扇束x射线ct采样方法及装置 |
| CN112433258A (zh) * | 2019-08-09 | 2021-03-02 | 同方威视技术股份有限公司 | 检查系统 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1191796A1 (ru) * | 1983-12-27 | 1985-11-15 | Киевский Ордена Ленина Государственный Университет Им.Т.Г.Шевченко | Малоугловой рентгеновский дифрактометр |
| US5263075A (en) * | 1992-01-13 | 1993-11-16 | Ion Track Instruments, Inc. | High angular resolution x-ray collimator |
| GB2297835A (en) * | 1995-02-08 | 1996-08-14 | Secr Defence | Three dimensional detection of contraband using x rays |
| CN1146890A (zh) * | 1995-03-30 | 1997-04-09 | 西门子公司 | 用于电子束x线断层成相的固定隔板准直器 |
| RU2119659C1 (ru) * | 1997-01-24 | 1998-09-27 | Закрытое акционерное общество "Кванта Инвест" | Устройство для малоугловой топографии (варианты) |
| JP2000235007A (ja) * | 1999-02-15 | 2000-08-29 | Hitachi Engineering & Services Co Ltd | Ｘ線ｃｔスキャナ装置およびｘ線貨物検査方法 |
| DE19954664B4 (de) * | 1999-11-13 | 2006-06-08 | Smiths Heimann Gmbh | Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien eines Gegenstandes |
| ATE250761T1 (de) * | 2001-03-14 | 2003-10-15 | Yxlon Int X Ray Gmbh | Anordnung zum messen des impulsübertragungsspektrums von in einem untersuchungsbereich für behältnisse elastisch gestreuten röntgenquanten |
| TW583463B (en) | 2002-11-07 | 2004-04-11 | Toppoly Optoelectronics Corp | Transflective liquid crystal display |
| EP1609004A2 (en) * | 2003-04-02 | 2005-12-28 | Reveal Imaging Technologies, Inc. | System and method for detection of explosives in baggage |
| US7092485B2 (en) * | 2003-05-27 | 2006-08-15 | Control Screening, Llc | X-ray inspection system for detecting explosives and other contraband |
| WO2005120354A1 (en) * | 2004-06-07 | 2005-12-22 | Philips Intellectual Property & Standards Gmbh | Coherent-scatter computer tomograph |
| US7697664B2 (en) * | 2006-05-15 | 2010-04-13 | Morpho Detection, Inc. | Systems and methods for determining an atomic number of a substance |
| JP4860418B2 (ja) * | 2006-10-10 | 2012-01-25 | 株式会社リガク | Ｘ線光学系 |
| US7742563B2 (en) * | 2008-09-10 | 2010-06-22 | Morpho Detection, Inc. | X-ray source and detector configuration for a non-translational x-ray diffraction system |
| US20110188632A1 (en) * | 2010-02-03 | 2011-08-04 | Geoffrey Harding | Multiple plane multi-inverse fan-beam detection systems and method for using the same |
| WO2012049590A1 (en) | 2010-10-13 | 2012-04-19 | Koninklijke Philips Electronics N.V. | Multi-modality compact bore imaging system |
| NL2009049C2 (en) * | 2012-06-21 | 2013-12-24 | Entech Scient B V | Method and device for identifying unknown substances in an object. |
| CN103330570B (zh) * | 2013-04-27 | 2016-06-08 | 中国人民解放军北京军区总医院 | X射线准直器、x射线准直系统及移动ct扫描仪 |
| CN103385732A (zh) * | 2013-07-25 | 2013-11-13 | 中国科学院苏州生物医学工程技术研究所 | 一种静态ct扫描仪 |
| CN203929678U (zh) * | 2014-03-04 | 2014-11-05 | 清华大学 | 检查设备和系统 |
-
2014
- 2014-03-04 CN CN201410075765.1A patent/CN104897703B/zh active Active
-
2015
- 2015-03-03 AU AU2015226613A patent/AU2015226613A1/en not_active Abandoned
- 2015-03-03 ES ES15759349T patent/ES2871025T3/es active Active
- 2015-03-03 KR KR1020167026749A patent/KR101862692B1/ko active IP Right Grant
- 2015-03-03 EP EP15759349.2A patent/EP3115773B1/en active Active
- 2015-03-03 US US15/122,659 patent/US10408966B2/en active Active
- 2015-03-03 JP JP2016558258A patent/JP6306738B2/ja active Active
- 2015-03-03 WO PCT/CN2015/073558 patent/WO2015131802A1/zh active Application Filing
- 2015-03-03 RU RU2016137612A patent/RU2636810C1/ru active
- 2015-03-03 BR BR112016016805-4A patent/BR112016016805B1/pt active IP Right Grant
- 2015-12-21 HK HK15112552.8A patent/HK1211703A1/xx unknown
-
2017
- 2017-11-22 AU AU2017265073A patent/AU2017265073B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| AU2017265073B2 (en) | 2019-04-18 |
| HK1211703A1 (en) | 2016-05-27 |
| BR112016016805B1 (pt) | 2020-10-20 |
| EP3115773A1 (en) | 2017-01-11 |
| RU2636810C1 (ru) | 2017-11-28 |
| KR101862692B1 (ko) | 2018-05-31 |
| EP3115773B1 (en) | 2021-03-03 |
| EP3115773A4 (en) | 2017-10-18 |
| WO2015131802A1 (zh) | 2015-09-11 |
| JP2016540999A (ja) | 2016-12-28 |
| KR20160128365A (ko) | 2016-11-07 |
| CN104897703A (zh) | 2015-09-09 |
| AU2015226613A1 (en) | 2016-07-28 |
| ES2871025T3 (es) | 2021-10-28 |
| AU2017265073A1 (en) | 2017-12-14 |
| US20170075026A1 (en) | 2017-03-16 |
| US10408966B2 (en) | 2019-09-10 |
| JP6306738B2 (ja) | 2018-04-04 |
| BR112016016805A2 (pt) | 2018-06-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104897703B (zh) | 检查设备、方法和系统 | |
| KR101751196B1 (ko) | Ct 시스템 및 ct 시스템에 사용되는 탐측장치 | |
| US8842808B2 (en) | Scatter attenuation tomography using a monochromatic radiation source | |
| US9639973B2 (en) | Muon tomography imaging improvement using optimized limited angle data | |
| US7486760B2 (en) | Compact systems and methods for generating a diffraction profile | |
| EP2817661B1 (en) | X-ray imager with sparse detector array | |
| US8462913B2 (en) | Detection of X-ray scattering | |
| US20090225944A1 (en) | X-ray inspection and detection system and method | |
| CN202948145U (zh) | Ct系统和用于ct系统的探测装置 | |
| CN203929678U (zh) | 检查设备和系统 | |
| US7492863B2 (en) | Method for developing an x-ray diffraction imaging system | |
| EP3182175B1 (en) | X-ray diffraction detection system and method | |
| CN110325846A (zh) | 采用衍射检测器的样本检查设备 | |
| US20160061752A1 (en) | Detection of an object within a volume of interest | |
| US9897559B2 (en) | Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector | |
| CN110531418A (zh) | 一种基于希尔伯特极化成像的断点三维精细定位方法 | |
| Chen et al. | Energy-dispersive X-ray diffraction system with a spiral-array structure for security inspection | |
| CN113939732B (zh) | 具有减少视差效应的x射线测量装置 | |
| CN113939732A (zh) | 具有减少视差效应的x射线测量装置 | |
| RU2472138C1 (ru) | Способ неразрушающего контроля изделий |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| REG | Reference to a national code |
Ref country code: HK Ref legal event code: DE Ref document number: 1211703 Country of ref document: HK |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |