HK1211088A1 - 用於測試工件的方法及裝置 - Google Patents

用於測試工件的方法及裝置

Info

Publication number
HK1211088A1
HK1211088A1 HK15111839.5A HK15111839A HK1211088A1 HK 1211088 A1 HK1211088 A1 HK 1211088A1 HK 15111839 A HK15111839 A HK 15111839A HK 1211088 A1 HK1211088 A1 HK 1211088A1
Authority
HK
Hong Kong
Prior art keywords
workpiece
testing
Prior art date
Application number
HK15111839.5A
Other languages
English (en)
Inventor
Michael Konrad
Stefan Werner
Original Assignee
Konrad Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE201210111216 external-priority patent/DE102012111216A1/de
Priority claimed from DE201210111215 external-priority patent/DE102012111215A1/de
Application filed by Konrad Gmbh filed Critical Konrad Gmbh
Publication of HK1211088A1 publication Critical patent/HK1211088A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Tests Of Electronic Circuits (AREA)
HK15111839.5A 2012-11-21 2015-12-02 用於測試工件的方法及裝置 HK1211088A1 (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE201210111216 DE102012111216A1 (de) 2012-11-21 2012-11-21 Verfahren zum Bewegen eines Gegenstandes
DE201210111215 DE102012111215A1 (de) 2012-11-21 2012-11-21 Verfahren und Vorrichtung zum Prüfen eines Werkstücks
PCT/EP2013/074348 WO2014079913A1 (de) 2012-11-21 2013-11-21 Verfahren und vorrichtung zum prüfen eines werkstücks

Publications (1)

Publication Number Publication Date
HK1211088A1 true HK1211088A1 (zh) 2016-05-13

Family

ID=49841633

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15111839.5A HK1211088A1 (zh) 2012-11-21 2015-12-02 用於測試工件的方法及裝置

Country Status (5)

Country Link
US (1) US9739826B2 (zh)
EP (1) EP2923211A1 (zh)
CN (2) CN104969080B (zh)
HK (1) HK1211088A1 (zh)
WO (1) WO2014079913A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106093752B (zh) * 2016-06-20 2019-03-12 定颖电子(黄石)有限公司 一种应用于集成电路的测试探针卡
DE102016123122B3 (de) * 2016-11-30 2018-03-15 Michael Konrad Haptic-Test-Messvorrichtung und Verfahren zur Ermittlung einer Kraft-Weg-Kurve bei einer Haptic-Test-Messung
CN113484722B (zh) * 2021-07-06 2022-07-08 广州弘高科技股份有限公司 一种手机pcb板的测试装置及测试方法

Family Cites Families (39)

* Cited by examiner, † Cited by third party
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FR2418466A1 (fr) * 1978-02-24 1979-09-21 Telecommunications Sa Appareil pour etablir des prises de contact temporaires sur des circuits electriques
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DE19503329C2 (de) * 1995-02-02 2000-05-18 Ita Ingb Testaufgaben Gmbh Testvorrichtung für elektronische Flachbaugruppen
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KR0176627B1 (ko) * 1995-12-30 1999-05-15 김광호 인쇄회로기판의 통전검사용 프로브 장치
US6051982A (en) 1996-08-02 2000-04-18 International Business Machines Corporation Electronic component test apparatus with rotational probe and conductive spaced apart means
DE19646252A1 (de) 1996-11-08 1998-05-14 Ingun Pruefmittelbau Prüfvorrichtung
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JP2004505251A (ja) * 2000-07-19 2004-02-19 オルボテック　リミテッド 電気回路の電気的試験のための装置および方法
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JP2008533441A (ja) 2005-02-08 2008-08-21 ナノネクサス インク Ｉｃパッケージおよび相互接続アゼンブリのための高密度の相互接続システム
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WO2007057944A1 (ja) 2005-11-15 2007-05-24 Advantest Corporation 電子部品試験装置及び電子部品試験装置へのパフォーマンスボードの装着方法
KR20080078681A (ko) * 2005-12-20 2008-08-27 코닌클리케 필립스 일렉트로닉스 엔.브이. 유전성 폴리머 액추에이터를 사용하는 카메라 조리개 및렌즈 위치지정 시스템
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Also Published As

Publication number Publication date
CN110031658A (zh) 2019-07-19
CN104969080A (zh) 2015-10-07
WO2014079913A1 (de) 2014-05-30
EP2923211A1 (de) 2015-09-30
CN110031658B (zh) 2021-11-30
CN104969080B (zh) 2019-02-15
US20160011253A1 (en) 2016-01-14
US9739826B2 (en) 2017-08-22

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